TWI805902B - Surface treated copper foil, copper clad laminate and printed circuit board - Google Patents

Surface treated copper foil, copper clad laminate and printed circuit board Download PDF

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TWI805902B
TWI805902B TW109107019A TW109107019A TWI805902B TW I805902 B TWI805902 B TW I805902B TW 109107019 A TW109107019 A TW 109107019A TW 109107019 A TW109107019 A TW 109107019A TW I805902 B TWI805902 B TW I805902B
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copper foil
zinc
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roughened
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TW202042600A (en
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篠崎淳
齋藤貴廣
西田真輔
佐佐木宏和
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日商古河電氣工業股份有限公司
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Abstract

本發明提供一種以高水準兼顧非粗化面之密接性、可靠性以及傳輸損失之降低之表面處理銅箔。 表面處理銅箔具備:銅箔主體1,其兩個主面中之一者為由粗化處理形成之粗化面1a,另一者為非粗化面1b;以及防銹層10,其形成於銅箔主體1之非粗化面1b上。防銹層10具有由金屬鋅構成之金屬鋅層11、由鋅氧化物構成之鋅氧化物層12、由鋅氫氧化物構成之鋅氫氧化物層13以及由鉻化合物構成之鉻酸鹽層14,防銹層10所具有之該些各層自銅箔主體1側起按照金屬鋅層11、鋅氧化物層12、鋅氫氧化物層13、鉻酸鹽層14之順序積層。The present invention provides a surface-treated copper foil that achieves a high level of adhesion, reliability, and reduction in transmission loss on a non-roughened surface. The surface-treated copper foil has: a copper foil main body 1, one of its two main surfaces is a roughened surface 1a formed by roughening treatment, and the other is a non-roughened surface 1b; and an antirust layer 10 formed On the non-roughened surface 1b of the copper foil main body 1. The antirust layer 10 has a metallic zinc layer 11 composed of metallic zinc, a zinc oxide layer 12 composed of zinc oxide, a zinc hydroxide layer 13 composed of zinc hydroxide, and a chromate layer composed of chromium compounds 14. The layers of the antirust layer 10 are laminated in the order of the metal zinc layer 11, the zinc oxide layer 12, the zinc hydroxide layer 13, and the chromate layer 14 from the copper foil main body 1 side.

Description

表面處理銅箔、覆銅積層板及印刷線路板Surface treated copper foil, copper clad laminate and printed circuit board

本發明係關於一種表面處理銅箔。進而,本發明係關於一種使用有前述表面處理銅箔之覆銅積層板與印刷線路板。The invention relates to a surface-treated copper foil. Furthermore, the present invention relates to a copper-clad laminate and a printed wiring board using the aforementioned surface-treated copper foil.

在各種電子設備類中,印刷線路板被用作基板、連接材料,印刷線路板之導電層通常使用銅箔。作為印刷線路板所採用之銅箔,通常使用軋製銅箔、電解銅箔。In various electronic equipment, printed circuit boards are used as substrates and connecting materials, and copper foil is usually used for the conductive layer of printed circuit boards. As copper foil used in printed circuit boards, rolled copper foil and electrolytic copper foil are generally used.

對於用作印刷線路板用銅箔之軋製銅箔而言,為抑制在其製造步驟中由賦予之熱歷程引起之晶體生長,作為必須成分含有金屬等添加物。因此,存在如下情況:銅箔原本之導電性降低,此外,製造成本亦較電解銅箔高。因此,作為印刷線路板用銅箔,有廣泛使用導電性高、生產性優異、薄層化容易之電解銅箔之傾向。Rolled copper foil used as copper foil for printed wiring boards contains additives such as metals as essential components in order to suppress crystal growth due to the heat history given during the manufacturing process. Therefore, there are cases where the original electrical conductivity of the copper foil is lowered, and the manufacturing cost is also higher than that of the electrolytic copper foil. Therefore, as copper foil for printed wiring boards, electrolytic copper foil with high conductivity, excellent productivity, and easy thinning tends to be widely used.

