TW202122236A - Resin sealing device capable of accurately clamping substrates for resin sealing formation even if thicknesses of substrates are different - Google Patents

Resin sealing device capable of accurately clamping substrates for resin sealing formation even if thicknesses of substrates are different Download PDF

Info

Publication number
TW202122236A
TW202122236A TW109142155A TW109142155A TW202122236A TW 202122236 A TW202122236 A TW 202122236A TW 109142155 A TW109142155 A TW 109142155A TW 109142155 A TW109142155 A TW 109142155A TW 202122236 A TW202122236 A TW 202122236A
Authority
TW
Taiwan
Prior art keywords
mold
substrates
resin sealing
sealing device
thickness
Prior art date
Application number
TW109142155A
Other languages
Chinese (zh)
Other versions
TWI753678B (en
Inventor
石井正明
Original Assignee
日商朝日科技股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商朝日科技股份有限公司 filed Critical 日商朝日科技股份有限公司
Publication of TW202122236A publication Critical patent/TW202122236A/en
Application granted granted Critical
Publication of TWI753678B publication Critical patent/TWI753678B/en

Links

Images

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C45/00Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
    • B29C45/14Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles
    • B29C45/14639Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles for obtaining an insulating effect, e.g. for electrical components
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C45/00Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
    • B29C45/17Component parts, details or accessories; Auxiliary operations
    • B29C45/26Moulds
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C45/00Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
    • B29C45/17Component parts, details or accessories; Auxiliary operations
    • B29C45/26Moulds
    • B29C45/37Mould cavity walls, i.e. the inner surface forming the mould cavity, e.g. linings
    • B29C45/376Mould cavity walls, i.e. the inner surface forming the mould cavity, e.g. linings adjustable
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/56Encapsulations, e.g. encapsulation layers, coatings
    • H01L21/565Moulds
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C45/00Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
    • B29C45/17Component parts, details or accessories; Auxiliary operations
    • B29C45/26Moulds
    • B29C2045/2683Plurality of independent mould cavities in a single mould

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
  • Moulds For Moulding Plastics Or The Like (AREA)
  • Injection Moulding Of Plastics Or The Like (AREA)

Abstract

The invention provides a resin sealing device, which is capable of clamping a plurality of independent substrates, like FCBGA, on a mold to perform resin sealing formation and may accurately clamp for uniformly performing resin sealing formation even if the thickness of each substrate is different. The resin sealing device comprises: a lower mold 3 having a plurality of substrate carrying portions 31 provided for individually carrying the plurality of substrates; and a rod 32 penetrated through the lower mold along an up and down direction and abutted against each substrate carrying portion of the plurality of substrate carrying portions 31; a thickness measurement member for measuring individual thicknesses of the plurality of substrates; a mold rack 2 for supporting the lower mold 3 to be detached and mounted; and, an adjusting mechanism 23 for pressing the rod 32 by a pressing member 22 penetrating through the mold rack 2 in correspondence to individual thicknesses of the plurality of substrates measured by the thickness measurement member and for independently adjusting the heights of the plurality of substrate carrying portions 31.

Description

樹脂密封裝置Resin sealing device

本發明涉及一種對FCBGA(Flip Chip Ball Grid Array:倒裝晶片球柵格陣列)等獨立型基板進行樹脂密封的樹脂密封裝置。The invention relates to a resin sealing device for resin sealing an independent substrate such as FCBGA (Flip Chip Ball Grid Array).

半導體的樹脂密封成型中,對FCBGA等獨立型(一個基板對應一個產品(晶片數量為一個~多個))基板的樹脂密封成型的需求日益增長。由於該FCBGA基板是多層構造的基板,因此厚度比現有BGA(Ball Grid Array:球柵陣列)產品厚,而且由於是多層構造,因此基板厚度的尺寸偏差較大。而且,由於搭載於基板的晶片較大,發熱量也較多,因此還存有下述這樣的期望:想使晶片表面以暴露的狀態成型,在後面的工序中進行散熱器的安裝。 例如,專利文獻1公開了一種樹脂模制模具,該樹脂模制模具具有第1模具和第2模具,由該第1模具和第2模具夾持成型物件來進行樹脂模制,以能夠與搭載於成型物件的搭載零部件的厚度相應地準確地夾持搭載零部件來進行樹脂模制,在第1模具裝配有:第1嵌插構件,使該第1嵌插構件的端面與搭載於成型物件的搭載零部件相對,該第1嵌插構件沿模具開閉方向滑動;及推動構件,其沿模具開閉方向推動第1嵌插構件以調節該第1嵌插構件的在模具開閉方向上的位置,裝配於第1模具的多個推動構件具有:可動斜面板,其被驅動沿與成型物件的長度方向正交的方向進退;及固定斜面板,其以其斜面部與可動斜面板相對的方式配置,裝配於第2模具的推動構件具有:可動斜面板,其被驅動沿與成型物件的長度方向平行的方向進退;及固定斜面板,其以其斜面部與可動斜面板相對的方式配置。 該樹脂模制模具中,在對成型對象的基板的厚度和成型物件的搭載零部件的厚度進行測算之後,基於搭載零部件的厚度的測算結果,控制裝配於第1模具的推動構件,設定第1嵌插構件的在模具開閉方向上的位置,並基於基板的厚度的測算結果,控制裝配於第2模具的推動構件,設定第2嵌插構件的在模具開閉方向上的位置,進行樹脂模制。由此,也能夠存在成型物件的厚度存在偏差的情況或以暴露狀態成型。 [先前技術文獻] [專利文獻] 專利文獻1:日本特開2011-11426號公報In the resin sealing and molding of semiconductors, there is an increasing demand for resin sealing and molding of individual substrates such as FCBGA (one substrate corresponds to one product (the number of wafers is one or more)) substrates. Since the FCBGA substrate is a substrate with a multilayer structure, its thickness is thicker than that of conventional BGA (Ball Grid Array) products, and because of the multilayer structure, the dimensional deviation of the substrate thickness is large. In addition, since the wafer mounted on the substrate is large and generates a lot of heat, there is also a desire to mold the surface of the wafer in an exposed state, and install the heat sink in a subsequent process. For example, Patent Document 1 discloses a resin molding mold that has a first mold and a second mold, and the first mold and the second mold sandwich the molded article to perform resin molding so as to be compatible with the mounting According to the thickness of the mounted parts of the molded object, the mounted parts are accurately clamped to perform resin molding. The first mold is equipped with: a first insert member, so that the end surface of the first insert member is placed in the molding The mounting parts of the object are opposite, the first inserting member slides in the mold opening and closing direction; and a pushing member that pushes the first inserting member along the mold opening and closing direction to adjust the position of the first inserting member in the mold opening and closing direction , The multiple pushing members assembled in the first mold have: a movable inclined panel, which is driven to advance and retreat in a direction orthogonal to the longitudinal direction of the molded article; and a fixed inclined panel, with its inclined surface facing the movable inclined panel. The pushing member installed in the second mold has: a movable inclined panel, which is driven to advance and retreat in a direction parallel to the longitudinal direction of the molded article; and a fixed inclined panel, which is arranged such that its inclined surface faces the movable inclined panel. In this resin molding mold, after measuring the thickness of the substrate to be molded and the thickness of the mounted parts of the molded object, based on the measurement result of the thickness of the mounted parts, the pushing member assembled in the first mold is controlled to set the first 1 The position of the insert member in the mold opening and closing direction, and based on the measurement result of the thickness of the substrate, the pushing member assembled in the second mold is controlled, and the position of the second insert member in the mold opening and closing direction is set to perform resin molding. system. As a result, the thickness of the molded object may vary or it may be molded in an exposed state. [Prior Technical Literature] [Patent Literature] Patent Document 1: Japanese Patent Application Publication No. 2011-11426

