TW202342662A - 氧化矽膜用研磨液組合物 - Google Patents
氧化矽膜用研磨液組合物 Download PDFInfo
- Publication number
- TW202342662A TW202342662A TW111150361A TW111150361A TW202342662A TW 202342662 A TW202342662 A TW 202342662A TW 111150361 A TW111150361 A TW 111150361A TW 111150361 A TW111150361 A TW 111150361A TW 202342662 A TW202342662 A TW 202342662A
- Authority
- TW
- Taiwan
- Prior art keywords
- component
- polishing
- group
- liquid composition
- silicon oxide
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Materials Engineering (AREA)
- Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021-214529 | 2021-12-28 | ||
| JP2021214529 | 2021-12-28 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW202342662A true TW202342662A (zh) | 2023-11-01 |
Family
ID=86999094
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW111150361A TW202342662A (zh) | 2021-12-28 | 2022-12-28 | 氧化矽膜用研磨液組合物 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP7685983B2 (enExample) |
| TW (1) | TW202342662A (enExample) |
| WO (1) | WO2023127898A1 (enExample) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2025023040A1 (ja) * | 2023-07-21 | 2025-01-30 | Agc株式会社 | 研磨剤及びその製造方法、研磨剤用添加液の製造方法、研磨方法、並びに、半導体部品の製造方法 |
| CN119998926A (zh) * | 2023-09-13 | 2025-05-13 | 株式会社力森诺科 | Cmp用研磨液、cmp用研磨液套组及研磨方法 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4462593B2 (ja) * | 2001-07-26 | 2010-05-12 | 花王株式会社 | 研磨液組成物 |
| JP7326048B2 (ja) * | 2018-09-28 | 2023-08-15 | 花王株式会社 | 酸化珪素膜用研磨液組成物 |
| JP7024690B2 (ja) * | 2018-11-12 | 2022-02-24 | トヨタ自動車株式会社 | 制御ユニット |
| JP7209583B2 (ja) * | 2019-05-08 | 2023-01-20 | 花王株式会社 | 酸化珪素膜用研磨液組成物 |
| JP7041714B2 (ja) * | 2019-06-26 | 2022-03-24 | 花王株式会社 | 酸化珪素膜用研磨液組成物 |
| JP7425660B2 (ja) * | 2020-04-07 | 2024-01-31 | 花王株式会社 | 酸化珪素膜用研磨液組成物 |
-
2022
- 2022-12-27 JP JP2022210624A patent/JP7685983B2/ja active Active
- 2022-12-27 WO PCT/JP2022/048279 patent/WO2023127898A1/ja not_active Ceased
- 2022-12-28 TW TW111150361A patent/TW202342662A/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| JP2023098704A (ja) | 2023-07-10 |
| WO2023127898A1 (ja) | 2023-07-06 |
| JP7685983B2 (ja) | 2025-05-30 |
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