JPS4994386A - - Google Patents

Info

Publication number
JPS4994386A
JPS4994386A JP48005140A JP514073A JPS4994386A JP S4994386 A JPS4994386 A JP S4994386A JP 48005140 A JP48005140 A JP 48005140A JP 514073 A JP514073 A JP 514073A JP S4994386 A JPS4994386 A JP S4994386A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP48005140A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP48005140A priority Critical patent/JPS4994386A/ja
Priority to GB11574A priority patent/GB1441211A/en
Priority to GB11474A priority patent/GB1448611A/en
Priority to FR7400531A priority patent/FR2213481B1/fr
Priority to US05/431,735 priority patent/US4027978A/en
Priority to FR7400530A priority patent/FR2213510B1/fr
Priority to IT19238/74A priority patent/IT1006825B/it
Priority to IT1923774A priority patent/IT1006824B/it
Priority to DE19742401105 priority patent/DE2401105C3/de
Priority to DE2401113A priority patent/DE2401113C3/de
Publication of JPS4994386A publication Critical patent/JPS4994386A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/04—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
    • G01B11/046—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving for measuring width

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Optical Transform (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Geophysics And Detection Of Objects (AREA)
JP48005140A 1973-01-10 1973-01-10 Pending JPS4994386A (zh)

Priority Applications (10)

Application Number Priority Date Filing Date Title
JP48005140A JPS4994386A (zh) 1973-01-10 1973-01-10
GB11574A GB1441211A (en) 1973-01-10 1974-01-02 Method and apparatus for producing and detecting an optical mark on a high temperature material
GB11474A GB1448611A (en) 1973-01-10 1974-01-02 Method and apparatus for on-contact measurement of a gauge of a high temperature material
FR7400531A FR2213481B1 (zh) 1973-01-10 1974-01-08
US05/431,735 US4027978A (en) 1973-01-10 1974-01-08 Method and apparatus for non-contact measurement of a gauge of a high temperature material
FR7400530A FR2213510B1 (zh) 1973-01-10 1974-01-08
IT19238/74A IT1006825B (it) 1973-01-10 1974-01-09 Procedimento ed apparecchiatura par ticolarmente per la misura senza contatto di uno spessore di un ma teriale ad alta temperatura
IT1923774A IT1006824B (it) 1973-01-10 1974-01-09 Procedimento ed apparecchiatura par ticolarmente per la rivelazione di un segno ottico su un materiale ad alta temperatura
DE19742401105 DE2401105C3 (de) 1973-01-10 1974-01-10 Vorrichtung zur Abtastung einer optischen Marke auf einem rotglühenden Stahlstück
DE2401113A DE2401113C3 (de) 1973-01-10 1974-01-10 Verfahren und Vorrichtung zur optischen Messung der Breite oder Dicke eines eine hohe Temperatur aufweisenden Werkstücks

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP48005140A JPS4994386A (zh) 1973-01-10 1973-01-10

Publications (1)

Publication Number Publication Date
JPS4994386A true JPS4994386A (zh) 1974-09-07

Family

ID=11602990

Family Applications (1)

Application Number Title Priority Date Filing Date
JP48005140A Pending JPS4994386A (zh) 1973-01-10 1973-01-10

Country Status (4)

Country Link
JP (1) JPS4994386A (zh)
FR (1) FR2213510B1 (zh)
GB (1) GB1441211A (zh)
IT (1) IT1006824B (zh)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50104046A (zh) * 1974-01-18 1975-08-16
JPS5245361A (en) * 1975-10-07 1977-04-09 Nippon Kokan Kk <Nkk> Method of detecting position of molten metal stream
JPS61243391A (ja) * 1985-04-19 1986-10-29 Kiiensu:Kk 半導体レ−ザ光電スイツチのレ−ザ光照射位置確認方法
JPH09210622A (ja) * 1996-02-07 1997-08-12 Kobe Steel Ltd 高温物体の距離測定方法及び装置

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5539656A (en) * 1994-10-11 1996-07-23 United Technologies Corporation Crack monitoring apparatus
US5517861A (en) * 1994-10-11 1996-05-21 United Technologies Corporation High temperature crack monitoring apparatus
US6859285B1 (en) 1999-08-31 2005-02-22 Og Technologies, Inc. Optical observation device and method for observing articles at elevated temperatures

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4946455A (zh) * 1972-09-05 1974-05-04

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3187185A (en) * 1960-12-22 1965-06-01 United States Steel Corp Apparatus for determining surface contour

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4946455A (zh) * 1972-09-05 1974-05-04

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50104046A (zh) * 1974-01-18 1975-08-16
JPS5245361A (en) * 1975-10-07 1977-04-09 Nippon Kokan Kk <Nkk> Method of detecting position of molten metal stream
JPS61243391A (ja) * 1985-04-19 1986-10-29 Kiiensu:Kk 半導体レ−ザ光電スイツチのレ−ザ光照射位置確認方法
JPH09210622A (ja) * 1996-02-07 1997-08-12 Kobe Steel Ltd 高温物体の距離測定方法及び装置

Also Published As

Publication number Publication date
DE2401105A1 (de) 1974-07-18
DE2401105B2 (de) 1976-03-25
FR2213510A1 (zh) 1974-08-02
GB1441211A (en) 1976-06-30
IT1006824B (it) 1976-10-20
FR2213510B1 (zh) 1976-10-08

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