[發明欲解決之課題] 上述現有的樹脂模制模具中,進行基板載置高度的調整的嵌插構件、推動構件等調整機構裝配在模具內,若是將現有的細條狀引線框或1塊對應多個半導體產品的兩塊基板載置於模具來統一進行成型的情況還好,但在對4塊~6塊等許多塊FCBGA等獨立型基板統一進行生產的情況下,要將與許多塊基板相對應的個數的調整機構內置於模具,該做法在空間上較難實現。 因此,本發明的目的在於,提供一種樹脂密封裝置,該樹脂密封裝置能夠將多塊FCBGA等獨立型基板夾持於模具來進行樹脂密封成型,在各基板的厚度存在偏差的情況下,該樹脂密封裝置也能夠準確地夾持來統一進行樹脂密封成型。 [解決課題之手段] 本發明的樹脂密封裝置具有:下模,該下模用於將多個基板夾持在該下模與上模之間,並通過向形成在該下模與上模之間的模腔內注入樹脂來進行樹脂密封成型,該下模具有供多個基板單獨地載置的多個基板載置部、及沿上下方向貫穿該下模且與多個基板載置部中的各基板載置部相抵接的桿;厚度測算部件,其測算多個基板各自的厚度;模架,其將下模支承為能夠拆裝;及調整機構,其與厚度測算部件所測得的多個基板各自的厚度相應地,利用貫穿模架的推壓構件對桿進行推壓,對多個基板載置部的高度單獨地進行調整。 採用本發明的樹脂密封裝置,在將單獨載置於下模的多個基板載置部上的多個基板夾持在該下模與上模之間時,能夠與厚度測算部件所測得的多個基板各自的厚度相應地,利用貫穿模架的推壓構件對桿進行推壓,對下模的多個基板載置部的高度單獨地進行調整,準確地夾持被載置於各基板載置部上的基板。 在此,優選的是,調整機構具有:升降構件,其使推壓構件升降,該升降構件在下部具有第1斜面;彈性構件,其向下方推壓升降構件;移動構件,其在上部具有與升降構件的第1斜面相對的第2斜面;滑動構件,其夾裝在第1斜面與第2斜面之間;及驅動部,其通過使移動構件前進、後退,借助第1斜面、滑動構件和第2斜面使升降構件升降。由此,由於在升降構件的第1斜面與移動構件的第2斜面之間夾裝有滑動構件,因此,在使移動構件前進、後退時滑動構件滑動,從而能夠使升降構件順利地升降。 優選的是,本發明的樹脂密封裝置中,在推壓構件的上端具有能夠拆裝的間隔構件。由此,能夠通過對間隔構件的更換或加工進行間隔構件的厚度調整,能夠進行推壓構件對基板載置部的均勻的推壓力的調整及傾斜度調整。 優選的是,本發明的樹脂密封裝置中,在多個基板載置部中的各基板載置部都設有多個桿,該樹脂密封裝置具有座板,該座板與多個前述桿的下表面相抵接以傳遞推壓構件的推壓力。由此,推壓構件的推壓力能夠經由座板均勻地傳遞給多個桿,能夠提高基板載置部的驅動精度。 優選的是,本發明的樹脂密封裝置具有控制部,該控制部利用厚度測算部件測算多個基板各自的厚度,並與厚度測算部件所測得的多個基板各自的厚度相應地,利用調整機構對多個基板載置部的高度單獨地進行調整,之後,暫時使上模和下模閉合,以夾持在分別載置於多個基板載置部上的多個基板上配設的脫模膜,在注入樹脂之後,進一步使上模和下模閉合,利用調整機構使多個基板載置部上升。由此,利用厚度測算部件測算多個基板各自的厚度,並與厚度測算部件所測得的多個基板各自的厚度相應地,利用調整機構對多個基板載置部的高度單獨地進行調整,之後,暫時使上模和下模閉合,以夾持在分別載置於多個基板載置部上的多個基板上配設的脫模膜,並注入樹脂,此時,因樹脂的注入壓力使得基板載置部稍微下沉,或使模具稍微打開,但通過進一步使上模和下模閉合,並利用調整機構使多個基板載置部上升,也能夠避免過度夾持脫模膜導致其損壞,能夠控制因夾持導致的損壞量。 [發明效果] (1)具有:下模,該下模用於將多個基板夾持在該下模與上模之間,並通過向形成在該下模與上模之間的模腔內注入樹脂來進行樹脂密封成型,該下模具有:供多個基板單獨地載置的多個基板載置部、及沿上下方向貫穿該下模且與多個基板載置部中的各基板載置部相抵接的桿;厚度測算部件,其測算多個基板各自的厚度;模架,其將下模支承為能夠拆裝;及調整機構,其與厚度測算部件所測得的多個基板各自的厚度相應地,利用貫穿模架的推壓構件對桿進行推壓,對多個基板載置部的高度單獨地進行調整,採用上述結構,在將單獨載置於下模的多個基板載置部上的多個基板夾持在該下模與上模之間時,通過與厚度測算部件所測得的多個基板各自的厚度相應地,利用貫穿模架的推壓構件對桿進行推壓,對下模的多個基板載置部的高度單獨地進行調整,能夠吸收載置於各基板載置部上的基板的厚度的偏差,能夠準確地進行夾持,統一進行樹脂密封成型。 (2)調整機構具有:升降構件,其使推壓構件升降,該升降構件在下部具有第1斜面;彈性構件,其向下方推壓升降構件;移動構件,其在上部具有與升降構件的第1斜面相對的第2斜面;滑動構件,其夾裝在第1斜面與第2斜面之間;及驅動部,其通過使移動構件前進、後退,借助第1斜面、滑動構件和第2斜面使升降構件升降,採用上述結構,在使移動構件前進、後退時滑動構件滑動,從而能夠使升降構件順利地升降,能夠高精度地調整基板載置部的高度。 (3)在推壓構件的上端具有能夠拆裝的間隔構件,採用上述結構,能夠通過對間隔構件的更換或加工來容易地進行間隔構件的厚度調整,能夠容易地進行推壓構件對基板載置部的均勻的推壓力的調整及傾斜度調整。 (4)在多個基板載置部中的各基板載置部都設有多個桿,且具有座板,該座板與多個前述桿的下表面相抵接以傳遞推壓構件的推壓力,採用上述結構,能夠提高基板載置部的驅動精度。 (5)具有控制部,該控制部利用厚度測算部件測算多個基板各自的厚度,並與厚度測算部件所測得的多個基板各自的厚度相應地,利用調整機構對多個基板載置部的高度單獨地進行調整,之後,暫時使上模和下模閉合,以夾持在分別載置於多個基板載置部上的多個基板上配設的脫模膜,在注入樹脂之後,進一步使上模和下模閉合,利用調整機構使多個基板載置部上升,採用上述結構,利用厚度測算部件測算多個基板各自的厚度,並與厚度測算部件所測得的多個基板各自的厚度相應地,利用調整機構對多個基板載置部的高度單獨地進行調整,之後,暫時使上模和下模閉合,以夾持在分別載置於多個基板載置部上的多個基板上配設的脫模膜,並注入樹脂,此時,因樹脂的注入壓力使得基板載置部稍微下沉,或使模具稍微打開,但通過進一步使上模和下模閉合,利用調整機構使多個基板載置部上升,也能夠避免過度夾持脫模膜導致其損壞,能夠控制因夾持導致的損壞量,能夠防止通氣孔的走形,防止樹脂洩漏,以及防止脫模膜的起皺。[The problem to be solved by the invention] In the above-mentioned existing resin molding molds, adjustment mechanisms such as inserting members and pushing members for adjusting the height of the substrate placement are assembled in the mold. If it is an existing thin lead frame or two pieces corresponding to multiple semiconductor products It’s fine if the substrates are placed in a mold for unified molding. However, in the case of unified production of many independent substrates such as FCBGA, such as 4 to 6, the number of substrates corresponding to the many substrates must be adjusted. The mechanism is built into the mold, which is difficult to achieve in space. Therefore, the object of the present invention is to provide a resin sealing device that can clamp a plurality of independent substrates such as FCBGA in a mold for resin sealing and molding. When the thickness of each substrate varies, the resin The sealing device can also be accurately clamped to collectively perform resin sealing and molding. [Means to solve the problem] The resin sealing device of the present invention has: a lower mold for clamping a plurality of substrates between the lower mold and the upper mold, and by injecting into a cavity formed between the lower mold and the upper mold Resin is used for resin sealing and molding, and the lower mold has a plurality of substrate placement portions for placing a plurality of substrates individually, and each of the plurality of substrate placement portions that penetrates the lower mold in the vertical direction and is connected to each of the plurality of substrate placement portions. Abutting rods; thickness measurement components, which measure the respective thicknesses of multiple substrates; mold bases, which support the lower mold so as to be detachable; and an adjustment mechanism, which and the thickness measurement components measure the respective thicknesses of the multiple substrates Correspondingly, the rod is pressed by the pressing member penetrating the mold base, and the heights of the plurality of substrate mounting portions are individually adjusted. With the resin sealing device of the present invention, when a plurality of substrates individually placed on the plurality of substrate placement portions of the lower mold are clamped between the lower mold and the upper mold, it can be compared with the thickness measured by the thickness measuring part. According to the thickness of each of the plurality of substrates, the rod is pushed by the pushing member penetrating the mold base, and the height of the plurality of substrate placement parts of the lower mold is individually adjusted to accurately clamp each substrate placed on it. The substrate on the mounting part. Here, it is preferable that the adjustment mechanism has: an elevating member that raises and lowers the pressing member, and the elevating member has a first inclined surface at the lower part; an elastic member that pushes the elevating member downward; and a moving member that has and The second inclined surface facing the first inclined surface of the lifting member; the sliding member, which is sandwiched between the first inclined surface and the second inclined surface; and the driving part, which advances and retreats the moving member by means of the first inclined surface, the sliding member and The second inclined surface raises and lowers the elevating member. As a result, since the sliding member is interposed between the first inclined surface of the lifting member and the second inclined surface of the moving member, the sliding member slides when the moving member is moved forward and backward, so that the lifting member can be smoothly raised and lowered. Preferably, in the resin sealing device of the present invention, a spacer member that can be detached and detached is provided at the upper end of the pressing member. Thereby, it is possible to adjust the thickness of the spacer member by replacing or processing the spacer member, and it is possible to adjust the uniform pressing force and the inclination of the substrate mounting portion by the pressing member. Preferably, in the resin sealing device of the present invention, each of the plurality of substrate mounting portions is provided with a plurality of rods, and the resin sealing device has a seat plate that is connected to the plurality of rods. The lower surface abuts to transmit the pressing force of the pressing