TW444414B - Method of manufacturing a photovoltaic foil - Google Patents
Method of manufacturing a photovoltaic foil Download PDFInfo
- Publication number
- TW444414B TW444414B TW086117872A TW86117872A TW444414B TW 444414 B TW444414 B TW 444414B TW 086117872 A TW086117872 A TW 086117872A TW 86117872 A TW86117872 A TW 86117872A TW 444414 B TW444414 B TW 444414B
- Authority
- TW
- Taiwan
- Prior art keywords
- layer
- photovoltaic
- sheet
- transparent conductor
- layers
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 22
- 239000011888 foil Substances 0.000 title abstract description 8
- 239000000758 substrate Substances 0.000 claims abstract description 68
- 238000000034 method Methods 0.000 claims abstract description 59
- 239000004020 conductor Substances 0.000 claims abstract description 56
- 239000000463 material Substances 0.000 claims abstract description 25
- 229910052751 metal Inorganic materials 0.000 claims description 26
- 239000002184 metal Substances 0.000 claims description 26
- 230000005693 optoelectronics Effects 0.000 claims description 15
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 claims description 14
- 238000011049 filling Methods 0.000 claims description 13
- 239000010409 thin film Substances 0.000 claims description 11
- 239000011248 coating agent Substances 0.000 claims description 7
- 238000000576 coating method Methods 0.000 claims description 7
- 229910001887 tin oxide Inorganic materials 0.000 claims description 6
- 239000010408 film Substances 0.000 claims description 5
- 238000010147 laser engraving Methods 0.000 claims description 5
- 239000013067 intermediate product Substances 0.000 claims description 2
- 229910001092 metal group alloy Inorganic materials 0.000 claims description 2
- PCTMTFRHKVHKIS-BMFZQQSSSA-N (1s,3r,4e,6e,8e,10e,12e,14e,16e,18s,19r,20r,21s,25r,27r,30r,31r,33s,35r,37s,38r)-3-[(2r,3s,4s,5s,6r)-4-amino-3,5-dihydroxy-6-methyloxan-2-yl]oxy-19,25,27,30,31,33,35,37-octahydroxy-18,20,21-trimethyl-23-oxo-22,39-dioxabicyclo[33.3.1]nonatriaconta-4,6,8,10 Chemical compound C1C=C2C[C@@H](OS(O)(=O)=O)CC[C@]2(C)[C@@H]2[C@@H]1[C@@H]1CC[C@H]([C@H](C)CCCC(C)C)[C@@]1(C)CC2.O[C@H]1[C@@H](N)[C@H](O)[C@@H](C)O[C@H]1O[C@H]1/C=C/C=C/C=C/C=C/C=C/C=C/C=C/[C@H](C)[C@@H](O)[C@@H](C)[C@H](C)OC(=O)C[C@H](O)C[C@H](O)CC[C@@H](O)[C@H](O)C[C@H](O)C[C@](O)(C[C@H](O)[C@H]2C(O)=O)O[C@H]2C1 PCTMTFRHKVHKIS-BMFZQQSSSA-N 0.000 claims 1
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- 101100008048 Caenorhabditis elegans cut-4 gene Proteins 0.000 description 1
- 229910004613 CdTe Inorganic materials 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 229910021578 Iron(III) chloride Inorganic materials 0.000 description 1
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 1
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- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- UCKMPCXJQFINFW-UHFFFAOYSA-N Sulphide Chemical compound [S-2] UCKMPCXJQFINFW-UHFFFAOYSA-N 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- 229910000611 Zinc aluminium Inorganic materials 0.000 description 1
- 230000002378 acidificating effect Effects 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
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- CXKCTMHTOKXKQT-UHFFFAOYSA-N cadmium oxide Inorganic materials [Cd]=O CXKCTMHTOKXKQT-UHFFFAOYSA-N 0.000 description 1
- CFEAAQFZALKQPA-UHFFFAOYSA-N cadmium(2+);oxygen(2-) Chemical compound [O-2].[Cd+2] CFEAAQFZALKQPA-UHFFFAOYSA-N 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/1892—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof methods involving the use of temporary, removable substrates
- H01L31/1896—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof methods involving the use of temporary, removable substrates for thin-film semiconductors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/036—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
- H01L31/0392—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022466—Electrodes made of transparent conductive layers, e.g. TCO, ITO layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022466—Electrodes made of transparent conductive layers, e.g. TCO, ITO layers
- H01L31/022483—Electrodes made of transparent conductive layers, e.g. TCO, ITO layers composed of zinc oxide [ZnO]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0236—Special surface textures
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/036—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
- H01L31/0392—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate
- H01L31/03921—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate including only elements of Group IV of the Periodic Table
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/042—PV modules or arrays of single PV cells
- H01L31/0445—PV modules or arrays of single PV cells including thin film solar cells, e.g. single thin film a-Si, CIS or CdTe solar cells
- H01L31/046—PV modules composed of a plurality of thin film solar cells deposited on the same substrate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/042—PV modules or arrays of single PV cells
- H01L31/0445—PV modules or arrays of single PV cells including thin film solar cells, e.g. single thin film a-Si, CIS or CdTe solar cells
- H01L31/046—PV modules composed of a plurality of thin film solar cells deposited on the same substrate
