MY113318A - Device transfer and reinspection method for ic handler - Google Patents

Device transfer and reinspection method for ic handler

Info

Publication number
MY113318A
MY113318A MYPI95002883A MYPI19952883A MY113318A MY 113318 A MY113318 A MY 113318A MY PI95002883 A MYPI95002883 A MY PI95002883A MY PI19952883 A MYPI19952883 A MY PI19952883A MY 113318 A MY113318 A MY 113318A
Authority
MY
Malaysia
Prior art keywords
tray
magazine
devices
test
handler
Prior art date
Application number
MYPI95002883A
Inventor
Suzuki Katsuhiko
Kobayashi Yoshihito
Nakamura Hiroto
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of MY113318A publication Critical patent/MY113318A/en

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

AN IC DEVICE TRANSFER METHOD FOR IC HANDLER ACCOMMODATES BOTH A TRAY AND A ROD-SHAPED MAGAZINE. THE TRAY INSTALLS A PLURALITY OF IC DEVICES (215) WHICH TRANSPORT IN HORIZONTAL DIRECTIONS IN THE IC HANDLER (221) .THE ROD-SHAPED MAGAZINE (150) INSTALLS A PLURALITY OF IC DEVICES WHICH TRANSPORT IN VERTICAL DIRECTIONS IN THE IC HANDLER. A DEVICE REINSPECTION METHOD IN THE IC TEST HANDLER REINSPECTS THE IC DEVICES STORED IN THE TRAY OR MAGAZINE WITHOUT HUMAN INTERVENTION, SORTS IN ACCORDANCE WITH THE TEST RESULTS, AND STORES IN EITHER THE ROD-SHAPED MAGAZINE OR THE TRAY (180) .FOR THIS PURPOSE, A TRAY SUPPLY SECTION TRANSFERS A USER TRAY TO A TEST TRAY, WHEREAS A MAGAZINE SUPPLY SECTION AND A PICK CARRIER SECTION TRANSFER A ROD-SHAPED MAGAZINE TO THE TEST TRAY (180) .AN INSPECTION SETTING SETS THE NUMBER OF REINSPECTION, THE CLASSIFICATION OF INSPECTION RESULTS, AND THE STORAGE TRAY/MAGAZINE. THE IC DEVICES (215) ARE LOADED FROM THE MAGAZINE AND THE USER TRAY (170) TO THE TEST TRAY (180) AND ARE TESTED. WHEN A REINSPECTION MODE IS EFFECTIVE, THE IC DEVICES TO BE REINSPECTED ARE STORED IN THE UNLOADER SECTION (223) AND TRANSFERRED TO THE LOADER SECTION (222) BY THE TRAY TRANSFER SYSTEM (227) TO TEST THE IC DEVICES AGAIN. WHEN THE REINSPECTION MODE IS COMPLETED, THE IC DEVICE ARE SORTED BY CATEGORIES AND STORED IN THE TRAY/MAGAZINE. (FIGURE 1)
MYPI95002883A 1995-03-23 1995-09-27 Device transfer and reinspection method for ic handler MY113318A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7090376A JPH08262102A (en) 1995-03-23 1995-03-23 Method for reinspecting device in handler for ic tester

Publications (1)

Publication Number Publication Date
MY113318A true MY113318A (en) 2002-01-31

Family

ID=13996855

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI95002883A MY113318A (en) 1995-03-23 1995-09-27 Device transfer and reinspection method for ic handler

Country Status (4)

Country Link
JP (1) JPH08262102A (en)
CN (1) CN1152754A (en)
MY (1) MY113318A (en)
SG (2) SG54087A1 (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3235594B2 (en) 1999-05-10 2001-12-04 日本電気株式会社 Semiconductor device inspection apparatus and semiconductor device inspection method
KR100401932B1 (en) * 2001-12-20 2003-10-17 주식회사 테스트이엔지 Method of testing semiconductor devices on test handler
CN100399038C (en) * 2002-12-25 2008-07-02 株式会社理光 Integrated circuit transfer device
JP4537400B2 (en) * 2004-07-23 2010-09-01 株式会社アドバンテスト Electronic component handling device knitting method
KR100705655B1 (en) * 2005-10-19 2007-04-09 (주) 인텍플러스 Sorting method of semiconductor package
CN101339146B (en) * 2007-07-05 2011-07-20 京元电子股份有限公司 Automatic optical detector
CN101887104B (en) * 2010-04-21 2012-09-19 江阴新基电子设备有限公司 Double-flow channel unit device of QFN (Quad Flat No-lead Package) integrated circuit testing separator
KR101864781B1 (en) * 2010-04-21 2018-06-05 미래산업 주식회사 Method for transferring tray and Test Handler using the same
JP2017067591A (en) * 2015-09-30 2017-04-06 セイコーエプソン株式会社 Electronic component conveyance device and electronic component inspection device
KR102391516B1 (en) * 2015-10-08 2022-04-27 삼성전자주식회사 Semiconductor test apparatus
US10782348B2 (en) * 2017-03-10 2020-09-22 Keithley Instruments, Llc Automatic device detection and connection verification

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2627929B2 (en) * 1988-07-01 1997-07-09 東京エレクトロン株式会社 Inspection device

Also Published As

Publication number Publication date
CN1152754A (en) 1997-06-25
SG102546A1 (en) 2004-03-26
JPH08262102A (en) 1996-10-11
SG54087A1 (en) 1998-11-16

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