member. Thereby, the pressing force of the pressing member can be uniformly transmitted to the plurality of rods via the seat plate, and the driving accuracy of the substrate mounting portion can be improved. Preferably, the resin sealing device of the present invention has a control unit that measures the thickness of each of the plurality of substrates using a thickness measurement component, and uses an adjustment mechanism in accordance with the thickness of each of the multiple substrates measured by the thickness measurement component. The heights of the multiple substrate placement sections are adjusted individually, and then the upper mold and the lower mold are temporarily closed to clamp the mold releases arranged on the multiple substrates respectively placed on the multiple substrate placement sections After the resin is injected into the film, the upper mold and the lower mold are further closed, and the plurality of substrate placement portions are raised by the adjustment mechanism. In this way, the thickness of each of the plurality of substrates is measured by the thickness measurement unit, and the height of the plurality of substrate placement portions is individually adjusted by the adjustment mechanism according to the thickness of each of the plurality of substrates measured by the thickness measurement unit. After that, the upper mold and the lower mold are temporarily closed to clamp the release films arranged on the plurality of substrates respectively placed on the plurality of substrate placement parts, and the resin is injected. At this time, due to the injection pressure of the resin Make the substrate placement part sink slightly, or make the mold slightly open, but by further closing the upper mold and the lower mold, and using the adjustment mechanism to raise the plurality of substrate placement parts, it is also possible to avoid excessive clamping of the release film. Damage, can control the amount of damage caused by clamping. [Effects of the invention] (1) Having: a lower mold for clamping a plurality of substrates between the lower mold and the upper mold, and by injecting resin into a cavity formed between the lower mold and the upper mold Resin sealing molding, the lower mold has: a plurality of substrate placement portions for individually placing a plurality of substrates, and a vertical direction penetrating the lower mold and abutting each of the plurality of substrate placement portions The thickness measurement component, which measures the thickness of each of the multiple substrates; the mold base, which supports the lower mold to be detachable; and the adjustment mechanism, which corresponds to the thickness of each of the multiple substrates measured by the thickness measurement component , The rod is pressed by the pressing member penetrating the mold base to individually adjust the height of the multiple substrate placement parts. With the above structure, the multiple substrate placement parts that are individually placed on the lower mold When a plurality of substrates are clamped between the lower mold and the upper mold, according to the thickness of each of the plurality of substrates measured by the thickness measuring part, the rod is pressed by the pressing member penetrating the mold base, and the lower The heights of the plurality of substrate mounting portions of the mold can be adjusted individually to absorb variations in the thickness of the substrates mounted on the respective substrate mounting portions, to accurately clamp, and to perform resin sealing molding in a unified manner. (2) The adjustment mechanism has: an elevating member that raises and lowers the pressing member, and the elevating member has a first inclined surface at the lower part; an elastic member that pushes the elevating member downward; and a moving member that has a first inclined surface on the upper part of the elevating member. 1 the second inclined surface facing the inclined surface; the sliding member, which is sandwiched between the first inclined surface and the second inclined surface; and the driving part, which advances and retreats the moving member, with the aid of the first inclined surface, the sliding member, and the second inclined surface. The elevating member is raised and lowered. With the above-mentioned structure, the sliding member slides when the moving member is moved forward and backward, so that the elevating member can be smoothly raised and lowered, and the height of the substrate placement portion can be adjusted with high precision. (3) There is a removable spacer at the upper end of the pressing member. With the above structure, the thickness of the spacer can be easily adjusted by replacing or processing the spacer, and the pressing member can be easily loaded on the substrate. Adjustment of uniform pressing force and tilt adjustment of the placement part. (4) Each of the plurality of substrate placement portions is provided with a plurality of rods and has a seat plate that abuts on the lower surfaces of the plurality of rods to transmit the pressing force of the pressing member With the above structure, it is possible to improve the driving accuracy of the substrate mounting portion. (5) It has a control unit that uses a thickness measuring component to measure the thickness of each of the plurality of substrates, and uses an adjustment mechanism to adjust the thickness of each of the plurality of substrates according to the thickness of each of the plurality of substrates measured by the thickness measuring component. The height of the dies is adjusted individually, and then the upper mold and the lower mold are temporarily closed to clamp the release films arranged on the plurality of substrates respectively placed on the plurality of substrate placement parts. After the resin is injected, The upper mold and the lower mold are further closed, and the plurality of substrate placement parts are raised by the adjusting mechanism. With the above structure, the thickness of each of the plurality of substrates is measured by the thickness measuring component, and the thickness of each of the plurality of substrates measured by the thickness measuring component is calculated. According to the thickness of the substrate, the heights of the multiple substrate placement sections are individually adjusted by the adjustment mechanism. After that, the upper mold and the lower mold are temporarily closed to clamp the multiple substrate placement sections that are respectively placed on the multiple substrate placement sections. The release film is placed on the substrate and the resin is injected. At this time, the substrate placement part is slightly sunk due to the injection pressure of the resin, or the mold is slightly opened. However, by further closing the upper mold and the lower mold, the adjustment The mechanism raises the multiple substrate placement parts, which can also prevent the release film from being damaged by excessive clamping, control the amount of damage caused by clamping, prevent the vent from being out of shape, prevent resin leakage, and prevent the release film Wrinkling.

