TW201942422A - Surface-treated copper foil, copper-cladded laminate, and manufacturing method for printed wiring board - Google Patents
Surface-treated copper foil, copper-cladded laminate, and manufacturing method for printed wiring board Download PDFInfo
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- TW201942422A TW201942422A TW108110578A TW108110578A TW201942422A TW 201942422 A TW201942422 A TW 201942422A TW 108110578 A TW108110578 A TW 108110578A TW 108110578 A TW108110578 A TW 108110578A TW 201942422 A TW201942422 A TW 201942422A
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/60—Electroplating characterised by the structure or texture of the layers
- C25D5/605—Surface topography of the layers, e.g. rough, dendritic or nodular layers
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B15/00—Layered products comprising a layer of metal
- B32B15/20—Layered products comprising a layer of metal comprising aluminium or copper
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D1/00—Electroforming
- C25D1/04—Wires; Strips; Foils
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D11/00—Electrolytic coating by surface reaction, i.e. forming conversion layers
- C25D11/38—Chromatising
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/10—Electroplating with more than one layer of the same or of different metals
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/48—After-treatment of electroplated surfaces
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/06—Wires; Strips; Foils
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/09—Use of materials for the conductive, e.g. metallic pattern
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C2222/00—Aspects relating to chemical surface treatment of metallic material by reaction of the surface with a reactive medium
- C23C2222/20—Use of solutions containing silanes
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/56—Electroplating: Baths therefor from solutions of alloys
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- Electrochemistry (AREA)
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- Organic Chemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Parts Printed On Printed Circuit Boards (AREA)
- Electroplating Methods And Accessories (AREA)
- Manufacturing Of Printed Wiring (AREA)
Abstract
Description
本發明係有關於表面處理銅箔、覆銅層積板、及印刷配線板的製造方法。The present invention relates to a method for manufacturing a surface-treated copper foil, a copper-clad laminate, and a printed wiring board.
在印刷配線板的製造工程中,以銅箔與絕緣樹脂基材貼合的覆銅層積板的形態被廣泛地使用。關於該點,為了防止在印刷配線板製造時產生配線的剝落,期望銅箔與絕緣樹脂基材有高密著力。其中,在通常的印刷配線板製造用銅箔中,在銅箔的貼合面施予粗糙化處理形成由微細的銅粒子所成的凹凸,藉由加壓加工使該凹凸陷入絕緣樹脂基材的內部而發揮錨定效應,來提升密著性。In the manufacturing process of a printed wiring board, the form of a copper-clad laminated board in which a copper foil and an insulating resin base material are bonded is widely used. In this regard, in order to prevent peeling of the wiring during the production of the printed wiring board, it is desirable that the copper foil and the insulating resin substrate have high adhesion. Among them, in general copper foils for the manufacture of printed wiring boards, roughening treatment is performed on the bonding surfaces of the copper foils to form irregularities made of fine copper particles, and the irregularities are caused to fall into the insulating resin substrate by press working. The anchoring effect of the inside of the to enhance adhesion.
此外,將在保管時等在銅箔表面可能產生的氧化被膜(鏽)所起因的銅箔的劣化防止等作為目的,通常會在銅箔表面施予防銹處理,作為防銹處理層已知有各種合金層。例如,在專利文獻1(特開2008-285751號公報)中,揭示在與絕緣樹脂基材貼合的黏接表面的Zn及Ni的合計量為40mg/m2
以上的表面處理銅箔,因為藉由該銅箔能夠將銅箔表面以Zn-Ni合金充分地被覆,能夠提升與絕緣樹脂基材的密著性及耐藥性等。又,專利文獻2(特開昭62-142389號公報)中,揭示具有Ni-Mo層的印刷電路用銅箔,藉由該銅箔電路形成後的耐藥性及耐熱性等佳。
[先前技術文獻]
[專利文獻]In addition, for the purpose of preventing deterioration of copper foil due to an oxide film (rust) that may occur on the surface of the copper foil during storage, etc., a rust prevention treatment is usually applied to the surface of the copper foil, and it is known as a rust prevention treatment layer Various alloy layers. For example, Patent Document 1 (Japanese Patent Application Laid-Open No. 2008-285751) discloses a surface-treated copper foil having a total amount of Zn and Ni of 40 mg / m 2 or more on an adhesive surface bonded to an insulating resin substrate, because By this copper foil, the surface of a copper foil can be fully covered with a Zn-Ni alloy, and the adhesiveness and chemical resistance with an insulating resin base material can be improved. In addition, Patent Document 2 (Japanese Patent Application Laid-Open No. 62-142389) discloses that a copper foil for a printed circuit having a Ni-Mo layer is excellent in chemical resistance and heat resistance after the copper foil circuit is formed.
[Prior technical literature]
[Patent Literature]
[專利文獻1] 特開2008-285751號公報
[專利文獻2] 特開昭62-142389號公報[Patent Document 1] JP 2008-285751
[Patent Document 2] Japanese Unexamined Patent Publication No. 62-142389
此外,隨著近年的攜帶用電子機器等的高機能化,為了進行大量資訊的高速處理,不論是數位或類比,信號的高頻化都在進行,要求適於高頻用途的印刷配線板。在這種高頻用印刷配線板中,為了不使高頻信號的品質降低而能傳送,希望降低傳送損耗。印刷配線板雖是具備在配線圖案加工的銅箔與絕緣基材者,但傳送損耗主要是由銅箔引起的導體損耗、及由絕緣基材引起的介電損耗。因此,為了降低由銅箔引起的導體損耗及由絕緣基材引起的介電損耗,若能使用凹凸小的銅箔及損耗因子低的絕緣基材則是好的。但是,使用凹凸小的銅箔時,因上述錨定效應減弱,銅箔-基材間的物理密著力降低,尤其是藥品浸漬後及焊接工程後等的剝離強度(剝離強度)的降低成為問題。又,損耗因子低的絕緣基材一般官能基的活性低,與銅箔的化學密著力低。因此,當銅箔的凹凸小時,因為將銅箔進行蝕刻除去時與該銅箔抵接的絕緣基材表面也變得平坦,不只是銅箔-基材間,與層積於絕緣基材表面的其他絕緣基材間的基材-基材間的密著力也降低。關於此點,將專利文獻2揭示的那種Ni-Mo層作為銅箔的防銹處理層使用時,銅箔蝕刻後因Ni-Mo層而來的殘渣會留在絕緣基材表面,妨礙了與層積於絕緣基材表面的其他絕緣基材間的樹脂密著,有造成密著力更降低的問題。In addition, in recent years, with the increase in the performance of portable electronic devices and the like, in order to perform high-speed processing of a large amount of information, no matter whether it is digital or analog, high-frequency signals are being performed, and printed wiring boards suitable for high-frequency applications are required. In such a high-frequency printed wiring board, in order to transmit without degrading the quality of high-frequency signals, it is desirable to reduce transmission loss. Although a printed wiring board includes a copper foil and an insulating base material processed in a wiring pattern, the transmission loss is mainly a conductor loss caused by the copper foil and a dielectric loss caused by the insulating base material. Therefore, in order to reduce the conductor loss caused by the copper foil and the dielectric loss caused by the insulating base material, it is good to use a copper foil with small unevenness and an insulating base material having a low loss factor. However, when the copper foil with small unevenness is used, the anchoring effect is weakened, and the physical adhesion between the copper foil and the substrate is reduced. In particular, a decrease in peel strength (peel strength) after immersion of a drug or after a welding process becomes a problem. . In addition, an insulating base material having a low loss factor generally has a low activity of a functional group and a low chemical adhesion with a copper foil. Therefore, when the unevenness of the copper foil is small, the surface of the insulating base material that comes into contact with the copper foil becomes flat when the copper foil is etched away, not only between the copper foil and the base material, but also on the surface of the insulating base material. The substrate-to-substrate adhesion between other insulating substrates is also reduced. In this regard, when the Ni-Mo layer disclosed in Patent Document 2 is used as a rust-preventive treatment layer for copper foil, residues due to the Ni-Mo layer after copper foil etching will remain on the surface of the insulating base material, preventing it. There is a problem that the resin adheres to other insulating substrates laminated on the surface of the insulating substrate, and the adhesion force is further reduced.
