TW202247035A - Fingerprint sensing device - Google Patents
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Abstract
Description
本發明是有關於一種感測裝置,且特別是有關於一種指紋感測裝置。The present invention relates to a sensing device, and in particular to a fingerprint sensing device.
為了建構智慧生活的環境,感測技術已廣泛應用於各式電子裝置中。舉例而言,手機及電子鎖等裝置採用指紋感測器來保護個人數據安全及門禁管制。就實際應用需求而言,指紋感測器需搭配光準直設計,以克服指紋相鄰紋峰/紋谷反射光干擾的問題。然而,在指紋按壓測試的過程中發現,由於手指下壓力道不平均,容易發生氣隙(air gap)不均及微透鏡(micro lens)壓傷的狀況,這些狀況會進一步造成光學聚焦點變異與收光角度變異,導致感測解析度不佳。In order to construct a smart living environment, sensing technology has been widely used in various electronic devices. For example, devices such as mobile phones and electronic locks use fingerprint sensors to protect personal data security and access control. In terms of practical application requirements, the fingerprint sensor needs to be equipped with a light collimation design to overcome the problem of reflected light interference from adjacent peaks/valleys of the fingerprint. However, during the fingerprint pressing test, it was found that due to the uneven pressure of the fingers, the uneven air gap and the crushing of the micro lens are prone to occur, and these conditions will further cause the variation of the optical focus point Variations with the receiving angle lead to poor sensing resolution.
本發明提供一種指紋感測裝置,具有提高的感測解析度。The invention provides a fingerprint sensing device with improved sensing resolution.
本發明的一個實施例提出一種指紋感測裝置,包括:第一基板;感測元件層,位於第一基板上,且包括多個感測元件;第二基板,位於感測元件層上;微結構層,位於第二基板與感測元件層之間,且包括多個微透鏡結構及多個虛設結構,其中多個微透鏡結構於第一基板的正投影分別重疊多個感測元件於第一基板的正投影;以及間隔層,位於第二基板與感測元件層之間,且包括多個主間隙物,其中各主間隙物覆蓋至少一個虛設結構。An embodiment of the present invention proposes a fingerprint sensing device, comprising: a first substrate; a sensing element layer located on the first substrate and including a plurality of sensing elements; a second substrate located on the sensing element layer; The structural layer is located between the second substrate and the sensing element layer, and includes a plurality of microlens structures and a plurality of dummy structures, wherein the orthographic projections of the plurality of microlens structures on the first substrate respectively overlap a plurality of sensing elements on the second substrate. an orthographic projection of a substrate; and a spacer layer, located between the second substrate and the sensing element layer, and comprising a plurality of main spacers, wherein each main spacer covers at least one dummy structure.
在本發明的一實施例中,上述的微結構層及間隔層設置於第一基板。In an embodiment of the present invention, the above-mentioned microstructure layer and spacer layer are disposed on the first substrate.
在本發明的一實施例中,上述的微結構層及間隔層設置於第二基板。In an embodiment of the present invention, the above-mentioned microstructure layer and spacer layer are disposed on the second substrate.
在本發明的一實施例中,上述的主間隙物的高度大於10 μm。In an embodiment of the present invention, the height of the above-mentioned main spacers is greater than 10 μm.
在本發明的一實施例中,上述的間隔層還包括多個對頂物,且主間隙物位於對頂物與虛設結構之間。In an embodiment of the present invention, the spacer layer further includes a plurality of countertops, and the main spacers are located between the countertops and the dummy structures.
在本發明的一實施例中,上述的間隔層還包括多個副間隙物,各副間隙物覆蓋至少一個虛設結構,且副間隙物的高度小於主間隙物的高度。In an embodiment of the present invention, the above spacer layer further includes a plurality of secondary spacers, each of which covers at least one dummy structure, and the height of the secondary spacers is smaller than that of the main spacers.
在本發明的一實施例中,上述的間隔層還包括多個對頂物,且主間隙物及副間隙物分別位於對頂物與虛設結構之間。In an embodiment of the present invention, the spacer layer further includes a plurality of counters, and the main spacers and the auxiliary spacers are respectively located between the counters and the dummy structures.
在本發明的一實施例中,上述的虛設結構於第一基板的正投影在感測元件於第一基板的正投影之外。In an embodiment of the present invention, the above-mentioned orthographic projection of the dummy structure on the first substrate is outside the orthographic projection of the sensing element on the first substrate.
在本發明的一實施例中,上述的指紋感測裝置還包括遮光層,位於感測元件層與微結構層之間。In an embodiment of the present invention, the above-mentioned fingerprint sensing device further includes a light-shielding layer located between the sensing element layer and the microstructure layer.
在本發明的一實施例中,上述的遮光層具有多個開口,且多個開口於第一基板的正投影分別重疊多個感測元件於第一基板的正投影。In an embodiment of the present invention, the light-shielding layer has a plurality of openings, and the orthographic projections of the plurality of openings on the first substrate respectively overlap the orthographic projections of the plurality of sensing elements on the first substrate.
在本發明的一實施例中,上述的間隔層還包括周邊間隙物。In an embodiment of the present invention, the above spacer layer further includes peripheral spacers.
本發明的一個實施例提出一種指紋感測裝置,包括:第一基板;感測元件層,位於第一基板上,且包括多個感測元件;第二基板,位於感測元件層上;微結構層,位於第二基板與感測元件層之間,且包括多個微透鏡結構及多個虛設結構;以及間隔層,位於微結構層的一側,且包括多個主間隙物及多個副間隙物,其中各主間隙物及各副間隙物分別重疊至少一個虛設結構,且副間隙物的高度小於主間隙物的高度。An embodiment of the present invention proposes a fingerprint sensing device, comprising: a first substrate; a sensing element layer located on the first substrate and including a plurality of sensing elements; a second substrate located on the sensing element layer; The structural layer is located between the second substrate and the sensing element layer and includes multiple microlens structures and multiple dummy structures; and the spacer layer is located on one side of the microstructural layer and includes multiple main spacers and multiple The auxiliary spacers, wherein each main spacer and each auxiliary spacer respectively overlap at least one dummy structure, and the height of the auxiliary spacers is smaller than that of the main spacers.
在本發明的一實施例中,上述的微結構層設置於第一基板,且間隔層設置於第二基板。In an embodiment of the present invention, the above-mentioned microstructure layer is disposed on the first substrate, and the spacer layer is disposed on the second substrate.
在本發明的一實施例中,上述的微結構層設置於第二基板,且間隔層設置於第一基板。In an embodiment of the present invention, the above-mentioned microstructure layer is disposed on the second substrate, and the spacer layer is disposed on the first substrate.
在本發明的一實施例中,上述的多個微透鏡結構於第一基板的正投影分別重疊多個感測元件於第一基板的正投影。In an embodiment of the present invention, the above-mentioned orthographic projections of the plurality of microlens structures on the first substrate respectively overlap the orthographic projections of the plurality of sensing elements on the first substrate.
在本發明的一實施例中,上述的虛設結構於第一基板的正投影在感測元件於第一基板的正投影之外。In an embodiment of the present invention, the above-mentioned orthographic projection of the dummy structure on the first substrate is outside the orthographic projection of the sensing element on the first substrate.
在本發明的一實施例中,上述的第二基板為彩色濾光基板。In an embodiment of the present invention, the above-mentioned second substrate is a color filter substrate.
為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。In order to make the above-mentioned features and advantages of the present invention more comprehensible, the following specific embodiments are described in detail together with the accompanying drawings.
在附圖中,為了清楚起見,放大了層、膜、面板、區域等的厚度。在整個說明書中,相同的附圖標記表示相同的元件。應當理解,當諸如層、膜、區域或基板的元件被稱為在另一元件「上」或「連接到」另一元件時,其可以直接在另一元件上或與另一元件連接,或者中間元件可以也存在。相反地,當元件被稱為「直接在另一元件上」或「直接連接到」另一元件時,不存在中間元件。如本文所使用的,「連接」可以指物理及/或電性連接。再者,「電性連接」或「耦合」可為二元件間存在其它元件。In the drawings, the thickness of layers, films, panels, regions, etc., are exaggerated for clarity. Throughout the specification, the same reference numerals denote the same elements. It will be understood that when an element such as a layer, film, region, or substrate is referred to as being "on" or "connected to" another element, it can be directly on or connected to the other element, or Intermediate elements may also be present. In contrast, when an element is referred to as being "directly on" or "directly connected to" another element, there are no intervening elements present. As used herein, "connected" may refer to physical and/or electrical connection. Furthermore, "electrically connected" or "coupled" may mean that other elements exist between two elements.
應當理解,儘管術語「第一」、「第二」、「第三」等在本文中可以用於描述各種元件、部件、區域、層及/或部分,但是這些元件、部件、區域、層及/或部分不應受這些術語的限制。這些術語僅用於將一個元件、部件、區域、層或部分與另一個元件、部件、區域、層或部分區分開。因此,下面討論的第一「元件」、「部件」、「區域」、「層」或「部分」可以被稱為第二元件、部件、區域、層或部分而不脫離本文的教導。It should be understood that although the terms "first", "second", "third", etc. may be used herein to describe various elements, components, regions, layers and/or sections, these elements, components, regions, layers and and/or parts should not be limited by these terms. These terms are only used to distinguish one element, component, region, layer or section from another element, component, region, layer or section. Thus, a first "element," "component," "region," "layer" or "section" discussed below could be termed a second element, component, region, layer or section without departing from the teachings herein.
這裡使用的術語僅僅是為了描述特定實施例的目的,而不是限制性的。如本文所使用的,除非內容清楚地指示,否則單數形式「一」、「一個」和「該」旨在包括複數形式,包括「至少一個」或表示「及/或」。如本文所使用的,術語「及/或」包括一個或多個相關所列項目的任何和所有組合。還應當理解,當在本說明書中使用時,術語「包含」及/或「包括」指定所述特徵、區域、整體、步驟、操作、元件及/或部件的存在,但不排除一個或多個其它特徵、區域、整體、步驟、操作、元件、部件及/或其組合的存在或添加。The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting. As used herein, the singular forms "a", "an" and "the" are intended to include plural forms including "at least one" or meaning "and/or" unless the content clearly dictates otherwise. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items. It should also be understood that when used in this specification, the terms "comprising" and/or "comprising" designate the existence of said features, regions, integers, steps, operations, elements and/or parts, but do not exclude one or more Existence or addition of other features, regions, integers, steps, operations, elements, parts and/or combinations thereof.
此外,諸如「下」或「底部」和「上」或「頂部」的相對術語可在本文中用於描述一個元件與另一元件的關係,如圖所示。應當理解,相對術語旨在包括除了圖中所示的方位之外的裝置的不同方位。例如,如果一個附圖中的裝置翻轉,則被描述為在其他元件的「下」側的元件將被定向在其他元件的「上」側。因此,示例性術語「下」可以包括「下」和「上」的取向,取決於附圖的特定取向。類似地,如果一個附圖中的裝置翻轉,則被描述為在其它元件「下」或「下方」的元件將被定向為在其它元件「上方」。因此,示例性術語「下」或「下方」可以包括上方和下方的取向。Additionally, relative terms such as "lower" or "bottom" and "upper" or "top" may be used herein to describe one element's relationship to another element as shown in the figures. It will be understood that relative terms are intended to encompass different orientations of the device in addition to the orientation depicted in the figures. For example, if the device in one of the figures is turned over, elements described as being on the "lower" side of other elements would then be oriented on "upper" sides of the other elements. Thus, the exemplary term "below" can encompass both an orientation of "below" and "upper," depending on the particular orientation of the drawing. Similarly, if the device in one of the figures is turned over, elements described as "below" or "beneath" other elements would then be oriented "above" the other elements. Thus, the exemplary terms "below" or "beneath" can encompass both an orientation of above and below.
考慮到所討論的測量和與測量相關的誤差的特定數量(即,測量系統的限制),本文使用的「約」、「近似」、或「實質上」包括所述值和在本領域普通技術人員確定的特定值的可接受的偏差範圍內的平均值。例如,「約」可以表示在所述值的一個或多個標準偏差內,或±30%、±20%、±10%、±5%內。再者,本文使用的「約」、「近似」、或「實質上」可依光學性質、蝕刻性質或其它性質,來選擇較可接受的偏差範圍或標準偏差,而可不用一個標準偏差適用全部性質。The terms "about," "approximately," or "substantially" as used herein include stated values and those within ordinary skill in the art, taking into account the measurements in question and the specific amount of error associated with the measurements (i.e., limitations of the measurement system). The average value within an acceptable range of deviation from a specified value as determined by a human being. For example, "about" can mean within one or more standard deviations, or within ±30%, ±20%, ±10%, ±5% of the stated value. Furthermore, "about", "approximately", or "substantially" used herein may select a more acceptable range of deviation or standard deviation based on optical properties, etching properties or other properties, and may not use one standard deviation to apply to all nature.