近年來,隨著行動通訊流量之進一步增大等,印刷線路板傳輸數GHz至100 GHz左右之高頻信號之情況增加。已知該高頻信號有如下傾向:頻率越高越能進行高速、大容量之通訊,另一方面,信號僅通過印刷線路板之導電層之表面(集膚效應)。若高頻信號僅通過表面,則會受到銅箔之表面形狀、防銹層之更大影響。即,若銅箔之表面粗糙度大,則信號之傳輸長度變大,傳輸損失變大。此外,若導電率較銅低或具有磁性之異種金屬在銅箔之表面多,則傳輸損失變大。因此,自降低傳輸損失之觀點而言而言,銅箔之表面越平滑且粗糙度越小則越佳,異種金屬之附著量越少則越佳。In recent years, with the further increase of mobile communication traffic, etc., the transmission of high-frequency signals from several GHz to 100 GHz by printed circuit boards has increased. It is known that the high-frequency signal has the following tendency: the higher the frequency, the more high-speed and large-capacity communication can be carried out. On the other hand, the signal only passes through the surface of the conductive layer of the printed circuit board (skin effect). If the high-frequency signal only passes through the surface, it will be more affected by the surface shape of the copper foil and the anti-rust layer. That is, if the surface roughness of copper foil is large, the transmission length of a signal will become long, and a transmission loss will become large. In addition, if the electrical conductivity is lower than that of copper or if there are many dissimilar metals with magnetism on the surface of the copper foil, the transmission loss will increase. Therefore, from the viewpoint of reducing the transmission loss, the smoother the surface of the copper foil and the smaller the roughness, the better, and the less the amount of adhesion of dissimilar metals, the better.

另一方面,通常,印刷線路板藉由以下方式製造,即,利用高溫壓製將含環氧樹脂、聚苯醚等之樹脂膜與銅箔貼合,利用蝕刻形成電路圖案。因此,為提高與樹脂膜之密接性,大多在銅箔之表面設置粗化處理層。所謂粗化處理係調整銅箔之表面形狀(包括由銅或各種合金構成之粒狀突起形狀、蝕刻銅箔所得之多孔形狀)而增加粗糙度之處理。On the other hand, a printed wiring board is generally produced by laminating a resin film containing epoxy resin, polyphenylene ether, etc., and copper foil by high-temperature pressing, and forming a circuit pattern by etching. Therefore, in order to improve the adhesion with the resin film, a roughening treatment layer is often provided on the surface of the copper foil. The so-called roughening treatment is to adjust the surface shape of copper foil (including the shape of granular protrusions made of copper or various alloys, and the porous shape obtained by etching copper foil) to increase the roughness.

除此之外,作為印刷線路板之可靠性,需要在加熱時(例如耐熱試驗時)、酸浸漬時(例如酸浸漬試驗時)亦良好地保持銅箔與樹脂之間的密接性,因此銅箔大多具備包含以鎳、鋅、鉻為代表之異種金屬之防銹層。In addition, as the reliability of printed circuit boards, it is necessary to maintain good adhesion between copper foil and resin during heating (such as heat resistance test) and acid immersion (such as acid immersion test), so copper Foils often have an antirust layer containing dissimilar metals represented by nickel, zinc, and chromium.

然而,自降低傳輸損失之觀點而言,該些粗化處理層、防銹層成為造成不良影響之主要原因。根據此種情況,為兼顧密接性、可靠性以及傳輸損失之降低,至今為止進行過大量研究。However, from the viewpoint of reducing transmission loss, these roughening treatment layers and anti-rust layers are the main causes of adverse effects. Under such circumstances, a lot of research has been conducted so far in order to balance the adhesion, reliability, and reduction of transmission loss.

例如,在專利文獻1中,提出有利用微細之凹凸增加銅箔之表面積之技術,在專利文獻2中,提出有將粗化粒子設為特殊形狀之技術,在專利文獻3中,提出有利用與鎳、鈷等之合金鍍敷形成微細之粗化粒子之技術,在專利文獻4中,提出有形成微細之粗化粒子,並以含有鉬與鈷之抗氧化處理層覆蓋於該粗化粒子上之技術。For example, in Patent Document 1, a technique of increasing the surface area of copper foil by using fine unevenness is proposed; in Patent Document 2, a technique of making roughened particles into a special shape is proposed; in Patent Document 3, a technique of using The technique of forming fine roughened particles by alloy plating with nickel, cobalt, etc., is proposed in Patent Document 4 to form fine roughened particles and cover the roughened particles with an anti-oxidation treatment layer containing molybdenum and cobalt technology above all else.

