TW448307B - Optical projection system - Google Patents
Optical projection system Download PDFInfo
- Publication number
- TW448307B TW448307B TW089125820A TW89125820A TW448307B TW 448307 B TW448307 B TW 448307B TW 089125820 A TW089125820 A TW 089125820A TW 89125820 A TW89125820 A TW 89125820A TW 448307 B TW448307 B TW 448307B
- Authority
- TW
- Taiwan
- Prior art keywords
- lens
- optical projection
- protrusion
- scope
- lens system
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 title claims abstract description 28
- WUKWITHWXAAZEY-UHFFFAOYSA-L calcium difluoride Chemical compound [F-].[F-].[Ca+2] WUKWITHWXAAZEY-UHFFFAOYSA-L 0.000 claims description 9
- 229910001634 calcium fluoride Inorganic materials 0.000 claims description 9
- 239000000463 material Substances 0.000 claims description 7
- 238000012937 correction Methods 0.000 claims description 4
- 238000000034 method Methods 0.000 claims description 4
- 230000008569 process Effects 0.000 claims description 4
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 claims 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 22
- 238000001459 lithography Methods 0.000 description 5
- 238000003384 imaging method Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 238000007792 addition Methods 0.000 description 2
- 230000004075 alteration Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 150000002222 fluorine compounds Chemical class 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000005065 mining Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70241—Optical aspects of refractive lens systems, i.e. comprising only refractive elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B13/00—Optical objectives specially designed for the purposes specified below
- G02B13/14—Optical objectives specially designed for the purposes specified below for use with infrared or ultraviolet radiation
- G02B13/143—Optical objectives specially designed for the purposes specified below for use with infrared or ultraviolet radiation for use with ultraviolet radiation
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B13/00—Optical objectives specially designed for the purposes specified below
- G02B13/18—Optical objectives specially designed for the purposes specified below with lenses having one or more non-spherical faces, e.g. for reducing geometrical aberration
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Lenses (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US17182799P | 1999-12-21 | 1999-12-21 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW448307B true TW448307B (en) | 2001-08-01 |
Family
ID=22625292
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW089125820A TW448307B (en) | 1999-12-21 | 2000-12-04 | Optical projection system |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20020001141A1 (enExample) |
| EP (1) | EP1111425A3 (enExample) |
| JP (1) | JP2001201682A (enExample) |
| TW (1) | TW448307B (enExample) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH1195095A (ja) | 1997-09-22 | 1999-04-09 | Nikon Corp | 投影光学系 |
| WO2001023935A1 (en) | 1999-09-29 | 2001-04-05 | Nikon Corporation | Projection exposure method and apparatus and projection optical system |
| WO2001023933A1 (en) | 1999-09-29 | 2001-04-05 | Nikon Corporation | Projection optical system |
| JP2002244034A (ja) | 2001-02-21 | 2002-08-28 | Nikon Corp | 投影光学系および該投影光学系を備えた露光装置 |
| JP2002323652A (ja) | 2001-02-23 | 2002-11-08 | Nikon Corp | 投影光学系,該投影光学系を備えた投影露光装置および投影露光方法 |
| US7154676B2 (en) | 2002-03-01 | 2006-12-26 | Carl Zeiss Smt A.G. | Very-high aperture projection objective |
| DE10224361A1 (de) * | 2002-05-03 | 2003-11-13 | Zeiss Carl Smt Ag | Projektionsobjektiv höchster Apertur |
| EP1481286A2 (de) * | 2002-03-01 | 2004-12-01 | Carl Zeiss SMT AG | Refraktives projektionsobjektiv mit einer taille |
| US7190527B2 (en) | 2002-03-01 | 2007-03-13 | Carl Zeiss Smt Ag | Refractive projection objective |