本發明者們,如今得到能夠提供一種表面處理銅箔,藉由作為防銹處理層採用預定組成的Zn-Ni-Mo層,與樹脂的密著性、耐藥性及耐熱性佳,且蝕刻殘渣不容易剩餘,因此用於印刷配線板的製造時能夠提升銅箔-基材間及基材-基材間兩者的密著信賴性的見解。The present inventors have now obtained a surface-treated copper foil capable of providing a Zn-Ni-Mo layer of a predetermined composition as a rust-preventive treatment layer, which is excellent in adhesion, chemical resistance, and heat resistance to a resin, and is etched Residues are not easily left. Therefore, when used for the production of a printed wiring board, it is possible to improve the insight of the close reliability between the copper foil and the substrate and between the substrate and the substrate.
因此,本發明的目的為提供一種表面處理銅箔,與樹脂的密著性、耐藥性及耐熱性佳,且蝕刻殘渣不容易剩餘,因此用於印刷配線板的製造時能夠提升銅箔-基材間及基材-基材間兩者的密著信賴性。Therefore, the object of the present invention is to provide a surface-treated copper foil that has excellent adhesion, resin resistance, and heat resistance to the resin, and that etching residues are not easily left. Therefore, the copper foil can be improved when used in the manufacture of printed wiring boards- Adhesion reliability between substrates and substrate-to-substrate.
根據本發明的一態樣,提供一種表面處理銅箔,具備:銅箔及Zn-Ni-Mo層;
前述Zn-Ni-Mo層係設於前述銅箔的至少一面,Zn附著量為3mg/m2
以上100mg/m2
以下、Ni附著量為5mg/m2
以上60mg/m2
以下及Mo附著量為2.0mg/m2
以上40mg/m2
以下,且前述Ni附著量相對於前述Zn附著量、前述Ni附著量及前述Mo附著量的合計量的比例即Ni/(Zn+Ni+Mo)為0.40以上0.80以下。According to one aspect of the present invention, a surface-treated copper foil is provided, including: a copper foil and a Zn-Ni-Mo layer;
The Zn-Ni-Mo layer is provided on at least one side of the copper foil. The Zn adhesion amount is 3 mg / m 2 or more and 100 mg / m 2 or less, the Ni adhesion amount is 5 mg / m 2 or more and 60 mg / m 2 or less, and the Mo adhesion amount. It is 2.0 mg / m 2 or more and 40 mg / m 2 or less, and Ni / (Zn + Ni + Mo) is a ratio of the Ni adhesion amount to the total amount of the Zn adhesion amount, the Ni adhesion amount, and the Mo adhesion amount, that is, Ni / (Zn + Ni + Mo) is 0.40 or more and 0.80 or less.
根據本發明的一態樣,提供一種覆銅層積板,具備:前述表面處理銅箔;
設於前述表面處理銅箔的前述至少一面的絕緣基材。According to one aspect of the present invention, a copper-clad laminate is provided, comprising: the aforementioned surface-treated copper foil;
An insulating base material provided on the at least one side of the surface-treated copper foil.
根據本發明的其他一態樣,提供一種印刷配線板的製造方法,係利用前述表面處理銅箔或前述覆銅層積板來製造印刷配線板。According to another aspect of the present invention, a method for manufacturing a printed wiring board is provided. The printed wiring board is manufactured by using the surface-treated copper foil or the copper-clad laminate.
定義
用來特定本發明的用語及參數的定義如以下所示。The definitions of terms and parameters used to specify the present invention are as follows.
本說明書中,「最大高度Sz」指的是以ISO25178為準據測定的表示從表面的最高點到最低點的距離的參數。最大高度Sz能夠藉由將在銅箔表面的預定測定面積(例如22500μm2 的區域)的表面輪廓以市售的雷射顯微鏡測定來算出。In this specification, the "maximum height Sz" refers to a parameter that indicates the distance from the highest point to the lowest point of the surface, measured based on ISO25178. The maximum height Sz can be calculated by measuring a surface profile of a predetermined measurement area (for example, an area of 22500 μm 2 ) on the copper foil surface with a commercially available laser microscope.
在本說明書中,「M附著量(M為Zn、Ni或Mo)」指的是存在於防銹處理層(典型為Zn-Ni-Mo層)中的每單位面積的M的重量(mg/m2 )。M附著量能夠藉由將在具有防銹處理層之側的銅箔表面的預定面積以酸溶解,將得到的溶解液中的M濃度基於ICP發光分析法分析來算出。In this specification, the "M adhesion amount (M is Zn, Ni, or Mo)" refers to the weight per unit area of the M (mg / mg) present in the rust-preventive treatment layer (typically a Zn-Ni-Mo layer). m 2 ). The amount of M deposited can be calculated by dissolving a predetermined area of the surface of the copper foil on the side having the anti-rust treatment layer with an acid, and analyzing the concentration of M in the obtained dissolved solution based on ICP emission analysis.
於本說明書中,電解銅箔的「電極面」指的是電解銅箔製作時與陰極連接之側的面。In this specification, the "electrode surface" of an electrolytic copper foil refers to the surface on the side connected to a cathode at the time of manufacture of an electrolytic copper foil.
於本說明書中,電解銅箔的「析出面」為電解銅箔製作時電解銅析出之側的面,亦即不與陰極連接之側的面。In the present specification, the "precipitation surface" of the electrolytic copper foil is the surface on the side where the electrolytic copper is deposited during the production of the electrolytic copper foil, that is, the side on the side not connected to the cathode.
表面處理銅箔
本發明的表面處理銅箔具備:銅箔、設於該銅箔的至少一面的Zn-Ni-Mo層。視其需要,Zn-Ni-Mo層也可以設於銅箔的兩面。Zn-Ni-Mo層其Zn附著量為3mg/m2
以上100mg/m2
以下、Ni附著量為5mg/m2
以上60mg/m2
以下及Mo附著量為2.0mg/m2
以上40mg/m2
以下。接著,Ni附著量相對於Zn附著量、Ni附著量及Mo附著量的合計量的比例即Ni/(Zn+Ni+Mo)為0.40以上0.80以下。 藉由作為防銹處理層採用預定組成的Zn-Ni-Mo層,與樹脂的密著性、耐藥性及耐熱性佳,且蝕刻殘渣不容易剩餘,因此用於印刷配線板的製造時能夠提升銅箔-基材間及基材-基材間兩者的密著信賴性。Surface-treated copper foil The surface-treated copper foil of the present invention includes a copper foil and a Zn-Ni-Mo layer provided on at least one side of the copper foil. If necessary, Zn-Ni-Mo layers may be provided on both sides of the copper foil. The Zn-Ni-Mo layer has a Zn adhesion amount of 3 mg / m 2 or more and 100 mg / m 2 or less, a Ni adhesion amount of 5 mg / m 2 or more and 60 mg / m 2 or less, and a Mo adhesion amount of 2.0 mg / m 2 or more and 40 mg / m 2. 2 or less. Next, Ni / (Zn + Ni + Mo), which is a ratio of the total amount of Ni deposition to the total amount of Zn deposition, Ni deposition, and Mo deposition, is 0.40 or more and 0.80 or less. By using a Zn-Ni-Mo layer with a predetermined composition as the rust-preventive treatment layer, it has excellent adhesion to the resin, chemical resistance, and heat resistance, and it is not easy to leave etching residues. Therefore, it can be used in the manufacture of printed wiring boards. Improves the adhesion reliability between copper foil-to-substrate and substrate-to-substrate.
關於此點,施予防銹處理的從前的表面處理銅箔,用於印刷配線板時,銅箔-基材間及基材-基材間的兩者的密著信賴性未必是好的。例如,專利文獻1揭示的那種具備Zn-Ni層的表面處理銅箔為耐熱性差者,焊接工程後等的剝離強度降低。又,如同前述,使用專利文獻2揭示的那種具備Ni-Mo層的表面處理銅箔來製作印刷配線板時,銅箔蝕刻後因Ni-Mo層而來的殘渣會留在絕緣基材表面,基材-基材間的樹脂密著力會降低。相對於此,本發明的表面處理銅箔,藉由作為防銹處理層具備Zn、Ni及Mo以預定附著量及附著比例包含的Zn-Ni-Mo層,耐藥性及耐熱性等佳,而且在銅蝕刻液(例如氯化第二銅蝕刻液)會快速溶解而難以產生因防銹處理層而來的殘渣。其結果,本發明的表面處理銅箔,關於銅箔-基材間的密著性,不只是常態中的密著性,在焊接工程後及酸處理後等中的密著性也佳,能呈現穩定的高密著性。而且,在印刷配線板的製造工程中,因為在將銅箔蝕刻除去後的絕緣基材表面殘渣不容易剩餘,不會妨礙與層積於絕緣基材表面的其他絕緣基材間的樹脂密著而充分發揮,能夠確保基材-基材間的高密著力。因此,本發明的表面處理銅箔因為在用於印刷配線板時能夠提升銅箔-基材間及基材-基材間兩者的信賴性,極適於銅箔-基材間及基材-基材間的密著力容易降低的高頻用印刷配線板的用途。In this regard, when the conventional surface-treated copper foil subjected to the rust prevention treatment is used for a printed wiring board, the adhesion reliability between the copper foil and the substrate and between the substrate and the substrate is not necessarily good. For example, the surface-treated copper foil provided with a Zn-Ni layer disclosed in Patent Document 1 is one having poor heat resistance, and the peel strength after welding process and the like is reduced. Also, as described above, when a printed wiring board is manufactured using a surface-treated copper foil provided with a Ni-Mo layer as disclosed in Patent Document 2, residues due to the Ni-Mo layer after copper foil etching remain on the surface of the insulating substrate , The substrate-to-substrate resin adhesion will be reduced. On the other hand, the surface-treated copper foil of the present invention is excellent in chemical resistance and heat resistance by including a Zn-Ni-Mo layer containing Zn, Ni, and Mo in a predetermined adhesion amount and adhesion ratio as a rust-preventive treatment layer. In addition, a copper etchant (for example, a second chlorinated copper etchant) rapidly dissolves and it is difficult to generate residues due to the rust-preventive treatment layer. As a result, the surface-treated copper foil of the present invention has excellent adhesion between the copper foil and the substrate, not only in the normal state, but also after the welding process and after the acid treatment. Shows stable high adhesion. Furthermore, in the manufacturing process of the printed wiring board, the residue on the surface of the insulating base material after the copper foil is removed by etching is not easy to remain, and it does not prevent the resin from adhering to other insulating base materials laminated on the surface of the insulating base material. However, full use can ensure high adhesion between the substrate and the substrate. Therefore, the surface-treated copper foil of the present invention is highly suitable for copper foil-to-substrate and substrate substrates because it can improve the reliability of both the copper-to-substrate and substrate-to-substrate substrates when used in printed wiring boards. -Use of a high-frequency printed wiring board in which the adhesion between substrates is easily reduced.
Zn為帶來防銹性能的基本成分,雖對銅蝕刻液具有好的溶解性,但為耐熱性差的金屬。從上述觀點來看,Zn-Ni-Mo層中的Zn附著量為3mg/m2 以上100mg/m2 以下、較佳為3mg/m2 以上80mg/m2 以下、更佳為4mg/m2 以上50mg/m2 以下、再佳為5mg/m2 以上30mg/m2 以下。在該範圍內確保了所期望的耐熱性,而且提升了Zn-Ni-Mo層相對於銅蝕刻液的溶解性能夠有效地防止殘渣的產生。Zn is a basic component that brings rust prevention performance. Although it has good solubility in copper etchant, it is a metal with poor heat resistance. From the above viewpoint, the Zn adhesion amount in the Zn-Ni-Mo layer is 3 mg / m 2 or more and 100 mg / m 2 or less, preferably 3 mg / m 2 or more and 80 mg / m 2 or less, and more preferably 4 mg / m 2. It is 50 mg / m 2 or less, more preferably 5 mg / m 2 or more and 30 mg / m 2 or less. Within this range, desired heat resistance is ensured, and the solubility of the Zn-Ni-Mo layer with respect to the copper etching solution is improved, which can effectively prevent the generation of residues.
Ni雖耐藥性及耐熱性佳,但為對銅蝕刻液難以溶解的金屬。從上述觀點來看,Zn-Ni-Mo層中的Ni附著量為5mg/m2 以上60mg/m2 以下、較佳為10mg/m2 以上50mg/m2 以下、更佳為15mg/m2 以上30mg/m2 以下。若在該範圍內,確保了銅箔蝕刻時的Zn-Ni-Mo層的優溶解性,且能提升銅箔的耐藥性及耐熱性,能夠有效地防止藥品浸漬後及焊接工程後等中的與絕緣基材的密著力降低。Although Ni is excellent in chemical resistance and heat resistance, it is a metal that is difficult to dissolve in a copper etchant. From the viewpoint described above, the Ni adhesion amount in the Zn-Ni-Mo layer is 5 mg / m 2 or more and 60 mg / m 2 or less, preferably 10 mg / m 2 or more and 50 mg / m 2 or less, and more preferably 15 mg / m 2. Above 30 mg / m 2 or less. Within this range, the excellent solubility of the Zn-Ni-Mo layer during copper foil etching is ensured, and the chemical resistance and heat resistance of the copper foil can be improved, which can effectively prevent chemical impregnation and soldering processes. The adhesion to the insulating substrate is reduced.
Mo雖然是有助於Cu的擴散防止的金屬,但若大量存在則在銅箔蝕刻時會容易產生殘渣。從上述觀點來看,Zn-Ni-Mo層中的Mo附著量為2.0mg/m2 以上40mg/m2 以下、較佳為2.0mg/m2 以上20mg/m2 以下、更佳為2.2mg/m2 以上10mg/m2 以下。若在該範圍內,確保了銅箔蝕刻時的Zn-Ni-Mo層的優溶解性,且能有效地防止Cu的擴散。其結果,提升了銅箔的耐藥性,能夠有效地防止焊接工程後等中的與絕緣基材的密著力降低。Mo is a metal that contributes to the prevention of the diffusion of Cu, but if it is present in a large amount, residue is liable to be generated during copper foil etching. From the above viewpoint, the Mo adhesion amount in the Zn-Ni-Mo layer is 2.0 mg / m 2 or more and 40 mg / m 2 or less, preferably 2.0 mg / m 2 or more and 20 mg / m 2 or less, and more preferably 2.2 mg. / m 2 or more and 10 mg / m 2 or less. Within this range, excellent solubility of the Zn-Ni-Mo layer during copper foil etching is ensured, and Cu diffusion can be effectively prevented. As a result, the chemical resistance of the copper foil is improved, and it is possible to effectively prevent a decrease in adhesion with the insulating base material after the welding process and the like.
Ni附著量相對於Zn附著量、Ni附著量及Mo附著量的合計量的比例即Ni/(Zn+Ni+Mo)為0.40以上0.80以下、較佳為0.45以上0.75以下、更佳為0.50以上0.65以下。 在該範圍內確保了的銅箔的良好耐藥性及耐熱性,也確保了Zn-Ni-Mo層相對於銅蝕刻液的良好溶解性,銅箔蝕刻時能夠有效地防止殘渣的產生。The ratio of the Ni adhesion amount to the total amount of the Zn adhesion amount, the Ni adhesion amount, and the Mo adhesion amount, that is, Ni / (Zn + Ni + Mo) is 0.40 or more and 0.80 or less, preferably 0.45 or more and 0.75 or less, and more preferably 0.50 or more. 0.65 or less. The good chemical resistance and heat resistance of the copper foil are ensured within this range, and the good solubility of the Zn-Ni-Mo layer with respect to the copper etchant is also ensured, and the occurrence of residues can be effectively prevented during copper foil etching.
Zn-Ni-Mo層為含Zn、Ni及Mo的層(較佳為合金層)即可。又,Zn-Ni-Mo層中的Zn附著量,在Zn-Ni-Mo層的表面設置Zn層適宜調整也可以。The Zn-Ni-Mo layer may be a layer (preferably an alloy layer) containing Zn, Ni, and Mo. The amount of Zn deposited in the Zn-Ni-Mo layer may be appropriately adjusted by providing a Zn layer on the surface of the Zn-Ni-Mo layer.
從與絕緣基材的密著性提升的觀點來看,表面處理銅箔在銅箔與Zn-Ni-Mo層之間,更具備以複數粗糙化粒子構成的粗糙化層較佳。粗糙化層的厚度較佳為0.01μm以上0.50μm以下、更佳為0.05μm以上0.30μm以下。From the viewpoint of improving the adhesion with the insulating substrate, it is preferable that the surface-treated copper foil further includes a roughened layer composed of a plurality of roughened particles between the copper foil and the Zn-Ni-Mo layer. The thickness of the roughened layer is preferably 0.01 μm or more and 0.50 μm or less, and more preferably 0.05 μm or more and 0.30 μm or less.
