TW328139B - Pulsed plate plasma implantation system - Google Patents
Pulsed plate plasma implantation systemInfo
- Publication number
- TW328139B TW328139B TW086104147A TW86104147A TW328139B TW 328139 B TW328139 B TW 328139B TW 086104147 A TW086104147 A TW 086104147A TW 86104147 A TW86104147 A TW 86104147A TW 328139 B TW328139 B TW 328139B
- Authority
- TW
- Taiwan
- Prior art keywords
- chamber
- workpieces
- gas
- implantation system
- plate plasma
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32412—Plasma immersion ion implantation
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/48—Ion implantation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
- Plasma Technology (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/728,000 US5654043A (en) | 1996-10-10 | 1996-10-10 | Pulsed plate plasma implantation system and method |
Publications (1)
Publication Number | Publication Date |
---|---|
TW328139B true TW328139B (en) | 1998-03-11 |
Family
ID=24925020
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW086104147A TW328139B (en) | 1996-10-10 | 1997-04-01 | Pulsed plate plasma implantation system |
Country Status (4)
Country | Link |
---|---|
KR (1) | KR19980032745A (zh) |
DE (1) | DE69735986D1 (zh) |
SG (1) | SG101917A1 (zh) |
TW (1) | TW328139B (zh) |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6091629A (ja) * | 1983-10-25 | 1985-05-23 | Nec Corp | プラズマ気相成長装置 |
JPH01185918A (ja) * | 1988-01-21 | 1989-07-25 | Fuji Electric Co Ltd | 半導体基体への不純物導入装置 |
JPH0536620A (ja) * | 1991-07-25 | 1993-02-12 | Canon Inc | 半導体表面処理方法及び装置 |
US5572038A (en) * | 1993-05-07 | 1996-11-05 | Varian Associates, Inc. | Charge monitor for high potential pulse current dose measurement apparatus and method |
JPH0786603A (ja) * | 1993-09-16 | 1995-03-31 | Sharp Corp | 半導体膜の製造方法 |
KR0137704B1 (ko) * | 1994-11-25 | 1998-06-01 | 김은영 | 이중 모드 플라즈마 이온 주입 장치 및 이를 사용한 표면 개질 방법 |
-
1997
- 1997-04-01 TW TW086104147A patent/TW328139B/zh not_active IP Right Cessation
- 1997-10-04 SG SG9703664A patent/SG101917A1/en unknown
- 1997-10-07 DE DE69735986T patent/DE69735986D1/de not_active Expired - Lifetime
- 1997-10-10 KR KR1019970052173A patent/KR19980032745A/ko not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
KR19980032745A (ko) | 1998-07-25 |
DE69735986D1 (de) | 2006-07-06 |
SG101917A1 (en) | 2004-02-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |