TW283239B - Improved charge pumps using accumulation capacitors - Google Patents
Improved charge pumps using accumulation capacitorsInfo
- Publication number
- TW283239B TW283239B TW084113740A TW84113740A TW283239B TW 283239 B TW283239 B TW 283239B TW 084113740 A TW084113740 A TW 084113740A TW 84113740 A TW84113740 A TW 84113740A TW 283239 B TW283239 B TW 283239B
- Authority
- TW
- Taiwan
- Prior art keywords
- accumulation capacitors
- accumulation
- mos transistors
- capacitors
- terminal
- Prior art date
Links
- 238000009825 accumulation Methods 0.000 title abstract 6
- 239000003990 capacitor Substances 0.000 title abstract 6
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0214—Particular design considerations for integrated circuits for internal polarisation, e.g. I2L
- H01L27/0218—Particular design considerations for integrated circuits for internal polarisation, e.g. I2L of field effect structures
- H01L27/0222—Charge pumping, substrate bias generation structures
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/145—Applications of charge pumps; Boosted voltage circuits; Clamp circuits therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/0611—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region
- H01L27/0617—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region comprising components of the field-effect type
- H01L27/0629—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region comprising components of the field-effect type in combination with diodes, or resistors, or capacitors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/86—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
- H01L29/92—Capacitors having potential barriers
- H01L29/94—Metal-insulator-semiconductors, e.g. MOS
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M3/00—Conversion of dc power input into dc power output
- H02M3/02—Conversion of dc power input into dc power output without intermediate conversion into ac
- H02M3/04—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters
- H02M3/06—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider
- H02M3/07—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider using capacitors charged and discharged alternately by semiconductor devices with control electrode, e.g. charge pumps
- H02M3/073—Charge pumps of the Schenkel-type
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Ceramic Engineering (AREA)
- Dc-Dc Converters (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US55811995A | 1995-11-13 | 1995-11-13 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW283239B true TW283239B (en) | 1996-08-11 |
Family
ID=24228287
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW084113740A TW283239B (en) | 1995-11-13 | 1995-12-22 | Improved charge pumps using accumulation capacitors |
Country Status (4)
Country | Link |
---|---|
JP (1) | JPH11511904A (ko) |
KR (1) | KR19990067252A (ko) |
TW (1) | TW283239B (ko) |
WO (1) | WO1997018588A1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI493852B (zh) * | 2012-08-15 | 2015-07-21 | Omnivision Tech Inc | 影像感測器、升壓轉換器及調節電源供應器之方法 |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6835491B2 (en) | 1998-04-02 | 2004-12-28 | The Board Of Trustees Of The University Of Illinois | Battery having a built-in controller |
US6074775A (en) * | 1998-04-02 | 2000-06-13 | The Procter & Gamble Company | Battery having a built-in controller |
US6118248A (en) * | 1998-04-02 | 2000-09-12 | The Procter & Gamble Company | Battery having a built-in controller to extend battery service run time |
US6163131A (en) * | 1998-04-02 | 2000-12-19 | The Procter & Gamble Company | Battery having a built-in controller |
US6198250B1 (en) | 1998-04-02 | 2001-03-06 | The Procter & Gamble Company | Primary battery having a built-in controller to extend battery run time |
US9397370B2 (en) | 1999-06-25 | 2016-07-19 | The Board Of Trustees Of The University Of Illinois | Single and multiple cell battery with built-in controller |
US6828654B2 (en) | 2001-12-27 | 2004-12-07 | Broadcom Corporation | Thick oxide P-gate NMOS capacitor for use in a phase-locked loop circuit and method of making same |
WO2004112145A1 (ja) | 2003-06-10 | 2004-12-23 | Fujitsu Limited | パンチスルー耐性を向上させた半導体集積回路装置およびその製造方法、低電圧トランジスタと高電圧トランジスタとを含む半導体集積回路装置 |
KR102143520B1 (ko) | 2014-09-17 | 2020-08-11 | 삼성전자 주식회사 | 펌핑 캐패시터 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4559548A (en) * | 1981-04-07 | 1985-12-17 | Tokyo Shibaura Denki Kabushiki Kaisha | CMOS Charge pump free of parasitic injection |
FR2694450B1 (fr) * | 1992-07-30 | 1994-10-21 | Sgs Thomson Microelectronics | Condensateur en technologie CMOS. |
US5386151A (en) * | 1993-08-11 | 1995-01-31 | Advanced Micro Devices, Inc. | Low voltage charge pumps using p-well driven MOS capacitors |
-
1995
- 1995-12-22 TW TW084113740A patent/TW283239B/zh active
-
1996
- 1996-07-23 JP JP8536018A patent/JPH11511904A/ja not_active Ceased
- 1996-07-23 KR KR1019980703211A patent/KR19990067252A/ko active IP Right Grant
- 1996-07-23 WO PCT/US1996/012122 patent/WO1997018588A1/en active IP Right Grant
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI493852B (zh) * | 2012-08-15 | 2015-07-21 | Omnivision Tech Inc | 影像感測器、升壓轉換器及調節電源供應器之方法 |
Also Published As
Publication number | Publication date |
---|---|
KR19990067252A (ko) | 1999-08-16 |
JPH11511904A (ja) | 1999-10-12 |
WO1997018588A1 (en) | 1997-05-22 |
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