圖1A是依照本發明一實施例的指紋感測裝置10的局部上視示意圖。圖1B是沿圖1A的剖面線A-A’所作的剖面示意圖。圖1C是圖1B的指紋感測裝置10的區域I的放大示意圖。為了使圖式的表達較為簡潔,圖1A省略圖1B及圖1C所示的部分構件。FIG. 1A is a schematic partial top view of a
首先,請同時參照圖1A至圖1B,指紋感測裝置10包括:第一基板SB1;感測元件層110,位於第一基板SB1上,且包括多個感測元件112;第二基板SB2,位於感測元件層110上;微結構層120,位於第二基板SB2與感測元件層110之間,且包括多個微透鏡結構LM及多個虛設結構LD,其中多個微透鏡結構LM於第一基板SB1的正投影分別重疊多個感測元件112於第一基板SB1的正投影;以及間隔層130,位於第二基板SB2與感測元件層110之間,且包括多個主間隙物SMa,其中各主間隙物SMa覆蓋至少一個虛設結構LD。First, please refer to FIG. 1A to FIG. 1B at the same time. The
在本發明的一實施例的指紋感測裝置10中,藉由將多個主間隙物SMa設置於間隔層130中的多個虛設結構LD上,能夠使間隔層130保持穩定的間距,同時避免微透鏡結構LM壓傷,進而改善光學聚焦點與收光角度的調控,以提高指紋感測裝置10的感測解析度。In the
以下,配合圖1A至圖1C,繼續說明指紋感測裝置10的各個元件的實施方式,但本發明不以此為限。Hereinafter, with reference to FIG. 1A to FIG. 1C , the implementation of each element of the
在本實施例中,指紋感測裝置10的第一基板SB1可以是透明基板或不透明基板,其材質可以是陶瓷基板、石英基板、玻璃基板、高分子基板或其他適合的材質,但不限於此。指紋感測裝置10的第二基板SB2可以是透明基板,其材質可以是石英基板、玻璃基板、高分子基板或其他適合的材質,但不限於此。In this embodiment, the first substrate SB1 of the
在本實施例中,感測元件層110可以包括多個感測元件112以及平坦層PL1。舉例而言,請參照圖1C,感測元件層110可以包括感測元件112以及平坦層PL1,且平坦層PL1可以包括平坦層PL1a及平坦層PL1b。感測元件112可以是可見光指紋感測元件或不可見光指紋感測元件,例如紅外光指紋感測元件。舉例而言,感測元件112可以包括電極E1、感測層SR以及電極E2,感測層SR可以位於電極E1與電極E2之間,且電極E2可以位於平坦層PL1a與平坦層PL1b之間。In this embodiment, the
具體而言,電極E1的材質可以是鉬、鋁、鈦、銅、金、銀或其他導電材料、或上述兩種以上之材料的合金組合或堆疊。感測層SR的材質可以是富矽氧化物(Silicon-Rich Oxide,SRO)、摻雜鍺之富矽氧化物或其他合適的材料。電極E2的材質較佳為透明導電材料,例如銦錫氧化物、銦鋅氧化物、鋁錫氧化物、鋁鋅氧化物、銦鎵鋅氧化物或其他合適的氧化物或者是上述至少二者之堆疊層。平坦層PL1a、PL1b的材質可以包括有機材料,例如壓克力(acrylic)材料、矽氧烷(siloxane)材料、聚醯亞胺(polyimide)材料、環氧樹脂(epoxy)材料或上述材料的疊層,但不限於此。Specifically, the material of the electrode E1 may be molybdenum, aluminum, titanium, copper, gold, silver or other conductive materials, or an alloy combination or stack of two or more of the above materials. The material of the sensing layer SR may be Silicon-Rich Oxide (SRO), Silicon-Rich Oxide doped with Germanium, or other suitable materials. The material of the electrode E2 is preferably a transparent conductive material, such as indium tin oxide, indium zinc oxide, aluminum tin oxide, aluminum zinc oxide, indium gallium zinc oxide or other suitable oxides or at least two of the above Stack layers. The material of the planar layers PL1a and PL1b may include organic materials, such as acrylic materials, siloxane materials, polyimide materials, epoxy resin materials or a combination of the above materials. layer, but not limited to this.
請參照圖1C,在一些實施例中,感測元件層110還可以包括多個開關元件TR、閘極絕緣層GI以及層間絕緣層IL,且多個開關元件TR可以分別電性連接多個感測元件112,以個別控制感測元件112的操作。舉例而言,開關元件TR可以由半導體層CH、閘極GE、源極SE與汲極DE所構成。半導體層CH重疊閘極GE的區域可視為開關元件TR的通道區。閘極絕緣層GI位於閘極GE與半導體層CH之間,層間絕緣層IL位於源極SE與閘極GE之間以及汲極DE與閘極GE之間。閘極GE及源極SE可分別接收來自例如驅動元件的訊號,且感測元件112的電極E1可以實體連接或電性連接汲極DE。當閘極GE接收訊號而開啟開關元件TR時,可使源極SE接收的訊號通過汲極DE傳遞至感測元件112的電極E1。Please refer to FIG. 1C , in some embodiments, the
舉例而言,半導體層CH的材質可以包括矽質半導體材料(例如多晶矽、非晶矽等)、氧化物半導體材料或有機半導體材料,而閘極GE、源極SE以及汲極DE的材質可包括導電性良好的金屬(例如鋁、鉬、鈦、銅)、合金、或上述金屬及/或合金之疊層,但不限於此。閘極絕緣層GI以及層間絕緣層IL的材質可以包括透明的絕緣材料,例如氧化矽、氮化矽、氮氧化矽、上述材料的疊層或其他適合的材料。For example, the material of the semiconductor layer CH may include silicon semiconductor material (such as polysilicon, amorphous silicon, etc.), oxide semiconductor material or organic semiconductor material, and the material of the gate GE, the source SE and the drain DE may include Metals with good electrical conductivity (such as aluminum, molybdenum, titanium, copper), alloys, or stacks of the above metals and/or alloys, but not limited thereto. Materials of the gate insulating layer GI and the interlayer insulating layer IL may include transparent insulating materials, such as silicon oxide, silicon nitride, silicon oxynitride, stacks of the above materials, or other suitable materials.