- H01L31/0463—PV modules composed of a plurality of thin film solar cells deposited on the same substrate characterised by special patterning methods to connect the PV cells in a module, e.g. laser cutting of the conductive or active layers
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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Description
A7 B7 444414 五'發明説明( 本發明係在薄膜光電電池之範圍φ θ 闺中。例如,非晶矽(也就 疋a-Si : Η)光電(PV)池爲已知結槎,Α .. 稱,其包含數層,其通常 舄又替之η-型摻雜、本質、及p_型拖 P尘摻雜矽,並且其實質上 乃具有能以入射光產生電流之能力。例如,假設因此陽光 能被用在製造能源時’主要是來自於所感興趣其能替代能 源之光電電池,其較石化燃料或核能乃更具有環保上之親 和力。然而’對諸此光電電池而言,欲成爲一種愼重及妳 濟吸引力之取代品,.其乃需以適當形式提供並需利用相^ 低成本之方法及利用相當低廉之原料進行製造。 爲滿足此需求,本發明係指出能以薄片形式製造光電電 池之方法。使光電電池能以薄片爲形式不僅較佳,因諸此 係可容許以大規模經濟方式生產(以•,捲至捲"之方法),但 其也因爲以可撓曲基材爲基準之光電電池與在玻璃基材上 製ie之較爲傳統非晶碎光電電池相較之下將具有更多之變 化性並更爲容易處理。 經濟部中央標準局負工消費合作杜印製 因此,本發明乃是關於以載體支撑並包含多層之光電薄 片製法’其在一側上爲與光電層相鄰並平行之背向電極層 ,而在另一侧上爲與光電層相鄰並平行之透明導體層,其 共同乃具有能以入射光(文後中稱爲•,光電(pv)層,_)產生出 電流之能力’該方法包括出提供一個基材並使透明電極層 及光電層(其包含任何其它及/或相鄰層)施加至該基材上。 於光電層施加後,使背向電極層施加至某些點上。此並不 需爲透明電極’貫際上其較佳者爲能用在可見光(其兩者係 被用於反射及導電’背向電核層一般將是金屬層)之反射層 -4- 本纸張尺度適用中國國家榇準(CNS ) A4規格(2丨0X297公釐) 4 444 1 4 第86117872號專利申請案 A7 中文說明書修正頁(90年1月) B7
五、發明説明(2 {請先閱讀背面之注意事項再填寫本頁) 。為清楚起見,在本f明之原文中其需注意者為專有名詞" 背向''係指光電薄片侧,其最終於使用時係將由光線著落側 上面向他處σ 經濟部中央標準局員工消賢合作社印製 諸此方法係可由例如Shinohara等人於1994年12月5-9 曰發表於夏威夷之第一次WCPEC由682頁起(©IEEE)得 知,其中所使用之基材為聚乙烯2,6奈二羧酸酯(PEN)。其 揭示之方法係有數項嚴重缺點,例如,其先建構出光電層 其次才是透明導體。此為基材不夠透明之邏輯上的結果, 也就是說,其最終乃無法當成用在透明導體層(於非晶矽光 電電池中其傳統上係在玻璃基材上製造)之窗口。然而,其 必需先施加光電層其次才是透明導電層之"反轉”順序乃在 所使用之透明導體材料上設下嚴重限制。例如,一種非常 佳之透明電極層為F摻雜之氧化錫。然而,為使此能具備較 佳之性質及織構,其必需在至少4 〇 〇 °C之溫度時施加。在 此高溫下時尤其因結晶化、摻雜劑之擴散、及/或氫之損耗 結果而可能對光電層造成損害。用在F -摻雜氧化錫沈積時 之較佳溫度亦造成P E N基材劣化,因此,此層並不能在光 電層之前沈積。因此,於使用透明電極之較佳施加溫度時 ,在PEN基材上之任何沈積步驟將有可能對光電薄片產生 能源之基本能力造成負面影響。 因此,其需能容許光電薄片或裝置以捲至捲方式進行製 造之方法,然於同時其可能使用任何較佳之透明導體材料 及沈積方法,並且其不致危害光電層產生電流之動作。利 用本發明方法則其乃能滿足此等要求及其它所需之目的。 本纸張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐) 444 41 4 A7 B7 經濟部中央標準局員工消費合作社印製 五、發明説明( 至此,:發明乃包括含前述之已知類型方法,該方法包 括如下順序之步職: 提供出一個暫時性基材, 施加透明導體層., 施加光電層, 施加背向電極層, 施加(永久性)載體, 使該暫時性基材移除,及較佳者爲, 使頂塗層施加在透明導體層側之上。 於本發明之較佳具體實施例中,透明導體層係在高於光 電層能抵擒(例如,對a.si: H而言,光電層能抵擒之最大 溫度約與薇層义沈積溫度相同。更高之溫度將造成氨損耗 與摻雜劑及雜質擴散,因此其形成使光電層效率降低之缺 陷)之溫度時施加。 此等步驟及其順序實質上乃係使得光電電池以薄片形式 製造成爲可能,然而其仍能保持在製造時之較佳规律性, 其爲傳統上在玻璃基材(在該實例中,其可從施加透明導體 展開,因爲玻璃將被當成其窗口)上製造光.電電池時之情況 。因此,當追隨本發明之方法時,可選擇基材以容許進一 步之處理步驟(類似在高溫時施加透明導體層),而其無關於 其(也就是基材的)用在作用成最終光電層所需之透明性及其 它性質之任何考量。於施加完最後之光電層後使暫時性基 材、走向電極層移除’並且亦施加永久性之載體背由基材 ’此乃爲能使薄光電薄片可在儘可能多數之處理步驟期間 -6- 本紙張尺度通用中國國家標準(匚]^)六4規格〔2丨〇>< 297公疫) (請先閲讀背面之注意事項再填寫本頁) 、va -冬 444414 A7 B7 經濟部中央樣毕局員工消費合作社印製 五、發明説明(4 並支撑及確保薄片具有足夠強度及彎曲剛性(其較佳者爲能 使其適用在企圖之最終產品)。於暫時性基材移除後,透^ 導體(前電極)一般係將被供以一個透明保護層,其較佳者爲 進一步使其增添在薄片及/或最終產品之機械性質中。 