表面處理銅箔,Zn-Ni-Mo層側的表面(亦即從銅箔遠離側的最表面)的最大高度Sz較佳為7.0μm以下、更佳為1.0μm以上7.0μm以下。若在該範圍內,藉由微距化電路形成及高頻用途成為較合適者。特別是這樣的低粗度,在高頻信號傳送中降低了成為問題的銅箔的表皮效應,降低了銅箔引起的導體損耗,藉此能夠將高頻信號的傳送損耗刻意地降低。The maximum height Sz of the surface-treated copper foil, the surface of the Zn-Ni-Mo layer side (that is, the outermost surface away from the copper foil side) is preferably 7.0 μm or less, and more preferably 1.0 μm or more and 7.0 μm or less. If it is within this range, it is more suitable to use a macro circuit formation and high-frequency applications. In particular, such a low thickness reduces the skin effect of the copper foil that is a problem in the transmission of high-frequency signals, and reduces the conductor loss caused by the copper foil, thereby making it possible to intentionally reduce the transmission loss of high-frequency signals.
表面處理銅箔在Zn-Ni-Mo層的表面更具備鉻酸鹽層或矽烷偶合劑層較佳、更佳為具備鉻酸鹽層及矽烷偶合劑層兩者。藉由更具備鉻酸鹽層及/或矽烷偶合劑層,除了防銹性、耐濕性及耐藥性的提升以外,也能夠藉由與Zn-Ni-Mo層的組合提升與絕緣基材的密著性。The surface-treated copper foil preferably has a chromate layer or a silane coupling agent layer on the surface of the Zn-Ni-Mo layer, and more preferably has both a chromate layer and a silane coupling agent layer. With the addition of a chromate layer and / or a silane coupling agent layer, in addition to the improvement of rust prevention, moisture resistance, and chemical resistance, the combination with the Zn-Ni-Mo layer can also improve and insulate the substrate. Of adhesion.
表面處理銅箔的厚度雖無特別限定,但較佳為0.1μm以上105μm以下、更佳為0.5μm以上70μm以下。此外,表面處理銅箔不限於在通常的銅箔表面具備Zn-Ni-Mo層者,在附載體銅箔的銅箔表面具備Zn-Ni-Mo層者也可以。Although the thickness of the surface-treated copper foil is not particularly limited, it is preferably 0.1 μm or more and 105 μm or less, and more preferably 0.5 μm or more and 70 μm or less. The surface-treated copper foil is not limited to those having a Zn-Ni-Mo layer on the surface of a normal copper foil, and those having a Zn-Ni-Mo layer on the surface of a copper foil with a carrier copper foil may be used.
表面處理銅箔的製造方法
說明本發明的表面處理銅箔的較佳的製造方法的一例。該較佳的製造方法,包含準備銅箔,對該銅箔利用包含Zn、Ni及Mo的溶液進行表面處理。此外,本發明的表面處理銅箔不限於以下說明的方法,也可以是由任意方法製造者。The manufacturing method of the surface-treated copper foil is an example of the preferable manufacturing method of the surface-treated copper foil of this invention. The preferred manufacturing method includes preparing a copper foil, and subjecting the copper foil to a surface treatment with a solution containing Zn, Ni, and Mo. The surface-treated copper foil of the present invention is not limited to the method described below, and may be produced by any method.
(1)銅箔的準備
作為使用於表面處理銅箔的製造的銅箔,能使用電解銅箔及壓延銅箔兩者,較佳為電解銅箔。又,銅箔也可以是無粗糙化的銅箔、施予預備粗糙化者也可以。銅箔的厚度雖無特別限定,但較佳為0.1μm以上105μm以下、更佳為0.5μm以上70μm以下。銅箔以附載體銅箔的形態準備時,銅箔為藉由無電解鍍銅法及電解鍍銅法等濕式等成膜法、濺鍍及化學蒸鍍等乾式成膜法、或組合該等方法所形成者即可。(1) Preparation of copper foil As a copper foil used for the manufacture of a surface-treated copper foil, both electrolytic copper foil and rolled copper foil can be used, and electrolytic copper foil is preferred. In addition, the copper foil may be a copper foil without roughening, or it may be provided by a preliminary roughening. Although the thickness of the copper foil is not particularly limited, it is preferably from 0.1 μm to 105 μm, and more preferably from 0.5 μm to 70 μm. When the copper foil is prepared in the form of a copper foil with a carrier, the copper foil is formed by a wet film formation method such as electroless copper plating method and electrolytic copper plating method, a dry film formation method such as sputtering and chemical vapor deposition, or a combination thereof. Only those who are formed by the method can be used.
對銅箔進行粗糙化處理時,進行粗糙化處理而成的銅箔的表面,以ISO25178為準據測定的最大高度Sz較佳為2.0μm以下、更佳為1.5μm以下、再更佳為1.0μm以下。 若是上述範圍內,在表面處理銅箔的表面Sz容易實現期望的低表面輪廓。Sz的下限值沒有特別限定,但典型為0.1μm以上。When the copper foil is roughened, the maximum height Sz of the surface of the copper foil obtained by the roughening treatment based on ISO25178 is preferably 2.0 μm or less, more preferably 1.5 μm or less, and even more preferably 1.0. μm or less. Within the above range, it is easy to achieve a desired low surface profile on the surface Sz of the surface-treated copper foil. The lower limit value of Sz is not particularly limited, but is typically 0.1 μm or more.
(2)粗糙化處理
這樣對賦予上述低Sz的銅箔的表面施予粗糙化處理較佳。施予粗糙化處理的銅箔的表面可以是電極面及析出面的任一者,沒有特別限定。粗糙化處理為在包含銅濃度4g/L以上25g/L以下、及硫酸濃度50g/L以上300g/L以下的硫酸銅溶液中,以20℃以上60℃以下的溫度,以10A/dm2
以上100A/dm2
以下進行電解析出較佳,該電解析出以1秒以上20秒以下進行較佳。粗糙化處理,依照包含經由於銅箔上使微細銅粒析出附著的燒附鍍膜工程、及用來防止該微細銅粒脫落的覆蓋鍍膜工程的至少2種類的鍍膜工程的公知的鍍膜方法進行也可以。此時,燒附鍍膜工程以上述粗糙化處理條件進行電解析出較佳。又,覆蓋鍍膜工程為在包含銅濃度6g/L以上80g/L以下、及硫酸濃度100g/L以上300g/L以下的硫酸銅溶液中,以40℃以上60℃以下的溫度,以1A/dm2
以上70A/dm2
以下進行電解析出較佳,該電解析出以1秒以上20秒以下進行較佳。(2) Roughening treatment It is preferable to apply a roughening treatment to the surface of the copper foil provided with the low Sz as described above. The surface of the copper foil subjected to the roughening treatment may be any one of an electrode surface and a precipitation surface, and is not particularly limited. The roughening treatment is performed in a copper sulfate solution containing a copper concentration of 4 g / L or more and 25 g / L or less and a sulfuric acid concentration of 50 g / L or more and 300 g / L or less, at a temperature of 20 ° C or higher and 60 ° C or lower, and at 10A / dm 2 or higher. 100 A / dm 2 or less is preferably performed by electrolysis, and the electrolysis is preferably performed at 1 second or more and 20 seconds or less. The roughening treatment is performed according to a known coating method including at least two types of coating processes including a firing coating process for depositing and depositing fine copper particles on a copper foil and a covering coating process for preventing the fine copper particles from falling off. can. At this time, it is preferable that the firing coating process is performed by electrolytic analysis under the above roughening treatment conditions. In addition, the coating process is performed at a temperature of 40 ° C. to 60 ° C. and 1 A / dm in a copper sulfate solution containing a copper concentration of 6 g / L to 80 g / L and a sulfuric acid concentration of 100 g / L to 300 g / L. 2 to 70 A / dm 2 or less is preferred for electrical resolution, and the electrical resolution is preferably 1 to 20 seconds.