在本實施例中,指紋感測裝置10的微結構層120可以設置於第一基板SB1上,且微結構層120的多個微透鏡結構LM及多個虛設結構LD可以陣列排列於感測元件層110上。另外,指紋感測裝置10還可以包括遮光層BM3,且微結構層120的微透鏡結構LM以及虛設結構LD可以設置於遮光層BM3的開口O3中。In this embodiment, the
微透鏡結構LM於第一基板SB1的正投影可以分別重疊感測元件112於第一基板SB1的正投影。較佳地,微透鏡結構LM的中心軸可以穿過感測層SR。更佳地,微透鏡結構LM的中心軸可以與感測層SR的中心軸重疊。微透鏡結構LM可以是中心厚度較邊緣厚度大的透鏡結構,例如對稱雙凸透鏡、非對稱雙凸透鏡、平凸透鏡或凹凸透鏡。微透鏡結構LM能夠提升光準直,避免散射光或折射光所導致的漏光或混光問題產生,進而減少光損耗。The orthographic projections of the microlens structure LM on the first substrate SB1 can respectively overlap the orthographic projections of the
一般而言,虛設結構LD下方不會設置感測元件112,因此,虛設結構LD於第一基板SB1的正投影可以在感測元件112於第一基板SB1的正投影之外。也就是說,感測元件112是設置在虛設結構LD的正投影區以外的區域。虛設結構LD與微透鏡結構LM可以具有相同或不同的材質及形狀。舉例而言,在本實施例中,虛設結構LD可以具有與微透鏡結構LM相同的材質及相同的形狀。然而,在一些實施例中,虛設結構LD可以具有與微透鏡結構LM相同的材質,且具有與微透鏡結構LM不同的形狀。在一些實施例中,虛設結構LD可以具有與微透鏡結構LM不同的材質,且具有與微透鏡結構LM相同的形狀。在一些實施例中,虛設結構LD可以具有與微透鏡結構LM不同的材質及不同的形狀。Generally speaking, no
在本實施例中,指紋感測裝置10還可以包括位於感測元件層110與微結構層120之間的遮光層BM1、BM2以及平坦層PL2、PL3,其中遮光層BM1位於感測元件層110與平坦層PL2之間,遮光層BM2位於平坦層PL2與平坦層PL3之間,且微透鏡結構LM及虛設結構LD位於平坦層PL3與間隔層130之間。In this embodiment, the
遮光層BM1可以具有多個開口O1,且開口O1於第一基板SB1的正投影可以分別重疊感測元件112於第一基板SB1的正投影。同樣地,遮光層BM2可以具有多個開口O2,且開口O2於第一基板SB1的正投影可以分別重疊感測元件112於第一基板SB1的正投影。在一些實施例中,開口O1於第一基板SB1的正投影可以重疊開口O2於第一基板SB1的正投影以及微透鏡結構LM於第一基板SB1的正投影。在一些實施例中,開口O1、O2以及微透鏡結構LM的中心軸可以重疊。如此一來,開口O1、O2搭配微透鏡結構LM能夠調控感測元件112的收光角度,藉以實現光準直設計。The light shielding layer BM1 may have a plurality of openings O1, and the orthographic projections of the openings O1 on the first substrate SB1 may respectively overlap the orthographic projections of the
遮光層BM1、BM2的材質可以包括金屬、金屬氧化物、黑色樹脂或石墨等遮光材料、或上述遮光材料的疊層。舉例而言,在一些實施例中,遮光層BM1或遮光層BM2可以包括金屬層以及半透明金屬氧化物層的疊層,其中金屬層的材質可以包括導電性良好的金屬,例如鋁、鉬、鈦、銅、銀等金屬或其疊層,且半透明金屬氧化物層的材質包括可以降低金屬層反射率的金屬氧化物,例如鉬鉭氧化物(MoTaOx)或鉬鈮氧化物(MoNbOx)等,但不以此為限。另外,平坦層PL2、PL3的材質可以包括有機材料或其他適合的材料,例如壓克力(acrylic)材料、矽氧烷(siloxane)材料、聚醯亞胺(polyimide)材料、環氧樹脂(epoxy)材料或上述材料的疊層。The material of the light-shielding layers BM1 and BM2 may include light-shielding materials such as metal, metal oxide, black resin or graphite, or a laminate of the above-mentioned light-shielding materials. For example, in some embodiments, the light-shielding layer BM1 or the light-shielding layer BM2 may include a stack of a metal layer and a semi-transparent metal oxide layer, wherein the material of the metal layer may include a metal with good conductivity, such as aluminum, molybdenum, Titanium, copper, silver and other metals or their laminates, and the material of the semi-transparent metal oxide layer includes metal oxides that can reduce the reflectivity of the metal layer, such as molybdenum-tantalum oxide (MoTaOx) or molybdenum-niobium oxide (MoNbOx), etc. , but not limited to this. In addition, the material of the flat layers PL2 and PL3 may include organic materials or other suitable materials, such as acrylic materials, siloxane materials, polyimide materials, epoxy resins ) material or a laminate of the above materials.
在本實施例中,間隔層130的主間隙物SMa可以設置於第一基板SB1上,且主間隙物SMa可以分別覆蓋一個虛設結構LD,以在微結構層120與第二基板SB2之間形成穩定的間隙GP。主間隙物SMa的材質可以包括壓克力材料,但不以此為限。在一些實施例中,主間隙物SMa還可以包括光起始劑,光起始劑可有助於在曝光期間調整主間隙物SMa的錐度(taper)及膜厚,以符合主間隙物SMa需提供較高錐度及高度的要求。In this embodiment, the main spacer SMa of the
以下,使用圖2A至圖11D繼續說明本發明的其他實施例,並且,沿用圖1A至圖1C的實施例的元件標號與相關內容,其中,採用相同的標號來表示相同或近似的元件,並且省略了相同技術內容的說明。關於省略部分的說明,可參考圖1A至圖1C的實施例,在以下的說明中不再重述。In the following, other embodiments of the present invention are continued to be described using FIGS. 2A to 11D , and the element numbers and related contents of the embodiment in FIGS. 1A to 1C are used, wherein the same or similar elements are represented by the same numbers, and Descriptions of the same technical contents are omitted. For the description of omitted parts, reference may be made to the embodiment shown in FIG. 1A to FIG. 1C , which will not be repeated in the following description.
圖2A是依照本發明一實施例的指紋感測裝置20的局部上視示意圖。圖2B是沿圖2A的剖面線B-B’所作的剖面示意圖。指紋感測裝置20包括:第一基板SB1;感測元件層110,位於第一基板SB1上,且包括多個感測元件112及平坦層PL1;第二基板SB2,位於感測元件層110上;微結構層120,位於第二基板SB2與感測元件層110之間,且包括多個微透鏡結構LM及多個虛設結構LD;以及間隔層130,位於第二基板SB2與微結構層120之間,且包括多個主間隙物SMb。指紋感測裝置20還包括遮光層BM1、BM2、BM3以及平坦層PL2、PL3,位於感測元件層110與間隔層130之間。FIG. 2A is a schematic partial top view of a
與如圖1A至圖1C所示的指紋感測裝置10相比,圖2A至圖2B所示的指紋感測裝置20的不同之處在於:指紋感測裝置20的間隔層130的主間隙物SMb可以設置於兩個相鄰的虛設結構LD之間,且延伸至此兩個相鄰的虛設結構LD的一部分表面上。也就是說,主間隙物SMb可以同時覆蓋兩個相鄰的虛設結構LD的一部分。主間隙物SMb能夠使間隔層130保持穩定的間距,同時避免微透鏡結構LM壓傷,以提高指紋感測裝置20的感測解析度。Compared with the
圖3A是依照本發明一實施例的指紋感測裝置30的局部上視示意圖。圖3B是沿圖3A的剖面線C-C’所作的剖面示意圖。指紋感測裝置30包括:第一基板SB1;感測元件層110,位於第一基板SB1上,且包括多個感測元件112及平坦層PL1;第二基板SB2,位於感測元件層110上;微結構層120,位於第二基板SB2與感測元件層110之間,且包括多個微透鏡結構LM及多個虛設結構LD;以及間隔層130,位於第二基板SB2與微結構層120之間,且包括多個主間隙物SMc。指紋感測裝置30還包括遮光層BM1、BM2、BM3以及平坦層PL2、PL3,位於感測元件層110與間隔層130之間。FIG. 3A is a schematic partial top view of a
與如圖1A至圖1C所示的指紋感測裝置10相比,圖3A至圖3B所示的指紋感測裝置30的不同之處在於:指紋感測裝置30的間隔層130的主間隙物SMc可以覆蓋四個相鄰的虛設結構LD。主間隙物SMc能夠使間隔層130保持穩定的間距,同時避免微透鏡結構LM壓傷,以提高指紋感測裝置30的感測解析度。Compared with the
圖4A是依照本發明一實施例的指紋感測裝置40的局部上視示意圖。圖4B是沿圖4A的剖面線D-D’所作的剖面示意圖。指紋感測裝置40包括:第一基板SB1;感測元件層110,位於第一基板SB1上,且包括多個感測元件112及平坦層PL1;第二基板SB2,位於感測元件層110上;微結構層120,位於第二基板SB2與感測元件層110之間,且包括多個微透鏡結構LM及多個虛設結構LD;以及間隔層130,位於第二基板SB2與感測元件層110之間,且包括多個主間隙物SMd,其中各主間隙物SMa覆蓋四個虛設結構LD。FIG. 4A is a schematic partial top view of a
與如圖3A至圖3B所示的指紋感測裝置30相比,圖4A至圖4B所示的指紋感測裝置40的不同之處在於:指紋感測裝置40的微結構層120、間隔層130及遮光層BM3可以設置於第二基板SB2,且間隔層130的主間隙物SMd可以位於微結構層120的虛設結構LD與感測元件層110之間,遮光層BM1、BM2以及平坦層PL2可以位於感測元件層110與主間隙物SMd之間。Compared with the
在本實施例中,指紋感測裝置40還可以包括光學層OC以及色轉換層CT,光學層OC以及色轉換層CT可以設置於第二基板SB2,其中色轉換層CT可以位於光學層OC與第二基板SB2之間,且光學層OC可以位於色轉換層CT與微結構層120之間。如此一來,第二基板SB2還能夠作為彩色濾光基板。In this embodiment, the
在本實施例中,主間隙物SMd的高度H1可以大於10 μm,例如12 μm、15 μm或20 μm,以提升遮光層BM1、BM2以及微透鏡結構LM所提供的光準直功效,同時主間隙物SMd能夠使間隔層130保持穩定的間距,以避免微透鏡結構LM壓傷,且提高指紋感測裝置40的感測解析度。In this embodiment, the height H1 of the main spacer SMd can be greater than 10 μm, such as 12 μm, 15 μm or 20 μm, so as to improve the light collimation effect provided by the light shielding layers BM1, BM2 and the microlens structure LM, while the main spacer The spacer SMd can keep the
圖5A是依照本發明一實施例的指紋感測裝置50的局部上視示意圖。圖5B是沿圖5A的剖面線E-E’所作的剖面示意圖。指紋感測裝置50包括:第一基板SB1;感測元件層110,位於第一基板SB1上,且包括多個感測元件112及平坦層PL1;第二基板SB2,位於感測元件層110上;微結構層120,位於第二基板SB2與感測元件層110之間,且包括多個微透鏡結構LM及多個虛設結構LD;以及間隔層130,位於第二基板SB2與感測元件層110之間,且包括多個主間隙物SMe,其中各主間隙物SMe覆蓋四個虛設結構LD。指紋感測裝置50還包括遮光層BM1、BM2、BM3、平坦層PL2、光學層OC以及色轉換層CT。FIG. 5A is a schematic partial top view of a
與如圖4A至圖4B所示的指紋感測裝置40相比,圖5A至圖5B所示的指紋感測裝置50的不同之處在於:指紋感測裝置50的間隔層130還包括多個副間隙物SSa,各副間隙物SSa覆蓋至少一個虛設結構LD,且副間隙物SSa的高度H2小於主間隙物SMe的高度H1。Compared with the
在本實施例中,副間隙物SSa可以與主間隙物SMe同樣覆蓋四個虛設結構LD,使得副間隙物SSa於第二基板SB2的投影面積可以近似於或等於主間隙物SMe於第二基板SB2的投影面積,但不以此為限。在一些實施例中,副間隙物SSa與主間隙物SMe可以分別覆蓋一個、兩個、三個、六個或更多個虛設結構LD,且副間隙物SSa於第二基板SB2的投影面積可以與主間隙物SMe於第二基板SB2的投影面積不同。In this embodiment, the sub-spacer SSa can cover the four dummy structures LD similarly to the main spacer SMe, so that the projected area of the sub-spacer SSa on the second substrate SB2 can be similar to or equal to that of the main spacer SMe on the second substrate. The projected area of SB2, but not limited thereto. In some embodiments, the sub-spacer SSa and the main spacer SMe may respectively cover one, two, three, six or more dummy structures LD, and the projected area of the sub-spacer SSa on the second substrate SB2 may be It is different from the projected area of the main spacer SMe on the second substrate SB2.