圖1是表示本發明的實施方式的樹脂密封裝置的下模部分的概略結構的縱剖視圖,圖2是表示圖1的將下模拆卸下來的狀態的圖,圖3是圖1的俯視圖,圖4是表示厚度測算部件的配置的說明圖。 如圖1和圖2所示,本發明的實施方式的樹脂密封裝置在模壓部1上具有模架2。模架2將下模3支承為能夠拆裝。下模3用於將多個基板6夾持在該下模3與上模5(參照圖6)之間,並向形成在該下模3與上模5之間的模腔51(參照圖3)注入樹脂來進行樹脂密封成型。 另外,圖3中,用單點劃線圖示形成在上模5與下模3之間的模腔51的位置以及形成在上模5的冷料井57、流道58、澆口59和通氣孔60的位置。在模腔51收容已安裝於基板6的半導體晶片7(參照圖6和圖7)。冷料井57、流道58和澆口59是與模腔51相連通的樹脂路徑。通氣孔60是形成在隔著模腔51與澆口59所在側相反的那側的排氣路徑。 而且,本實施方式的樹脂密封裝置具有用於測算多個基板6各自的厚度的厚度測算部件4(參照圖4)。厚度測算部件4能夠由例如一對鐳射位移感測器4A、4B構成,該一對鐳射位移感測器4A、4B以將基板6夾在它們之間的方式上下地配置。厚度測算部件4通過分別利用鐳射位移感測器4A、4B檢測基板6的上表面和下表面的位置來測算基板6的厚度。厚度測算部件4由控制部10控制。 下模3具有:多個基板載置部31,多個基板6單獨地載置於該多個基板載置部31;及桿32,其沿上下方向貫穿下模3,且分別與多個基板載置部31相抵接。針對多個基板載置部31中的各基板載置部31配備多個桿32。而且,在與各基板載置部31相抵接的多個桿32的下表面設有多個座板33。 座板33始終被彈性構件34向下方推壓,座板33抗衡彈性構件34,按照因推壓構件22上升而被抬起的量來上升。另一方面,在推壓構件22下降時,座板33被彈性構件34推壓而下降。針對多個基板載置部31中的每個基板載置部31都設有座板33,座板33與多個基板載置部31各自的桿32的下表面相抵接,將後述的推壓構件22的推壓力經由桿32傳遞給各基板載置部31。 模架2具有:模具保持部21,其保持下模3;推壓構件22,其貫穿模架2,對桿32進行推壓;及調整機構23,其與由厚度測算部件4測得的多個基板6各自的厚度相應地,利用推壓構件22對桿32進行推壓,對多個基板載置部31的高度單獨地進行調整。推壓構件22借助模具保持部21中的下模3的多個座板33對桿32進行推壓。而且,在推壓構件22的上端具有能夠拆裝的間隔構件22A。 調整機構23針對每個基板載置部31都具有:升降構件24,其使推壓構件22升降;彈性構件25,其向下方推壓升降構件24;移動構件26,其通過前進、後退使升降構件24升降;及驅動部27,其使移動構件26前進、後退。升降構件24在下表面具有第1斜面24A。移動構件26在底座30上沿水準方向移動。而且,移動構件26在上部具有與升降構件24的第1斜面24A相對的第2斜面26A。在第1斜面24A與第2斜面26A之間夾裝有作為滑動構件的輥28。在移動構件26與底座30之間夾裝有作為滑動構件的輥29。 調整機構23通過利用驅動部27使移動構件26前進、後退,從而借助第1斜面24A、輥28和第2斜面26A使升降構件24升降。此時,升降構件24始終被彈性構件25向下方推壓,升降構件24抗衡彈性構件25,按照因移動構件26前進而被抬起的量來上升。另一方面,在移動構件26後退時,升降構件24被彈性構件25推壓而下降。調整機構23由控制部10控制。 上述結構的樹脂密封裝置中,控制部10利用厚度測算部件4測算分別載置於各基板載置部31的基板6的厚度,並與由厚度測算部件4測得的多個基板6各自的厚度相應地,利用調整機構23單獨調整各基板載置部31的高度。由此,例如在像圖5所示那樣地將厚度不同的較厚的基板6A和較薄的基板6B搭載於一個下模3的基板載置部31上的情況下,也能夠與各基板6A、6B的厚度相應地利用推壓構件22對桿32進行推壓,能夠單獨調整基板載置部31的高度。 之後,像圖6所示的那樣,將各基板6載置於各基板載置部31上,向下模3的容器35中倒入樹脂36,之後,在分別載置於多個基板載置部31上的多個基板6上配設脫模膜11,並像圖7所示的那樣,暫時使上模5和下模3閉合以進行夾持。然後,使推桿37上升,將樹脂36從容器35經由冷料井57、流道58和澆口59注入到模腔51內。 在該樹脂注入時,因樹脂36的注入壓力使得基板載置部31稍微下沉,或使上模5和下模3之間稍微打開(0.02mm~ 0.03mm左右),因此,控制部10進一步使上模5和下模3閉合,利用調整機構23使各基板載置部31上升。由此,如圖8所示,能夠避免過度夾持脫模膜11導致其損壞,能夠控制因夾持導致的損壞量,能夠防止通氣孔60的走形,防止樹脂洩漏,以及防止脫模膜11的起皺。 如上,本實施方式的樹脂密封裝置中,在將單獨載置於下模3的多個基板載置部31上的多個基板6夾持在該下模3與上模5之間時,通過與由厚度測算部件4測得的多個基板6各自的厚度相應地,利用貫穿模架2的推壓構件22對桿32進行推壓,對下模3的多個基板載置部31的高度單獨地進行調整,能夠吸收載置於各基板載置部31上的基板6的厚度的偏差,能夠準確地進行夾持,對多個基板6統一進行樹脂密封成型。 因而,在基板6為FCBGA等大型獨立型的多層構造基板,厚度比現有BGA產品厚,且基板厚度的偏差較大的情況下,也能夠提高樹脂密封成型的生產效率。而且,該樹脂密封裝置中,能夠像圖2所示那樣地將下模3從模架2拆卸下來進行更換,因此,通過僅更換模具就能夠實現對其他種類的產品的生產,針對多種類生產也能夠實現降低成本。 而且,本實施方式的樹脂密封裝置中,在升降構件24的第1斜面24A與移動構件26的第2斜面26A之間夾裝有作為滑動構件的輥28,在使移動構件26前進、後退時該輥28滑動,從而能夠使升降構件24順利地升降,能夠高精度地調整基板載置部31的高度。 而且,在本實施方式的推壓構件22的上端具有能夠拆裝的間隔構件22A,因此,能夠通過對該間隔構件22A的更換或加工來容易地進行間隔構件22A的厚度調整,能夠容易地進行推壓構件22對基板載置部31的均勻的推壓力的調整及傾斜度調整。 而且,本實施方式的樹脂密封裝置中,為這樣的構造:在多個基板載置部31中的各基板載置部31都設有多個桿32,且具有座板33,該座板33與該多個桿32的下表面相抵接以傳遞推壓構件22的推壓力,因此,推壓構件22的推壓力能夠經由座板33均勻地傳遞給多個桿32,能夠提高基板載置部31的驅動精度。 另外,還能夠做成這樣的結構:如圖9所示,在推壓構件22的上端部還設有推壓板22B,借助該推壓板22B對座板33進行推壓。由此,推壓板22B的上表面與基板載置部31的下表面平行,推壓構件22的推壓力能夠均勻地傳遞給基板載置部31。 而且,本實施方式的樹脂密封裝置中,如圖6所示,能夠使上模5的各模腔51的底面構件52升降。該底面構件52的升降機構具有:多個桿53,它們沿上下方向貫穿上模5,且與各模腔51的底面構件52相抵接;座板54,其與桿53的上表面相抵接;彈性構件55,其向上方推壓座板54;及推壓構件56,其借助座板54對桿53進行推壓。在推壓構件56的下端具有能夠拆裝的間隔構件56A。 座板54始終被彈性構件55向上方推壓,座板54抗衡彈性構件55,按照因推壓構件56下降而被按下的量下降。另一方面,在推壓構件56上升時,座板54被彈性構件55推壓而上升。針對每個模腔51都設有座板54,座板54將推壓構件56的推壓力經由桿53傳遞給底面構件52。 圖10表示上模5的模腔51的底面構件52處於後退位置時的狀態。通過單獨使各模腔51的推壓構件56從該後退位置下降,能夠使底面構件52下降至各模腔51的、在圖11中示出的成型位置,進行樹脂密封成型。而且,通過像圖12所示那樣地使推壓構件56下降,將底面構件52向安裝於基板6的半導體晶片7的表面推壓,還能夠以晶片表面暴露的狀態進行成型。 [產業上的可利用性] 本發明的樹脂密封裝置作為對FCBGA(Flip Chip Ball Grid Array)等獨立型基板進行樹脂密封的樹脂密封裝置較為有用,特別是優選作為在各基板的厚度存在偏差的情況下也能夠準確地夾持來統一進行樹脂密封成型的樹脂密封裝置。1 is a longitudinal cross-sectional view showing a schematic structure of a lower mold part of a resin sealing device according to an embodiment of the present invention, FIG. 2 is a diagram showing a state in which the lower mold of FIG. 1 is removed, and FIG. 3 is a plan view of FIG. 4 is an explanatory diagram showing the arrangement of thickness measurement components. As shown in FIGS. 1 and 2, the resin sealing device according to the embodiment of the present invention has a mold base 2 on the mold part 1. The mold base 2 supports the lower mold 3 so as to be detachable. The lower mold 3 is used to clamp a plurality of substrates 6 between the lower mold 3 and the upper mold 5 (refer to FIG. 6), and to a cavity 51 formed between the lower mold 3 and the upper mold 5 (refer to FIG. 3) Inject resin to perform resin sealing molding. In addition, in FIG. 3, the position of the cavity 51 formed between the upper mold 5 and the lower mold 3, as well as the cold slug 57, runners 58, and gate 59 formed in the upper mold 5 are illustrated by single-dot chain lines. The location of the vent 60. The semiconductor wafer 7 mounted on the substrate 6 is accommodated in the cavity 51 (refer to FIGS. 6 and 7). The cold slug well 57, the runner 58 and the gate 59 are resin paths that communicate with the cavity 51. The vent hole 60 is an exhaust path formed on the side opposite to the side where the gate 59 is located with the cavity 51 interposed therebetween. Furthermore, the resin sealing apparatus of this embodiment has the thickness measuring member 4 (refer FIG. 4) for measuring the thickness of each of the several board|substrate 6. The thickness measurement member 4 can be constituted by, for example, a pair of laser displacement sensors 4A and 4B, which are arranged vertically so as to sandwich the substrate 6 therebetween. The thickness measurement unit 4 measures the thickness of the substrate 6 by detecting the positions of the upper surface and the lower surface of the substrate 6 by using laser displacement sensors 4A and 4B, respectively. The thickness measurement component 4 is controlled by the control unit 10. The lower mold 3 has: a plurality of substrate placing portions 31 on which the plurality of substrates 6 are individually placed; and a rod 32 which penetrates the lower mold 3 in the vertical direction and is connected to the plurality of substrates. The placing portion 31 abuts against each other. A plurality of rods 32 are provided for each of the plurality of substrate placement sections 31. In addition, a plurality of seat plates 33 are provided on the lower surfaces of the plurality of rods 32 that abut each substrate mounting portion 31. The seat plate 33 is always pushed downward by the elastic member 34, and the seat plate 33 counteracts the elastic member 34 and rises by the amount lifted by the pushing member 22 ascending. On the other hand, when the pressing member 22 descends, the seat plate 33 is pressed by the elastic member 34 to descend. A seat plate 33 is provided for each of the substrate placing sections 31 of the plurality of substrate placing sections 31, and the seat plate 33 abuts against the lower surface of the rod 32 of each of the plurality of substrate placing sections 31, and presses it as described later. The pressing force of the member 22 is transmitted to each substrate mounting portion 31 via the rod 32. The mold base 2 has: a mold holding portion 21 that holds the lower mold 3; a pressing member 22 that penetrates the mold base 2 to push the rod 32; and an adjustment mechanism 23 that is more than the thickness measured by the thickness measurement unit 4. According to the thickness of each substrate 6, the rod 32 is pressed by the pressing member 22, and the heights of the plurality of substrate mounting portions 31 are individually adjusted. The pressing member 22 presses the rod 32 via the plurality of seat plates 33 of the lower mold 3 in the mold holding portion 21. Furthermore, at the upper end of the pressing member 22, there is a spacer member 22A that can be detached and detached. The adjustment mechanism 23 has, for each substrate placement portion 31, an elevating member 24, which raises and lowers the pressing member 22; an elastic member 25, which pushes the elevating member 24 downward; and a moving member 26, which raises and lowers by advancing and retreating. The member 24 is raised and lowered; and the driving part 27 which causes the moving member 26 to advance and retreat. The lifting member 24 has a first inclined surface 24A on the lower surface. The moving member 26 moves in the horizontal direction on the base 30. In addition, the moving member 26 has a second inclined surface 26A opposed to the first inclined surface 24A of the lifting member 24 on the upper portion. A roller 28 as a sliding member is interposed between the first inclined surface 24A and the second