(3)防銹處理
對銅箔進行防銹處理形成Zn-Ni-Mo層。對銅箔進行粗糙化處理時,至少對粗糙化層存在之側的銅箔表面進行防銹處理較佳、更佳為對銅箔的兩面進行防銹處理。防銹處理較佳為包含利用Zn、Ni及Mo的鍍膜處理。該鍍膜處理可利用包含Zn、Ni及Mo的鍍膜液進行。鍍膜處理藉由吡咯啉酸浴進行較佳,例如能夠利用濃度為50g/L以上150g/L以下的吡咯啉酸鉀進行。作為鍍膜液的Zn源使用吡咯啉酸鋅、硫酸鋅等較佳,鍍膜液中的Zn濃度較佳為0.1g/L以上10g/L以下、更佳為1g/L以上5g/L以下作為鍍膜液的Ni源使用硫酸鎳、氯化鎳、醋酸鎳等較佳,鍍膜液中的Ni濃度較佳為0.1g/L以上10g/L以下、更佳為1g/L以上5g/L以下作為鍍膜液的Mo源使用鉬酸鈉、鉬酸鉀、鉬酸氨等較佳,鍍膜液中的Mo濃度較佳為0.1g/L以上10g/L以下、更佳為0.5g/L以上5g/L以下利用上述範圍內的鍍膜液以20℃以上50℃以下的溫度,以0.1A/dm2
以上5.0A/dm2
以下進行電解較佳,該電解以1秒以上30秒以下進行較佳。(3) Anti-rust treatment The copper foil is subjected to an anti-rust treatment to form a Zn-Ni-Mo layer. When the copper foil is roughened, it is preferable to perform rust prevention treatment on at least the surface of the copper foil on the side where the roughened layer exists, and more preferably to perform rust prevention treatment on both sides of the copper foil. The rust prevention treatment preferably includes a plating treatment using Zn, Ni, and Mo. This coating process can be performed using a coating solution containing Zn, Ni, and Mo. The coating treatment is preferably performed using a pyrroline acid bath, and can be performed using, for example, potassium pyrroline acid having a concentration of 50 g / L or more and 150 g / L or less. As the Zn source of the coating solution, zinc pyrrolinate, zinc sulfate, etc. are preferably used. The Zn concentration in the coating solution is preferably 0.1 g / L or more and 10 g / L or less, and more preferably 1 g / L or more and 5 g / L or less as the coating film. As the Ni source of the liquid, nickel sulfate, nickel chloride, nickel acetate, etc. are preferably used. The Ni concentration in the coating solution is preferably 0.1 g / L or more and 10 g / L or less, and more preferably 1 g / L or more and 5 g / L or less as the coating film. The Mo source of the liquid is preferably sodium molybdate, potassium molybdate, ammonia molybdate, etc. The Mo concentration in the coating solution is preferably 0.1 g / L or more and 10 g / L or less, and more preferably 0.5 g / L or more and 5 g / L or more. using the following plating liquid at a temperature within the above range above 20 ℃ or less 50 ℃, to 0.1A / dm 2 or more 5.0A / dm 2 or less preferred electrolysis, the electrolysis is preferably 1 second or more to 30 seconds or less.
(4)鉻酸鹽處理
對施予防銹處理的銅箔進行鉻酸鹽處理,形成鉻酸鹽層較佳。鉻酸鹽處理以鉻酸濃度0.5g/L以上8g/L以下、pH1以上13以下、電流密度為0.1A/dm2
以上10A/dm2
以下進行電解較佳,該電解以1秒以上30秒以下進行較佳。(4) Chromate treatment It is preferable to perform a chromate treatment on the copper foil subjected to the rust prevention treatment to form a chromate layer. The chromate treatment is preferably performed at a chromic acid concentration of 0.5 g / L or more and 8 g / L or less, pH 1 or more and 13 or less, and a current density of 0.1 A / dm 2 or more and 10 A / dm 2 or less. The electrolysis is performed for 1 second or more and 30 seconds or less. The following is preferred.
(5)矽烷偶合劑處理
對銅箔施予矽烷偶合劑處理,形成矽烷偶合劑層較佳。矽烷偶合劑層可以將矽烷偶合劑適度地稀釋並塗布,將其乾燥而形成。作為矽烷偶合劑之例,有4-縮水甘油醚三甲、3-環氧丙氧基丙基三甲氧基矽烷等的環氧官能性矽烷偶合劑、或3-氨丙基三乙氧基矽烷、N-2(氨乙基)3-氨丙基三乙氧基矽烷、N-3-(4-(3-氨丙氧基)丁氧基)丙基-3-氨基丙基三乙氧基矽烷、N-苯基-3-氨丙基三乙氧基矽烷等的氨官能性矽烷偶合劑、或3-氨丙基三乙氧基矽烷等的巰基官能性矽烷偶合劑或乙烯基三甲氧基矽烷、乙烯基苯基三甲氧基矽烷等的烯烴官能性矽烷偶合劑、或3-甲基丙烯醯氧基丙基三甲氧基矽烷等的丙烯酸官能性矽烷偶合劑、或咪唑矽烷等的咪唑官能性矽烷偶合劑、或三嗪矽烷等的三嗪官能性矽烷偶合劑等。(5) Silane coupling agent treatment It is preferable to apply a silane coupling agent treatment to copper foil to form a silane coupling agent layer. The silane coupling agent layer can be formed by appropriately diluting and coating the silane coupling agent and drying it. Examples of the silane coupling agent include epoxy-functional silane coupling agents such as 4-glycidyl ether trimethyl, 3-glycidoxypropyltrimethoxysilane, or 3-aminopropyltriethoxysilane, N-2 (aminoethyl) 3-aminopropyltriethoxysilane, N-3- (4- (3-aminopropoxy) butoxy) propyl-3-aminopropyltriethoxy Ammonia-functional silane coupling agents such as silane, N-phenyl-3-aminopropyltriethoxysilane, or mercapto-functional silane coupling agents such as 3-aminopropyltriethoxysilane, or vinyltrimethoxy Olefin-functional silane coupling agents such as silanes and vinylphenyltrimethoxysilane; acrylic functional silane coupling agents such as 3-methacryloxypropyltrimethoxysilane; or imidazoles such as imidazole silane A functional silane coupling agent, or a triazine functional silane coupling agent such as a triazine silane.
覆銅層積板
本發明的表面處理銅箔較佳為用於印刷配線板用覆銅層積板的製作。亦即,根據本發明較佳的態樣,提供一種覆銅層積板,具備:上述表面處理銅箔、及設於該表面處理銅箔的至少一面的絕緣基材。表面處理銅箔可以設於絕緣基材的單面、也可以設於兩面。絕緣基材的損耗因子在頻率10GHz中為0.004以下較佳、更佳為0.003以下。 藉此,用於印刷配線板時能夠降低由絕緣基材引起的介電損耗,因此能製作適合高頻用途的印刷配線板。絕緣基材較佳為含有絕緣性樹脂。絕緣基材較佳為預浸物及/或樹脂片。預浸物為合成樹脂板、玻璃板、玻璃織布、玻璃不織布、紙等基材浸於合成樹脂的複合材料之總稱。作為含浸於預浸物的絕緣性樹脂較佳的例子,有環氧樹脂、氰酸酯樹脂、雙馬來酰亞胺三嗪樹脂(BT樹脂)、聚苯醚樹脂、酚醛樹脂等。此外,作為構成樹脂片的絕緣性樹脂的例子,有環氧樹脂、聚酰亞胺樹脂、聚酯纖維樹脂等。此外,絕緣基材從提升絕緣性等的觀點來看,也可以含有由二氧化矽、氧化鋁等各種無機粒子所構成的填料粒子。絕緣基材的厚度沒有特別限定,但較佳為1μm以上1000μm以下、更佳為2μm以上400μm以下、再更佳為3μm以上200μm以下。絕緣基材也可以由複數的層所構成。預浸物及/或樹脂片等的絕緣基材也可以藉由預先在銅箔表面塗佈的底塗層樹脂層設於表面處理銅箔。Copper-clad laminate The surface-treated copper foil of the present invention is preferably used for producing a copper-clad laminate for a printed wiring board. That is, according to a preferred aspect of the present invention, a copper-clad laminate is provided, including the above-mentioned surface-treated copper foil and an insulating substrate provided on at least one side of the surface-treated copper foil. The surface-treated copper foil may be provided on one side or both sides of the insulating substrate. The loss factor of the insulating base material is preferably 0.004 or less and more preferably 0.003 or less at a frequency of 10 GHz. Accordingly, when used for a printed wiring board, the dielectric loss caused by the insulating substrate can be reduced, so that a printed wiring board suitable for high-frequency applications can be produced. The insulating substrate preferably contains an insulating resin. The insulating substrate is preferably a prepreg and / or a resin sheet. The prepreg is a general term for a composite material in which a substrate such as a synthetic resin plate, a glass plate, a glass woven fabric, a glass non-woven fabric, and paper is impregnated with a synthetic resin. Preferred examples of the insulating resin impregnated with the prepreg include epoxy resin, cyanate resin, bismaleimide triazine resin (BT resin), polyphenylene ether resin, and phenol resin. Examples of the insulating resin constituting the resin sheet include epoxy resin, polyimide resin, and polyester fiber resin. In addition, the insulating substrate may contain filler particles composed of various inorganic particles such as silicon dioxide and alumina from the viewpoint of improving insulation properties and the like. The thickness of the insulating substrate is not particularly limited, but it is preferably 1 μm or more and 1000 μm or less, more preferably 2 μm or more and 400 μm or less, and even more preferably 3 μm or more and 200 μm or less. The insulating substrate may be composed of a plurality of layers. An insulating base material such as a prepreg and / or a resin sheet may be provided on the surface-treated copper foil by an undercoat resin layer applied on the surface of the copper foil in advance.