在本實施例中,副間隙物SSa的高度H2小於主間隙物SMe的高度H1,使得副間隙物SSa與遮光層BM2之間可以具有間距D1,且高度H2與間距D1之和可以近似於或等於高度H1。副間隙物SSa可以輔助間隔層130保持穩定的間距,同時提供指紋感測裝置50適當的按壓緩衝空間。In this embodiment, the height H2 of the sub-spacer SSa is smaller than the height H1 of the main spacer SMe, so that there may be a distance D1 between the sub-spacer SSa and the light shielding layer BM2, and the sum of the height H2 and the distance D1 may be approximately or equal to height H1. The sub-spacer SSa can assist the
圖6A是依照本發明一實施例的指紋感測裝置60的局部上視示意圖。圖6B是沿圖6A的剖面線F-F’所作的剖面示意圖。指紋感測裝置60包括:第一基板SB1;感測元件層110,位於第一基板SB1上,且包括多個感測元件112及平坦層PL1;第二基板SB2,位於感測元件層110上;微結構層120,位於第二基板SB2與感測元件層110之間,且包括多個微透鏡結構LM及多個虛設結構LD;以及間隔層130,位於第二基板SB2與感測元件層110之間,且包括多個主間隙物SMf,其中各主間隙物SMf覆蓋四個虛設結構LD。指紋感測裝置60還包括遮光層BM1、BM2、BM3、平坦層PL2、光學層OC以及色轉換層CT。FIG. 6A is a schematic partial top view of a
與如圖4A至圖4B所示的指紋感測裝置40相比,圖6A至圖6B所示的指紋感測裝置60的不同之處在於:指紋感測裝置60的間隔層130還包括多個對頂物BPa,且主間隙物SMf位於對頂物BPa與虛設結構LD之間。Compared with the
在本實施例中,對頂物BPa於第一基板SB1的投影面積可以小於主間隙物SMf於第一基板SB1的投影面積,但不限於此。對頂物BPa可以設置於第一基板SB1,且對頂物BPa於第一基板SB1的正投影可以重疊主間隙物SMf於第一基板SB1的正投影,使得對頂物BPa與主間隙物SMf能夠相互抵頂而保持穩定的間隔層130間距,同時進一步增加間隔層130的間距以提升光準直功效,而不受限於主間隙物SMf的膜厚。In this embodiment, the projected area of the counter object BPa on the first substrate SB1 may be smaller than the projected area of the main spacer SMf on the first substrate SB1 , but it is not limited thereto. The countertop BPa can be arranged on the first substrate SB1, and the orthographic projection of the countertop BPa on the first substrate SB1 can overlap the orthographic projection of the main spacer SMf on the first substrate SB1, so that the countertop BPa and the main spacer SMf The distance between the spacer layers 130 can be abutted against each other to maintain a stable distance, and at the same time, the distance between the spacer layers 130 can be further increased to improve the light collimation effect, without being limited by the film thickness of the main spacer SMf.
圖7A是依照本發明一實施例的指紋感測裝置70的局部上視示意圖。圖7B是沿圖7A的剖面線G-G’所作的剖面示意圖。指紋感測裝置70包括:第一基板SB1;感測元件層110,位於第一基板SB1上,且包括多個感測元件112及平坦層PL1;第二基板SB2,位於感測元件層110上;微結構層120,位於第二基板SB2與感測元件層110之間,且包括多個微透鏡結構LM及多個虛設結構LD;以及間隔層130,位於第二基板SB2與感測元件層110之間,且包括多個主間隙物SMg及副間隙物SSb。指紋感測裝置70還包括遮光層BM1、BM2、BM3、平坦層PL2、光學層OC以及色轉換層CT。FIG. 7A is a schematic partial top view of a
與如圖5A至圖5B所示的指紋感測裝置50相比,圖7A至圖7B所示的指紋感測裝置70的不同之處在於:指紋感測裝置70的間隔層130還包括多個對頂物BPb,且主間隙物SMg及副間隙物SSb分別位於對頂物BPb與虛設結構LD之間。另外,對頂物BPb於第一基板SB1的投影面積可以大於主間隙物SMg或副間隙物SSb於第一基板SB1的投影面積。Compared with the
在本實施例中,主間隙物SMg及副間隙物SSb可以分別覆蓋相鄰的兩個虛設結構LD的各一部分,且主間隙物SMg的高度H3大於副間隙物SSb的高度H5,使得副間隙物SSb與對頂物BPb之間可以具有間距D2,且高度H5與間距D2之和可以近似於或等於高度H3。另外,對頂物BPb可以具有高度H4,使得間隔層130可以具有間距H3+H4。如此一來,對頂物BPb與主間隙物SMg能夠相互抵頂而保持穩定的間隔層130間距,且能夠提供更大的間隔層130間距,同時副間隙物SSb與對頂物BPb之間還能夠提供指紋感測裝置70適當的按壓緩衝空間。In this embodiment, the main spacer SMg and the secondary spacer SSb can respectively cover parts of two adjacent dummy structures LD, and the height H3 of the main spacer SMg is greater than the height H5 of the secondary spacer SSb, so that the secondary spacer There may be a distance D2 between the object SSb and the counter object BPb, and the sum of the height H5 and the distance D2 may be approximately or equal to the height H3. In addition, the counter object BPb may have a height H4 such that the
圖8A是依照本發明一實施例的指紋感測裝置80的局部上視示意圖。圖8B是沿圖8A的剖面線H-H’所作的剖面示意圖。指紋感測裝置80包括:第一基板SB1;感測元件層110,位於第一基板SB1上,且包括多個感測元件112及平坦層PL1;第二基板SB2,位於感測元件層110上;微結構層120,位於第二基板SB2與感測元件層110之間,且包括多個微透鏡結構LM及多個虛設結構LD;以及間隔層130,位於微結構層120的一側(例如上側),且包括多個主間隙物SMh及多個副間隙物SSc,其中各主間隙物SMh及各副間隙物SSc分別重疊至少一個(例如四個)虛設結構LD,且副間隙物SSc的高度H7小於主間隙物SMh的高度H6。FIG. 8A is a schematic partial top view of a
與如圖3A至圖3B所示的指紋感測裝置30相比,圖8A至圖8B所示的指紋感測裝置80的不同之處在於:指紋感測裝置80的間隔層130還包括副間隙物SSc,且間隔層130的主間隙物SMh及副間隙物SSc設置於第二基板SB2而未覆蓋虛設結構LD。另外,除了遮光層BM1、BM2、BM3以及平坦層PL2、PL3之外,指紋感測裝置80還包括位於間隔層130與第二基板SB2之間的光學層OC以及色轉換層CT,使得第二基板SB2可以作為彩色濾光基板。Compared with the
