TW429504B - Semiconductor integrated circuit device having testing functions - Google Patents

Semiconductor integrated circuit device having testing functions

Info

Publication number
TW429504B
TW429504B TW087102661A TW87102661A TW429504B TW 429504 B TW429504 B TW 429504B TW 087102661 A TW087102661 A TW 087102661A TW 87102661 A TW87102661 A TW 87102661A TW 429504 B TW429504 B TW 429504B
Authority
TW
Taiwan
Prior art keywords
integrated circuit
semiconductor integrated
circuit device
testing functions
logic
Prior art date
Application number
TW087102661A
Other languages
English (en)
Inventor
Fumihiko Sato
Original Assignee
Nippon Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co filed Critical Nippon Electric Co
Application granted granted Critical
Publication of TW429504B publication Critical patent/TW429504B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3016—Delay or race condition test, e.g. race hazard test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
TW087102661A 1997-02-28 1998-02-24 Semiconductor integrated circuit device having testing functions TW429504B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9045840A JP3039423B2 (ja) 1997-02-28 1997-02-28 半導体集積回路装置

Publications (1)

Publication Number Publication Date
TW429504B true TW429504B (en) 2001-04-11

Family

ID=12730429

Family Applications (1)

Application Number Title Priority Date Filing Date
TW087102661A TW429504B (en) 1997-02-28 1998-02-24 Semiconductor integrated circuit device having testing functions

Country Status (4)

Country Link
US (1) US6125462A (zh)
JP (1) JP3039423B2 (zh)
KR (1) KR100351697B1 (zh)
TW (1) TW429504B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7716544B2 (en) 2005-08-22 2010-05-11 Samsung Electronics Co., Ltd. Path data transmission unit

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3708799B2 (ja) 2000-06-15 2005-10-19 三菱電機株式会社 内燃機関用点火コイル
JP4263374B2 (ja) * 2001-01-22 2009-05-13 株式会社ルネサステクノロジ 半導体集積回路

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4504784A (en) * 1981-07-02 1985-03-12 International Business Machines Corporation Method of electrically testing a packaging structure having N interconnected integrated circuit chips
JP2515704B2 (ja) * 1986-05-23 1996-07-10 株式会社日立製作所 半導体集積回路装置
US5579349A (en) * 1993-06-30 1996-11-26 Intel Corporation Circuitry for resolving multiple asynchronous state inputs

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7716544B2 (en) 2005-08-22 2010-05-11 Samsung Electronics Co., Ltd. Path data transmission unit

Also Published As

Publication number Publication date
JP3039423B2 (ja) 2000-05-08
JPH10239401A (ja) 1998-09-11
US6125462A (en) 2000-09-26
KR19980071266A (ko) 1998-10-26
KR100351697B1 (ko) 2002-12-26

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Legal Events

Date Code Title Description
GD4A Issue of patent certificate for granted invention patent
MM4A Annulment or lapse of patent due to non-payment of fees