TW336318B - Platinum-free ferroelectric memory cell with intermetallic barrier layer and method of making the same - Google Patents

Platinum-free ferroelectric memory cell with intermetallic barrier layer and method of making the same

Info

Publication number
TW336318B
TW336318B TW086100136A TW86100136A TW336318B TW 336318 B TW336318 B TW 336318B TW 086100136 A TW086100136 A TW 086100136A TW 86100136 A TW86100136 A TW 86100136A TW 336318 B TW336318 B TW 336318B
Authority
TW
Taiwan
Prior art keywords
barrier layer
layer
platinum
making
memory cell
Prior art date
Application number
TW086100136A
Other languages
English (en)
Inventor
M Dhote Anil
Ramesh Ramamoorthy
Original Assignee
Bell Communications Res
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bell Communications Res filed Critical Bell Communications Res
Application granted granted Critical
Publication of TW336318B publication Critical patent/TW336318B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
    • H01L28/40—Capacitors
    • H01L28/60—Electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
    • H01L28/40—Capacitors
    • H01L28/60—Electrodes
    • H01L28/75—Electrodes comprising two or more layers, e.g. comprising a barrier layer and a metal layer
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
    • H01L28/40—Capacitors
    • H01L28/55—Capacitors with a dielectric comprising a perovskite structure material

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Ceramic Engineering (AREA)
  • Semiconductor Memories (AREA)
  • Non-Volatile Memory (AREA)
  • Physical Vapour Deposition (AREA)
TW086100136A 1996-01-03 1997-01-08 Platinum-free ferroelectric memory cell with intermetallic barrier layer and method of making the same TW336318B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/582,545 US5777356A (en) 1996-01-03 1996-01-03 Platinum-free ferroelectric memory cell with intermetallic barrier layer and method of making same

Publications (1)

Publication Number Publication Date
TW336318B true TW336318B (en) 1998-07-11

Family

ID=24329555

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086100136A TW336318B (en) 1996-01-03 1997-01-08 Platinum-free ferroelectric memory cell with intermetallic barrier layer and method of making the same

Country Status (10)

Country Link
US (1) US5777356A (zh)
EP (1) EP0956595A1 (zh)
JP (1) JP3285036B2 (zh)
KR (1) KR100329040B1 (zh)
CA (1) CA2241676C (zh)
ID (1) ID19530A (zh)
IL (1) IL119889A (zh)
MY (1) MY121282A (zh)
TW (1) TW336318B (zh)
WO (1) WO1997025745A1 (zh)

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JP3585674B2 (ja) * 1996-11-21 2004-11-04 ローム株式会社 半導体記憶装置
US6115281A (en) 1997-06-09 2000-09-05 Telcordia Technologies, Inc. Methods and structures to cure the effects of hydrogen annealing on ferroelectric capacitors
JP2001504282A (ja) * 1997-06-09 2001-03-27 テルコーディア テクノロジーズ インコーポレイテッド 結晶ペロブスカイト強誘電体セルのアニールおよび改良された障壁特性を示すセル
US6303952B1 (en) * 1998-01-14 2001-10-16 Texas Instruments Incorporated Contact structure with an oxide silicidation barrier
MXPA01002814A (es) * 1998-09-24 2002-04-08 Telcordia Tech Inc Peliculas delgadas ferroelectricas de tetragonalidad reducida.
US6075264A (en) * 1999-01-25 2000-06-13 Samsung Electronics Co., Ltd. Structure of a ferroelectric memory cell and method of fabricating it
US6194754B1 (en) * 1999-03-05 2001-02-27 Telcordia Technologies, Inc. Amorphous barrier layer in a ferroelectric memory cell
US6688729B1 (en) * 1999-06-04 2004-02-10 Canon Kabushiki Kaisha Liquid discharge head substrate, liquid discharge head, liquid discharge apparatus having these elements, manufacturing method of liquid discharge head, and driving method of the same
US6518609B1 (en) * 2000-08-31 2003-02-11 University Of Maryland Niobium or vanadium substituted strontium titanate barrier intermediate a silicon underlayer and a functional metal oxide film
US6756620B2 (en) * 2001-06-29 2004-06-29 Intel Corporation Low-voltage and interface damage-free polymer memory device
US6858862B2 (en) 2001-06-29 2005-02-22 Intel Corporation Discrete polymer memory array and method of making same
US6624457B2 (en) 2001-07-20 2003-09-23 Intel Corporation Stepped structure for a multi-rank, stacked polymer memory device and method of making same
US6960479B2 (en) * 2001-07-20 2005-11-01 Intel Corporation Stacked ferroelectric memory device and method of making same
KR100561839B1 (ko) * 2001-11-10 2006-03-16 삼성전자주식회사 강유전체 커패시터 및 그 제조방법
US6936301B2 (en) * 2002-05-06 2005-08-30 North Carolina State University Methods of controlling oxygen partial pressure during annealing of a perovskite dielectric layer
WO2004055876A1 (en) * 2002-12-17 2004-07-01 Ibule Photonics Inc. Method for preparation of ferroelectric single crystal film structure using deposition method
US7297602B2 (en) * 2003-09-09 2007-11-20 Sharp Laboratories Of America, Inc. Conductive metal oxide gate ferroelectric memory transistor
US7378286B2 (en) * 2004-08-20 2008-05-27 Sharp Laboratories Of America, Inc. Semiconductive metal oxide thin film ferroelectric memory transistor
US20070029592A1 (en) * 2005-08-04 2007-02-08 Ramamoorthy Ramesh Oriented bismuth ferrite films grown on silicon and devices formed thereby
US7696549B2 (en) * 2005-08-04 2010-04-13 University Of Maryland Bismuth ferrite films and devices grown on silicon
JP4996113B2 (ja) * 2006-03-08 2012-08-08 セイコーエプソン株式会社 強誘電体キャパシタ及び強誘電体メモリ
US20100001371A1 (en) * 2007-12-05 2010-01-07 Rohm Co., Ltd. Semiconductor device having capacitor including a high dielectric film and manufacture method of the same
US20100135061A1 (en) * 2008-12-02 2010-06-03 Shaoping Li Non-Volatile Memory Cell with Ferroelectric Layer Configurations
US8026111B2 (en) * 2009-02-24 2011-09-27 Oracle America, Inc. Dielectric enhancements to chip-to-chip capacitive proximity communication
FR2993705B1 (fr) * 2012-07-20 2015-05-29 Thales Sa Dispositif comportant une pluralite de couches minces
US20180151301A1 (en) * 2016-11-25 2018-05-31 The Boeing Company Epitaxial perovskite materials for optoelectronics
US10861992B2 (en) 2016-11-25 2020-12-08 The Boeing Company Perovskite solar cells for space
US10937783B2 (en) 2016-11-29 2021-03-02 Taiwan Semiconductor Manufacturing Co., Ltd. Semiconductor device and manufacturing method thereof
DE112020001796T5 (de) 2019-04-08 2022-02-17 Kepler Computing, Inc. Dotierte polare Schichten und Halbleitervorrichtung enthaltend dieselben
US11482528B2 (en) 2019-12-27 2022-10-25 Kepler Computing Inc. Pillar capacitor and method of fabricating such
US11430861B2 (en) 2019-12-27 2022-08-30 Kepler Computing Inc. Ferroelectric capacitor and method of patterning such
US11289497B2 (en) 2019-12-27 2022-03-29 Kepler Computing Inc. Integration method of ferroelectric memory array
US11785782B1 (en) 2021-06-11 2023-10-10 Kepler Computing Inc. Embedded memory with encapsulation layer adjacent to a memory stack
WO2023079631A1 (ja) * 2021-11-04 2023-05-11 三菱電機株式会社 半導体装置及びその製造方法

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US5075755A (en) * 1987-10-20 1991-12-24 Bell Communications Research, Inc. Epitaxial intermetallic contact for compound semiconductors
US5051792A (en) * 1987-10-20 1991-09-24 Bell Communications Research, Inc. Epitaxial intermetallic contact for compound for compound semiconductors
JP2847680B2 (ja) * 1990-03-26 1999-01-20 株式会社村田製作所 セラミック電子部品及びその製造方法
US5169485A (en) * 1991-03-07 1992-12-08 Bell Communications Research, Inc. Method for the preparation of epitaxial ferromagnetic manganese aluminum magnetic memory element
JPH0555514A (ja) * 1991-08-28 1993-03-05 Hitachi Ltd 半導体装置およびその製造方法
JPH05283756A (ja) * 1992-03-31 1993-10-29 Murata Mfg Co Ltd 強誘電体薄膜素子
US5187638A (en) * 1992-07-27 1993-02-16 Micron Technology, Inc. Barrier layers for ferroelectric and pzt dielectric on silicon
US5371699A (en) * 1992-11-17 1994-12-06 Ramtron International Corporation Non-volatile ferroelectric memory with folded bit lines and method of making the same
DE69431971T2 (de) * 1993-03-25 2003-11-27 Matsushita Electric Industrial Co., Ltd. Dünnschichtkondensator und Herstellungsverfahren
US5479317A (en) * 1994-10-05 1995-12-26 Bell Communications Research, Inc. Ferroelectric capacitor heterostructure and method of making same
JP3373525B2 (ja) * 1995-06-28 2003-02-04 テルコーディア テクノロジーズ インコーポレイテッド シリコン上に集積された多層強誘電体セルおよびペロブスカイト電子へテロ構造

Also Published As

Publication number Publication date
EP0956595A4 (zh) 1999-11-17
CA2241676A1 (en) 1997-07-17
KR19990076992A (ko) 1999-10-25
JP3285036B2 (ja) 2002-05-27
KR100329040B1 (ko) 2002-06-20
US5777356A (en) 1998-07-07
EP0956595A1 (en) 1999-11-17
CA2241676C (en) 2002-04-02
IL119889A (en) 1999-12-31
MY121282A (en) 2006-01-28
IL119889A0 (en) 1997-03-18
WO1997025745A1 (en) 1997-07-17
JPH11508412A (ja) 1999-07-21
ID19530A (id) 1998-07-16

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GD4A Issue of patent certificate for granted invention patent