在本實施例中,副間隙物SSc的高度H7小於主間隙物SMh的高度H6,使得副間隙物SSc與虛設結構LD之間可以具有間距D3,且高度H7與間距D3之和可以近似於或等於高度H6。主間隙物SMh可以抵頂虛設結構LD以保持穩定的間隔層130間距,且副間隙物SSc可以輔助保持穩定的間距,同時提供指紋感測裝置80適當的按壓緩衝空間。In this embodiment, the height H7 of the secondary spacer SSc is smaller than the height H6 of the main spacer SMh, so that there may be a distance D3 between the secondary spacer SSc and the dummy structure LD, and the sum of the height H7 and the distance D3 may be approximately or equal to height H6. The main spacer SMh can abut against the dummy structure LD to maintain a stable distance between the spacer layers 130 , and the secondary spacer SSc can assist in maintaining a stable distance while providing a proper pressing buffer space for the
圖9A是依照本發明一實施例的指紋感測裝置90的局部上視示意圖。圖9B是沿圖9A的剖面線J-J’所作的剖面示意圖。指紋感測裝置90包括:第一基板SB1;感測元件層110,位於第一基板SB1上,且包括多個感測元件112及平坦層PL1;第二基板SB2,位於感測元件層110上;微結構層120,位於第二基板SB2與感測元件層110之間,且包括多個微透鏡結構LM及多個虛設結構LD;以及間隔層130,位於微結構層120的一側(例如下側),且包括多個主間隙物SMj及多個副間隙物SSd,其中各主間隙物SMj及各副間隙物SSd分別重疊至少一個(例如四個)虛設結構LD,且副間隙物SSd的高度H9小於主間隙物SMj的高度H8。另外,指紋感測裝置90還可以包括遮光層BM1、BM2、BM3、平坦層PL2、光學層OC以及色轉換層CT。FIG. 9A is a schematic partial top view of a
與如圖5A至圖5B所示的指紋感測裝置50相比,圖9A至圖9B所示的指紋感測裝置90的不同之處在於:指紋感測裝置90的間隔層130的主間隙物SMj及副間隙物SSd設置於第一基板SB1上而未覆蓋虛設結構LD,且主間隙物SMj可以抵頂虛設結構LD以保持穩定的間隔層130間距,副間隙物SSd可以輔助保持穩定的間距,同時提供指紋感測裝置90適當的按壓緩衝空間。Compared with the
圖10A是包括依照本發明一實施例的指紋感測裝置10’的顯示裝置100的上視示意圖。圖10B是沿圖10A的剖面線K-K’所作的剖面示意圖。顯示裝置100可以包括顯示面板DP以及指紋感測裝置10’,且顯示裝置100例如可以是具有指紋解鎖功能的手機。FIG. 10A is a schematic top view of a
請同時參照圖10A及圖10B,在本實施例中,指紋感測裝置10’可以具有感測區AA及周邊區PA,圖10A中的區域II位於感測區AA,且區域II的放大示意圖可以如圖8A所示。也就是說,指紋感測裝置10’的感測區AA可以具有如圖8B所示的結構,指紋感測裝置10’可以包括如圖8B所示的第一基板SB1、感測元件層110、遮光層BM1、平坦層PL2、遮光層BM2、平坦層PL3、遮光層BM3及微結構層120、間隔層130、光學層OC、色轉換層CT以及第二基板SB2。Please refer to FIG. 10A and FIG. 10B at the same time. In this embodiment, the fingerprint sensing device 10' may have a sensing area AA and a peripheral area PA. The area II in FIG. 10A is located in the sensing area AA, and the enlarged schematic view of the area II It can be shown in Figure 8A. That is to say, the sensing area AA of the fingerprint sensing device 10' may have a structure as shown in FIG. 8B, and the fingerprint sensing device 10' may include a first substrate SB1, a
另外,指紋感測裝置10’的周邊區PA的剖面示意圖可以如圖10B所示。在本實施例中,指紋感測裝置10’的間隔層130還可以包括位於周邊區PA的周邊間隙物SEa,同時微結構層120還可以包括位於周邊區PA的虛設結構LE,其中,虛設結構LE與微透鏡結構LM的形狀可以不同,且周邊間隙物SEa與虛設結構LE能夠相互抵頂,使得光學層OC或第二基板SB2與微透鏡結構LM之間能夠保持穩定的間距。In addition, a schematic cross-sectional view of the peripheral area PA of the fingerprint sensing device 10' can be shown in FIG. 10B . In this embodiment, the
在一些實施例中,指紋感測裝置10’可以是前述的指紋感測裝置10至指紋感測裝置90中的任一者。舉例而言,圖1A、圖2A、圖3A、圖4A、圖5A、圖6A、圖7A及圖9A可以是圖10A中的區域II的放大示意圖,且指紋感測裝置10’的周邊區PA可以具有如圖1B、圖2B、圖3B、圖4B、圖5B、圖6B、圖7B或圖9B所示的結構。In some embodiments, the fingerprint sensing device 10' can be any one of the aforementioned
在本實施例中,如圖10A所示,周邊間隙物SEa可以呈現單層矩形的上視輪廓,但不限於此。圖11A至圖11D分別是依照本發明一實施例的指紋感測裝置的周邊間隙物SEb、SEc、SEd、SEe的上視示意圖。在一些實施例中,如圖11A所示,周邊間隙物SEb可以呈現多層矩形的上視輪廓。在一些實施例中,如圖11B所示,周邊間隙物SEc可以呈現多層交錯的上視輪廓。在一些實施例中,如圖11C所示,周邊間隙物SEd可以呈現多圖形組合的上視輪廓。在一些實施例中,如圖11D所示,周邊間隙物SEe可以呈現網狀交織的上視輪廓。周邊間隙物SEa、SEb、SEc、SEd、SEe能夠增強指紋感測裝置的結構支撐性,藉以維持穩定的間隔層間距。In this embodiment, as shown in FIG. 10A , the peripheral spacer SEa may present a single-layer rectangular top-view profile, but it is not limited thereto. 11A to 11D are schematic top views of peripheral spacers SEb, SEc, SEd, and SEe of a fingerprint sensing device according to an embodiment of the present invention, respectively. In some embodiments, as shown in FIG. 11A , the perimeter spacer SEb may exhibit a multi-layer rectangular top-view profile. In some embodiments, as shown in FIG. 11B , the peripheral spacer SEc may present a top-view profile with multiple layers interlaced. In some embodiments, as shown in FIG. 11C , the peripheral spacer SEd may present a top-view outline of a combination of multiple figures. In some embodiments, as shown in FIG. 11D , the peripheral spacer SEe may present a mesh-like top-view profile. The peripheral spacers SEa, SEb, SEc, SEd, SEe can enhance the structural support of the fingerprint sensing device, so as to maintain a stable spacer layer spacing.