| DE10210899A1 (de) * | 2002-03-08 | 2003-09-18 | Zeiss Carl Smt Ag | Refraktives Projektionsobjektiv für Immersions-Lithographie |
| JP2005524866A (ja) * | 2002-05-03 | 2005-08-18 | カール・ツァイス・エスエムティー・アーゲー | 超高開口度の投影対物レンズ |
| JP2009104184A (ja) * | 2002-07-04 | 2009-05-14 | Nikon Corp | 投影光学系、露光装置、およびデバイス製造方法 |
| JP2007512658A (ja) * | 2003-08-08 | 2007-05-17 | ゼネラル・エレクトリック・カンパニイ | 導電性組成物及びその製造方法 |
| JP2011237588A (ja) * | 2010-05-10 | 2011-11-24 | Sony Corp | ズームレンズ及び撮像装置 |
| CN101975983B (zh) * | 2010-09-13 | 2012-05-30 | 北京理工大学 | 高分辨率非球面光刻物镜 |
| CN102486569B (zh) * | 2010-12-01 | 2014-06-18 | 上海微电子装备有限公司 | 一种投影物镜系统 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3298131B2 (ja) * | 1991-10-24 | 2002-07-02 | 株式会社ニコン | 縮小投影レンズ |
| JPH07113955A (ja) * | 1993-10-18 | 1995-05-02 | Minolta Co Ltd | ズームレンズ |
| JPH0817719A (ja) * | 1994-06-30 | 1996-01-19 | Nikon Corp | 投影露光装置 |
| JP3429584B2 (ja) * | 1994-11-11 | 2003-07-22 | オリンパス光学工業株式会社 | ズームレンズ |
| JP3624973B2 (ja) * | 1995-10-12 | 2005-03-02 | 株式会社ニコン | 投影光学系 |
| JP3864399B2 (ja) * | 1996-08-08 | 2006-12-27 | 株式会社ニコン | 投影露光装置及び該投影露光装置に用いられる投影光学系並びにデバイス製造方法 |
| JPH116957A (ja) * | 1997-04-25 | 1999-01-12 | Nikon Corp | 投影光学系および投影露光装置並びに投影露光方法 |
| DE19818444A1 (de) * | 1997-04-25 | 1998-10-29 | Nikon Corp | Abbildungsoptik, Projektionsoptikvorrichtung und Projektionsbelichtungsverfahren |
| US5990926A (en) * | 1997-07-16 | 1999-11-23 | Nikon Corporation | Projection lens systems for excimer laser exposure lithography |
| JPH11214293A (ja) * | 1998-01-22 | 1999-08-06 | Nikon Corp | 投影光学系及び該光学系を備えた露光装置並びにデバイス製造方法 |
| JP3292136B2 (ja) * | 1998-05-11 | 2002-06-17 | 株式会社ニコン | 投影系及び投影露光法 |
| DE19942281A1 (de) * | 1999-05-14 | 2000-11-16 | Zeiss Carl Fa | Projektionsobjektiv |
| WO2000033138A1 (de) * | 1998-11-30 | 2000-06-08 | Carl Zeiss | Hochaperturiges projektionsobjektiv mit minimalem blendenfehler |
-
2000
- 2000-12-04 TW TW089125820A patent/TW448307B/zh not_active IP Right Cessation
- 2000-12-18 EP EP00127677A patent/EP1111425A3/en not_active Ceased
- 2000-12-19 JP JP2000384773A patent/JP2001201682A/ja active Pending
- 2000-12-21 US US09/746,728 patent/US20020001141A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| EP1111425A2 (en) | 2001-06-27 |
| EP1111425A3 (en) | 2003-10-01 |
| JP2001201682A (ja) | 2001-07-27 |
| US20020001141A1 (en) | 2002-01-03 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TW448307B (en) | Optical projection system | |
| KR100615068B1 (ko) | 반사 굴절 광학 시스템 및 이를 구비하는 노광 장치 | |
| JP3624973B2 (ja) | 投影光学系 | |
| TW451076B (en) | Optical projection lens system | |
| KR100866818B1 (ko) | 투영광학계 및 이 투영광학계를 구비한 노광장치 | |
| US6863403B2 (en) | Deep ultraviolet unit-magnification projection optical system and projection exposure apparatus | |
| JP3454390B2 (ja) | 投影光学系、投影露光装置及び投影露光方法 | |
| JP3750123B2 (ja) | 投影光学系 | |
| JP3819048B2 (ja) | 投影光学系及びそれを備えた露光装置並びに露光方法 | |
| JP3396935B2 (ja) | 投影光学系及び投影露光装置 | |
| JP2001343589A (ja) | 投影光学系、および該投影光学系による投影露光装置、デバイス製造方法 | |
| US6590715B2 (en) | Optical projection system | |
| WO2004008507A1 (ja) | オプティカルインテグレータ、照明光学装置、露光装置および露光方法 | |
| JP2004022708A (ja) | 結像光学系、照明光学系、露光装置及び露光方法 | |
| JP2005003982A (ja) | 投影光学系、露光装置および露光方法 | |
| US20030210385A1 (en) | Projection optical system, a projection exposure apparatus provided with the same, as well as a device manufacturing method | |
| JP2002244036A (ja) | 投影レンズ、及び微細構造化部品の製造方法 | |
| JP4779394B2 (ja) | 投影光学系、露光装置、および露光方法 | |
| TW508655B (en) | Relay imaging optical system, and illumination optical device and exposure device having the optical system | |
| JP7029564B2 (ja) | カタディオプトリック光学系、照明光学系、露光装置および物品製造方法 | |
| JP2004524554A (ja) | 投射対物レンズ | |
| JP2002250865A (ja) | 投影光学系、露光装置、およびそれらの製造方法 | |
| CN101107570B (zh) | 投影光学系统 | |
| JP2002244035A (ja) | 投影光学系および該投影光学系を備えた露光装置 | |
| TW201235729A (en) | Large view field projection lithography objective |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GD4A | Issue of patent certificate for granted invention patent | ||
| MM4A | Annulment or lapse of patent due to non-payment of fees |