雖本發明之透明導體一般是直接被沈積在暫時性基材(有 時是利用一個或多個極薄的膜當成輔助處理來進行)上,於 提供出暫時性基材後,利用首先使最終之保護層施加至該 暫時性基材上,其次施加透明導體層、接著施加其它層以 製造薄片亦有可能。在此情況中,保護層較佳者必需是以 無機材料製造。 暫時性基材本身及使其移除之方法(利用溶解法或蝕刻法 較適合)兩者係可由熟習此技藝之人員選擇而並無太大之困 難。暫時性基材可爲”正,,光阻,也就是説其爲一種經照射 後可由抗溶劑變化成溶劑可萃取之光敏材料,例如,交鏈 聚亞醯胺β爲滿足使用低材料成本之目的,此等乃並非基 材之較佳選擇。在此方面,使用利用電漿蝕刻法(例如,h 電漿或例如用於聚矽氧烷之SFe電漿)可移除之聚合物乃更2 有利然而,以上述之觀點而T,基本上任何聚合物將因 而旎適用,當然,其較佳者爲使用可忍受較高溫度的(其爲 25〇C ’而更佳者係高於400eC)。 根據本發明,較佳之暫時性基材爲金屬或金屬合金薄片 爲此緣故之主要原因爲,諸此薄片一般在其它之處理期 間將能忍受較高的溫度,其遭遇之蒸發較少,並且可利用 已知之蝕刻技術相當容易的使其移除。另—個選擇金屬而 -7- CNS )7¾. ( 210X297^» ) ----——~ (諳先閲讀背面之注意事項再填寫本頁) -訂 β. 4 切4 14 第86II7872號專利申請案 中文說明書修正頁(90年1月)
其值得注意m油之原",光電薄片最終必需含有 侧’’電極(其可形成用於連接任 經濟部中央榡準局員工消費合作杜印製 五、發明説明( 无仕仃輔助裝置或網絡之接觸, 也就是說實際上是利用光電薄片去 . 片w成電源)。利用容許部搞 暫時性基材保持在其適當位置(例 且1W如’當成侧邊緣或條紋: 時’則並不需個別施加此等接觸。 適合之金屬乃包括鋼、銘、銅、鐵、鎳、銀、鋅、銷、 及其合金或多m為了經濟原因,其較佳者係利用 、Ai、Cu、或其合金。因其性能之緣故(與成本相結合), 銘、電解鐵、及電解銅乃享有最高之優先櫂。適合之蝕刻 技術已知,然而,對每種經選擇之金屬其並不相同,其可 由熟習此技藝之人員《it當技術選擇。較佳之姓刻劑包括 ,(路易士酸及白朗氏酸),例如,在以銅當成金屬薄片之 賞例中其較佳者係利用F e C 13、硝酸、或硫酸。可利用 例如苛性鈉而有效的使鋁移除φ 為其移除性之緣故,儘可能的使暫時性基材薄乃較佳。 當然其必需仍能容許在其它層施加至其之上時而能使此等 維持在—起,但此一般將無法對高於500微米之厚度要求 。較佳地’厚度係自!至2 0 〇从瓜視彈性模數而定,大部分 材料將要求5微米之最小厚度,在該情況中,其較佳範圍之 係在5至1 〇 〇微米間,較佳者係在$至5 〇微米之厚度間。 可使永久性載體材料施加在背向電極層之上,也就是說 ’由處理之觀點而言其乃"在上",但事實上其乃在薄片最 終之背部或底部。因此,該新載體層最終將會形成一個真 實基材(於處理期間表示為"暫時性基材"之層事實上為一個 本紙狀歧财關家縣(⑽〉&4規格(21GX297公瘦) (請先閲讀背面之注意事項再填寫本頁)
A7 B7— 4 44 4 1 4 五、發明説明(6 ) "上層材(supe_te)" ’因爲其被置放在薄片最終之前側或 上部適用此載體層之材料包括聚合薄片,其諸如聚㈣ 對苯二甲酸醋、聚乙埽2,6奈二幾酸酿、聚氣乙晞、或諸如 聚酿胺或聚亞酿胺薄片之高性能聚合物薄片,但JL亦可爲 ,如被供以絕緣(介電)上層、玻璃板之金屬薄片,或包含環 •乳及玻璃之複合物。其較佳者爲聚合性之,,共擠製”薄片, 其包括具有低於載體本身軟化點之熱塑性附著層。視需要 可使抗擴散層(例如,其分別爲聚酿(ρΕΤ)、共聚醋、及 提供至共擠製薄片。載體厚度較佳者必需在75微米至_ 米之範圍内。其更佳之範園爲1〇〇微米至6毫米及15〇微米 至300微米間。.f曲剛性(在本發明之架構内其定義爲材料 (彈性模數(Έ,是以牛頓/毫米2)乘以載體厚度(,t,是以毫来 )之三次方:Ext3)較佳者係大於16χ1〇·2牛頓毫米而其 將小於15xl〇6牛頓毫米。 戴體(最終基材)本身可爲已經是或含有企圖使用之所需結 構。因此’例如載體可爲碑或碑組 '屋頂碑、屋頂板 車頂、房車車頂等1而…般而言暫時性基材及/或載體 較佳者爲可撓曲。 如上所述,使"頂塗層"或上層施加至透明導體。此― 乃將爲(腔狀)板狀或具有高穿透性之聚合膜,其諸如非晶形 (過)氟化聚合物、聚碳酸酯、聚甲基两烯酸酯、或諸如該等 使用在汽車工業中所使用任何可取得之透明塗覆。若需要 時,可施以其它之抗反射或抗污染層。 進一步較佳者爲經最終處理步驟(大部分之弩曲剛性—般 -9 本紙張級適财_家縣 先閔積背面之注意事項再填寫本頁} 訂 經濟部中央榇率局員工消費合作社印聚 Α7 Β7 ^444 ί 4 五、發明説明( 將可由载體及頂塗層決定出)後薄片之f曲剛性乃大於任何 一個中間產品之彎曲剛性。 其需注意者爲揭示在日本專利1 987_ 1 23 7 80號中係提出 —種製造光電轉化薄膜之方法,其依序使TCQ電極 '光電 ,'及其它TCO電極沈在基材上。其後續使基材移除以獲 传一層非常薄並可高度撓曲之薄膜。支撑載體之添加對本 發明而T係非常必要,並且其可造成較厚(例,1〇〇 和 剛硬之薄片,其貫施乃將違背曰本專利號之 敎導。進者,雖日本專利1987-123780號的確揭示出暫時 性基材<用途,其亦一致與重複的提出在光電層上沈積 丁c〇。因此,使用暫時性基材時並無法避免需使〇沈積 在光電層上或該沈積在光電層上時之有害影響β 美國專利5,232,860號中係提供一種具有異常好之撓曲 性之類似光電裝置,其乃形成在板狀玻璃基材上。其利用 一層導引層以提高裝置與玻璃基材間之隔離。再次地,其 並未提及載體之添加而其係將不可能製造出較佳之,,異常好 之撓曲性"(其爲美國專利5,232,860號之科技中之主要目的 ),而可使TCO再次沈積在光電層上。因基材必需是以玻璃 或類似材料製造,於美國專利5,232,860號之裝置製造中 捲至捲方法乃並非其一選擇。 曰本專利1980-143706號係揭示出用於製造包含透明導 電層之高聚合物產品(諸如薄膜及〇£^1131*或〇111:1131631透鏡 )時可移除基材之用途。日本專利1980-143706號係未揭示 出光電電池(或類似之複雜結構產品)及在諸此電池中所遭遇 -10- 本紙掁尺度適用中國國家標隼(CNS ) Α4规格(210X297公釐) (請先閲讀背面之注意事項再填寫本頁) 訂 經濟部中央標準局貝工消費合作社印製 經濟部中央福準局肩工消费合作社印製 4 444 14 Α7 五、發明説明(8 ) 又問題,因此,該發表專利係與本發明無關。 '歐洲專利1 89 976乃提出一種製造類似SMn〇hara等人 之半導裝置(特別疋太陽能電池)之方法。根據歐洲專利 1 8 6 9 7 6號之方法,其首先係建構出光電層並後績使透明 導體施加至光電層。
