TW202322323A - 半導體模組及其製造方法、電子裝置、電子模組以及電子裝置的製造方法 - Google Patents
半導體模組及其製造方法、電子裝置、電子模組以及電子裝置的製造方法 Download PDFInfo
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- TW202322323A TW202322323A TW111131350A TW111131350A TW202322323A TW 202322323 A TW202322323 A TW 202322323A TW 111131350 A TW111131350 A TW 111131350A TW 111131350 A TW111131350 A TW 111131350A TW 202322323 A TW202322323 A TW 202322323A
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- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/01—Manufacture or treatment
- H10W70/05—Manufacture or treatment of insulating or insulated package substrates, or of interposers, or of redistribution layers
- H10W70/093—Connecting or disconnecting other interconnections thereto or therefrom, e.g. connecting bond wires or bumps
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- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/40—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
- H10W20/41—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes characterised by their conductive parts
- H10W20/42—Vias, e.g. via plugs
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- H10W70/01—Manufacture or treatment
- H10W70/05—Manufacture or treatment of insulating or insulated package substrates, or of interposers, or of redistribution layers
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- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/611—Insulating or insulated package substrates; Interposers; Redistribution layers for connecting multiple chips together
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- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/62—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
- H10W70/65—Shapes or dispositions of interconnections
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- H10W72/071—Connecting or disconnecting
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- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
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- H10W74/016—Manufacture or treatment using moulds
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- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/111—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed
- H10W74/114—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed by a substrate and the encapsulations
- H10W74/117—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed by a substrate and the encapsulations the substrate having spherical bumps for external connection
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/131—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed
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- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/40—Encapsulations, e.g. protective coatings characterised by their materials
- H10W74/47—Encapsulations, e.g. protective coatings characterised by their materials comprising organic materials, e.g. plastics or resins
- H10W74/473—Encapsulations, e.g. protective coatings characterised by their materials comprising organic materials, e.g. plastics or resins containing a filler
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/401—Package configurations characterised by multiple insulating or insulated package substrates, interposers or RDLs
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W99/00—Subject matter not provided for in other groups of this subclass
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/42—Coupling light guides with opto-electronic elements
- G02B6/4201—Packages, e.g. shape, construction, internal or external details
- G02B6/4204—Packages, e.g. shape, construction, internal or external details the coupling comprising intermediate optical elements, e.g. lenses, holograms
- G02B6/4214—Packages, e.g. shape, construction, internal or external details the coupling comprising intermediate optical elements, e.g. lenses, holograms the intermediate optical element having redirecting reflective means, e.g. mirrors, prisms for deflecting the radiation from horizontal to down- or upward direction toward a device
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/42—Coupling light guides with opto-electronic elements
- G02B6/4201—Packages, e.g. shape, construction, internal or external details
- G02B6/4246—Bidirectionally operating package structures
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/42—Coupling light guides with opto-electronic elements
- G02B6/4201—Packages, e.g. shape, construction, internal or external details
- G02B6/4274—Electrical aspects
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/42—Coupling light guides with opto-electronic elements
- G02B6/43—Arrangements comprising a plurality of opto-electronic elements and associated optical interconnections
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W40/00—Arrangements for thermal protection or thermal control
- H10W40/20—Arrangements for cooling
- H10W40/22—Arrangements for cooling characterised by their shape, e.g. having conical or cylindrical projections
- H10W40/226—Arrangements for cooling characterised by their shape, e.g. having conical or cylindrical projections characterised by projecting parts, e.g. fins to increase surface area
- H10W40/228—Arrangements for cooling characterised by their shape, e.g. having conical or cylindrical projections characterised by projecting parts, e.g. fins to increase surface area the projecting parts being wire-shaped or pin-shaped
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- H10W74/00—Encapsulations, e.g. protective coatings
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- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/15—Encapsulations, e.g. protective coatings characterised by their shape or disposition on active surfaces of flip-chip devices, e.g. underfills
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W80/00—Direct bonding of chips, wafers or substrates