綜上所述,本發明的指紋感測裝置藉由設置主間隙物於虛設結構上,能夠避免微透鏡結構壓傷,同時使間隔層間距保持穩定,藉以穩定收光角度的調控與光學聚焦,從而提高指紋感測裝置的感測解析度。另外,本發明的指紋感測裝置藉由設置副間隙物能夠輔助保持穩定的間隔層間距,同時提供指紋感測裝置適當的按壓緩衝空間。此外,本發明的指紋感測裝置藉由設置對頂物能夠進一步增加間隔層的間距,進而提升光準直功效。To sum up, the fingerprint sensing device of the present invention can avoid the damage of the microlens structure by setting the main spacer on the dummy structure, and at the same time keep the distance between the spacer layers stable, thereby stabilizing the control of the receiving angle and optical focusing. Therefore, the sensing resolution of the fingerprint sensing device is improved. In addition, the fingerprint sensing device of the present invention can assist in maintaining a stable distance between the spacer layers by setting the auxiliary spacer, and at the same time provide a proper press buffer space for the fingerprint sensing device. In addition, the fingerprint sensing device of the present invention can further increase the distance between the spacer layers by setting the counter object, thereby improving the light collimation effect.
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed above with the embodiments, it is not intended to limit the present invention. Anyone with ordinary knowledge in the technical field may make some changes and modifications without departing from the spirit and scope of the present invention. The scope of protection of the present invention should be defined by the scope of the appended patent application.
10、10’、20、30、40、50、60、70、80、90:指紋感測裝置 110:感測元件層 112:感測元件 120:微結構層 130:間隔層 A-A’、B-B’、C-C’、D-D’、E-E’、F-F’、G-G’、H-H’、J-J’、K-K’:剖面線 AA:感測區 BM1、BM2、BM3:遮光層 BPa、BPb:對頂物 CH:半導體層 CT:色轉換層 D1、D2、D3:間距 DE:汲極 DP:顯示面板 E1、E2:電極 GE:閘極 GI:閘極絕緣層 GP:間隙 H1、H2、H3、H4、H5、H6、H7、H8、H9:高度 I、II:區域 LD、LE:虛設結構 IL:層間絕緣層 LM:微透鏡結構 O1、O2、O3:開口 OC:光學層 PA:周邊區 PL1、PL1a、PL1b、PL2、PL3:平坦層 SB1:第一基板 SB2:第二基板 SE:源極 SEa、SEb、SEc、SEd、SEe:周邊間隙物 SMa、SMb、SMc、SMd、SMe、SMf、SMg、SMh、SMj:主間隙物 SR:感測層 SSa、SSb、SSc、SSd:副間隙物 TR:開關元件 10, 10', 20, 30, 40, 50, 60, 70, 80, 90: fingerprint sensing device 110: sensing element layer 112: sensing element 120: microstructure layer 130: spacer layer A-A', BB', C-C', D-D', E-E', F-F', G-G', H-H', J-J', K-K': hatching AA: sensing area BM1, BM2, BM3: shading layer BPa, BPb: counterparts CH: semiconductor layer CT: color conversion layer D1, D2, D3: Spacing DE: drain DP: display panel E1, E2: electrodes GE: Gate GI: gate insulating layer GP: gap H1, H2, H3, H4, H5, H6, H7, H8, H9: Height I, II: area LD, LE: dummy structure IL: interlayer insulating layer LM: microlens structure O1, O2, O3: opening OC: optical layer PA: Peripheral Area PL1, PL1a, PL1b, PL2, PL3: Planarization layer SB1: first substrate SB2: second substrate SE: source SEa, SEb, SEc, SEd, SEe: peripheral spacers SMa, SMb, SMc, SMd, SMe, SMf, SMg, SMh, SMj: main spacers SR: sensing layer SSa, SSb, SSc, SSd: secondary spacers TR: switching element
圖1A是依照本發明一實施例的指紋感測裝置10的局部上視示意圖。
圖1B是沿圖1A的剖面線A-A’所作的剖面示意圖。
圖1C是圖1B的指紋感測裝置10的區域I的放大示意圖。
圖2A是依照本發明一實施例的指紋感測裝置20的局部上視示意圖。
圖2B是沿圖2A的剖面線B-B’所作的剖面示意圖。
圖3A是依照本發明一實施例的指紋感測裝置30的局部上視示意圖。
圖3B是沿圖3A的剖面線C-C’所作的剖面示意圖。
圖4A是依照本發明一實施例的指紋感測裝置40的局部上視示意圖。
圖4B是沿圖4A的剖面線D-D’所作的剖面示意圖。
圖5A是依照本發明一實施例的指紋感測裝置50的局部上視示意圖。
圖5B是沿圖5A的剖面線E-E’所作的剖面示意圖。
圖6A是依照本發明一實施例的指紋感測裝置60的局部上視示意圖。
圖6B是沿圖6A的剖面線F-F’所作的剖面示意圖。
圖7A是依照本發明一實施例的指紋感測裝置70的局部上視示意圖。
圖7B是沿圖7A的剖面線G-G’所作的剖面示意圖。
圖8A是依照本發明一實施例的指紋感測裝置80的局部上視示意圖。
圖8B是沿圖8A的剖面線H-H’所作的剖面示意圖。
圖9A是依照本發明一實施例的指紋感測裝置90的局部上視示意圖。
圖9B是沿圖9A的剖面線J-J’所作的剖面示意圖。
圖10A是包括依照本發明一實施例的指紋感測裝置10’的顯示裝置100的上視示意圖。
圖10B是沿圖10A的剖面線K-K’所作的剖面示意圖。
圖11A至圖11D分別是依照本發明一實施例的指紋感測裝置的周邊間隙物SEb、SEc、SEd、SEe的上視示意圖。
FIG. 1A is a schematic partial top view of a
10:指紋感測裝置 10: Fingerprint sensing device
110:感測元件層 110: sensing element layer
112:感測元件 112: sensing element
120:微結構層 120: microstructure layer
130:間隔層 130: spacer layer
BM1、BM2、BM3:遮光層 BM1, BM2, BM3: shading layer
GP:間隙 GP: gap
I:區域 I: area
LD:虛設結構 LD: dummy structure
LM:微透鏡結構 LM: microlens structure
O1、O2、O3:開口 O1, O2, O3: opening
PL1、PL2、PL3:平坦層 PL1, PL2, PL3: flat layer
SB1:第一基板 SB1: first substrate
SB2:第二基板 SB2: second substrate
SMa:主間隙物 SMa: main spacer
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