inclined surface 26A. A roller 29 as a sliding member is interposed between the moving member 26 and the base 30. The adjustment mechanism 23 advances and retreats the moving member 26 by the drive part 27, so that the elevating member 24 is raised and lowered via the first inclined surface 24A, the roller 28, and the second inclined surface 26A. At this time, the elevating member 24 is always pushed downward by the elastic member 25, and the elevating member 24 counterbalances the elastic member 25, and rises by the amount lifted by the moving member 26 advancing. On the other hand, when the moving member 26 retreats, the elevating member 24 is pushed by the elastic member 25 to descend. The adjustment mechanism 23 is controlled by the control unit 10. In the resin sealing device of the above-mentioned structure, the control unit 10 uses the thickness measuring unit 4 to measure the thickness of the substrates 6 respectively placed on the respective substrate mounting portions 31, and compares the thickness of each of the plurality of substrates 6 measured by the thickness measuring unit 4 Accordingly, the height of each substrate mounting portion 31 is individually adjusted by the adjustment mechanism 23. Thus, for example, when a thicker substrate 6A and a thinner substrate 6B having different thicknesses are mounted on the substrate mounting portion 31 of one lower mold 3 as shown in FIG. 5, they can be combined with each substrate 6A. According to the thickness of 6B, the rod 32 is pressed by the pressing member 22, and the height of the substrate mounting portion 31 can be adjusted individually. After that, as shown in FIG. 6, each substrate 6 is placed on each substrate placement portion 31, and resin 36 is poured into the container 35 of the lower mold 3, and then placed on a plurality of substrate placement sections. The mold release film 11 is arrange|positioned on the several board|substrate 6 on the part 31, and as shown in FIG. 7, the upper mold|type 5 and the lower mold|type 3 are temporarily closed and clamped. Then, the push rod 37 is raised, and the resin 36 is injected from the container 35 into the cavity 51 through the cold slug 57, the runner 58 and the gate 59. When the resin is injected, the substrate mounting portion 31 is slightly sunk due to the injection pressure of the resin 36, or the gap between the upper mold 5 and the lower mold 3 is slightly opened (about 0.02 mm to 0.03 mm), so the control unit 10 further The upper mold 5 and the lower mold 3 are closed, and each substrate mounting portion 31 is raised by the adjustment mechanism 23. As a result, as shown in FIG. 8, it is possible to prevent the release film 11 from being damaged by excessive clamping, to control the amount of damage due to clamping, to prevent the vent hole 60 from being out of shape, to prevent resin leakage, and to prevent the release film 11's wrinkling. As described above, in the resin sealing device of this embodiment, when the plurality of substrates 6 individually placed on the plurality of substrate placement portions 31 of the lower mold 3 are sandwiched between the lower mold 3 and the upper mold 5, Corresponding to the thickness of each of the plurality of substrates 6 measured by the thickness measurement unit 4, the rod 32 is pushed by the pushing member 22 penetrating through the mold base 2, and the height of the plurality of substrate placement portions 31 of the lower mold 3 Individual adjustments can absorb variations in the thickness of the substrates 6 placed on the respective substrate placement portions 31, can accurately clamp, and collectively perform resin sealing and molding of a plurality of substrates 6. Therefore, even when the substrate 6 is a large independent multilayer structure substrate such as FCBGA, which is thicker than conventional BGA products, and the substrate thickness varies greatly, the production efficiency of resin sealing molding can be improved. Moreover, in this resin sealing device, the lower mold 3 can be detached from the mold base 2 for replacement as shown in FIG. 2. Therefore, the production of other types of products can be achieved by only replacing the mold, and is suitable for various types of production. It is also possible to reduce costs. Furthermore, in the resin sealing device of this embodiment, a roller 28 as a sliding member is interposed between the first inclined surface 24A of the lifting member 24 and the second inclined surface 26A of the moving member 26, and when the moving member 26 is moved forward and backward, This roller 28 slides, so that the lifting member 24 can be smoothly raised and lowered, and the height of the substrate mounting portion 31 can be adjusted with high precision. Furthermore, the upper end of the pressing member 22 of the present embodiment has a detachable spacer member 22A. Therefore, the thickness adjustment of the spacer member 22A can be easily performed by replacing or processing the spacer member 22A. The pressing member 22 adjusts the uniform pressing force and the inclination of the substrate mounting portion 31. Furthermore, in the resin sealing device of this embodiment, the structure is such that each of the plurality of substrate placement portions 31 is provided with a plurality of rods 32, and has a seat plate 33. Abuts against the lower surface of the plurality of rods 32 to transmit the pressing force of the pressing member 22. Therefore, the pressing force of the pressing member 22 can be uniformly transmitted to the plurality of rods 32 via the seat plate 33, and the substrate placement portion can be improved. 31 driving accuracy. In addition, it is also possible to have a structure in which, as shown in FIG. 9, a pressing plate 22B is further provided at the upper end of the pressing member 22, and the seat plate 33 is pressed by the pressing plate 22B. Thereby, the upper surface of the pressing plate 22B is parallel to the lower surface of the substrate mounting portion 31, and the pressing force of the pressing member 22 can be uniformly transmitted to the substrate mounting portion 31. Furthermore, in the resin sealing device of the present embodiment, as shown in FIG. 6, the bottom surface member 52 of each cavity 51 of the upper mold 5 can be raised and lowered. The lifting mechanism of the bottom surface member 52 has: a plurality of rods 53 which penetrate the upper mold 5 in the up and down direction and abut against the bottom surface member 52 of each mold cavity 51; and a seat plate 54 which abuts against the upper surface of the rod 53; The elastic member 55 pushes the seat plate 54 upward, and the pressing member 56 pushes the rod 53 via the seat plate 54. At the lower end of the pressing member 56, there is a spacer member 56A that can be attached and detached. The seat plate 54 is always pushed upward by the elastic member 55, and the seat plate 54 counteracts the elastic member 55, and is lowered by the amount of the pressing member 56 being pushed down due to the lowering of the pressing member 56. On the other hand, when the pressing member 56 ascends, the seat plate 54 is pressed by the elastic member 55 and ascends. A seat plate 54 is provided for each cavity 51, and the seat plate 54 transmits the pressing force of the pressing member 56 to the bottom surface member 52 via the rod 53. FIG. 10 shows a state when the bottom surface member 52 of the cavity 51 of the upper mold 5 is in the retracted position. By individually lowering the pressing member 56 of each cavity 51 from the retracted position, the bottom surface member 52 can be lowered to the molding position shown in FIG. 11 of each cavity 51 to perform resin sealing molding. Furthermore, by lowering the pressing member 56 as shown in FIG. 12, the bottom surface member 52 is pressed against the surface of the semiconductor wafer 7 mounted on the substrate 6, and molding can also be performed with the surface of the wafer exposed. [Industrial availability] The resin sealing device of the present invention is useful as a resin sealing device for resin-sealing independent substrates such as FCBGA (Flip Chip Ball Grid Array), and is particularly preferable as a resin sealing device that can accurately clamp even when the thickness of each substrate varies. This is a resin sealing device that performs resin sealing and molding in a unified way.