本發明的表面處理銅箔或覆銅層積板用於印刷配線板的製作較佳。亦即,根據本發明的較佳態樣,提供一種利用前述表面處理銅箔或上述覆銅層積板製造印刷配線板的印刷配線板的製造方法、或者利用前述表面處理銅箔或上述覆銅層積板得到的印刷配線板。藉由使用本發明的表面處理銅箔乃至覆銅層積板,如同上述能夠提供一種銅箔-基材間及基材-基材間的兩者的密著信賴性佳的印刷配線板。本態樣的印刷配線板包含依序層積絕緣基材、及銅層的層構成。此外,就絕緣基材而言,關於覆銅層積板與上述相同。不管如何,印刷配線板可以採用公知的層構成。作為有關印刷配線板的具體例,有作為在預浸物的單面或兩面使本發明的表面處理銅箔黏接並硬化的層積體後形成電路的單面或兩面印刷配線板、或將其等多層化的多層印刷配線板等。此外,作為其他的具體例,也可以是在樹脂薄膜上形成本發明的表面處理銅箔並形成電路的軟性印刷電路配線板、COF、TAB賿帶等。再來作為其他的具體例,在本發明的表面處理銅箔形成塗佈上述絕緣性樹脂的帶樹脂銅箔(RCC),將絕緣性樹脂作為絕緣黏接材層層積於上述印刷配線板後,將表面處理銅箔作為配線層的全部或一部分利用改性半添加(MSAP)法、減法製程法等的手法形成電路的積層配線板,或除去表面處理銅箔以半添加(SAP)法形成電路的積層配線板、向半導體積體電路上交互反覆進行帶樹脂銅箔的積層及形成電路的在晶圓上直接積層等。
[實施例]The surface-treated copper foil or copper-clad laminated board of the present invention is preferably used for manufacturing a printed wiring board. That is, according to a preferred aspect of the present invention, there is provided a method for manufacturing a printed wiring board using the aforementioned surface-treated copper foil or the aforementioned copper-clad laminate to produce a printed wiring board, or using the aforementioned surface-treated copper foil or the aforementioned copper-clad A printed wiring board obtained by laminating a board. By using the surface-treated copper foil or the copper-clad laminated board of the present invention, it is possible to provide a printed wiring board having excellent adhesion and reliability between the copper foil-to-base material and the substrate-to-base material as described above. The printed wiring board of this aspect includes a layer structure in which an insulating base material and a copper layer are sequentially laminated. In addition, regarding the insulating base material, the copper-clad laminate is the same as described above. In any case, the printed wiring board can be constructed using a known layer. As a specific example of the printed wiring board, there is a single-sided or double-sided printed wiring board that forms a circuit after the surface-treated copper foil of the present invention is adhered and cured on one or both sides of a prepreg, or the Such multilayer printed wiring boards and the like. In addition, as another specific example, a flexible printed circuit wiring board, a COF, a TAB tape, or the like, in which the surface-treated copper foil of the present invention is formed on a resin film to form a circuit, may also be used. As another specific example, a resin-coated copper foil (RCC) coated with the insulating resin is formed on the surface-treated copper foil of the present invention, and the insulating resin is laminated on the printed wiring board as an insulating adhesive. The surface-treated copper foil is used as the whole or a part of the wiring layer to form a laminated wiring board of a circuit by a method such as modified semi-additive (MSAP) method or subtractive process method, or the surface-treated copper foil is removed and formed by the semi-additive (SAP) method Laminated wiring boards for circuits, lamination with resin copper foil alternately on semiconductor integrated circuits, and direct lamination on wafers to form circuits.
[Example]
以下,利用實施例來更進一步說明本發明。Hereinafter, the present invention will be further described using examples.
例1~9
本發明的表面處理銅箔的製作及評價以以下的方式進行。Examples 1-9
The preparation and evaluation of the surface-treated copper foil of this invention were performed as follows.
(1)電解銅箔的製作
作為銅電解液利用以下所示組成的硫酸酸性硫酸銅溶液,在陰極使用鈦製的旋轉電極,在陽極使用DSA(尺寸穩定性陽極),以溶液溫度45℃、電流密度55A/dm2
電解,得到厚度18μm的電解銅箔。將該電解銅箔的析出面及電極面的最大高度Sz以ISO25178為準據利用雷射顯微鏡(股份公司基恩斯製,VK-X100)測定,析出面的Sz為0.5μm、電極面的Sz為1.2μm。該測定,就電解銅箔的析出面及電極面而言,藉由分別測定面積22500μm2
的區域(150μm× 150μm)的表面輪廓而進行,未使用測定面積濾光器。
<硫酸酸性硫酸銅溶液的組成>
‐ 銅濃度:80g/L
‐ 硫酸濃度:260g/L
‐ 雙(3-磺丙基)二硫化物濃度:30mg/L
‐ 二烯丙基二甲基氯化銨聚合體濃度:50mg/L
‐ 氯濃度:40mg/L(1) Production of electrolytic copper foil As a copper electrolyte, a sulfuric acidic copper sulfate solution having the composition shown below was used, a rotating electrode made of titanium was used for the cathode, and a DSA (dimensional stability anode) was used for the anode. Electrolysis was performed at a current density of 55 A / dm 2 to obtain an electrolytic copper foil having a thickness of 18 μm. The maximum height Sz of the precipitation surface and the electrode surface of this electrolytic copper foil was measured with a laser microscope (VK-X100, manufactured by Keynes Corporation) based on ISO25178. The Sz of the precipitation surface was 0.5 μm, and the Sz of the electrode surface was 1.2. μm. This measurement was performed by measuring the surface profile of a region (150 μm × 150 μm) with an area of 22,500 μm 2 for the precipitation surface and the electrode surface of the electrolytic copper foil, and a measurement area filter was not used.
<Composition of Acidic Copper Sulfate Solution>
‐ Copper concentration: 80g / L
‐ Sulfuric acid concentration: 260g / L
‐ Bis (3-sulfopropyl) disulfide concentration: 30mg / L
‐ Diallyl dimethyl ammonium chloride polymer concentration: 50mg / L
‐ Chlorine concentration: 40mg / L
(2)粗糙化處理
對上述得到的電解銅箔的析出面側,進行以下所示的條件A(1階段鍍膜,例1~3及5~9)或條件B(2階段鍍膜,例4)所致的粗糙化處理。(2) Roughening treatment On the deposition surface side of the electrolytic copper foil obtained as described above, the condition A (first-stage coating, Examples 1 to 3 and 5-9) or condition B (two-stage coating, Example 4) shown below was performed. Roughening caused by.
<條件A(1階段鍍膜)>
在銅濃度10g/L、硫酸濃度100g/L的硫酸銅溶液浸漬電解銅箔,以液溫30℃、電流密度40A/dm2
的條件進行粗糙化處理,在電解銅箔的析出面側形成粗糙化層。<Condition A (1-stage coating)>
The electrolytic copper foil was immersed in a copper sulfate solution having a copper concentration of 10 g / L and a sulfuric acid concentration of 100 g / L, and roughened under the conditions of a liquid temperature of 30 ° C and a current density of 40 A / dm 2 to form a rough surface on the precipitation surface side of the electrolytic copper foil.化 层。 The layer.
<條件B(2階段鍍膜)>
在銅濃度4g/L、硫酸濃度200g/L的硫酸銅溶液浸漬電解銅箔,以液溫30℃、電流密度30A/dm2
的條件進行第1階段的粗糙化處理。之後,作為第2階段的粗糙化處理,在銅濃度69g/L、硫酸濃度240g/L的硫酸銅溶液浸漬硫酸銅溶液,以液溫50℃、電流密度10A/dm2
的條件進行覆蓋鍍膜,在電解銅箔的析出面側形成粗糙化層。<Condition B (two-stage coating)>
The electrolytic copper foil was immersed in a copper sulfate solution having a copper concentration of 4 g / L and a sulfuric acid concentration of 200 g / L, and the first-stage roughening treatment was performed under the conditions of a liquid temperature of 30 ° C and a current density of 30 A / dm 2 . After that, as the second-stage roughening treatment, the copper sulfate solution was immersed in a copper sulfate solution having a copper concentration of 69 g / L and a sulfuric acid concentration of 240 g / L, and the coating was performed under the conditions of a liquid temperature of 50 ° C and a current density of 10 A / dm 2 . A roughened layer is formed on the precipitation surface side of the electrolytic copper foil.
