TW350978B - Splash coating device for manufacturing of IC barrier films - Google Patents

Splash coating device for manufacturing of IC barrier films

Info

Publication number
TW350978B
TW350978B TW086115675A TW86115675A TW350978B TW 350978 B TW350978 B TW 350978B TW 086115675 A TW086115675 A TW 086115675A TW 86115675 A TW86115675 A TW 86115675A TW 350978 B TW350978 B TW 350978B
Authority
TW
Taiwan
Prior art keywords
titanium
substrate
manufacturing
barrier films
splash coating
Prior art date
Application number
TW086115675A
Other languages
English (en)
Chinese (zh)
Inventor
Masahiko Kobayashi
Original Assignee
Anelva Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anelva Corp filed Critical Anelva Corp
Application granted granted Critical
Publication of TW350978B publication Critical patent/TW350978B/zh

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C28/00Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
    • C23C28/30Coatings combining at least one metallic layer and at least one inorganic non-metallic layer
    • C23C28/34Coatings combining at least one metallic layer and at least one inorganic non-metallic layer including at least one inorganic non-metallic material layer, e.g. metal carbide, nitride, boride, silicide layer and their mixtures, enamels, phosphates and sulphates
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/14Metallic material, boron or silicon
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/35Sputtering by application of a magnetic field, e.g. magnetron sputtering
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C8/00Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals
    • C23C8/06Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using gases
    • C23C8/08Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using gases only one element being applied
    • C23C8/24Nitriding

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Physical Vapour Deposition (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
TW086115675A 1997-02-24 1997-10-23 Splash coating device for manufacturing of IC barrier films TW350978B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9055550A JPH10237639A (ja) 1997-02-24 1997-02-24 集積回路用バリア膜を作成するスパッタリング装置

Publications (1)

Publication Number Publication Date
TW350978B true TW350978B (en) 1999-01-21

Family

ID=13001823

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086115675A TW350978B (en) 1997-02-24 1997-10-23 Splash coating device for manufacturing of IC barrier films

Country Status (3)

Country Link
JP (1) JPH10237639A (https=)
KR (1) KR19980070035A (https=)
TW (1) TW350978B (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5962923A (en) * 1995-08-07 1999-10-05 Applied Materials, Inc. Semiconductor device having a low thermal budget metal filling and planarization of contacts, vias and trenches
KR100440261B1 (ko) * 2001-12-22 2004-07-15 주식회사 하이닉스반도체 반도체 소자의 금속 배선 형성 방법
US9659758B2 (en) 2005-03-22 2017-05-23 Honeywell International Inc. Coils utilized in vapor deposition applications and methods of production
US8475634B2 (en) * 2007-10-26 2013-07-02 OC Oerlikon Balzers AF Application of HIPIMS to through silicon via metallization in three-dimensional wafer packaging
JP5808623B2 (ja) * 2011-09-07 2015-11-10 株式会社アルバック バリアメタル層の形成方法
US11183373B2 (en) 2017-10-11 2021-11-23 Honeywell International Inc. Multi-patterned sputter traps and methods of making
CN115110025B (zh) * 2022-07-20 2023-10-20 苏州大学 一种螺旋波等离子体溅射沉积氮化钨薄膜的方法
CN115074689B (zh) * 2022-07-21 2023-06-02 苏州大学 一种螺旋波等离子体反应溅射沉积制备氮化钛薄膜的方法

Also Published As

Publication number Publication date
KR19980070035A (ko) 1998-10-26
JPH10237639A (ja) 1998-09-08

Similar Documents

Publication Publication Date Title
TW339473B (en) Electronic package with multilevel connections
TW358992B (en) Semiconductor device and method of fabricating the same
TW346675B (en) Silicon-on-insulator and CMOS-on-SOI double film structures and fabrication process
KR900000817B1 (en) Semiconductor ic device manufacturing method
DK0755461T3 (da) Fremgangsmåde og anlæg til ionunderbygget vacuumbelægning.
AUPQ234599A0 (en) Hydrophobic material
AU2854099A (en) Semiconductor device and method for manufacturing the same, circuit substrate, and electronic device
GB2354762A (en) Tantalum amide precursors for deposition of tantalum nitride on a substrate
MXPA03011185A (es) Componentes beneficiosos en sustratos desviados a la parte superior.
SG69995A1 (en) Semiconductor body with solder material layer
KR950007032A (ko) 반도체장치의 절연층 형성방법 및 그 형성장치
TW349247B (en) Process for producing semiconductor element
AU5844698A (en) Semiconductor substrate having compound semiconductor layer, process for its production, and electronic device fabricated on semiconductor substrate
EP0100571A3 (en) Low resistance buried power bus for integrated circuits
TW350978B (en) Splash coating device for manufacturing of IC barrier films
TW328172B (en) Ferroelectric device for use in integrated circuits and method of making the same
TW333671B (en) The semiconductor device and its producing method
TW350094B (en) Process for producing semiconductor substrate
MY123345A (en) Semiconductor device, its fabrication method and electronic device
GB2249670B (en) Semiconductor device using insulation coated metal substrate
TW369683B (en) A method for forming a semiconductor device having a shallow junction and a low sheet resistance
TW329557B (en) ESD sensor and method of use
TW335547B (en) Semiconductor device
AU2002217253A1 (en) Electrostatic device for holding an electronic component wafer
AU3726593A (en) Ammonia plasma treatment of silicide contact surfaces in semiconductor devices