TW359754B - IC test method - Google Patents

IC test method

Info

Publication number
TW359754B
TW359754B TW087103934A TW87103934A TW359754B TW 359754 B TW359754 B TW 359754B TW 087103934 A TW087103934 A TW 087103934A TW 87103934 A TW87103934 A TW 87103934A TW 359754 B TW359754 B TW 359754B
Authority
TW
Taiwan
Prior art keywords
test
test tray
remaining
array
devices
Prior art date
Application number
TW087103934A
Other languages
English (en)
Inventor
Katsuhiko Suzuki
Takeshi Onishi
Hidetaka Nakazawa
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Application granted granted Critical
Publication of TW359754B publication Critical patent/TW359754B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2868—Complete testing stations; systems; procedures; software aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Environmental & Geological Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
TW087103934A 1997-03-18 1998-03-17 IC test method TW359754B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP06435097A JP3503860B2 (ja) 1997-03-18 1997-03-18 Ｉｃ試験方法およびこの方法を実施する装置

Publications (1)

Publication Number Publication Date
TW359754B true TW359754B (en) 1999-06-01

Family

ID=13255718

Family Applications (1)

Application Number Title Priority Date Filing Date
TW087103934A TW359754B (en) 1997-03-18 1998-03-17 IC test method

Country Status (5)

Country Link
US (1) US6163146A (zh)
JP (1) JP3503860B2 (zh)
KR (1) KR100287981B1 (zh)
DE (1) DE19811850A1 (zh)
TW (1) TW359754B (zh)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW490564B (en) * 1999-02-01 2002-06-11 Mirae Corp A carrier handling apparatus for module IC handler, and method thereof
AU2002253589A1 (en) 2002-04-25 2003-11-10 Advantest Corporation Electronic component test apparatus
KR100498496B1 (ko) * 2003-05-07 2005-07-01 삼성전자주식회사 자투리 반도체 소자의 검사 방법
EP1832886B1 (de) * 2006-03-08 2015-04-01 Rasco GmbH Vorrichtung und Verfahren zum Testen von elektronischen Bauteilen
US9285416B2 (en) * 2012-04-02 2016-03-15 Samsung Electronics Co., Ltd. Apparatus and method for manufacturing substrates

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2921937B2 (ja) * 1990-07-18 1999-07-19 東京エレクトロン株式会社 Ｉｃ検査装置
US5290134A (en) * 1991-12-03 1994-03-01 Advantest Corporation Pick and place for automatic test handler
TW312749B (zh) * 1994-07-26 1997-08-11 Tokyo Electron Co Ltd
US5788084A (en) * 1994-09-22 1998-08-04 Advantest Corporation Automatic testing system and method for semiconductor devices

Also Published As

Publication number Publication date
US6163146A (en) 2000-12-19
KR100287981B1 (ko) 2001-05-02
JPH10260225A (ja) 1998-09-29
DE19811850A1 (de) 1998-10-08
KR19980080424A (ko) 1998-11-25
JP3503860B2 (ja) 2004-03-08

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees