TW335521B - A novel asymmetric transistor design - Google Patents
A novel asymmetric transistor designInfo
- Publication number
- TW335521B TW335521B TW085113406A TW85113406A TW335521B TW 335521 B TW335521 B TW 335521B TW 085113406 A TW085113406 A TW 085113406A TW 85113406 A TW85113406 A TW 85113406A TW 335521 B TW335521 B TW 335521B
- Authority
- TW
- Taiwan
- Prior art keywords
- region
- transistor design
- novel asymmetric
- asymmetric transistor
- transistor
- Prior art date
Links
- 239000000758 substrate Substances 0.000 abstract 2
- 239000002019 doping agent Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
- H01L29/66568—Lateral single gate silicon transistors
- H01L29/66659—Lateral single gate silicon transistors with asymmetry in the channel direction, e.g. lateral high-voltage MISFETs with drain offset region, extended drain MISFETs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/10—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
- H01L29/1025—Channel region of field-effect devices
- H01L29/1029—Channel region of field-effect devices of field-effect transistors
- H01L29/1033—Channel region of field-effect devices of field-effect transistors with insulated gate, e.g. characterised by the length, the width, the geometric contour or the doping structure
- H01L29/1041—Channel region of field-effect devices of field-effect transistors with insulated gate, e.g. characterised by the length, the width, the geometric contour or the doping structure with a non-uniform doping structure in the channel region surface
- H01L29/1045—Channel region of field-effect devices of field-effect transistors with insulated gate, e.g. characterised by the length, the width, the geometric contour or the doping structure with a non-uniform doping structure in the channel region surface the doping structure being parallel to the channel length, e.g. DMOS like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7833—Field effect transistors with field effect produced by an insulated gate with lightly doped drain or source extension, e.g. LDD MOSFET's; DDD MOSFET's
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
- Junction Field-Effect Transistors (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US386795P | 1995-09-18 | 1995-09-18 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW335521B true TW335521B (en) | 1998-07-01 |
Family
ID=21707983
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW085113406A TW335521B (en) | 1995-09-18 | 1996-11-04 | A novel asymmetric transistor design |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP0763855A3 (zh) |
JP (1) | JPH09116151A (zh) |
KR (1) | KR970018690A (zh) |
TW (1) | TW335521B (zh) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6127697A (en) * | 1997-11-14 | 2000-10-03 | Eastman Kodak Company | CMOS image sensor |
JP4797225B2 (ja) * | 1999-05-27 | 2011-10-19 | 富士電機株式会社 | 半導体装置 |
FR2794898B1 (fr) * | 1999-06-11 | 2001-09-14 | France Telecom | Dispositif semi-conducteur a tension de seuil compensee et procede de fabrication |
US6482724B1 (en) * | 1999-09-07 | 2002-11-19 | Texas Instruments Incorporated | Integrated circuit asymmetric transistors |
US9902843B2 (en) | 2013-09-27 | 2018-02-27 | Asahi Kasei Chemicals Corporation | Polyamide resin composition and molded product |
EP3109282A4 (en) | 2014-02-21 | 2017-03-08 | Asahi Kasei Kabushiki Kaisha | Polyamide resin composition, production method for polyamide resin composition, and molded article |
CN111223877A (zh) * | 2019-11-28 | 2020-06-02 | 云谷(固安)科技有限公司 | 阵列基板、阵列基板的制作方法和显示面板 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5961185A (ja) * | 1982-09-30 | 1984-04-07 | Fujitsu Ltd | Mis電界効果半導体装置の製造方法 |
JPH025481A (ja) * | 1988-06-22 | 1990-01-10 | Nec Corp | 絶縁ゲート電界効果トランジスタ |
JP2545762B2 (ja) * | 1990-04-13 | 1996-10-23 | 日本電装株式会社 | 高耐圧misトランジスタおよびこのトランジスタを有する相補型トランジスタの製造方法 |
JPH0478169A (ja) * | 1990-07-20 | 1992-03-12 | Fujitsu Ltd | 半導体装置及びその製造方法 |
JPH05275693A (ja) * | 1992-03-25 | 1993-10-22 | Sanyo Electric Co Ltd | Mos型fetの製造方法 |
JPH05335571A (ja) * | 1992-05-29 | 1993-12-17 | Victor Co Of Japan Ltd | 半導体装置 |
-
1996
- 1996-09-12 EP EP96114639A patent/EP0763855A3/en not_active Withdrawn
- 1996-09-18 KR KR1019960040614A patent/KR970018690A/ko not_active Application Discontinuation
- 1996-09-18 JP JP8246645A patent/JPH09116151A/ja active Pending
- 1996-11-04 TW TW085113406A patent/TW335521B/zh active
Also Published As
Publication number | Publication date |
---|---|
JPH09116151A (ja) | 1997-05-02 |
EP0763855A2 (en) | 1997-03-19 |
KR970018690A (ko) | 1997-04-30 |
EP0763855A3 (en) | 1998-10-21 |
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