JP4235623B2 - Resin sealing device - Google Patents

Resin sealing device Download PDF

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JP4235623B2
JP4235623B2 JP2005136933A JP2005136933A JP4235623B2 JP 4235623 B2 JP4235623 B2 JP 4235623B2 JP 2005136933 A JP2005136933 A JP 2005136933A JP 2005136933 A JP2005136933 A JP 2005136933A JP 4235623 B2 JP4235623 B2 JP 4235623B2
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resin
molded product
unit
thickness
molded
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JP2006315184A (en
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一彦 小林
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Apic Yamada Corp
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Apic Yamada Corp
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Priority to JP2005136933A priority Critical patent/JP4235623B2/en
Priority to TW094137723A priority patent/TWI359069B/en
Priority to US11/262,851 priority patent/US7407608B2/en
Priority to EP05256773A priority patent/EP1657043B1/en
Priority to EP08008176A priority patent/EP1958748A3/en
Priority to CN201310321030.8A priority patent/CN103448188B/en
Priority to KR1020050104226A priority patent/KR101332141B1/en
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  • Moulds For Moulding Plastics Or The Like (AREA)
  • Casting Or Compression Moulding Of Plastics Or The Like (AREA)

Description

本発明は樹脂封止装置に関し、より詳細には樹脂封止用に被成形品に供給する樹脂量を高精度に制御して、品質のばらつきのない高精度の樹脂封止を可能にする樹脂封止装置に関する。   The present invention relates to a resin sealing device, and more specifically, a resin that enables high-precision resin sealing without variation in quality by controlling the amount of resin supplied to a molded product for resin sealing with high accuracy. The present invention relates to a sealing device.

樹脂封止金型を用いて被成形品を樹脂封止する方法に、被成形品の上に液状樹脂、粉末・顆粒状樹脂あるいはペースト状樹脂を供給し、被成形品とともに樹脂をクランプして樹脂封止する方法がある(圧縮成形方法)。本出願人は、圧縮成形方法による樹脂封止装置として、被成形品の重量や半導体チップの厚さを計測して被成形品に供給する樹脂量を計量し、被成形品のばらつきに応じて樹脂の供給量を調節して樹脂封止する樹脂封止装置を提案している(特許文献1参照)。
特開2003−165133号公報
In a method of resin-sealing a molded product using a resin-sealed mold, liquid resin, powder / granular resin or paste resin is supplied onto the molded product, and the resin is clamped together with the molded product. There is a method of resin sealing (compression molding method). As a resin sealing device using a compression molding method, the present applicant measures the weight of a molded product and the thickness of a semiconductor chip, measures the amount of resin supplied to the molded product, and responds to variations in the molded product. A resin sealing device that adjusts the amount of resin supplied to perform resin sealing has been proposed (see Patent Document 1).
JP 2003-165133 A

圧縮成形方法による場合は、被成形品に供給する樹脂量のばらつきが成形品の品質のばらつきに直接的に影響するから、上述したように、被成形品に搭載されている半導体チップの厚さ等を計測し、被成形品に供給する樹脂量を調節しながら樹脂封止する必要がある。しかしながら、被成形品に供給する樹脂量を計量して被成形品に供給したとしても、必ずしも的確な樹脂封止ができない場合が生じる。これは、半導体チップを搭載する被成形品の厚さがロットによってばらついたりして樹脂成形条件が変動すること、また、被成形品に封止用の樹脂を供給する際に、樹脂供給装置の精度ばらつきによって供給樹脂量がばらつくといったことによるものと考えられる。   In the case of the compression molding method, since the variation in the amount of resin supplied to the molded product directly affects the variation in the quality of the molded product, as described above, the thickness of the semiconductor chip mounted on the molded product It is necessary to perform resin sealing while adjusting the amount of resin supplied to the molded product. However, even if the amount of resin supplied to the molded product is measured and supplied to the molded product, there are cases where accurate resin sealing is not always possible. This is because the resin molding conditions fluctuate because the thickness of the molded product on which the semiconductor chip is mounted varies depending on the lot, and when the resin for sealing is supplied to the molded product, This is thought to be because the amount of resin supplied varies due to variations in accuracy.

最近の樹脂封止製品は、樹脂成形部分の厚さが1mm以下といったように、製品の厚さがきわめて薄くなってきている。この結果、被成形品を樹脂封止する際の樹脂成形条件のばらつきや樹脂供給量のばらつきが、成形品の品質のばらつきに大きく影響を与えるようになってきている。
本発明は、このように、樹脂成形条件の僅かなばらつきが成形品の品質のばらつきに大きな影響を及ぼすようになってきている現状に鑑みてなされたものであり、被成形品の形態あるいは樹脂の供給量等に起因する種々の樹脂成形条件がばらついた場合でも、これらの変動を補って、品質のばらつきのない樹脂成形品を得ることを可能にする樹脂封止装置を提供することを目的としている。
In recent resin-encapsulated products, the thickness of the resin-molded portion is extremely thin, such as 1 mm or less. As a result, variations in resin molding conditions and variations in the amount of resin supplied when the molded product is sealed with resin have greatly affected variations in the quality of the molded product.
Thus, the present invention has been made in view of the present situation in which slight variations in resin molding conditions have come to have a great influence on variations in quality of molded products. An object of the present invention is to provide a resin sealing device that makes it possible to obtain a resin molded product having no variation in quality by compensating for these fluctuations even when various resin molding conditions due to the supply amount of the resin vary. It is said.

本発明は、上記目的を達成するため次の構成を備える。
すなわち、被成形品の供給部と、被成形品に搭載されている半導体チップの厚さを計測する被成形品の計測部と、樹脂封止に用いる液状樹脂を被成形品に供給する樹脂供給部と、液状樹脂が供給された被成形品を封止金型を用いて樹脂成形する樹脂成形部と、樹脂成形された成形品の樹脂封止部の厚さを計測する成形品の計測部と、成形品の収納部と、これら各部の動作を制御する制御部とを備える樹脂封止装置において、前記被成形品は、基板に複数の半導体チップが搭載されたものであり、前記被成形品の計測部は、前記基板に搭載された半導体チップの厚さを測定するセンサ部として、被成形品を厚さ方向に挟む配置に対向させて一対設けられ、被成形品にレーザ光を照射しその反射光から半導体チップの厚さを測定するセンサと、前記被成形品を支持し、前記センサの測定位置に前記半導体チップが位置するよう被成形品を移動させるX−Yテーブルとを備え、前記成形品の計測部は、前記基板に搭載された半導体チップの樹脂封止部の厚さを測定するセンサ部として、成形品を厚さ方向に挟む配置に上下に対向して一対設けられ、成形品にレーザ光を照射しその反射光から樹脂封止部の厚さを測定するセンサと、前記成形品を支持し、前記センサの測定位置に前記樹脂封止部が位置するよう成形品を移動させるX−Yテーブルとを備え、前記制御部は、前記被成形品の計測部による前記半導体チップの厚さの計測結果に基づいて前記樹脂供給部において被成形品に供給する樹脂量を調節する調節手段と、前記成形品の計測部による前記樹脂封止部の厚さの計測結果に基づいて、前記樹脂供給部において被成形品に供給する樹脂量を調節する調節手段とを備えていることを特徴とする。
The present invention has the following configuration in order to achieve the above object.
That is, a molded product supply unit, a molded product measurement unit that measures the thickness of a semiconductor chip mounted on the molded product, and a resin supply that supplies liquid resin used for resin sealing to the molded product A molded part for measuring the thickness of the resin-sealed part of the resin-molded molded product, and a resin molded part for resin-molding the molded product supplied with the liquid resin using a sealing mold And a molded product storage unit and a control unit that controls the operation of each unit. In the resin sealing device, the molded product includes a plurality of semiconductor chips mounted on a substrate, and the molded product A product measuring unit is provided as a sensor unit for measuring the thickness of the semiconductor chip mounted on the substrate so as to face the arrangement sandwiching the molded product in the thickness direction, and irradiates the molded product with laser light. A sensor for measuring the thickness of the semiconductor chip from the reflected light, An XY table that supports the molded product and moves the molded product so that the semiconductor chip is positioned at the measurement position of the sensor, and the measurement unit of the molded product is a semiconductor chip mounted on the substrate As a sensor unit for measuring the thickness of the resin-sealed portion, a pair of upper and lower portions are provided so as to sandwich the molded product in the thickness direction, and the resin-sealed portion is irradiated from the reflected light by irradiating the molded product with laser light A sensor that measures the thickness of the XY table, and an XY table that supports the molded product and moves the molded product so that the resin sealing portion is positioned at the measurement position of the sensor. Adjustment means for adjusting the amount of resin supplied to the molded product in the resin supply unit based on the measurement result of the thickness of the semiconductor chip by the measurement unit of the molded product, and the resin sealing by the measurement unit of the molded product Based on the thickness measurement results Te, characterized in that it comprises an adjustment means for adjusting the amount of resin supplied to the molded article in the resin supply section.

また、前記制御部は、前記基板に搭載されている各々の半導体チップの厚さの計測結果に基づき、前記樹脂供給部において個々の半導体チップに供給する樹脂量を制御する調節手段と、前記成形品の各々の樹脂封止部についての厚さの計測結果に基づき、樹脂封止部が所定の厚さ公差内におさまるように前記樹脂供給部における樹脂供給量を調節する調節手段とを備えていることを特徴とする。 Further, the control unit is configured to adjust the amount of resin supplied to each semiconductor chip in the resin supply unit based on the measurement result of the thickness of each semiconductor chip mounted on the substrate, and the molding Adjusting means for adjusting the resin supply amount in the resin supply unit based on the measurement result of the thickness of each resin sealing unit of the product, so that the resin sealing unit falls within a predetermined thickness tolerance It is characterized by being.

また、前記被成形品の計測部、および前記成形品の計測部には、画像処理用のカメラが配置されていることを特徴とする。 Further, an image processing camera is arranged in the measurement part of the molded product and the measurement part of the molded product.

本発明に係る樹脂封止装置によれば、被成形品の計測部において被成形品の半導体チップの厚さを計測した結果、および成形品の計測部において成形品の樹脂封止部の厚さを計測した結果を、樹脂供給部において被成形品に供給する樹脂量にフィードバックすることによって、被成形品に応じて的確な樹脂封止を行うことができ、また成形品の樹脂封止結果に基づいて的確に被成形品を樹脂封止することができる。 According to the resin sealing device of the present invention, the result of measuring the thickness of the semiconductor chip of the molded product in the measuring unit of the molded product, and the thickness of the resin sealing portion of the molded product in the measuring unit of the molded product the measurement results of the, by feeding back the amount of resin supplied to Oite the molded article in the resin supply section, it is possible to perform accurate resin encapsulation in accordance with the molded article, also of molded product resin sealing Based on the result, the molded product can be accurately resin-sealed.

(樹脂封止装置の構成)
図1、2は、本発明に係る樹脂封止装置の全体構成を示す平面図および正面図である。以下では、図1、2にしたがって樹脂封止装置の各部の構成について説明する。
図1に示すように、樹脂封止装置は、被成形品の供給部(A)と、被成形品に搭載されている半導体チップの厚さを計測する被成形品の計測部(B)と、樹脂封止に用いる液状樹脂を被成形品に供給する樹脂供給部(C)と、液状樹脂が供給された被成形品を封止金型を用いて樹脂成形する樹脂成形部(D)と、樹脂成形された成形品の樹脂封止部の厚さを計測する成形品の計測部(E)と、成形品の収納部(F)とを備える。
(Configuration of resin sealing device)
1 and 2 are a plan view and a front view showing the overall configuration of the resin sealing device according to the present invention. Below, the structure of each part of a resin sealing apparatus is demonstrated according to FIG.
As shown in FIG. 1, the resin sealing device includes a supply unit (A) for a molded product, and a measurement unit (B) for the molded product that measures the thickness of a semiconductor chip mounted on the molded product. A resin supply unit (C) for supplying a liquid resin used for resin sealing to the molded product, and a resin molding unit (D) for resin molding the molded product supplied with the liquid resin using a sealing mold And a molded product measuring section (E) for measuring the thickness of the resin-sealed portion of the molded product, and a molded product storage section (F).

図3は、本実施形態の樹脂封止装置の各部の構成をブロック図で示したものである。制御部(G)は、被成形品を樹脂封止装置に供給する操作から、封止用の樹脂を被成形品に供給し、樹脂成形後、成形品を収納するまでの一連の各部の動作を制御する。   FIG. 3 is a block diagram showing the configuration of each part of the resin sealing device of this embodiment. The control unit (G) operates a series of operations from supplying the molded product to the resin sealing device, supplying the sealing resin to the molded product, and molding the resin after resin molding. To control.

本実施形態の樹脂封止装置において使用する被成形品10は、短冊状に形成された基板上に2列に半導体チップが搭載された製品である。
被成形品の供給部(A)は、被成形品がマガジンに収納された状態でマガジンごとセットするセット部11と、セット部11にセットされたマガジンを昇降駆動するエレベータ12およびマガジンから被成形品を切り出しするプッシャ等を備えた取り出し機構と、取り出し機構によってマガジンから取り出された2枚の被成形品を、樹脂成形部(D)における被成形品の配置に合わせて、向かい合わせに配置するターンテーブル14等を備えた切り出し機構とを備える。
ターンテーブル14の後方には、ターンテーブル14によって対向して並置された被成形品を一時的に搬出して支持するセット位置が設けられ、ターンテーブル14とセット位置との間で被成形品を搬送する2本のフィーダーレール16a、16bが設けられている。
The molded product 10 used in the resin sealing device of the present embodiment is a product in which semiconductor chips are mounted in two rows on a strip-shaped substrate.
The molded product supply unit (A) includes a set unit 11 that sets the magazine in a state where the molded product is stored in the magazine, an elevator 12 that drives the magazine set in the set unit 11 up and down, and a molded product. A take-out mechanism having a pusher or the like for cutting out the product, and two molded products taken out from the magazine by the take-out mechanism are arranged face to face in accordance with the arrangement of the molded product in the resin molding portion (D). And a cutting mechanism including a turntable 14 and the like.
At the rear of the turntable 14, a set position is provided for temporarily carrying out and supporting the moldings arranged side by side with the turntable 14, and the molding is placed between the turntable 14 and the setting position. Two feeder rails 16a and 16b to be conveyed are provided.

被成形品の計測部(B)は、被成形品10を支持するX−Yテーブル20と、X−Yテーブル20に支持された被成形品10の厚さを計測するセンサ部22とを備える。X−Yテーブル20は被成形品10を2枚並列して支持するように設けられている。また、X−Yテーブル20の上方には画像処理用のカメラ21が配置されている。
なお、ターンテーブル14から搬出される被成形品10のセット位置と、X−Yテーブル20との側方には、セット位置からX−Yテーブル20へ被成形品10を搬送するインローダ36とレール18が設けられている。
The measurement unit (B) of the molded product includes an XY table 20 that supports the molded product 10 and a sensor unit 22 that measures the thickness of the molded product 10 supported by the XY table 20. . The XY table 20 is provided so as to support two molded articles 10 in parallel. An image processing camera 21 is disposed above the XY table 20.
Note that an inloader 36 and a rail for conveying the molded product 10 from the set position to the XY table 20 are located at the side of the set position of the molded product 10 carried out from the turntable 14 and the XY table 20. 18 is provided.

図2に示すように、被成形品の計測部(B)のセンサ部22は、正面形状がコ字形に形成された支持枠23と支持枠23に取り付けられたセンサ24とからなる。
図4、5にセンサ部22の構成を拡大して示す。本実施形態のセンサ部22で使用しているセンサ24は、被成形品にレーザ光を照射してその反射光から被成形品の厚さを測定するもので、図4に示すように、被成形品10を厚さ方向に挟む配置に一対のセンサ24a、24bを対向させて支持枠23に配置している。基板の厚さは、上下に対向して配置されたセンサ24a、24bから基板に照射したレーザ光により、センサ24a、24bから基板までの距離を計測し、その計測値をセンサ間の距離から減算することによって求められる。
As shown in FIG. 2, the sensor unit 22 of the measurement unit (B) of the molded product includes a support frame 23 whose front shape is formed in a U shape and a sensor 24 attached to the support frame 23.
4 and 5 show an enlarged configuration of the sensor unit 22. The sensor 24 used in the sensor unit 22 of the present embodiment irradiates the molded product with laser light and measures the thickness of the molded product from the reflected light. As shown in FIG. A pair of sensors 24 a and 24 b are arranged on the support frame 23 so as to face each other so as to sandwich the molded product 10 in the thickness direction. The thickness of the substrate is measured by measuring the distance from the sensor 24a, 24b to the substrate by the laser light irradiated to the substrate from the sensors 24a, 24b arranged opposite to each other, and subtracting the measured value from the distance between the sensors. It is required by doing.

X−Yテーブル20には所定間隔をあけて平行に2枚の被成形品10が支持されるから、これらの被成形品10の配置に合わせて、正面方向から見て左右に離間した位置に、上下に一対ずつセンサ24a、24bが設けられる。センサ24a、24bは各々スライドガイド25a、25bにガイドされ、X−Yテーブル20上における被成形品10の配置間隔に合わせて左右位置が調節可能となっている。   Since the two molded articles 10 are supported in parallel at a predetermined interval on the XY table 20, according to the arrangement of these molded articles 10, they are spaced apart from each other as viewed from the front. A pair of sensors 24a and 24b are provided on the upper and lower sides. The sensors 24 a and 24 b are guided by slide guides 25 a and 25 b, respectively, and the left and right positions can be adjusted according to the arrangement interval of the molded product 10 on the XY table 20.

樹脂供給部(C)は、基板10aに搭載されている半導体チップ10bの各々の配置位置に合わせて液状樹脂を供給するためのノズル30a、30bを備えたディスペンサ装置32と、被成形品10を支持するX−Yテーブル34とを備える。
本実施形態の樹脂封止装置では、図1に示すように、基台の左右中央の前部に樹脂供給部(C)が配置されている。ノズル30a、30bはX−Yテーブル34に支持される2枚の被成形品10の各々に液状樹脂を供給するため、正面方向から見て左右一対設けられている。X−Yテーブル34はX−Y方向への移動位置が制御されるとともに、Z方向(高さ方向)の移動位置も制御可能に設けられている。
The resin supply unit (C) includes a dispenser device 32 provided with nozzles 30a and 30b for supplying a liquid resin in accordance with each arrangement position of the semiconductor chip 10b mounted on the substrate 10a, and the product 10 to be molded. And an XY table 34 to be supported.
In the resin sealing apparatus of this embodiment, as shown in FIG. 1, the resin supply part (C) is arrange | positioned in the front part of the left-right center of a base. The nozzles 30a and 30b are provided as a pair on the left and right sides when viewed from the front in order to supply the liquid resin to each of the two molded articles 10 supported by the XY table 34. The XY table 34 is provided such that the movement position in the XY direction is controlled and the movement position in the Z direction (height direction) can also be controlled.

樹脂供給部(C)の後方には、被成形品の計測部(B)から樹脂供給部(C)に被成形品10を搬送し、樹脂供給部(C)から樹脂成形部(D)に被成形品10を搬送するインローダー36が配置されている。このインローダー36は対向して配置された一対の被成形品10、10をチャックするチャック機構を備え、被成形品10の向きを変えずに平行に支持して搬送する操作をなす。   Behind the resin supply unit (C), the molded product 10 is conveyed from the measurement unit (B) of the molded product to the resin supply unit (C), and from the resin supply unit (C) to the resin molded unit (D). An inloader 36 for conveying the molded product 10 is disposed. The inloader 36 includes a chuck mechanism that chucks a pair of molded articles 10 and 10 that are disposed to face each other, and performs an operation of supporting and conveying the molded article 10 in parallel without changing the direction of the molded article 10.

樹脂成形部(D)は、被成形品10をクランプして樹脂成形する上型40および下型41と、上型40および下型41を支持するプレス部42とを備える。プレス部42は、上型40を支持する固定プラテン43と、下型41を支持する可動プラテン44と、可動プラテン44を押動して型締めする型締機構46を備える。本実施形態におけるプレス部42は、型締機構46の駆動源として電動モータを用い、トグル機構からなる押圧機構を備えている。   The resin molding portion (D) includes an upper die 40 and a lower die 41 that clamp the product 10 and resin-mold, and a press portion 42 that supports the upper die 40 and the lower die 41. The press unit 42 includes a fixed platen 43 that supports the upper mold 40, a movable platen 44 that supports the lower mold 41, and a mold clamping mechanism 46 that presses the movable platen 44 and clamps the mold. The press unit 42 in the present embodiment uses an electric motor as a drive source of the mold clamping mechanism 46 and includes a pressing mechanism including a toggle mechanism.

成形品の計測部(E)は、樹脂成形部(D)で成形された2枚の成形品50を支持するX−Yテーブル60と、成形品50の樹脂封止部を計測するセンサ部62とを備える。X−Yテーブル60は、樹脂成形部(D)の金型上における成形品50の平面配置と同一の平面配置に成形品50を支持する。
センサ部62は、前述した被成形品の計測部(B)に設けられているセンサ部22と同様に形成されたもので、X−Yテーブル60に支持されている各々の成形品50、50の配置位置に合わせて左右に離間した配置に、上下一対のセンサが対向して配置されている。X−Yテーブル60はセンサ部62に設けられた上下一対のセンサの高さ方向の中間位置でX−Y方向に移動する。また、X−Yテーブル60の上方には、X−Yテーブル20の上方に設けたと同様の画像処理用のカメラ63が搭載されている。
The measurement unit (E) of the molded product includes an XY table 60 that supports the two molded products 50 molded by the resin molding unit (D), and a sensor unit 62 that measures the resin sealing portion of the molded product 50. With. The XY table 60 supports the molded product 50 in the same planar arrangement as the planar arrangement of the molded product 50 on the mold of the resin molding part (D).
The sensor unit 62 is formed in the same manner as the sensor unit 22 provided in the measurement unit (B) of the molded product described above, and each molded product 50, 50 supported by the XY table 60 is provided. A pair of upper and lower sensors are arranged to face each other in an arrangement separated from each other in accordance with the arrangement position. The XY table 60 moves in the XY direction at an intermediate position in the height direction of a pair of upper and lower sensors provided in the sensor unit 62. An image processing camera 63 similar to that provided above the XY table 20 is mounted above the XY table 60.

なお、樹脂成形部(D)の後方には、樹脂成形部(D)から成形品の計測部(E)に成形品50を搬出するアンローダー64が配置されている。アンローダー64は樹脂成形部(D)のプレス部42における成形品50、50の平面配置を維持した状態で下型41から成形品50、50をピックアップし、X−Yテーブル60に移載する操作を行う。   Note that an unloader 64 for carrying out the molded product 50 from the resin molded portion (D) to the measurement portion (E) of the molded product is disposed behind the resin molded portion (D). The unloader 64 picks up the molded products 50 and 50 from the lower mold 41 while maintaining the planar arrangement of the molded products 50 and 50 in the press section 42 of the resin molded portion (D), and transfers them to the XY table 60. Perform the operation.

成形品の収納部(F)は、基台の前面の右側位置に配置されている。
成形品50を計測操作する際に、X−Yテーブル60が前部側に移動した位置の上方には、成形品50をピックアップするピックアップ機構70が配置されている。このピックアップ機構70は、X−Yテーブル60から成形品50をピックアップし、成形品50をマガジン(不図示)に挿入して収納する作用をなす。図2において、74は成形品50を収納するマガジンをマガジンの収納部72に収納するためのエレベータである。
The storage part (F) for the molded product is arranged at the right position on the front surface of the base.
A pickup mechanism 70 that picks up the molded product 50 is disposed above the position where the XY table 60 has moved to the front side when the molded product 50 is measured and operated. The pickup mechanism 70 functions to pick up the molded product 50 from the XY table 60 and insert the molded product 50 into a magazine (not shown) for storage. In FIG. 2, reference numeral 74 denotes an elevator for storing a magazine for storing the molded product 50 in the magazine storage portion 72.

(樹脂封止装置の作用)
続いて、上述した樹脂封止装置の作用について説明する。
まず、セット部11に収納されたマガジンはエレベータ12により下位置から1段ずつ持ち上げられ、取り出し機構によってマガジンから被成形品10が1枚ずつターンテーブル14上に送出される。ターンテーブル14は、取り出し機構によって供給される1枚目の被成形品10を一方の支持位置で受けた後、平面内で180°反転して2枚目の被成形品10を他方の支持位置で受け、これによって2枚の被成形品10を対向させた配置とする。
(Operation of resin sealing device)
Then, the effect | action of the resin sealing apparatus mentioned above is demonstrated.
First, the magazines stored in the set unit 11 are lifted one by one from the lower position by the elevator 12, and the molded products 10 are sent out one by one from the magazine onto the turntable 14 by the take-out mechanism. The turntable 14 receives the first molded article 10 supplied by the take-out mechanism at one support position, and then reverses 180 ° in the plane to bring the second molded article 10 into the other support position. In this way, the two molded articles 10 are arranged to face each other.

ターンテーブル14上で向かい合わせに整列して支持された被成形品10、10は、フィーダーレール16a、16bによりターンテーブル14の後方のセット位置に移送される。
この移送位置からインローダ36により被成形品の計測部(B)に設けられているX−Yテーブル20に2枚の被成形品10が移載される。X−Yテーブル20に被成形品10を移載する際には、インローダ36によってフィーダーレール16a、16bから被成形品10、10をピックアップした後、インローダ36を横移動させX−Yテーブル20に被成形品10を移載する。
X−Yテーブル20に被成形品10を移載した後、カメラ21により被成形品10の画像を取り込み、画像処理によって、半導体チップの未搭載、欠けを調べる。
The moldings 10 and 10 that are supported on the turntable 14 so as to face each other are transferred to a set position behind the turntable 14 by feeder rails 16a and 16b.
From this transfer position, two in-mold products 10 are transferred to the XY table 20 provided in the measurement unit (B) of the in-mold product by the inloader 36. When transferring the molded product 10 to the XY table 20, the inloader 36 picks up the molded products 10, 10 from the feeder rails 16 a, 16 b, and then moves the inloader 36 to the XY table 20. The molded product 10 is transferred.
After the molded product 10 is transferred to the XY table 20, an image of the molded product 10 is captured by the camera 21, and the semiconductor chip is not mounted or chipped by image processing.

被成形品の計測部(B)では、X−Yテーブル20を被成形品10の長手方向に移動させ、1列目の各々の半導体チップ10bの厚さを計測した後、X−Yテーブル20を左右方向に移動して2列目に移動し、2列目の各々の半導体チップ10bの厚さを計測する。図6に、X−Yテーブル20を移動させ、被成形品10に搭載されている半導体チップ10bの厚さを測定している様子を示す。
センサ24a、24bを被成形品10を厚さ方向に挟む配置で対向させて配置して計測することによって、被成形品10の基板10aが撓んでいたような場合でも、被成形品10の基板10aの厚さを差し引いて半導体チップ10bの厚さを正確に計測することができる。またこの時、センサ24a、24bによる計測データから、半導体チップの未搭載のチェックも行う。
In the measurement unit (B) of the molded product, the XY table 20 is moved in the longitudinal direction of the molded product 10 and the thickness of each semiconductor chip 10b in the first row is measured. Are moved to the second row to measure the thickness of each semiconductor chip 10b in the second row. FIG. 6 shows a state in which the XY table 20 is moved and the thickness of the semiconductor chip 10b mounted on the molded product 10 is measured.
Even if the substrate 10a of the molded product 10 is bent by measuring the sensors 24a and 24b facing each other so as to sandwich the molded product 10 in the thickness direction, the substrate of the molded product 10 can be obtained. The thickness of the semiconductor chip 10b can be accurately measured by subtracting the thickness 10a. At this time, a check is also made on whether the semiconductor chip is not mounted from the measurement data obtained by the sensors 24a and 24b.

この計測部による計測結果は、基板10aに搭載されている個々の半導体チップ10bについて、すべて次工程の樹脂供給部(C)における供給樹脂量にフィードバックされる。すなわち、制御部(G)では、半導体チップ10bの厚さを計測した結果に基づき、個々の半導体チップ10bに供給する樹脂量が演算され、樹脂供給部(C)において個々の半導体チップ10bに供給する樹脂量が制御される。基板10a上で半導体チップ10bが搭載されるべき位置に半導体チップ10bが搭載されていない場合でも、当該搭載位置で必要となる樹脂量を求め、次工程の樹脂供給部(C)で所要量の樹脂が供給される。   The measurement result by the measurement unit is fed back to the amount of resin supplied in the resin supply unit (C) in the next process for each semiconductor chip 10b mounted on the substrate 10a. That is, the control unit (G) calculates the amount of resin to be supplied to each semiconductor chip 10b based on the result of measuring the thickness of the semiconductor chip 10b, and supplies it to each semiconductor chip 10b in the resin supply unit (C). The amount of resin to be controlled is controlled. Even when the semiconductor chip 10b is not mounted at the position where the semiconductor chip 10b is to be mounted on the substrate 10a, the amount of resin required at the mounting position is obtained, and the required amount is obtained by the resin supply unit (C) in the next process. Resin is supplied.

被成形品10の厚さを計測した後、インローダー36によりX−Yテーブル20から被成形品10がピックアップされ、樹脂供給部(C)のX−Yテーブル34に移載される。樹脂供給部(C)では、ディスペンサ装置32のノズル30a、30bから被成形品10の上に液状樹脂が供給される。本実施形態ではノズル30a、30bからX−Yテーブル34に支持されている2枚の被成形品10に、各々液状樹脂が供給される。   After measuring the thickness of the molded product 10, the molded product 10 is picked up from the XY table 20 by the inloader 36 and transferred to the XY table 34 of the resin supply unit (C). In the resin supply unit (C), the liquid resin is supplied onto the article 10 from the nozzles 30 a and 30 b of the dispenser device 32. In the present embodiment, the liquid resin is supplied from the nozzles 30a and 30b to the two molded articles 10 supported by the XY table 34, respectively.

前述した計測部(B)におけると同様に、X−Yテーブル34を被成形品10の長手方向にピッチ移動させ、X−Yテーブル34に支持されている被成形品10の半導体チップ10bの上に次々と液状樹脂を供給する。1列目の半導体チップ10bに液状樹脂を供給した後、2列目の半導体チップ10bに液状樹脂を供給する。なお、液状樹脂を供給する方法は、この方法に限定されるものではなく、全ての列について同時に液状樹脂を供給するといったことも可能である。   Similarly to the measurement unit (B) described above, the XY table 34 is pitch-shifted in the longitudinal direction of the molded product 10 and the semiconductor chip 10b of the molded product 10 supported by the XY table 34 is moved. One after another, liquid resin is supplied. After supplying the liquid resin to the first row of semiconductor chips 10b, the liquid resin is supplied to the second row of semiconductor chips 10b. Note that the method of supplying the liquid resin is not limited to this method, and it is also possible to supply the liquid resin to all the rows at the same time.

樹脂成形部(D)における樹脂成形操作は、プレス部42の可動プラテン44を下動させ、型開きした状態で下型41上にインローダー36により被成形品10、10を搬入してセットし、下型41を上動させ、被成形品10、10を上型40と下型41とでクランプすることによってなされる。本実施形態の樹脂成形方法は、液状樹脂を供給した被成形品10を液状樹脂とともに上型40と下型41とでクランプして樹脂封止するもので、いわゆる圧縮成形方法による樹脂封止方法である。   In the resin molding operation in the resin molding part (D), the movable platen 44 of the press part 42 is moved downward, and the molded articles 10 and 10 are loaded onto the lower mold 41 by the inloader 36 in the opened state and set. The lower mold 41 is moved upward, and the products 10 and 10 are clamped by the upper mold 40 and the lower mold 41. The resin molding method of the present embodiment is a method of clamping a molded article 10 supplied with a liquid resin with an upper mold 40 and a lower mold 41 together with the liquid resin and sealing the resin, and a resin sealing method using a so-called compression molding method. It is.

上型40と下型41とで、液状樹脂とともに被成形品10をクランプして一定時間保持することにより、樹脂が硬化して樹脂成形される。
樹脂硬化した時点で、下型41を下動させて型開きし、アンローダー64により成形品50を金型内から搬出する。アンローダー64は2枚の成形品50、50を金型からピックアップし、成形品の計測部(E)のX−Yテーブル60に成形品50、50を移載する。
The upper mold 40 and the lower mold 41 clamp the molded product 10 together with the liquid resin and hold it for a certain period of time, whereby the resin is cured and resin molded.
When the resin is cured, the lower mold 41 is moved downward to open the mold, and the molded product 50 is unloaded from the mold by the unloader 64. The unloader 64 picks up the two molded products 50 and 50 from the mold, and transfers the molded products 50 and 50 to the XY table 60 of the molded product measuring section (E).

成形品の計測部(E)においては、被成形品の計測部(B)において被成形品10の半導体チップ10bの厚さを計測した方法とまったく同様にして、成形品50を厚さ方向に挟む配置に設けられたレーザ光を用いたセンサにより、成形品50の樹脂封止部の厚さを計測する。X−Yテーブル60を移動させることにより成形品50のすべての樹脂封止部についてその厚さを計測する。また、カメラ63により、成形品の画像を取り込み、樹脂の未充填や成形部の欠けがあるかを画像処理によって判別する。
この成形品の計測部(E)による樹脂封止部の厚さや画像処理のの計測結果は、樹脂供給部(C)における液状樹脂の供給量にフィードバックされる。樹脂供給部(C)においては被成形品10に搭載されている半導体チップ10bの厚さを計測し、的確な樹脂成形を行うに必要な樹脂量を演算で求めて、樹脂供給部(C)から被成形品10に液状樹脂を供給している。したがって、成形品50の樹脂封止部は所定の厚さ公差内におさまるように樹脂成形される筈である。
In the measurement part (E) of the molded product, the molded product 50 is moved in the thickness direction in exactly the same manner as the method of measuring the thickness of the semiconductor chip 10b of the molded product 10 in the measurement part (B) of the molded product. The thickness of the resin sealing part of the molded product 50 is measured by a sensor using laser light provided in the sandwiched arrangement. By moving the XY table 60, the thickness of all the resin sealing portions of the molded product 50 is measured. Further, the camera 63 captures an image of the molded product, and determines whether there is unfilled resin or chipped portions by image processing.
The thickness of the resin sealing part and the measurement result of the image processing by the measurement part (E) of the molded product are fed back to the supply amount of the liquid resin in the resin supply part (C). In the resin supply section (C), the thickness of the semiconductor chip 10b mounted on the molded product 10 is measured, and the amount of resin necessary for performing accurate resin molding is obtained by calculation, and the resin supply section (C) The liquid resin is supplied to the article 10 from the mold. Therefore, the resin sealing portion of the molded product 50 should be resin-molded so as to fall within a predetermined thickness tolerance.

しかしながら、被成形品10の性質や金型の構成、プレス部42の特性等によって、実際に被成形品10を樹脂封止した際に、樹脂封止部の厚さが想定した厚さ公差内から外れる場合が起こり得る。このような場合には、成形品の計測部(E)での計測結果に基づいて樹脂供給部(C)での供給樹脂量を調節する(フィードバックする)ことによって、樹脂封止部の厚さを所定の公差内に合わせることが可能である。
たとえば、樹脂封止装置で新製品を樹脂封止するような場合には、被成形品10における半導体チップ10b等の厚さを計測して、樹脂供給部(C)における樹脂供給量を設定するとともに、実際の成形品の計測結果に基づいて樹脂供給部(C)における樹脂供給量を増減調節することによって、樹脂供給部(C)における樹脂供給量の適切値を効率的にかつ確実に設定することができる。すなわち、樹脂封止装置によって樹脂封止品を生産する際のセッティングを容易にすることができる。
However, due to the properties of the molded product 10, the configuration of the mold, the characteristics of the press part 42, etc., when the molded product 10 is actually resin-sealed, the thickness of the resin-sealed portion is within the assumed thickness tolerance. It may happen that it is out of the range. In such a case, the thickness of the resin sealing part is adjusted by adjusting (feeding back) the amount of resin supplied in the resin supply part (C) based on the measurement result in the measurement part (E) of the molded product. Can be adjusted within predetermined tolerances.
For example, when a new product is resin-sealed with a resin-sealing device, the thickness of the semiconductor chip 10b or the like in the molded product 10 is measured, and the resin supply amount in the resin supply unit (C) is set. At the same time, by adjusting the resin supply amount in the resin supply unit (C) based on the actual measurement result of the molded product, an appropriate value of the resin supply amount in the resin supply unit (C) is set efficiently and reliably. can do. That is, setting when producing a resin-sealed product by the resin-sealing device can be facilitated.