基於以上事實,近年來,要求以更高水準兼顧密接性、可靠性以及傳輸損失之降低。基於此,正在進行注目於銅箔之非粗化面之研究。Based on the above facts, in recent years, it has been required to achieve a higher level of adhesion, reliability, and reduction of transmission loss. Based on this, studies focusing on the non-roughened surface of copper foil are being conducted.

另外,在本說明書中,將銅箔之具有粗化處理層之面稱為「粗化面」,將不具有粗化處理層之面稱為「非粗化面」。電解銅箔之非粗化面根據其製造方法成為轉印有作為陰極之鼓面之研磨痕跡之形狀(光澤面(shiny surface),以下記為「S面」),或者與電解液接觸之、與各種有機添加劑相應之鍍敷析出形狀(粗糙面(mat surface),以下記為「M面」)中之任一種。軋製銅箔之非粗化面成為軋製完成之表面形狀。In addition, in this specification, the surface which has a roughening process layer of copper foil is called a "roughening surface", and the surface which does not have a roughening process layer is called a "non-roughening surface." The non-roughened surface of the electrolytic copper foil has a shape (shiny surface, hereinafter referred to as "S surface") in which the grinding marks of the drum surface as the cathode are transferred according to the manufacturing method, or is in contact with the electrolyte, Any of the plating deposit shapes (mat surface, hereinafter referred to as "M surface") corresponding to various organic additives. The non-roughened surface of the rolled copper foil becomes the surface shape of the rolled finish.

在製作多層印刷線路板時,與粗化面同樣地,對於非粗化面亦要求與樹脂膜之密接性與可靠性(即,加熱時、酸浸漬時之銅箔與樹脂之間的密接性)。另外,在本說明書中,將銅箔於非粗化面處與樹脂膜之密接性與可靠性(加熱時,酸浸漬時之銅箔與樹脂之間的密接性)記為銅箔之非粗化面之「內層密接性」。When making a multilayer printed circuit board, as with the roughened surface, the non-roughened surface also requires adhesion and reliability with the resin film (that is, the adhesion between the copper foil and the resin during heating and acid immersion) ). In addition, in this specification, the adhesion and reliability of the copper foil on the non-roughened surface and the resin film (adhesion between the copper foil and the resin during heating and acid dipping) are recorded as the non-roughened surface of the copper foil. The "inner layer adhesion" of the chemical surface.

在製作電路圖案之後,銅箔之非粗化面根據需要被半蝕刻,進而,為提高內層密接性,對銅箔之非粗化面與電路圖案之蝕刻端面進行黑化處理、微蝕刻等內層處理。黑化處理係形成銅之氧化物、還原銅之氧化物所得之銅之突起形狀之方法,微蝕刻係藉由使用硫酸-過氧化氫、有機酸之處理液將銅箔溶解為多孔狀而使表面粗面化之方法。然而,無論為哪種方法,均使銅箔表面之粗糙度增大,成為增加傳輸損失之一大主要原因。After making the circuit pattern, the non-roughened surface of the copper foil is half-etched as needed, and then, in order to improve the adhesion of the inner layer, the non-roughened surface of the copper foil and the etched end surface of the circuit pattern are blackened, micro-etched, etc. Inner treatment. Blackening treatment is a method of forming copper oxides and reducing copper oxides to form copper protrusions. Micro-etching is a method of dissolving copper foil into a porous shape using sulfuric acid-hydrogen peroxide and organic acid treatment solutions. A method of surface roughening. However, no matter which method is used, the roughness of the copper foil surface is increased, which becomes one of the main reasons for increasing the transmission loss.

此外,亦有如下情況,即,將四國化成工業股份有限公司之GliCAP所代表之、不伴隨著銅箔表面粗糙度之增加之化學密接處理用作內層處理,但存在內層密接性較差,並且內層密接性之提高效果根據貼附之樹脂種類差異大之課題。In addition, there are also cases where the chemical adhesion treatment represented by GliCAP of Shikoku Chemical Industry Co., Ltd., which does not accompany the increase in the surface roughness of the copper foil, is used as the inner layer treatment, but the adhesion of the inner layer is poor. , and the effect of improving the adhesion of the inner layer varies greatly depending on the type of resin attached.

