MY113318A - Device transfer and reinspection method for ic handler - Google Patents
Device transfer and reinspection method for ic handlerInfo
- Publication number
- MY113318A MY113318A MYPI95002883A MYPI19952883A MY113318A MY 113318 A MY113318 A MY 113318A MY PI95002883 A MYPI95002883 A MY PI95002883A MY PI19952883 A MYPI19952883 A MY PI19952883A MY 113318 A MY113318 A MY 113318A
- Authority
- MY
- Malaysia
- Prior art keywords
- tray
- magazine
- devices
- test
- handler
- Prior art date
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
AN IC DEVICE TRANSFER METHOD FOR IC HANDLER ACCOMMODATES BOTH A TRAY AND A ROD-SHAPED MAGAZINE. THE TRAY INSTALLS A PLURALITY OF IC DEVICES (215) WHICH TRANSPORT IN HORIZONTAL DIRECTIONS IN THE IC HANDLER (221) .THE ROD-SHAPED MAGAZINE (150) INSTALLS A PLURALITY OF IC DEVICES WHICH TRANSPORT IN VERTICAL DIRECTIONS IN THE IC HANDLER. A DEVICE REINSPECTION METHOD IN THE IC TEST HANDLER REINSPECTS THE IC DEVICES STORED IN THE TRAY OR MAGAZINE WITHOUT HUMAN INTERVENTION, SORTS IN ACCORDANCE WITH THE TEST RESULTS, AND STORES IN EITHER THE ROD-SHAPED MAGAZINE OR THE TRAY (180) .FOR THIS PURPOSE, A TRAY SUPPLY SECTION TRANSFERS A USER TRAY TO A TEST TRAY, WHEREAS A MAGAZINE SUPPLY SECTION AND A PICK CARRIER SECTION TRANSFER A ROD-SHAPED MAGAZINE TO THE TEST TRAY (180) .AN INSPECTION SETTING SETS THE NUMBER OF REINSPECTION, THE CLASSIFICATION OF INSPECTION RESULTS, AND THE STORAGE TRAY/MAGAZINE. THE IC DEVICES (215) ARE LOADED FROM THE MAGAZINE AND THE USER TRAY (170) TO THE TEST TRAY (180) AND ARE TESTED. WHEN A REINSPECTION MODE IS EFFECTIVE, THE IC DEVICES TO BE REINSPECTED ARE STORED IN THE UNLOADER SECTION (223) AND TRANSFERRED TO THE LOADER SECTION (222) BY THE TRAY TRANSFER SYSTEM (227) TO TEST THE IC DEVICES AGAIN. WHEN THE REINSPECTION MODE IS COMPLETED, THE IC DEVICE ARE SORTED BY CATEGORIES AND STORED IN THE TRAY/MAGAZINE. (FIGURE 1)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7090376A JPH08262102A (en) | 1995-03-23 | 1995-03-23 | Method for reinspecting device in handler for ic tester |
Publications (1)
Publication Number | Publication Date |
---|---|
MY113318A true MY113318A (en) | 2002-01-31 |
Family
ID=13996855
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MYPI95002883A MY113318A (en) | 1995-03-23 | 1995-09-27 | Device transfer and reinspection method for ic handler |
Country Status (4)
Country | Link |
---|---|
JP (1) | JPH08262102A (en) |
CN (1) | CN1152754A (en) |
MY (1) | MY113318A (en) |
SG (2) | SG54087A1 (en) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3235594B2 (en) | 1999-05-10 | 2001-12-04 | 日本電気株式会社 | Semiconductor device inspection apparatus and semiconductor device inspection method |
KR100401932B1 (en) * | 2001-12-20 | 2003-10-17 | 주식회사 테스트이엔지 | Method of testing semiconductor devices on test handler |
CN100399038C (en) * | 2002-12-25 | 2008-07-02 | 株式会社理光 | Integrated circuit transfer device |
JP4537400B2 (en) * | 2004-07-23 | 2010-09-01 | 株式会社アドバンテスト | Electronic component handling device knitting method |
KR100705655B1 (en) * | 2005-10-19 | 2007-04-09 | (주) 인텍플러스 | Sorting method of semiconductor package |
CN101339146B (en) * | 2007-07-05 | 2011-07-20 | 京元电子股份有限公司 | Automatic optical detector |
CN101887104B (en) * | 2010-04-21 | 2012-09-19 | 江阴新基电子设备有限公司 | Double-flow channel unit device of QFN (Quad Flat No-lead Package) integrated circuit testing separator |
KR101864781B1 (en) * | 2010-04-21 | 2018-06-05 | 미래산업 주식회사 | Method for transferring tray and Test Handler using the same |
JP2017067591A (en) * | 2015-09-30 | 2017-04-06 | セイコーエプソン株式会社 | Electronic component conveyance device and electronic component inspection device |
KR102391516B1 (en) * | 2015-10-08 | 2022-04-27 | 삼성전자주식회사 | Semiconductor test apparatus |
US10782348B2 (en) * | 2017-03-10 | 2020-09-22 | Keithley Instruments, Llc | Automatic device detection and connection verification |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2627929B2 (en) * | 1988-07-01 | 1997-07-09 | 東京エレクトロン株式会社 | Inspection device |
-
1995
- 1995-03-23 JP JP7090376A patent/JPH08262102A/en active Pending
- 1995-09-26 CN CN95117239A patent/CN1152754A/en active Pending
- 1995-09-27 MY MYPI95002883A patent/MY113318A/en unknown
- 1995-10-11 SG SG1995001534A patent/SG54087A1/en unknown
- 1995-10-11 SG SG9903596A patent/SG102546A1/en unknown
Also Published As
Publication number | Publication date |
---|---|
CN1152754A (en) | 1997-06-25 |
SG102546A1 (en) | 2004-03-26 |
JPH08262102A (en) | 1996-10-11 |
SG54087A1 (en) | 1998-11-16 |
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