(3)防銹處理
對上述粗糙化處理後的電解銅箔進行1階段(例1~7)或2階段(例8及9)的防銹處理,在形成電解銅箔的粗糙化層的表面形成Zn-Ni-Mo層。具體來說,第1階段的處理,藉由在以表1所示的Zn、Ni及Mo濃度包含吡咯啉酸鋅(Zn源)、硫酸鎳(Ni源)及鉬酸鈉(Mo源)的吡咯啉酸鉀濃度100g/L的吡咯啉酸浴中使電解銅箔浸漬,以液溫40℃、表1所示的電流密度及處理時間使Zn-Ni-Mo電沉積來進行。第2階段的處理,藉由在以表1所示的Zn濃度包含吡咯啉酸鋅(Zn源)的吡咯啉酸鉀濃度145g/L的吡咯啉酸浴中使經由第1階段的處理的電解銅箔浸漬,以液溫30℃、表1所示的電流密度及處理時間使Zn電沉積來進行。此時藉由將Zn濃度、Ni濃度、Mo濃度、電流密度及處理時間以表1所示那樣適宜變更,製作Zn-Ni-Mo層中的Zn附著量、Ni附著量、Mo附著量及Ni/(Zn+Ni+Mo)不同各種樣本。(3) Rust prevention treatment The electrolytic copper foil after the roughening treatment is subjected to a one-stage (examples 1 to 7) or two-stage (examples 8 and 9) rust prevention treatment, and the surface of the roughened layer of the electrolytic copper foil is formed. A Zn-Ni-Mo layer is formed. Specifically, in the first stage of the treatment, the concentration of Zn, Ni, and Mo shown in Table 1 includes zinc pyrrolinate (Zn source), nickel sulfate (Ni source), and sodium molybdate (Mo source). An electrolytic copper foil was immersed in a pyrroline acid bath having a potassium pyrroline acid concentration of 100 g / L, and Zn-Ni-Mo was electrodeposited at a liquid temperature of 40 ° C, a current density shown in Table 1, and a treatment time. In the second-stage treatment, electrolysis through the first-stage treatment was performed in a pyrroline acid bath having a potassium pyrroline acid concentration of 145 g / L containing zinc pyrroline acid (Zn source) at a Zn concentration shown in Table 1. The copper foil was immersed, and Zn was electrodeposited at a liquid temperature of 30 ° C, a current density shown in Table 1, and a treatment time. At this time, by appropriately changing the Zn concentration, Ni concentration, Mo concentration, current density, and processing time as shown in Table 1, a Zn-Ni-Mo layer, a Ni-layer, a Mo-layer, and a Ni-layer in the Zn-Ni-Mo layer were produced. / (Zn + Ni + Mo) different samples.
(4)鉻酸鹽處理
對進行上述防銹處理的電解銅箔的兩面進行鉻酸鹽處理,在Zn-Ni-Mo層之上形成鉻酸鹽層。該鉻酸鹽處理以鉻酸濃度1g/L、pH11、液溫25℃及電流密度1A/dm2
的條件進行。(4) Chromate treatment A chromate treatment is performed on both sides of the electrolytic copper foil subjected to the rust prevention treatment to form a chromate layer on the Zn-Ni-Mo layer. This chromate treatment was performed under conditions of a chromic acid concentration of 1 g / L, a pH of 11, a liquid temperature of 25 ° C, and a current density of 1 A / dm 2 .
(5)矽烷偶合劑處理
將形成上述鉻酸鹽層的銅箔進行水洗,之後馬上進行矽烷偶合劑處理,在粗糙化處理面的鉻酸鹽層上形成矽烷偶合劑層。該矽烷偶合劑處理藉由將純水作為溶劑,利用3-氨丙基三乙氧基矽烷濃度為3g/L的溶液,將該溶液以噴淋環吹送至粗糙化處理面經由吸附處理而進行。矽烷偶合劑的吸附後,最終藉由電熱器使水分蒸發,得到厚度18μm的表面處理銅箔。(5) Silane coupling agent treatment The copper foil forming the chromate layer was washed with water, and immediately after the silane coupling agent treatment, a silane coupling agent layer was formed on the chromate layer on the roughened surface. This silane coupling agent treatment is performed by using pure water as a solvent and using a solution of 3-aminopropyltriethoxysilane concentration of 3 g / L, and blowing the solution to a roughened surface through a spray ring, followed by adsorption treatment. . After adsorption of the silane coupling agent, water was finally evaporated by an electric heater to obtain a surface-treated copper foil having a thickness of 18 μm.
(6)評價
關於製作的表面處理銅箔,進行以下所示的測定及評價。(6) Evaluation About the produced surface-treated copper foil, the measurement and evaluation shown below were performed.
(a)最大高度Sz的測定
利用雷射顯微鏡(股份公司基恩斯製,VK-X100)以ISO25178為準據測定表面處理銅箔的Zn-Ni-Mo層側的表面(亦即矽烷偶合劑層的表面)的最大高度Sz。此外,該Zn-Ni-Mo層側的表面的Sz為概略反映粗化層表面的Sz者。該測定藉由表面處理銅箔的最表面的面積22500μm2
的區域(150μm×150μm)的表面輪廓而進行,未使用測定面積濾光器。結果顯示於表2。(a) Measurement of the maximum height Sz The surface of the Zn-Ni-Mo layer side of the surface-treated copper foil (that is, the Surface) maximum height Sz. The Sz on the surface of the Zn-Ni-Mo layer side is the one that roughly reflects the Sz on the surface of the roughened layer. This measurement was performed using the surface profile of a region (150 μm × 150 μm) of the surface area of the surface-treated copper foil of 22,500 μm 2 , and a measurement area filter was not used. The results are shown in Table 2.
(b)Zn-Ni-Mo層中的各元素附著量的測定
將表面處理銅箔的Zn-Ni-Mo層側的表面的面積25cm2
(5cm×5cm)的區域以酸溶解,將得到的溶解液中的Zn、Ni及Mo的各濃度以ICP發光分析法分析,測定Zn附著量、Ni附著量及Mo附著量。從得到的測定結果,算出Ni附著量相對於Zn附著量、Ni附著量及Mo附著量的合計量的比例即Ni/(Zn+Ni+Mo)。 結果顯示於表2。(b) Measurement of adhesion amount of each element in the Zn-Ni-Mo layer An area having a surface area of 25 cm 2 (5 cm × 5 cm) on the Zn-Ni-Mo layer side of the surface-treated copper foil was dissolved with an acid, and the obtained Each concentration of Zn, Ni, and Mo in the dissolved solution was analyzed by ICP emission analysis, and the amount of Zn, Ni, and Mo were measured. From the obtained measurement results, Ni / (Zn + Ni + Mo) was calculated as a ratio of the Ni deposition amount to the total amount of the Zn deposition amount, the Ni deposition amount, and the Mo deposition amount. The results are shown in Table 2.
(c)銅箔-基材間的密著信賴性評價
關於各種狀態(例如常態、熱負荷後及藥品浸漬後)的表面處理銅箔,為了評價與絕緣基材的密著性,如同以下進行常態剝離強度、焊接流程後剝離強度、及酸處理後剝離強度(耐鹽酸劣化率)的測定。結果顯示於表2。(c) Evaluation of adhesion reliability between copper foil and substrate The surface treated copper foil in various states (for example, normal state, after heat load, and after chemical impregnation) was evaluated as follows for the adhesion to the insulating substrate. Measurement of normal peeling strength, peeling strength after welding process, and peeling strength (resistance to hydrochloric acid deterioration) after acid treatment. The results are shown in Table 2.
(c-1)常態剝離強度
作為絕緣基材,將聚苯醚及三烯丙基異氰脲酸酯及雙馬來醯亞胺樹脂作為主成分的預浸物(厚度100μm)準備2枚,堆積。在該堆積的預浸物,以製作的表面處理銅箔以該粗糙化處理面與預浸物抵接的方式層積,以32kgf/cm2
、205℃進行120分的加壓製作覆銅層積板。接著,在該覆銅層積板藉由蝕刻法進行電路形成,製作具備3mm寬度的直線電路的試驗基板。將以此得到的直線電路以JIS C 5016-1994的A法(90°剝離)為準據從絕緣基材剝離測定常態剝離強度(kgf/cm)。結果顯示於表2。(c-1) Prepare two pieces of prepreg (thickness: 100 μm) with polyphenylene ether, triallyl isocyanurate, and bismaleimide resin as main components as the insulating base material. accumulation. The deposited prepreg was laminated with the prepared surface-treated copper foil such that the roughened surface abuts the prepreg, and was pressed at 32 kgf / cm 2 at 205 ° C for 120 minutes to produce a copper-clad layer. Product board. Next, a circuit board was formed on the copper-clad laminate by an etching method, and a test substrate having a linear circuit having a width of 3 mm was produced. The linear circuit thus obtained was peeled from the insulating substrate in accordance with A method (90 ° peeling) of JIS C 5016-1994 to measure the normal peel strength (kgf / cm). The results are shown in Table 2.