該些由內層處理引起之非粗化面之粗糙度之增加與伴隨於此之傳輸損失之增加為自先前便認識到之現象。然而,在先前之銅箔中,由於相較於非粗化面,粗化面對傳輸損失之增加造成之影響之程度更大,因此並未對非粗化面之改善加大力度。近年來,粗化面之改良發展,相對地,非粗化面對傳輸損失之增加造成之影響之程度變大,在此過程中,要求較先前以更高水準兼顧密接性、可靠性以及傳輸損失之降低,由此非粗化面之改良逐漸受到重視。These increases in the roughness of the non-roughened surface caused by the inner layer treatment and the accompanying increase in transmission loss are phenomena that have been recognized for a long time. However, in the conventional copper foil, since the roughened surface has a greater influence on the increase in transmission loss than the non-roughened surface, no effort has been made to improve the non-roughened surface. In recent years, the improvement and development of the roughened surface, relatively, the non-roughened surface has a greater impact on the increase in transmission loss. In the process, it is required to take into account the adhesion, reliability and transmission at a higher level than before. The reduction of the loss, thus the improvement of the non-roughened surface is gradually paid attention to.

例如非專利文獻1公開有:藉由將微蝕刻作為內層處理,尤其是傳輸損失會增加,且信號越高頻則其影響越顯著可見。另一方面,報告有:為確保內層密接性,微蝕刻為必須之處理。For example, Non-Patent Document 1 discloses that by using microetching as an inner layer process, especially the transmission loss increases, and the higher the frequency of the signal, the more conspicuous the effect is. On the other hand, it is reported that micro-etching is necessary to ensure the adhesion of the inner layer.

此外,在專利文獻5中,公開有作為代替黑化處理之內層處理,進行使用錫、鎳或該些之合金中之任一種之表面處理,進而塗佈底塗樹脂之方法。 先前技術文獻 專利文獻In addition, Patent Document 5 discloses a method of performing surface treatment using tin, nickel, or any of these alloys instead of blackening treatment as an inner layer treatment, and then applying an undercoat resin. prior art literature patent documents

專利文獻1:日本專利第6182584號公報 專利文獻2:日本專利第5972486號公報 專利文獻3:日本專利特開2015-61939號公報 專利文獻4:日本專利第6083619號公報 專利文獻5:日本專利第5129843號公報 專利文獻6:日本專利第6182584號公報 非專利文獻Patent Document 1: Japanese Patent No. 6182584 Patent Document 2: Japanese Patent No. 5972486 Patent Document 3: Japanese Patent Laid-Open No. 2015-61939 Patent Document 4: Japanese Patent No. 6083619 Patent Document 5: Japanese Patent No. 5129843 Patent Document 6: Japanese Patent No. 6182584 non-patent literature

非專利文獻1:杉本薫等人,「多層印刷線路板中之導體表面粗糙度對高速傳輸造成之影響」,表面技術,一般社團法人表面技術協會,2018年,Vol. 69, No. 1, p. 38–45Non-Patent Document 1: Kaoru Sugimoto et al., "Influence of Surface Roughness of Conductors in Multilayer Printed Wiring Boards on High-Speed Transmission", Surface Technology, Surface Technology Association, 2018, Vol. 69, No. 1, p.38–45

[發明欲解決之課題]如上所述,對於銅箔之非粗化面之內層密接性與傳輸損失之降低,現狀為取捨之關係,無法得到滿足近年之高要求水準之銅箔。作為內層處理而使用鎳等磁性金屬會導致傳輸損失之大幅增加,塗佈底塗樹脂不僅底塗樹脂之特性會影響傳輸損失,而且製造成本顯著地大量增加。[Problem to be Solved by the Invention] As mentioned above, there is currently a trade-off relationship between the reduction of the inner layer adhesion and the transmission loss of the non-roughened surface of the copper foil, and it is impossible to obtain a copper foil that meets the high level of demand in recent years. The use of magnetic metals such as nickel as an inner layer treatment will lead to a large increase in transmission loss, and the coating of primer resin will not only affect the transmission loss due to the characteristics of the primer resin, but also significantly increase the manufacturing cost.