1:模壓部 2:模架 3:下模 4:厚度測算部件 4A:鐳射位移感測器 5:上模 6,6A,6B:基板 7:半導體晶片 10:控制部 11:脫模膜 21:模具保持部 22:推壓構件 22A:間隔構件 22B:推壓板 23:調整機構 24:升降構件 25:彈性構件 26:移動構件 27:驅動部 28,29:輥 30:底座 31:基板載置部 32:桿 33:座板 34:彈性構件 35:容器 36:樹脂 37:推桿 51:模腔 52:底面構件 53:桿 54:座板 55:彈性構件 56:推壓構件 56A:間隔構件 57:冷料井 58:流道 59:澆口 60:通氣孔1: Molding department 2: formwork 3: Lower die 4: Thickness measurement parts 4A: Laser displacement sensor 5: Upper die 6, 6A, 6B: substrate 7: Semiconductor wafer 10: Control Department 11: Release film 21: Mold holding part 22: Pushing member 22A: Spacer 22B: Push plate 23: Adjust the organization 24: Lifting member 25: Elastic member 26: Moving components 27: Drive 28, 29: Roll 30: base 31: Board placement section 32: Rod 33: seat plate 34: Elastic member 35: container 36: resin 37: putter 51: Mould cavity 52: Bottom surface member 53: Rod 54: seat plate 55: Elastic member 56: Pushing member 56A: Spacer 57: cold slug well 58: runner 59: Gate 60: Vent