Kishi等人於i"〇年發表在曰本京都之國際pvsEC_5之 第645-648頁"超輕型可撓曲非晶砂太陽能電池及 其在飛機之應/¾ —文中係揭示出一種利用使個別層沈積於 透明塑膝膜上所製造出之太陽能電池。其並未提及或暗示 出暫時性基材。 、暫時性基材較佳者爲電沈積(也就是電鍍)金屬層。其除能 容許提供出容易被移除之薄(<1〇〇微米)金屬膜以外,此方 去乃具有可觀之優點,其特別是關於光電薄片之運作。也 就是説,爲使任何光電電池能有效率的進行操作,其需使 入射光儘可能多的散射通過光電結構。至此點,光電電池 及其它層之表面乃需有特定之織構,例如,諸如包含多個 光學菱鏡(其導致入射光破斷並發散通過光電電池)之表面。 以廷鐘提供金屬薄片之—大優點爲電鍵(電沈積)處理乃使薄 片在k供任何所需織構成爲可能。此織構係可利用在被金 屬電沈積疋表面(通常爲鼓形)上織構而獲得。當光電薄片是 建構在織構基材之上時,基材乃當成一個模,其施加於與 其相鄰之層,而後續層爲該織構之負影像(共形覆蓋)。較佳 之政面係可利用本身已知之方法獲得,例如,可利用雷射 雕刻法或利用任何之微影處理獲得。在由鼓面面向他處之
-II 本紙張尺度適用中國國家揉 t请先閱讀背面之注意事項再填寫本頁) 1Τ;------β----------- I - I I I— · 經濟部中央梯準局負工消費合作社印製 4 444 1 4 , Α7 ___ Β7 五、發明説明(9 ) 側上產生出織構表面亦有可能。在此側之織構並非或並非 僅被鼓狀織構表面及製造鼓形之材料影響,但其亦被諸如 電流密度、選用之電解質及其濃度之諸此參數影響,其並 受到任何使用之添加.劑影響。熟習此技藝之人員乃知如何 調整其相關參數並將能獲得0.1至10微米(與表面垂直 級數間之表面粗度。 然而,散射性織構乃較佳,其更佳者爲包含多個相鄰金 字塔形之織構,因此,其具有交替之凸起及壓痕,其 間之相對距離較佳者爲上述之級數,而更佳者約015或0.2 微米。凸起及壓痕進一步較佳者爲圓形(例如,由基準至極 大爲40°之斜邊時之角度)以防止非晶矽層中可能之缺陷, 其係可能發生在尖銳波峰或尖銳波谷之實例中。其需理解 者爲若凸起之金字塔形存在鼓形或類似之表面上時,則其 施加於暫時性基材並最終施加於透明導體及其它層上之負 影像將爲反轉之金字塔形結構,其乃具有壓痕狀=非凸起 之金字塔形。因此,利用調整暫時性基材之織構,本發明 實質上係容許透明導體之織構能以此方式進行調整以最終 能提供其最佳化之表面形態。 若以對最終織構造成影響之可能性觀點而言,選擇銅以 用於電沈積金屬薄片乃較佳。,然而,因鋼可能有擴教通過 矽光,層之傾向,其較佳者係使非還原性之擴散障壁提供 至銅薄片(電鍍),其例如爲抗腐_银層、値得注意的氧化鋅、 或選擇具有能保護該擴散能力之透明導體,例如、
Ah〇3 .、Sn〇2、或Zn0。例如,可利用物理氣相沈積法 -12- 本紙張从通财_家縣(CNS) (請先聞讀背面之注意事項再填寫本頁) 訂 4444 ! 4 Α7 Β7 經濟部中央標準局員工消費合作社印製 五、發明説明(10 ) (PVD)或化學氣相沈積法(CVD)施加該抗擴散層。 取代銅薄片,其乃被供以一層抗擴散層,慣例上其與暫 時性基材乃被移除,使一層適當類型之玻璃提供至鋼薄片 亦有可旎。此玻璃層實質上爲透明的,因而其可爲永久,故 的,其係被當成用於透明導體層之保護窗口。爲經濟性之 原因及各許能以捲至捲處理,玻璃層較佳者爲非常薄者, 例如100至200毫米間之厚度。用在諸此層之合適施用方法 ,例如,SiH4及N20(電漿氧化物)<PECVD(電漿增進化 學氣相沈積法)及添加諸如B2Hs之適當添加劑以形成具有較 佳透明性之硼-矽酸鹽玻璃。其較佳者係利用ApcVD氧化 以此方式提供出暫時性基材後,其·乃可提供出實際形成 光電層(以薄片形式)之此等層。廣泛而言,薄膜半導體類型 之光電電池乃包含一個透明導體(其最終將形成薄片之,,前 側’’,也就是説,其使用時爲被(陽)光照射側)、多個薄膜半 導體層’其共同係能顯現光電效應,其諸如P型摻雜、本質 、及η -型接雜非晶珍層、及前述之背向電極層之堆疊,其 較佳者乃被當成反射體。可使任何較佳之保護層提供至前 侧及背部兩者’當然,用於前側之主要要求爲諸此層是透 明的’而其進一步較佳之特性係包括良好之附著性、时磨 、防水、耐氣候、及抗紫外線等。 可利用已知方法沈積透明導體·(其通常爲TCO-透明導電 氧化物)’例如’可利用金屬有機化學氣相沈積法 (MOCVD)、濺鏡法、大氣化學氣相沈積法(apcvD)、 -13 - 本纸張尺度適用中國國家標率(CNS ) Α4规格(210X297公釐) (請先閔讀背面之注意事項再填寫本頁) 訂 A7 B7 經濟部中央標準局員工消费合作社印製 五、發明説明(11 E C VD、噴霧熱解法、蒸發(物理氣相沈積法)、電沈積、 網版印染 '溶膠凝膠法等。使透明導體層在高於之溫 度時施加乃較佳,其較佳者保高於4GGT:,以使獲得具有利 性質及/或織構之透明導體層成爲可能。 適用於透明導電層之材料實例爲氧化銦錫、氧化鋅、鋁 或硼-摻雜之氧化鋅、硫化鎬、氧化鎘、氧化錫,而最佳者 爲F-摻雜之Sn〇2。若在高於4〇〇。〇之溫度下時施加,則其 能形成具有柱狀、散光織構之較佳晶面能力之此最後透明 電極材料較佳,其較佳者係在3 0 0 °C至6 Ο Ο Ό間施加《其特 別於使用此電極材料時,則選擇暫時性基材(其能忍受該高 溫)其乃能顯現一大程度之優點,而更特定而言爲選擇具織 構(電沈積金屬基材。進者,該材料係具有之優點爲其能 抵擋所使用之最佳蝕刻劑,並且其乃具有較氧化銦錫爲佳 之化學抗性及較佳之光電性質。此外,其遠較便宜。 於透明導體層施加後,視需要建構所需之光電薄片。光 電層該如何施加及該選擇何種層狀组態係已知。關於此點 之一般常識可參考Ullmann百科全書A 20(1992)卷161頁 中Yukinoro Kuwano之,,光電電池”、及Ul 1 m ann百科 iA24(l 9 9 3 )卷369頁中之”太陽能科技”。 可利用不同之薄膜半導體材料製造光電層。因此,所需 之光電層可由非晶碎(a - S i : Η )、微晶珍、多晶非晶碳化石夕 (a-SiC)及 a-SiC : Η ' 非晶矽了錯(a-SiGe)及 a-SiGe : Η 製造。進者,本發明之光電層可包含CIS光電電池(二额化 銅銦,CuInSe2)、碲化鎘電池、Cu(In,Ga)電池、 -14- 本纸浪尺度適用中國國家標卒(CNS ) A4规格(2! 〇 X 297公釐) (請先閱讀背面之注意事項再I寫本頁)