實際上,現狀為犧牲任一特性之同時,根據貼附之樹脂之種類、顧客之製程,藉由試錯進行:先前之內層處理之最佳化;先前之銅箔之非粗化面之形狀、防銹層之最佳化。In fact, the status quo is to sacrifice any characteristic, according to the type of resin attached and the customer's manufacturing process, through trial and error: the optimization of the previous inner layer treatment; the non-roughened surface of the previous copper foil Optimization of shape and anti-rust layer.

本發明之課題在於提供一種以高水準兼顧非粗化面之密接性、可靠性以及傳輸損失之降低之表面處理銅箔、覆銅積層板及印刷線路板。The object of the present invention is to provide a surface-treated copper foil, a copper-clad laminate, and a printed wiring board that balance high-level adhesion, reliability, and transmission loss reduction of a non-roughened surface.

[解決問題之技術手段]本發明之一態樣之表面處理銅箔為下述表面處理銅箔,其具備:銅箔主體,其兩個主面中之一者為由粗化處理形成之粗化面,另一者為非粗化面;以及防銹層,其形成於銅箔主體之非粗化面上;該表面處理銅箔之主旨在於,防銹層具有由金屬鋅構成之金屬鋅層、由鋅氧化物構成之鋅氧化物層、由鋅氫氧化物構成之鋅氫氧化物層以及由鉻化合物構成之鉻酸鹽層,防銹層所具有之該些各層自銅箔主體側起按照金屬鋅層、鋅氧化物層、鋅氫氧化物層、鉻酸鹽層之順序積層。[Technical means to solve the problem] A surface-treated copper foil according to an aspect of the present invention is the following surface-treated copper foil, which has: a copper foil main body, one of the two main surfaces of which is roughened by roughening treatment. The other is the non-roughened surface; and the anti-rust layer is formed on the non-roughened surface of the copper foil main body; the main purpose of the surface-treated copper foil is that the anti-rust layer has metallic zinc layer, a zinc oxide layer composed of zinc oxide, a zinc hydroxide layer composed of zinc hydroxide, and a chromate layer composed of chromium compounds, these layers of the antirust layer are from the copper foil main body side Laminate layers in the order of metal zinc layer, zinc oxide layer, zinc hydroxide layer, and chromate layer.

本發明之另一態樣之覆銅積層板之主旨在於,其具備:上述一態樣之表面處理銅箔與積層於該表面處理銅箔之粗化面側之樹脂制基材。The gist of the copper-clad laminate of another aspect of the present invention is that it includes the surface-treated copper foil of the above-mentioned one aspect, and a resin base material laminated on the roughened surface side of the surface-treated copper foil.

本發明之再一態樣之印刷線路板之主旨在於,其具備上述另一態樣之覆銅積層板。The gist of the printed wiring board of still another aspect of the present invention is that it has the copper-clad laminated board of the above-mentioned another aspect.

[發明效果]根據本發明,能以高水準兼顧非粗化面之密接性、可靠性以及傳輸損失之降低。[Advantageous Effects of the Invention] According to the present invention, the adhesion, reliability, and reduction of transmission loss of the non-roughened surface can be achieved at a high level.

對本發明之一實施形態進行說明。另外,本實施形態係示出本發明之一例,可對本實施形態施加各種變更或改良,其施加過各種變更或改良之形態亦可包含於本發明。One embodiment of the present invention will be described. In addition, this embodiment shows an example of this invention, Various changes and improvements can be added to this embodiment, The form to which various changes or improvements were added can also be included in this invention.

為解決上述課題,本發明者等人注目於銅箔之非粗化面之防銹層。先前,通常在銅箔之非粗化面實施電鍍鋅,然後,實施酸性鉻酸鹽處理與鹼性鉻酸鹽處理中之一者或兩者。關於如此形成之防銹層,暗示除鉻酸鹽成分、金屬鋅以外含有一部分鋅氫氧化物、鋅氧化物,但極其微量,此外,發明者等人認識到:以金屬鋅作為母相以分散之形式存在鋅氫氧化物、鋅氧化物。In order to solve the above-mentioned problems, the inventors of the present invention paid attention to the antirust layer of the non-roughened surface of copper foil. Previously, electrogalvanizing was usually performed on the non-roughened surface of copper foil, and then either or both of acid chromate treatment and alkaline chromate treatment were performed. Regarding the antirust layer formed in this way, it is implied that a part of zinc hydroxide and zinc oxide are contained in addition to the chromate component and metallic zinc, but the amount is extremely small. It exists in the form of zinc hydroxide and zinc oxide.