[圖1]是表示本發明的實施方式的樹脂密封裝置的下模部分的概略結構的縱剖視圖。 [圖2]是表示圖1的將下模拆卸下來的狀態的圖。 [圖3]是圖1的俯視圖。 [圖4]是表示厚度測算部件的配置的說明圖。 [圖5]是表示針對厚度不同的基板調整基板載置部的高度的狀態的說明圖。 [圖6]是表示將模具打開的狀態的說明圖。 [圖7]是表示使模具閉合的狀態的說明圖。 [圖8]是表示在夾持有脫模膜的狀態下的通氣孔的情形的說明圖。 [圖9]是表示在推壓構件的上端部還設有推壓板的形態的說明圖。 [圖10]是表示上模的模腔的底面構件處於後退位置時的狀態的說明圖。 [圖11]是表示上模的模腔的底面構件處於成型位置時的狀態的說明圖。 [圖12]是表示上模的模腔的底面構件處於推壓半導體晶片的表面的狀態時的情形的說明圖。[Fig. 1] Fig. 1 is a longitudinal cross-sectional view showing a schematic structure of a lower mold portion of a resin sealing device according to an embodiment of the present invention. [Fig. 2] is a diagram showing a state in which the lower mold of Fig. 1 is removed. [Fig. 3] is a plan view of Fig. 1. [Fig. 4] is an explanatory diagram showing the arrangement of thickness measurement components. [Fig. 5] Fig. 5 is an explanatory diagram showing a state in which the height of the substrate mounting portion is adjusted for substrates with different thicknesses. [Fig. 6] is an explanatory diagram showing a state in which the mold is opened. [Fig. 7] is an explanatory diagram showing a state where the mold is closed. Fig. 8 is an explanatory diagram showing the state of the vent hole in a state where the release film is sandwiched. Fig. 9 is an explanatory diagram showing a form in which a pressing plate is further provided at the upper end of the pressing member. [Fig. 10] is an explanatory view showing a state when the bottom surface member of the cavity of the upper mold is in the retracted position. Fig. 11 is an explanatory diagram showing a state when the bottom surface member of the cavity of the upper mold is in the molding position. [Fig. 12] Fig. 12 is an explanatory diagram showing a state where the bottom surface member of the cavity of the upper mold is in a state of pressing the surface of the semiconductor wafer.

