TW359754B - IC test method - Google Patents
IC test methodInfo
- Publication number
- TW359754B TW359754B TW087103934A TW87103934A TW359754B TW 359754 B TW359754 B TW 359754B TW 087103934 A TW087103934 A TW 087103934A TW 87103934 A TW87103934 A TW 87103934A TW 359754 B TW359754 B TW 359754B
- Authority
- TW
- Taiwan
- Prior art keywords
- test
- test tray
- remaining
- array
- devices
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
- G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/316—Testing of analog circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2868—Complete testing stations; systems; procedures; software aspects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Environmental & Geological Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP06435097A JP3503860B2 (ja) | 1997-03-18 | 1997-03-18 | Ic試験方法およびこの方法を実施する装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW359754B true TW359754B (en) | 1999-06-01 |
Family
ID=13255718
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW087103934A TW359754B (en) | 1997-03-18 | 1998-03-17 | IC test method |
Country Status (5)
Country | Link |
---|---|
US (1) | US6163146A (zh) |
JP (1) | JP3503860B2 (zh) |
KR (1) | KR100287981B1 (zh) |
DE (1) | DE19811850A1 (zh) |
TW (1) | TW359754B (zh) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW490564B (en) * | 1999-02-01 | 2002-06-11 | Mirae Corp | A carrier handling apparatus for module IC handler, and method thereof |
AU2002253589A1 (en) | 2002-04-25 | 2003-11-10 | Advantest Corporation | Electronic component test apparatus |
KR100498496B1 (ko) * | 2003-05-07 | 2005-07-01 | 삼성전자주식회사 | 자투리 반도체 소자의 검사 방법 |
EP1832886B1 (de) * | 2006-03-08 | 2015-04-01 | Rasco GmbH | Vorrichtung und Verfahren zum Testen von elektronischen Bauteilen |
US9285416B2 (en) * | 2012-04-02 | 2016-03-15 | Samsung Electronics Co., Ltd. | Apparatus and method for manufacturing substrates |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2921937B2 (ja) * | 1990-07-18 | 1999-07-19 | 東京エレクトロン株式会社 | Ic検査装置 |
US5290134A (en) * | 1991-12-03 | 1994-03-01 | Advantest Corporation | Pick and place for automatic test handler |
TW312749B (zh) * | 1994-07-26 | 1997-08-11 | Tokyo Electron Co Ltd | |
US5788084A (en) * | 1994-09-22 | 1998-08-04 | Advantest Corporation | Automatic testing system and method for semiconductor devices |
-
1997
- 1997-03-18 JP JP06435097A patent/JP3503860B2/ja not_active Expired - Fee Related
-
1998
- 1998-03-17 US US09/042,802 patent/US6163146A/en not_active Expired - Fee Related
- 1998-03-17 TW TW087103934A patent/TW359754B/zh not_active IP Right Cessation
- 1998-03-18 DE DE19811850A patent/DE19811850A1/de not_active Ceased
- 1998-03-18 KR KR1019980009262A patent/KR100287981B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
US6163146A (en) | 2000-12-19 |
KR100287981B1 (ko) | 2001-05-02 |
JPH10260225A (ja) | 1998-09-29 |
DE19811850A1 (de) | 1998-10-08 |
KR19980080424A (ko) | 1998-11-25 |
JP3503860B2 (ja) | 2004-03-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |