TW202112496A - 研磨裝置、研磨方法、及基板處理裝置 - Google Patents
研磨裝置、研磨方法、及基板處理裝置 Download PDFInfo
- Publication number
- TW202112496A TW202112496A TW109123683A TW109123683A TW202112496A TW 202112496 A TW202112496 A TW 202112496A TW 109123683 A TW109123683 A TW 109123683A TW 109123683 A TW109123683 A TW 109123683A TW 202112496 A TW202112496 A TW 202112496A
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- polishing
- element surface
- wafer
- cleaning
- Prior art date
Links
- 238000005498 polishing Methods 0.000 title claims abstract description 300
- 239000000758 substrate Substances 0.000 title claims abstract description 186
- 238000000034 method Methods 0.000 title claims abstract description 29
- 238000012545 processing Methods 0.000 title claims abstract description 29
- 230000007246 mechanism Effects 0.000 claims abstract description 115
- 238000004140 cleaning Methods 0.000 claims description 233
- 239000012530 fluid Substances 0.000 claims description 129
- 239000007788 liquid Substances 0.000 claims description 49
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 47
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 claims description 29
- 238000000227 grinding Methods 0.000 claims description 26
- 239000007921 spray Substances 0.000 claims description 23
- 238000001035 drying Methods 0.000 claims description 12
- 230000001681 protective effect Effects 0.000 claims description 12
- 239000003814 drug Substances 0.000 claims description 4
- 239000000126 substance Substances 0.000 claims description 4
- 238000005507 spraying Methods 0.000 claims description 3
- 238000005406 washing Methods 0.000 abstract description 2
- 235000012431 wafers Nutrition 0.000 description 233
- 230000002093 peripheral effect Effects 0.000 description 19
- 238000013519 translation Methods 0.000 description 17
- 238000004804 winding Methods 0.000 description 13
- 239000007789 gas Substances 0.000 description 12
- 238000003825 pressing Methods 0.000 description 12
- 238000012546 transfer Methods 0.000 description 12
- 230000009471 action Effects 0.000 description 9
- 238000010586 diagram Methods 0.000 description 9
- 230000032258 transport Effects 0.000 description 9
- 239000006061 abrasive grain Substances 0.000 description 8
- 239000013256 coordination polymer Substances 0.000 description 8
- 230000008569 process Effects 0.000 description 6
- 238000011109 contamination Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 239000002245 particle Substances 0.000 description 3
- 238000007517 polishing process Methods 0.000 description 3
- 229910021642 ultra pure water Inorganic materials 0.000 description 3
- 239000012498 ultrapure water Substances 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 2
- 239000004696 Poly ether ether ketone Substances 0.000 description 2
- 239000000428 dust Substances 0.000 description 2
- 238000011010 flushing procedure Methods 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 239000002101 nanobubble Substances 0.000 description 2
- 229920002530 polyetherether ketone Polymers 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 230000001360 synchronised effect Effects 0.000 description 2
- 239000004677 Nylon Substances 0.000 description 1
- 239000004743 Polypropylene Substances 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000013013 elastic material Substances 0.000 description 1
- 238000005868 electrolysis reaction Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000004745 nonwoven fabric Substances 0.000 description 1
- 229920001778 nylon Polymers 0.000 description 1
- 239000005416 organic matter Substances 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
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- -1 polypropylene Polymers 0.000 description 1
- 229920001155 polypropylene Polymers 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 229920002379 silicone rubber Polymers 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B21/00—Machines or devices using grinding or polishing belts; Accessories therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B55/00—Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
- B24B55/06—Dust extraction equipment on grinding or polishing machines
- B24B55/08—Dust extraction equipment on grinding or polishing machines specially designed for belt grinding machines
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019-160218 | 2019-09-03 | ||
JP2019160218A JP7406943B2 (ja) | 2019-09-03 | 2019-09-03 | 研磨装置、研磨方法、および基板処理装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW202112496A true TW202112496A (zh) | 2021-04-01 |
Family
ID=74847361
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW109123683A TW202112496A (zh) | 2019-09-03 | 2020-07-14 | 研磨裝置、研磨方法、及基板處理裝置 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP7406943B2 (enrdf_load_stackoverflow) |
TW (1) | TW202112496A (enrdf_load_stackoverflow) |
WO (1) | WO2021044694A1 (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI849712B (zh) * | 2022-01-31 | 2024-07-21 | 日商斯庫林集團股份有限公司 | 基板處理方法以及基板處理裝置 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2024090389A (ja) * | 2022-12-23 | 2024-07-04 | 株式会社荏原製作所 | 基板処理装置、および基板処理方法 |
CN117260515B (zh) * | 2023-11-22 | 2024-02-13 | 北京特思迪半导体设备有限公司 | 抛光机的动态联动控制方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004273961A (ja) | 2003-03-12 | 2004-09-30 | Ebara Corp | 金属配線形成基板の洗浄処理装置 |
JP4507967B2 (ja) | 2005-04-20 | 2010-07-21 | セイコーエプソン株式会社 | 基板の洗浄装置 |
JP6210935B2 (ja) | 2013-11-13 | 2017-10-11 | 東京エレクトロン株式会社 | 研磨洗浄機構、基板処理装置及び基板処理方法 |
JP2017108113A (ja) | 2015-11-27 | 2017-06-15 | 株式会社荏原製作所 | 基板処理装置および基板処理方法ならびに基板処理装置の制御プログラム |
JP7148349B2 (ja) * | 2017-11-14 | 2022-10-05 | 株式会社荏原製作所 | 基板処理装置および基板処理方法 |
-
2019
- 2019-09-03 JP JP2019160218A patent/JP7406943B2/ja active Active
-
2020
- 2020-06-15 WO PCT/JP2020/023328 patent/WO2021044694A1/ja active Application Filing
- 2020-07-14 TW TW109123683A patent/TW202112496A/zh unknown
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI849712B (zh) * | 2022-01-31 | 2024-07-21 | 日商斯庫林集團股份有限公司 | 基板處理方法以及基板處理裝置 |
Also Published As
Publication number | Publication date |
---|---|
JP7406943B2 (ja) | 2023-12-28 |
WO2021044694A1 (ja) | 2021-03-11 |
JP2021040022A (ja) | 2021-03-11 |
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