(c-2)焊接流程後剝離強度
在剝離強度的測定之前,除了將具備直線電路的試驗基板在288℃的焊接浴中浮置300秒以外,藉由與上述常態剝離強度一樣的順序,測定焊接流程後剝離強度(kgf/cm)。結果顯示於表2。(c-2) Peel strength after soldering process Before the peel strength is measured, the test substrate with a linear circuit is floated in a solder bath at 288 ° C for 300 seconds, and measured in the same procedure as the above-mentioned normal peel strength. Peel strength (kgf / cm) after welding process. The results are shown in Table 2.
(c-3)酸處理後剝離強度(耐鹽酸劣化率)
將電路寬度作為0.4mm以外,藉由與上述常態剝離強度同樣的順序,測定酸處理前剝離強度(kgf/cm)。又,在(i)將電路寬度設為0.4mm、及(ii)剝離強度的測定之前,除了使具備直線電路的試驗基板,在4mol/L的鹽酸以60℃進行90分浸漬以外,藉由與上述常態剝離強度一樣的順序,測定酸處理後剝離強度(kgf/cm)。從以此得到的酸處理前後的剝離強度算出耐鹽酸劣化率(%)。(c-3) Peel strength after acid treatment (resistance to hydrochloric acid)
Using a circuit width other than 0.4 mm, the peel strength (kgf / cm) before acid treatment was measured in the same procedure as the normal peel strength. In addition, before (i) setting the circuit width to 0.4 mm and (ii) measuring the peel strength, a test substrate provided with a linear circuit was immersed in 4 mol / L hydrochloric acid at 60 ° C for 90 minutes by using In the same procedure as the above-mentioned normal peel strength, the peel strength (kgf / cm) after the acid treatment was measured. From the peel strength before and after the acid treatment thus obtained, the degradation rate (%) of hydrochloric acid resistance was calculated.
(c)基材-基材間的密著信賴性評價
經由銅箔的蝕刻除去而製作的多層層積體中的基材-基材間的密著性如同以下進行評價。首先,在將聚苯醚及三烯丙基異氰脲酸酯及雙馬來醯亞胺樹脂作為主成分的預浸物(厚度100μm)準備2枚堆積的絕緣基材110的兩面,將表面處理銅箔112以其粗糙化處理面與絕緣基材110抵接的方式層積,以32kgf/cm2
、205℃進行120分加壓得到第1覆銅層積板114(圖1(a))。對該第1覆銅層積板114的兩面,利用酸濃度3mol/L的氯化第二銅蝕刻液以浴溫50℃進行蝕刻,將存在於兩面的表面處理銅箔112溶解去除,得到表面處理銅箔112的粗糙化處理面的形狀轉印至表面的絕緣基材110’(圖1(b))。該蝕刻,藉由將第1覆銅層積板114在長度約50cm的蝕刻槽內以23秒通過的(速度1.3m/分)操作合計實施2次來進行。接著,對蝕刻處理後的絕緣基材110’,依序進行純水洗淨、稀鹽酸(濃度10體積%)洗淨、及純水洗淨。將洗淨後的絕緣基材110’在80℃的清淨烘箱內進行20分乾燥。在乾燥的絕緣基材110’的兩面依序層積上述厚度100μm的預浸物116及表面處理銅箔112,以32kgf/cm2
、205℃進行120分加壓作為第2覆銅層積板118(圖1(c))。對該第2覆銅層積板118的兩面,利用酸濃度3mol/L的氯化第二銅蝕刻液以浴溫50℃進行蝕刻,將存在於兩面的表面處理銅箔112溶解去除,得到評價用樣本120(圖1(d))。從該評價用樣本120切取出5cm×10cm的大小的2枚試驗片。將該等試驗片投入PCT(Pressure Cooker Test)試驗機,以2大氣壓、121℃、100%RH的條件進行50分吸濕。將吸濕後的試驗片藉由PCT試驗機取出,拭取水分後,從取出後10分以內進行焊接浸漬。該焊接浸漬藉由在288℃的焊接浴中使試驗片以20秒浸漬的操作合計實施20次來進行。焊接浸漬後,以目視確認試驗片中的膨凸(亦即層積體內部的基材間的剝離帶來的氣泡狀間隙)的有無,2枚試驗片之中至少1枚發生膨凸時判定有膨凸。又,產生的膨凸應該是在銅箔的蝕刻後殘留的防銹處理層的殘渣所引起的。結果顯示於表2。(c) Evaluation of adhesion reliability between the substrate and the substrate The adhesion between the substrate and the substrate in the multilayer laminate produced by etching removal of the copper foil was evaluated as follows. First, two surfaces of two stacked insulating substrates 110 were prepared on a prepreg (thickness: 100 μm) containing polyphenylene ether, triallyl isocyanurate, and bismaleimide resin as main components, and the surfaces were The processed copper foil 112 is laminated so that the roughened surface thereof comes into contact with the insulating substrate 110, and is pressed at 32 kgf / cm 2 at 205 ° C for 120 minutes to obtain a first copper-clad laminate 114 (Fig. 1 (a) ). The two surfaces of the first copper-clad laminate 114 were etched with a second copper etchant with an acid concentration of 3 mol / L at a bath temperature of 50 ° C, and the surface-treated copper foil 112 existing on both sides was dissolved and removed to obtain a surface. The shape of the roughened surface of the processed copper foil 112 is transferred to the surface of the insulating substrate 110 '(FIG. 1 (b)). This etching was performed by performing a total of 2 operations (speed 1.3 m / min) passing the first copper-clad laminate 114 in an etching tank having a length of about 50 cm for 23 seconds (speed 1.3 m / min). Next, the insulating base material 110 'after the etching treatment is sequentially washed with pure water, diluted with hydrochloric acid (concentration: 10% by volume), and washed with pure water. The washed insulating substrate 110 'was dried in a cleaning oven at 80 ° C for 20 minutes. The prepreg 116 and the surface-treated copper foil 112 having a thickness of 100 μm were sequentially laminated on both sides of the dried insulating substrate 110 ′, and pressed at 32 kgf / cm 2 at 205 ° C. for 120 minutes to form a second copper-clad laminate. 118 (Figure 1 (c)). The two surfaces of the second copper-clad laminate 118 were etched with a second copper etchant of chloride with an acid concentration of 3 mol / L at a bath temperature of 50 ° C., and the surface-treated copper foil 112 existing on both sides was dissolved and removed to obtain an evaluation. Sample 120 is used (Fig. 1 (d)). Two test pieces having a size of 5 cm × 10 cm were cut out from the sample 120 for evaluation. These test pieces were put into a PCT (Pressure Cooker Test) tester, and moisture absorption was performed for 50 minutes under the conditions of 2 atmospheres, 121 ° C, and 100% RH. The moisture-absorbing test piece was taken out by a PCT tester, and after the water was wiped off, it was welded and immersed within 10 minutes after taking out. This welding immersion was performed by performing a total of 20 operations of immersing a test piece in a welding bath at 288 ° C. for 20 seconds. After welding and dipping, the presence or absence of bulges in the test piece (that is, bubble-like gaps caused by peeling between substrates in the laminate) was visually confirmed. It was determined when bulges occurred in at least one of the two test pieces. Has bulging. The bulging should be caused by the residue of the rust-preventive treatment layer remaining after the etching of the copper foil. The results are shown in Table 2.
110‧‧‧絕緣基材110‧‧‧ insulating substrate
112‧‧‧表面處理銅箔 112‧‧‧Surface-treated copper foil
114‧‧‧第1覆銅層積板 114‧‧‧The first copper-clad laminate
116‧‧‧預浸物 116‧‧‧ Prepreg
118‧‧‧第2覆銅層積板 118‧‧‧The second copper-clad laminate
120‧‧‧評價用樣本 120‧‧‧ Evaluation Sample
[圖1] 表示例1~9的基材-基材間的密著性評價中的評價用樣本的製作工程(工程(a)~(d))的工程流程圖。[Fig. 1] A process flow of a production process (processes (a) to (d)) for preparing a sample for evaluation in the substrate-to-substrate adhesion evaluation in Table Examples 1 to 9.
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