、tT ,Α Α7 Β7 經濟部中央椋準局員工消費合作社印製 4 44 4 ί 4 五、發明説明(12 )
ZnSe/CIS 電池、ZnO/CIS電池、Mo/CIS/CdS/ZnO電池。 在包含氟-掺雜氧化錫之非晶$夕電池之較佳實例中,此等 一般將包含一個或多個p_型摻雜、本質 '及n_型摻雜非晶 矽層之堆疊,其乃使卜型掺雜層置放於面向入射先側。 因此,在a-Si-H之具體實施例中,光電層至少將包含一 個p -型掺雜之非晶妙層.(s i - p)、一個本質非晶碎層(s丨j) 、及一個η-型摻雜非晶矽層(Si_n)。可使第二及其它p — 層施加至第一組p-i-n層。亦可連續施加多個重複的卜卜 η ( “ p i n p i n p i η’’或’’p i η p i n p i n p i η ”)層。利用多個 p _ i _ n 層 堆疊可提高每個電池之電壓並增加穩定化之效率(所謂 S t aeb 1 er- Wr οnski效應之光诱導劣化係可被減少)。再者 ’可在不同層中利用選擇不同能帶隙之材料以使光讀回應 成最佳化’其特定者係在i -層,而更特定者係是在i _層内。 所有a-Si層之總厚度共同時一般將爲1〇〇至2〇〇〇毫微米間 之級數,其更典型係約2 〇 〇至6 0 〇毫微米,而較佳者約3 〇 〇 至5 0 0毫微米。 爲使光電層能在不同層、不同位置中適當運作,其較佳 者係使材料部份移除以產生出5至i 〇〇毫米之個別條紋,較 佳者約5 - 2 5毫米’以使薄片中之光電電池經由串連(每個p _ i-n在極大電源點時係產生出約〇·5伏特,而多個卩一巧電池 一般將以串連方式配置以產生較佳之薄片電壓)而提供所需 之導電性。此係能利用雷射以已知方法完成。至此,交替 利用(化學)蝕刻技術亦可行。爲避免正常所需之處理步驟( 塗覆光阻、經由遮蔽使其被照射、顯影、蝕刻、漂清、及 -15- 本紙張尺度適财_家料(c叫Α4規格(21()><297公 (請先聞讀背面之注意事項再^;寫本頁)
4 44 4 14 經濟部中央標準局員工消費合作社印製 A7 B7一 五、發明説明(13 ) 光阻剝離)數,本發明乃提供—種簡單的製造工具其最終將 能提供出較佳之蝕刻圖樣。至此,於其中一具體實施例中 ,本發明係於每層提供薄蝕刻劑層之圖樣化覆蓋。由於蝕 刻實施的層爲相當薄之認知則此乃爲可能的結果,其容許 施加足量之含钱刻劑物質以使蝕刻發生。然而,對薄片中 之每層而f其典型厚度爲一百至數百毫微米間之級數,可 施加例如長及寬爲25微米( = 25000毫微米)厚之蝕刻劑。因 不同層對蝕刻劑具有不同的電阻係數,使最終薄片在不同 層中含數種不同蝕刻劑的條紋係有可能。可在光電層(捲至 捲)處理期間使所需之微小條纹施加至每層。適合施加之技 術包括彈性凸版印刷(nexo_gravure)、旋轉式網版印染法、 喷纂法、擠壓塗覆法、移轉塗覆法等。換句話説,在每個 處理步驟中,於施加其部份必須被移除的每層後即能施以 蚀刻劑。其乃被施於F-摻雜之Sn〇2層,例如,可施加諸如 KOH強鹼。蝕刻處理可利用加熱加速,因此,其可能成爲 附加之處理步驟。例如’可利用諸如硫酸之酸性蝕刻劑使 A1-摻雜之Zn〇移除。其它之透明電極材料可利用熟練人員 一般所知之適當蝕刻劑蝕刻移除(例如,利用κ〇Η可蚀刻氧 化銦錫)。利用諸如NaOH或ΚΟΗ強鹼可蝕刻非晶沙。利用 酸則可蝕刻背向電極。 實質上所有的蝕刻步驟可利用相同裝置或機台组實施, 其中在所容許之足夠蝕刻時間後·即清洗/漂清蝕刻層並使其 乾燥。因爲處理是在可撓曲(暫時性)基材上實施,在整個處 理過程之每個步驟中,其有薄片自我支撑之問題,可利用 -16- 本紙張尺度適用中國國家標準(CNS ) A4規格(210 X 297公茇) (請先閲讀背面之注意事項再填寫本頁〕 訂. 經濟部中央標準局員工消費合作社印製 A7 B7 五、發明説明(u ) 展開以引導其經由不同之處理機台(諸如浴)並可利用回捲收 集之。當暫時性基材存在時,雖然爲此原因之故而實施所 有餘刻步锻較佳,但是在暫時性基材被移除後使透明導體 部份移除乃有可能。 其兩'/主意者爲實質上以上之蝕刻法係能普遍應用在製造 例如非晶矽、光電電池或薄片之所有過程之中。 其較佳者應儘量使蝕刻劑條紋狹窄,例如1至5 0微米,而 較佳者爲20-25微米或更小,在此等條紋之位置光電薄片乃 並未具有產生電流之動作。 於活性非晶矽層施加後使上述之背向電極層提供至光電 層’其較佳者爲可同時當成反射體及電極層(也就是說,因 爲此最終將成爲"背向"電極,所以透明導體層將成爲"前" 電極)β此背向電極層一般將約爲5〇至5〇〇毫微米並且其可 利用任何具反光性質之適當材料製造,其較佳者爲鋁、銀 、或兩者層之组合β可利用(眞空)物理氣相沈積(蒸發)法或 濺鍍法施加(其較佳者係在例如低於2 5 0。(:之相當低溫下)此 等金屬層,可視需要利用遮蔽或利用遮蔽線以防止條紋需 被蝕刻之位置處之沈積。在銀之實例中,其較佳者係首先 施加一層附著性提升層,其中若以適當之厚度(例如約8 〇毫 微米)施加時則例如Ti02及ZnO之適當材料乃具有其它之反 射優點。 如在之前施加層,背向電極像被製造成含有”條紋",也 就是説,其直接相鄰並平行於已存在之條紋,其係使反射 層之狹窄軌被移除。