據此,本發明者等人進行深入研究,結果發現:藉由將具有鉻酸鹽層、鋅氫氧化物層、鋅氧化物層與金屬鋅層之防銹層自銅箔主體側起按照金屬鋅層、鋅氧化物層、鋅氫氧化物層、鉻酸鹽層之順序進行設置,能以極高水準兼顧內層密接性與傳輸損失之降低。Accordingly, the inventors of the present invention conducted in-depth research and found that: by forming the antirust layer having a chromate layer, a zinc hydroxide layer, a zinc oxide layer, and a metal zinc layer from the side of the main body of the copper foil according to the metal Zinc layer, zinc oxide layer, zinc hydroxide layer, and chromate layer are arranged in order, which can take into account the reduction of inner layer adhesion and transmission loss at a very high level.

即,本實施形態之表面處理銅箔為下述表面處理銅箔,其具備:銅箔主體,其兩個主面中之一者為由粗化處理形成之粗化面,另一者為非粗化面;以及防銹層,其形成於銅箔主體之非粗化面上。而且,該防銹層具有由金屬鋅構成之金屬鋅層、由鋅氧化物構成之鋅氧化物層、由鋅氫氧化物構成之鋅氫氧化物層以及由鉻化合物構成之鉻酸鹽層,防銹層所具有之該些各層自銅箔主體側起按照金屬鋅層、鋅氧化物層、鋅氫氧化物層、鉻酸鹽層之順序進行積層。That is, the surface-treated copper foil of this embodiment is a surface-treated copper foil that includes a copper foil main body, one of its two main surfaces is a roughened surface formed by roughening treatment, and the other is a non-roughened surface. a roughened surface; and an antirust layer formed on the non-roughened surface of the copper foil main body. Furthermore, the antirust layer has a metallic zinc layer composed of metallic zinc, a zinc oxide layer composed of zinc oxide, a zinc hydroxide layer composed of zinc hydroxide, and a chromate layer composed of chromium compounds, These layers of the antirust layer are laminated in the order of the metal zinc layer, the zinc oxide layer, the zinc hydroxide layer, and the chromate layer from the copper foil main body side.

另外,防銹層可僅由該些四層構成,亦可與四層一起具有其他層。In addition, the antirust layer may consist only of these four layers, and may have another layer together with four layers.

此外,金屬鋅層、鋅氧化物層、鋅氫氧化物層有時分別與金屬鋅、鋅氧化物、鋅氫氧化物一起含有無法避免之雜質。作為該些層所含有之無法避免之雜質,例如可列舉出:鉛、鐵、鎘、錫、氯或該些之化合物。鉻酸鹽層亦有時與鉻化合物一起含有無法避免之雜質。In addition, the metal zinc layer, zinc oxide layer, and zinc hydroxide layer may contain unavoidable impurities together with metal zinc, zinc oxide, and zinc hydroxide, respectively. Examples of unavoidable impurities contained in these layers include lead, iron, cadmium, tin, chlorine, or compounds thereof. The chromate layer also sometimes contains unavoidable impurities together with chromium compounds.

而且,鋅氧化物層、鋅氫氧化物層有時分別含有鋅氧化物、鋅氫氧化物之不定比化合物。In addition, the zinc oxide layer and the zinc hydroxide layer may contain indefinite compounds of zinc oxide and zinc hydroxide, respectively.

以下,參照圖1對本實施形態之表面處理銅箔之一例進行詳細說明。在銅箔主體1之非粗化面1b側之正上方,首先設置金屬鋅層11。金屬鋅層11為賤金屬,因此起到犧牲抗腐蝕之作用,抑制接觸之其他金屬之腐蝕。此外,對防止酸浸漬時之密接力降低有效。Hereinafter, an example of the surface-treated copper foil of the present embodiment will be described in detail with reference to FIG. 1 . On the non-roughened surface 1b side of the copper foil main body 1, a metal zinc layer 11 is first provided. The metal zinc layer 11 is a base metal, so it plays the role of sacrificial corrosion resistance and inhibits the corrosion of other metals in contact. In addition, it is effective in preventing the decrease of adhesion force during acid immersion.