- H10W80/301—Bonding techniques, e.g. hybrid bonding
- H10W80/312—Bonding techniques, e.g. hybrid bonding characterised by the direct bonding of electrically conductive pads
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- H—ELECTRICITY
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W80/00—Direct bonding of chips, wafers or substrates
- H10W80/301—Bonding techniques, e.g. hybrid bonding
- H10W80/327—Bonding techniques, e.g. hybrid bonding characterised by the direct bonding of insulating parts, e.g. of silicon oxide layers
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- H10W90/00—Package configurations
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/724—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/733—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between laterally-adjacent chips
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/734—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
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- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Wire Bonding (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Geometry (AREA)
- Lead Frames For Integrated Circuits (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021135043 | 2021-08-20 | ||
| JP2021-135043 | 2021-08-20 | ||
| JP2022032024 | 2022-03-02 | ||
| JP2022-032024 | 2022-03-02 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW202322323A true TW202322323A (zh) | 2023-06-01 |
Family
ID=85239847
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW111131350A TW202322323A (zh) | 2021-08-20 | 2022-08-19 | 半導體模組及其製造方法、電子裝置、電子模組以及電子裝置的製造方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20250015002A1 (https=) |
| JP (3) | JP7496942B2 (https=) |
| KR (1) | KR20240046499A (https=) |
| TW (1) | TW202322323A (https=) |
| WO (1) | WO2023022179A1 (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI869987B (zh) * | 2023-06-26 | 2025-01-11 | 台灣積體電路製造股份有限公司 | 半導體裝置及其製造方法 |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2021182529A1 (ja) | 2020-03-10 | 2021-09-16 | 日本製鉄株式会社 | 曲げ加工装置、鋼矢板の製造設備、曲げ加工方法、及び、鋼矢板の製造方法 |
| JPWO2024219502A1 (https=) * | 2023-04-19 | 2024-10-24 | ||
| US20250006644A1 (en) * | 2023-06-29 | 2025-01-02 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor package and manufacturing method thereof |
| CN121889709A (zh) * | 2023-09-27 | 2026-04-17 | 古河电气工业株式会社 | 基板组件 |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20090059504A (ko) * | 2007-12-06 | 2009-06-11 | 삼성전자주식회사 | 반도체 장치 및 그 제조방법들 |
| US8637392B2 (en) * | 2010-02-05 | 2014-01-28 | International Business Machines Corporation | Solder interconnect with non-wettable sidewall pillars and methods of manufacture |
| JP2014236188A (ja) * | 2013-06-05 | 2014-12-15 | イビデン株式会社 | 配線板及びその製造方法 |
| US9443824B1 (en) * | 2015-03-30 | 2016-09-13 | Qualcomm Incorporated | Cavity bridge connection for die split architecture |
| US10622311B2 (en) * | 2017-08-10 | 2020-04-14 | International Business Machines Corporation | High-density interconnecting adhesive tape |
| US10510721B2 (en) * | 2017-08-11 | 2019-12-17 | Advanced Micro Devices, Inc. | Molded chip combination |
| US10340253B2 (en) * | 2017-09-26 | 2019-07-02 | Taiwan Semiconductor Manufacturing Co., Ltd. | Package structure and method of manufacturing the same |
| US10797022B2 (en) * | 2017-10-06 | 2020-10-06 | Advanced Semiconductor Engineering, Inc. | Semiconductor device package and method of manufacturing the same |
| US10651126B2 (en) * | 2017-12-08 | 2020-05-12 | Applied Materials, Inc. | Methods and apparatus for wafer-level die bridge |
| US11289424B2 (en) * | 2018-11-29 | 2022-03-29 | Taiwan Semiconductor Manufacturing Company, Ltd. | Package and method of manufacturing the same |
| US11735533B2 (en) | 2019-06-11 | 2023-08-22 | Intel Corporation | Heterogeneous nested interposer package for IC chips |
| US20210005542A1 (en) | 2019-07-03 | 2021-01-07 | Intel Corporation | Nested interposer package for ic chips |
| JP2021040012A (ja) * | 2019-09-02 | 2021-03-11 | キオクシア株式会社 | 半導体装置の製造方法 |
| US11854984B2 (en) * | 2019-09-25 | 2023-12-26 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor package and manufacturing method thereof |
| US11094637B2 (en) * | 2019-11-06 | 2021-08-17 | International Business Machines Corporation | Multi-chip package structures having embedded chip interconnect bridges and fan-out redistribution layers |
| US11239167B2 (en) * | 2019-12-04 | 2022-02-01 | International Business Machines Corporation | Cu—Cu bonding for interconnects on bridge chip attached to chips and packaging substrate |
| US11574872B2 (en) * | 2019-12-18 | 2023-02-07 | Taiwan Semiconductor Manufacturing Company, Ltd. | Package structure and method of manufacturing the same |
| US11276620B2 (en) * | 2019-12-30 | 2022-03-15 | Advanced Semiconductor Engineering, Inc. | Package structure and method for manufacturing the same |
-
2022
- 2022-08-17 WO PCT/JP2022/031116 patent/WO2023022179A1/ja not_active Ceased
- 2022-08-17 KR KR1020247004921A patent/KR20240046499A/ko active Pending
- 2022-08-17 US US18/684,440 patent/US20250015002A1/en active Pending
- 2022-08-17 JP JP2023542430A patent/JP7496942B2/ja active Active
- 2022-08-19 TW TW111131350A patent/TW202322323A/zh unknown
-
2024
- 2024-05-28 JP JP2024085925A patent/JP7832985B2/ja active Active
-
2025
- 2025-12-16 JP JP2025252176A patent/JP2026031831A/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI869987B (zh) * | 2023-06-26 | 2025-01-11 | 台灣積體電路製造股份有限公司 | 半導體裝置及其製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2026031831A (ja) | 2026-02-24 |
| WO2023022179A1 (ja) | 2023-02-23 |
| US20250015002A1 (en) | 2025-01-09 |
| JP2024101006A (ja) | 2024-07-26 |
| KR20240046499A (ko) | 2024-04-09 |
| JP7496942B2 (ja) | 2024-06-07 |
| JPWO2023022179A1 (https=) | 2023-02-23 |
| JP7832985B2 (ja) | 2026-03-18 |
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