再次,材料之諸此移除係可利用諸如 -17- 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐〉 (請先閱讀背面之注意事項再填寫本頁) 言 4444 f 4 Α7 Β7 五、發明説明(15 ) 雷射雕刻法、濕式化學蝕刻法、電漿蝕刻法之數種技街實 施,或可利用"直接式之蝕刻覆蓋",也就是説,其爲使前 述之蚀刻劑沈積在預成形之徑跡中。此來自於”背向電極,, <條紋蚀刻係用以提供產生於薄片中之個別光電層必需之 串連。 可使以上指出之蝕刻技術於暫時性基材後續移除時施加 °例如’可使薄片通過包含強鹼或H2S〇4或FeCl3之蝕刻浴 或使諸此白朗氏或路易士酸塗覆或喷塗在形成暫時性基材 之金屬薄片上。在該基材移除後即緊接以傳統之漂清及乾 燥步驟。若其僅需使部份暫時性基材移除(也就是説僅在入 ,光需到達透明導體表面之該等部份)’則可在蝕刻前施以 蝕刻光阻”,其較佳者係使狹窄條紋施加於幾乎使兩個透 明導體覆蓋住之徑跡位置。 因此,可使準備使用之光電薄片提供在—個捲上。視需 要可使具有預定電源及電壓片由薄片切下。 =據以上所述技術,本發明進—步係關於一種製造薄膜 2电薄片 <万法,其包含如下層:一個背向電極、多個光 b層:及-層透明導體層,上電極及背向電極係以串連方 經濟部中央標準为員工消費合作社印裝 * '美在該方法中,其使极雖於載體施加前界定在背向 :極中並使;^跡於光電層及背向電極層沈積後界定在透明 導體層中’而其較佳者係在暫時性基材移除後界定出。其 進一步較佳者爲利用雷射雕刻香或银刻界定徑跡乃較佳。 二报叙實例中,其較佳者爲使薄蚀刻劑層之圖樣化覆蓋 挺供在背向電極及/或透明導電層之 -18 - 本纸银尺度適用中國國家榇準(CNS )八4規格( X 297公釐) 4444 A7 B7 五 、發明説明(16 ) 經濟部中夬標準局貝工消費合作社印製 參考附圖,經根據本發明所提供其用於製造光電薄片之 實例説明,以下乃並非企圖限制本發明。所有附圖乃示出 製造過程中之數個階段之橫截面圖,其爲薄片在縱(製造)向 之同一部份。 圖1 :其提供出一個以諸如鋁爲金屬薄片形式之暫時性基 材(1 )。 圖2 :其在約550eC時利用實施APCVD使例如約600毫微 米厚之F-摻雜Sn〇2層沈積在金屬薄片上之透明導體(2) 。視需要可在光電層施加前使Zn〇中間層(约8〇毫微米厚) 沈積在透明導體層上(未示出)。 圖3及圖4 :其利用雷射雕刻法或利用蝕刻線(3)及部份被 移除之透明導體層D其餘部份爲利用被移除材料(5)之 狹窄徑跡(約25微米)隔離,而其約爲20毫米寬之條紋(4) p 圖5 :施加光電層此等將包含一或多组之严型摻雜 非晶矽層(Si-p)、本質非晶矽層(Si-i)、及η-型摻雜非晶梦 層(S i - η),其總厚度約5 0 0毫微米(未個別示出)。 圖6及7 :其利用雷射雕刻法或利用化學蝕刻劑(8)之施加 以移除材料之狹窄徑跡而使條紋圖樣(7)提供至非晶矽層 (6)。使被移除材料(9)之徑跡儘可能施加在靠近透明導體 層中被移除之徑跡(5 )。 圖8至10 :其使一層约250毫微米厚之鋁層(1〇)施加在非 晶矽層(6)上,以同時當成背向j極及反射層,並利用蝕刻 以移除直接相鄰於並平行於該等先前所產生(9)徑跡(1 2)中 之材料以提供出條紋(11 ),其可能首先利用蝕刻劑(1 3 )之提 -19- 本紙張尺度適用中國國家標準(CNS ) A4规格(210X297公釐) (請先閲讀背面之注意事項再填寫本瓦) ",裝- ,π.
s._liM-B 44幻4 第86117872號專利申請案 Α7 中文說明書修正頁(卯年1月) Β7
五、發明説明(口) 供而完成" 圖11及12 :其使一個載體(14)提供在背向電極(10)上, (請先閱讀背面之注$項再填寫本頁) 其後,(利用蝕刻)使金屬箔片之暫時性基材(1 )移除《所使 用載體(14)將成為根據本發明製造之光電薄片之實際基材( 背部,底部)。 圖1 3 :其使保護性之透明頂塗層(1 5 )提供至包含透明導 體層(2)之最終前側。 根據本發明之其它實例’其描述出碲化鎘薄膜太陽能電 池之製造。其在55CTC之溫度時利用APCVD法使鋁暫時性 基材提供在塗覆有Sri〇2層之上。其次,其提供一層CdS( 厚度:100毫微米)並後績使其在H2之氣氛中於400°C下退 火"俟退火後,其使裝配加熱至55CTC,並在He及02氣氛 中利用所謂的密閉空間昇華處理(氣體源至基材間之距離為 5毫米’其使CdTe源加熱至650°C並使基材加熱至550eC, 兩者係在具有兩個皆為30托氣體分壓之142及02氣氛中)使 鎘及碲沈積在C d S層上^後績在4 2 5 °C時以C d C12處理裝配 ’接著濺鍍背部接觸。最後,使用N a Ο Η溶液利用蝕刻使 暫時性基材移除。 蛵濟部中夬標準局員工消費合作社印製 本發明除關於一種方法之外,其亦包括新穎的光電產品 ’尤其是一種光電薄片,其包含下列各層:一個反射電極 層、多個光電層、及一個透明導體層,由透明導體層側面 向之薄片乃具有壓痕、反轉金字塔型之表面織構。 進者,其為利用上述涉及使用暫時性基材之製造方法, 本發明係能容許對可撓曲、薄片類型之光電電池進行實質 -20- 狀度適用中關家標導(CNS ) Α4規格(210Χ 297么、 4 44 4 ί 4 Α7 ______ _ Β7 五、發明説明(18 ) 改良。因此,本發明亦是關於—種光電薄片,其包含如下 層,一個反射電極層、多個光電層、—個透明導體層、及 一個透明保護性覆蓋,其包含之改良爲該透明導體層爲氣 摻雜之氧化錫。然而.,此乃爲本身所知之導體,並且其對 光電電池之高度而言乃較佳,最先進技術之方法乃無法容 許其在光電薄片中當成透明導體使用。也就是説,本發明 爲首先達成具有F-摻雜之Sn〇2類型之光電結構,當以可捷 曲薄片形式被當成透明導體(及於大於4〇(rc之溫度沉積)其 乃具有較佳之性質。 ' 事實上,本發明係提供出可具有F_Sn〇2之光電材料或可 在高溫下施加之其它透明導體,若無此導體層時則其需以 板狀玻璃窗面覆蓋(其乃爲用在具此等透明導體之光電電池 中最先進之技術)。 (請先閲讀背面之注意事項再¾.寫本頁」
經濟部中央標準局負工消费合作社印製 本紙張尺度適用中囷國家標準(CNS ) A4規格(210X297公釐)
Claims (1)