また、ロットによって被成形品10の性状が変動したり、液状樹脂の性状が変動したような場合には、成形品50の計測値に基づいて樹脂供給部(C)における樹脂供給量を調節することで、ランニング時におけるその変動を補完して成形品50の樹脂封止部のばらつきを抑えることができる。すなわち、成形品50の計測を常時、連続的に行い、成形品50における樹脂封止部の厚さのばらつきを連続的に監視することにより、その計測結果の傾向から、樹脂供給部(C)における樹脂供給量を事前に増減調節することが可能である。   Further, when the property of the molded product 10 varies depending on the lot or the property of the liquid resin varies, the resin supply amount in the resin supply unit (C) is adjusted based on the measured value of the molded product 50. Thus, the variation in the running can be compensated for and the variation of the resin sealing portion of the molded product 50 can be suppressed. That is, the measurement of the molded product 50 is continuously performed continuously, and the variation in the thickness of the resin sealing portion in the molded product 50 is continuously monitored. From the tendency of the measurement result, the resin supply unit (C) It is possible to increase or decrease the resin supply amount in advance.

すなわち、成形品の計測部(E)における計測結果の傾向を樹脂供給部(C)の樹脂供給量にフィードバックして樹脂封止することにより、種々の樹脂封止条件の変動によって生じる成形品の樹脂封止部の形状のばらつきが公差内に収まるように事前に樹脂供給部(C)における樹脂供給量を制御することができる。また、樹脂封止部の形状が公差外になってしまった場合でも、樹脂供給部(C)にその計測結果をフィードバックすることによって大量に不良品が発生することを未然に防止することができる。   That is, the trend of the measurement result in the measurement unit (E) of the molded product is fed back to the resin supply amount of the resin supply unit (C) and resin-sealed, so that the molded product caused by the variation of various resin sealing conditions The resin supply amount in the resin supply part (C) can be controlled in advance so that the variation in the shape of the resin sealing part is within the tolerance. Further, even when the shape of the resin sealing portion is out of the tolerance, it is possible to prevent a large amount of defective products from occurring by feeding back the measurement result to the resin supply portion (C). .

このように成形品50の樹脂封止部の計測結果を樹脂供給部(C)の樹脂供給量にフィードバックして制御する方法によれば、きわめて高精度でばらつきの小さい樹脂封止を行うことが可能になる。樹脂封止部の厚さが1mm以下といった樹脂封止部がきわめて薄い製品の場合には、このように成形品の樹脂封止部の厚さを常時、監視し、その監視結果に基づいて樹脂供給部(C)を制御する方法は的確な樹脂封止を可能にする上できわめて有効である。   Thus, according to the method of feeding back and controlling the measurement result of the resin sealing portion of the molded product 50 to the resin supply amount of the resin supply portion (C), it is possible to perform resin sealing with extremely high accuracy and small variation. It becomes possible. In the case of a product with a very thin resin sealing portion such as a thickness of 1 mm or less, the thickness of the resin sealing portion of the molded product is constantly monitored in this way, and the resin is determined based on the monitoring result. The method for controlling the supply section (C) is extremely effective in enabling accurate resin sealing.

なお、上述した実施形態では、基板10a上に半導体チップ10bを縦横に整列させて配置した被成形品10を対象として説明したが、本発明に係る樹脂封止装置は、このような被成形品10に限らず、複数個の半導体チップをグループ化して樹脂封止するような製品、あるいは半導体ウエハの片面を一括樹脂封止する場合についても同様に適用することができる。半導体ウエハの片面を一括樹脂封止する場合は、被成形品についての計測を省略し、成形品の厚さのみを計測して、その計測結果を樹脂供給部(C)にフィードバックして制御する方法、被成形品の表面の凹凸が樹脂供給量のばらつきに影響するような場合には被成形品の表面状態を計測して、その計測結果に基づいて樹脂供給部(C)における樹脂供給量を制御すればよい。   In the above-described embodiment, the molded product 10 in which the semiconductor chips 10b are arranged vertically and horizontally on the substrate 10a has been described as an object. However, the resin sealing device according to the present invention is such a molded product. The present invention is not limited to 10 and can be similarly applied to a product in which a plurality of semiconductor chips are grouped and resin-sealed, or one side of a semiconductor wafer is collectively resin-sealed. When batch-sealing one side of a semiconductor wafer, measurement of the molded product is omitted, only the thickness of the molded product is measured, and the measurement result is fed back to the resin supply unit (C) for control. Method, when the surface irregularities of the molded product affect the variation in the resin supply amount, measure the surface state of the molded product, and the resin supply amount in the resin supply part (C) based on the measurement result Can be controlled.

本発明に係る樹脂封止装置の一実施形態の全体構成を示す平面図である。It is a top view which shows the whole structure of one Embodiment of the resin sealing apparatus which concerns on this invention. 本発明に係る樹脂封止装置の一実施形態の全体構成を示す正面図である。It is a front view showing the whole composition of one embodiment of the resin sealing device concerning the present invention. 本発明に係る樹脂封止装置の各部の構成を示すブロック図である。It is a block diagram which shows the structure of each part of the resin sealing apparatus which concerns on this invention. 樹脂封止装置の一実施形態におけるセンサ部の正面図である。It is a front view of the sensor part in one embodiment of a resin sealing device. 樹脂封止装置の一実施形態におけるセンサ部の平面図である。It is a top view of the sensor part in one embodiment of a resin sealing device. センサ部により被成形品を計測する状態を示す説明図である。It is explanatory drawing which shows the state which measures a to-be-molded product with a sensor part.