1:模壓部 1: Molding department

2:模架 2: formwork

3:下模 3: Lower die

10:控制部 10: Control Department

21:模具保持部 21: Mold holding part

22:推壓構件 22: Pushing member

22A:間隔構件 22A: Spacer

23:調整機構 23: Adjust the organization

24:升降構件 24: Lifting member

24A:第1斜面 24A: 1st slope

25:彈性構件 25: Elastic member

26:移動構件 26: Moving components

26A:第2斜面 26A: 2nd slope

27:驅動部 27: Drive

28,29:輥 28, 29: Roll

30:底座 30: base

31:基板載置部 31: Board placement section

32:桿 32: Rod

33:座板 33: seat plate

34:彈性構件 34: Elastic member

Claims (5)

一種樹脂密封裝置,其中, 該樹脂密封裝置具有: 下模,該下模用於將多個基板夾持在該下模與上模之間,並通過向形成在該下模與前述上模之間的模腔內注入樹脂來進行樹脂密封成型,該下模具有供前述多個基板單獨地載置的多個基板載置部、及沿上下方向貫穿該下模且與前述多個基板載置部中的各基板載置部相抵接的桿; 厚度測算部件,其測算前述多個基板各自的厚度; 模架,其將前述下模支承為能夠拆裝;及 調整機構,其與前述厚度測算部件所測得的前述多個基板各自的厚度相應地,利用貫穿前述模架的推壓構件對前述桿進行推壓,對前述多個基板載置部的高度單獨地進行調整。A resin sealing device, in which, The resin sealing device has: The lower mold is used to clamp a plurality of substrates between the lower mold and the upper mold, and perform resin sealing molding by injecting resin into a cavity formed between the lower mold and the aforementioned upper mold, The lower mold has a plurality of substrate placement portions for individually placing the plurality of substrates, and a rod that penetrates the lower mold in the vertical direction and abuts each of the plurality of substrate placement portions; A thickness measurement component, which measures the thickness of each of the aforementioned multiple substrates; A mold base, which supports the aforementioned lower mold so as to be detachable; and An adjustment mechanism, which corresponds to the thickness of each of the plurality of substrates measured by the thickness measurement unit, presses the rod with a pressing member penetrating the mold base, and separates the heights of the plurality of substrate placement portions Make adjustments accordingly. 如請求項1的樹脂密封裝置,其中, 前述調整機構具有:升降構件,其使前述推壓構件升降,該升降構件在下部具有第1斜面;彈性構件,其向下方推壓前述升降構件;移動構件,其在上部具有與前述升降構件的第1斜面相對的第2斜面;滑動構件,其夾裝在前述第1斜面與前述第2斜面之間;及驅動部,其通過使前述移動構件前進、後退,借助前述第1斜面、前述滑動構件和前述第2斜面使前述升降構件升降。Such as the resin sealing device of claim 1, wherein The adjustment mechanism includes: an elevating member that raises and lowers the pressing member, the elevating member has a first inclined surface at the lower part; an elastic member that pushes the elevating member downward; and a moving member that has an upper part that is compatible with the elevating member A second inclined surface facing the first inclined surface; a sliding member interposed between the first inclined surface and the second inclined surface; and a driving part that advances and retreats the moving member by means of the first inclined surface and the sliding The member and the second inclined surface raise and lower the lifting member. 如請求項1或2的樹脂密封裝置,其中, 在前述推壓構件的上端具有能夠拆裝的間隔構件。Such as the resin sealing device of claim 1 or 2, in which, At the upper end of the pressing member, there is a spacer member that can be detached and detached. 如請求項1或2的樹脂密封裝置,其中, 在前述多個基板載置部中的各基板載置部都設有多個前述桿, 該樹脂密封裝置具有座板,該座板與多個前述桿的下表面相抵接以傳遞前述推壓構件的推壓力。Such as the resin sealing device of claim 1 or 2, in which, Each of the plurality of substrate placement portions is provided with a plurality of the aforementioned rods, The resin sealing device has a seat plate that abuts the lower surfaces of the plurality of rods to transmit the pressing force of the pressing member. 如請求項1或2的樹脂密封裝置,其中, 該樹脂密封裝置具有控制部,該控制部利用前述厚度測算部件測算前述多個基板各自的厚度,並與前述厚度測算部件所測得的前述多個基板各自的厚度相應地,利用前述調整機構對前述多個基板載置部的高度單獨地進行調整,之後,暫時使前述上模和前述下模閉合,以夾持在分別載置於前述多個基板載置部上的前述多個基板上配設的脫模膜,在注入樹脂之後,進一步使前述上模和前述下模閉合,利用前述調整機構使前述多個基板載置部上升。Such as the resin sealing device of claim 1 or 2, in which, The resin sealing device has a control unit that uses the thickness measurement unit to measure the thickness of each of the plurality of substrates, and according to the thickness of each of the plurality of substrates measured by the thickness measurement unit, uses the adjustment mechanism to adjust The heights of the plurality of substrate placement portions are adjusted individually, and then, the upper mold and the lower mold are temporarily closed to be clamped on the plurality of substrates respectively placed on the plurality of substrate placement portions. After injecting the resin into the mold release film provided, the upper mold and the lower mold are further closed, and the plurality of substrate placement portions are raised by the adjustment mechanism.
TW109142155A 2019-12-02 2020-12-01 Resin sealing device TWI753678B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2019-218096 2019-12-02
JP2019218096A JP6704159B1 (en) 2019-12-02 2019-12-02 Resin sealing device

Publications (2)

Publication Number Publication Date
TW202122236A true TW202122236A (en) 2021-06-16
TWI753678B TWI753678B (en) 2022-01-21

Family

ID=70858256

Family Applications (1)

Application Number Title Priority Date Filing Date
TW109142155A TWI753678B (en) 2019-12-02 2020-12-01 Resin sealing device

Country Status (3)

Country Link
JP (1) JP6704159B1 (en)
CN (1) CN112976475B (en)
TW (1) TWI753678B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20240038804A (en) * 2021-11-26 2024-03-25 아픽 야마다 가부시끼가이샤 Resin encapsulation method

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101028735B (en) * 2006-03-03 2010-09-29 鸿富锦精密工业(深圳)有限公司 Mould structure
JP5560479B2 (en) * 2009-07-01 2014-07-30 アピックヤマダ株式会社 Resin mold, resin mold apparatus, and resin mold method
JP5544585B2 (en) * 2010-07-13 2014-07-09 アピックヤマダ株式会社 Resin molding device and workpiece thickness measuring device
JP5944866B2 (en) * 2013-06-20 2016-07-05 Towa株式会社 Compressed resin sealing method and compressed resin sealing device for electronic parts
JP6236486B2 (en) * 2016-03-07 2017-11-22 Towa株式会社 A position adjusting mechanism, a resin sealing device, a resin sealing method, and a resin sealing product manufacturing method.
JP6580519B2 (en) * 2016-05-24 2019-09-25 Towa株式会社 Compression molding apparatus, resin-encapsulated product manufacturing apparatus, compression molding method, and resin-encapsulated product manufacturing method
JP6861609B2 (en) * 2017-10-30 2021-04-21 Towa株式会社 Resin molding equipment and manufacturing method of resin molded products
JP6541746B2 (en) * 2017-10-30 2019-07-10 Towa株式会社 Resin molding apparatus and method of manufacturing resin molded article
TWI787417B (en) * 2018-02-09 2022-12-21 日商山田尖端科技股份有限公司 Mold for compression molding and compression molding device

Also Published As

Publication number Publication date
JP2021089915A (en) 2021-06-10
JP6704159B1 (en) 2020-06-03
CN112976475A (en) 2021-06-18
TWI753678B (en) 2022-01-21
CN112976475B (en) 2024-02-02

Similar Documents

Publication Publication Date Title
JP4235623B2 (en) Resin sealing device
US20220161469A1 (en) Resin molding apparatus and method for manufacturing resin molded product
WO1999050908A1 (en) Method of manufacturing semiconductor device, apparatus for molding semiconductor device, and semiconductor device
US20210387385A1 (en) Conveying apparatus, resin molding apparatus, conveying method, and resin molded product manufacturing method
TWI753157B (en) Molding mold and resin molding method
TW202122236A (en) Resin sealing device capable of accurately clamping substrates for resin sealing formation even if thicknesses of substrates are different
CN112677422B (en) Method for producing resin molded article and resin molding apparatus
JP6804275B2 (en) Molding mold, resin molding equipment and resin molding method
NL2021845B1 (en) Mould half and mould method for encapsulating electronic components mounted on a carrier including a dual support surface and a method for using such
KR102202436B1 (en) Resin molding apparatus, resin molding method and resin molded product manufacturing method
KR101856903B1 (en) Apparatus for molding semiconductor devices
US20220161475A1 (en) Resin molding apparatus and method for manufacturing resin molded product
JP2020104464A (en) Assembly method of injection molding machine and injection molding machine
US20240116229A1 (en) Resin molding device and method for producing resin molded article
TWI851937B (en) Resin molding device and method for manufacturing resin molded product
US20240051199A1 (en) Resin molding device and method for producing resin molded article
KR200479309Y1 (en) Apparatus for molding a substrate
JP5621147B2 (en) Resin molding equipment
KR20180106593A (en) Compression molding system and moldiung method of the same
JPH10321658A (en) Resin sealing device for semiconductor element having sliding mechanism