- 4 444 486m872號專利令請案 A8 中文申請專利範園修正本(9〇年1月)B8 一 ~ - ο® 六 申請專利範圍 經 濟 部 中 央 m 準 扃 Ά 工 消 費 合 作 社 印 製 1‘種製造利用載體支撐之光t薄片之方法,該薄片包含 夕固光%層,其一起具有從入射光產生電流之能力,在 與光電廣相鄰並平行之一側上之背向電極看,及在另一 侧上之透明導體層,並與光電層相鄰並平行,其特徵在 於該方法包括如下順序之步騾: •提供一個暫時性基材, •塗敷透明導體層, •塗敷光電層, ♦塗敷背向電極層, •塗敷载體,及 *移除該暫時性基材。 2.如申π專利範園第i項之方法,其特徵在於透明導體層 係在高於光電層所能抵抗之溫度下塗敷。 1如申清專利範圍第1或2項之方法,其特徵在於暫時性基 材為可撓性。 4. 如申請專利範圍第丨項之方法,其特徵在於該載體為可 撓性。 5. 如申請專利範園第丨項之方法,其特徵在於透明導體層 係在希於2 5 0 ,較佳係高於4 0 0 t:之溫度下塗敷。 6. 如申請專利範圍第丨項之方法,其特徵在於暫時性基材 為金屬、金屬合金或多層金屬之金屬薄片。 7. 如申请專利範圍第6項之方法,其特徵在於該金屬薄片 為電沈積(電鍍)之金屬薄片。 8_如申清專利範園第6項之方法,其特徵在於該金屬為A I 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公着) (請先閎讀背面之注意事項再填寫本頁) "裝· 訂· ABCD ^444? 4 六、申請專利範圍 或C u β ---------「一裝i - {請先閲讀背面之注意事項再填寫本頁) 9. 如申請專利範圍第〗項之方法,其特徵在於透明導電層 之至少一·個表面乃被加以織構^ 10. 如申請專利範圍第1項之方法,其特徵在於最後處理步 騾後之薄片彎曲剛性乃大於任一個中間產物之彎曲剛性 Q 11. 一種製造薄膜光電薄片之方法,此薄片包含以下連績層 :一個背向電極層,多個光電層,及一個透明導體層, 上電極及背向電極係以串連方式連接,其特徵在於塗敷 載體之前徑跡乃被界定在背向電極之中,而於光電層及 背向電極沈積之後徑跡乃被界定在透明導電層之中。 12. 如申請專利範圍第1 1項之方法,其特徵在於該徑跡係利 用雷射雕刻法或蚀刻法界定。 13. 如申請專利範圍第u或1 2項之方法,其特徵在於蝕刻 劑薄膜之圖樣化塗層是被提供在背向電極及/或透明導 電層之上。. 經濟部中央標準局員工消費合作社印製 14. 一種光電薄片,其可根據令請專利範圍第1 -1 〇項中任 一項之方法獲得,該薄片包含以下連續層:一個反射電 極層、多個光電層,其特徵在於由透明導體層之側面所 面向之薄片,係具有凹入、反轉之金字塔型表面織構。 15. —種光電薄片,其可根據申請專利範園第1 _ 1 〇項中任 一項之方法獲得,該薄片係包含以下連績層:一個反射 電極層、多個光電層、一個透明導體層,其特徵在於該 透明導體層為在4 0 0 °C以上之溫度下沈積之氟掺雜氧化錫。 —--J 本紙乐尺度適用中國國家標準(CNS ) A4規格(210X297公釐)
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TW086117872A TW444414B (en) | 1996-09-26 | 1997-11-27 | Method of manufacturing a photovoltaic foil |
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US (1) | US6184057B1 (zh) |
EP (1) | EP0931356B1 (zh) |
JP (1) | JP2001501035A (zh) |
KR (1) | KR100488302B1 (zh) |
CN (1) | CN1145221C (zh) |
AU (1) | AU735142B2 (zh) |
BR (1) | BR9711418B1 (zh) |
CA (1) | CA2267076C (zh) |
DE (1) | DE69730337T2 (zh) |
ES (1) | ES2227677T3 (zh) |
HK (1) | HK1021254A1 (zh) |
RU (1) | RU2190901C2 (zh) |
TW (1) | TW444414B (zh) |
WO (1) | WO1998013882A1 (zh) |
ZA (1) | ZA978610B (zh) |
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ZA978610B (en) | 1998-03-26 |
CN1145221C (zh) | 2004-04-07 |
CA2267076C (en) | 2005-01-25 |
BR9711418B1 (pt) | 2010-06-29 |
WO1998013882A1 (en) | 1998-04-02 |
EP0931356B1 (en) | 2004-08-18 |
BR9711418A (pt) | 1999-08-24 |
ES2227677T3 (es) | 2005-04-01 |
KR100488302B1 (ko) | 2005-05-11 |
AU735142B2 (en) | 2001-07-05 |
RU2190901C2 (ru) | 2002-10-10 |
DE69730337D1 (de) | 2004-09-23 |
JP2001501035A (ja) | 2001-01-23 |
CN1231772A (zh) | 1999-10-13 |
US6184057B1 (en) | 2001-02-06 |
EP0931356A1 (en) | 1999-07-28 |
DE69730337T2 (de) | 2005-09-08 |
CA2267076A1 (en) | 1998-04-02 |
KR20000048653A (ko) | 2000-07-25 |
HK1021254A1 (en) | 2000-06-02 |
AU4706497A (en) | 1998-04-17 |
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