符号の説明Explanation of symbols

10 被成形品
10a 基板
10b 半導体チップ
12 エレベータ
14 ターンテーブル
16a、16b フィーダーレール
18 レール
20、34、60 X−Yテーブル
22 センサ部
23 支持枠
24、24a、24b センサ
30a、30b ノズル
32 ディスペンサ装置
36 インローダー
40 上型
41 下型
42 プレス部
43 固定プラテン
44 可動プラテン
46 型締機構
50 成形品
62 センサ部
64 アンローダー
70 ピックアップ機構
72 収納部
A 被成形品の供給部
B 被成形品の計測部
C 樹脂供給部
D 樹脂成形部
E 成形品の計測部
F 成形品の収納部
DESCRIPTION OF SYMBOLS 10 Molded article 10a Board | substrate 10b Semiconductor chip 12 Elevator 14 Turntable 16a, 16b Feeder rail 18 Rail 20, 34, 60 XY table 22 Sensor part 23 Support frame 24, 24a, 24b Sensor 30a, 30b Nozzle 32 Dispenser apparatus 36 Inloader 40 Upper mold 41 Lower mold 42 Press section 43 Fixed platen 44 Movable platen 46 Mold clamping mechanism 50 Molded product 62 Sensor unit 64 Unloader 70 Pickup mechanism 72 Storage unit A Molded product supply unit B Molded product measurement unit C Resin supply part D Resin molding part E Molded part measurement part F Molded part storage part

Claims (3)

被成形品の供給部と、被成形品に搭載されている半導体チップの厚さを計測する被成形品の計測部と、樹脂封止に用いる液状樹脂を被成形品に供給する樹脂供給部と、液状樹脂が供給された被成形品を封止金型を用いて樹脂成形する樹脂成形部と、樹脂成形された成形品の樹脂封止部の厚さを計測する成形品の計測部と、成形品の収納部と、これら各部の動作を制御する制御部とを備える樹脂封止装置において、
前記被成形品は、基板に複数の半導体チップが搭載されたものであり、
前記被成形品の計測部は、前記基板に搭載された半導体チップの厚さを測定するセンサ部として、被成形品を厚さ方向に挟む配置に対向させて一対設けられ、被成形品にレーザ光を照射しその反射光から半導体チップの厚さを測定するセンサと、前記被成形品を支持し、前記センサの測定位置に前記半導体チップが位置するよう被成形品を移動させるX−Yテーブルとを備え、
前記成形品の計測部は、前記基板に搭載された半導体チップの樹脂封止部の厚さを測定するセンサ部として、成形品を厚さ方向に挟む配置に上下に対向して一対設けられ、成形品にレーザ光を照射しその反射光から樹脂封止部の厚さを測定するセンサと、前記成形品を支持し、前記センサの測定位置に前記樹脂封止部が位置するよう成形品を移動させるX−Yテーブルとを備え、
前記制御部は、前記被成形品の計測部による前記半導体チップの厚さの計測結果に基づいて前記樹脂供給部において被成形品に供給する樹脂量を調節する調節手段と、前記成形品の計測部による前記樹脂封止部の厚さの計測結果に基づいて、前記樹脂供給部において被成形品に供給する樹脂量を調節する調節手段とを備えていることを特徴とする樹脂封止装置。
A molded product supply unit, a molded product measurement unit that measures the thickness of a semiconductor chip mounted on the molded product, and a resin supply unit that supplies liquid resin used for resin sealing to the molded product A resin molded part that resin-molds the molded product supplied with the liquid resin using a sealing mold, and a molded product measuring unit that measures the thickness of the resin-sealed part of the resin-molded molded product, In a resin sealing device including a molded product storage unit and a control unit that controls the operation of each unit,
The molded product is a substrate on which a plurality of semiconductor chips are mounted,
A pair of measuring parts for the molded product is provided as a sensor unit for measuring the thickness of the semiconductor chip mounted on the substrate so as to face the arrangement sandwiching the molded product in the thickness direction, and a laser is applied to the molded product. A sensor that irradiates light and measures the thickness of the semiconductor chip from the reflected light, and an XY table that supports the molded article and moves the molded article so that the semiconductor chip is positioned at the measurement position of the sensor And
The measurement part of the molded product is provided as a pair facing the top and bottom in an arrangement that sandwiches the molded product in the thickness direction as a sensor unit that measures the thickness of the resin sealing portion of the semiconductor chip mounted on the substrate, A sensor that irradiates the molded product with laser light and measures the thickness of the resin sealing portion from the reflected light, and a molded product that supports the molded product and that the resin sealing portion is positioned at the measurement position of the sensor. An XY table to be moved,
The control unit adjusts a resin amount supplied to the molded product in the resin supply unit based on a measurement result of the thickness of the semiconductor chip by the measurement unit of the molded product, and measures the molded product A resin sealing device, comprising: an adjustment unit that adjusts the amount of resin supplied to the molded product in the resin supply unit based on a measurement result of the thickness of the resin sealing unit by the unit.
前記制御部は、前記基板に搭載されている各々の半導体チップの厚さの計測結果に基づき、前記樹脂供給部において個々の半導体チップに供給する樹脂量を制御する調節手段と、
前記成形品の各々の樹脂封止部についての厚さの計測結果に基づき、樹脂封止部が所定の厚さ公差内におさまるように前記樹脂供給部における樹脂供給量を調節する調節手段とを備えていることを特徴とする請求項1記載の樹脂封止装置。
The control unit, based on the measurement result of the thickness of each semiconductor chip mounted on the substrate, adjusting means for controlling the amount of resin supplied to each semiconductor chip in the resin supply unit;
Adjusting means for adjusting the resin supply amount in the resin supply unit based on the measurement result of the thickness of each resin seal portion of the molded product so that the resin seal portion falls within a predetermined thickness tolerance; The resin sealing device according to claim 1, wherein the resin sealing device is provided.
前記被成形品の計測部、および前記成形品の計測部には、画像処理用のカメラが配置されていることを特徴とする請求項1または2記載の樹脂封止装置。   3. The resin sealing device according to claim 1, wherein an image processing camera is disposed in the measurement unit of the molded product and the measurement unit of the molded product.
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US11/262,851 US7407608B2 (en) 2004-11-02 2005-11-01 Resin molding equipment and resin molding method
EP08008176A EP1958748A3 (en) 2004-11-02 2005-11-02 Equipment and method for controlling encapsulating semiconductors with plastics
EP05256773A EP1657043B1 (en) 2004-11-02 2005-11-02 Machine for controlling encapsulating semiconductors with plastics
CN201310321030.8A CN103448188B (en) 2004-11-02 2005-11-02 Resin molding apparatus and resin molding method
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