然後,在金屬鋅層11之正上方設置鋅氧化物層12。鋅氧化物例如由氧化鋅(ZnO)構成。認為ZnO為離子結合性高之纖鋅礦型結構,形成緻密之層。發現利用鋅氧化物層12覆蓋下層之金屬鋅層11,有效地防止耐熱試驗、酸浸漬試驗中之密接力之降低。Then, a zinc oxide layer 12 is disposed directly on the metal zinc layer 11 . Zinc oxide is composed of zinc oxide (ZnO), for example. It is considered that ZnO has a wurtzite structure with high ion binding property and forms a dense layer. It was found that covering the lower metal zinc layer 11 with the zinc oxide layer 12 effectively prevents the decrease of the adhesion force in the heat resistance test and the acid immersion test.

此外,施加於印刷線路板之加熱溫度越高、時間越長,金屬鋅越有如下情況:與銅箔主體1之銅相互擴散而形成銅-鋅合金,損壞外觀上之色調、密接力。發現鋅氧化物與銅不相互擴散,因此藉由具有鋅氧化物層12,能將由銅-鋅合金之形成引起之不良影響抑制為最小限度。In addition, the higher the heating temperature and the longer the heating time applied to the printed circuit board, the more the metal zinc will diffuse with the copper of the copper foil main body 1 to form a copper-zinc alloy, which will damage the color tone and adhesion of the appearance. It was found that zinc oxide and copper do not diffuse with each other, and therefore, by having the zinc oxide layer 12, adverse effects caused by the formation of the copper-zinc alloy can be suppressed to a minimum.

然後,在鋅氧化物層12之正上方設置鋅氫氧化物層13。鋅氫氧化物例如為氫氧化鋅(Zn(OH)2 )。Zn(OH)2 為含有水分子之凝膠狀物質,發現在之後的鉻酸鹽處理中具有使鉻酸鹽皮膜(鉻酸鹽層14)更均勻且牢固地附著之效果。Then, a zinc hydroxide layer 13 is provided directly on the zinc oxide layer 12 . Zinc hydroxide is, for example, zinc hydroxide (Zn(OH) 2 ). Zn(OH) 2 is a gel-like substance containing water molecules, and it was found that in the subsequent chromate treatment, it has the effect of making the chromate film (chromate layer 14) adhere more uniformly and firmly.

然後,在鋅氫氧化物層13之正上方設置鉻酸鹽層14。鉻酸鹽層14為由鉻之氧化物與氫氧化物構成之抗腐蝕皮膜,該鉻之氧化物與氫氧化物係藉由在酸性或鹼性之含有鉻(VI)離子之處理液中進行陰極電解或單純浸漬而形成。鉻酸鹽層14成為與樹脂、尤其是聚苯醚系樹脂之官能團之結合點,提高密接性並且有效地防止耐熱試驗時、酸浸漬試驗時之密接力之降低。發現藉由在下層存在鋅氫氧化物層13,能形成較先前更緻密且均勻之鉻酸鹽層14。Then, a chromate layer 14 is provided directly on top of the zinc hydroxide layer 13 . The chromate layer 14 is an anti-corrosion film composed of chromium oxides and hydroxides, and the chromium oxides and hydroxides are formed in an acidic or alkaline treatment solution containing chromium (VI) ions. It is formed by cathodic electrolysis or simple impregnation. The chromate layer 14 serves as a bonding point with functional groups of resins, especially polyphenylene ether resins, improves adhesion and effectively prevents reduction in adhesion during heat resistance tests and acid immersion tests. It was found that by the presence of the zinc hydroxide layer 13 underneath, a denser and more uniform chromate layer 14 can be formed than before.

如上所述,藉由在銅箔主體1上設置由鉻酸鹽層14/鋅氫氧化物層13/鋅氧化物層12/金屬鋅層11構成之結構之防銹層10,而不在內層處理中使銅箔主體1之非粗化面1b之粗糙度增大便能有效地提高內層密接性。尤其重要的是,該些構成防銹層10之各層採用層結構而不混合存在,發現由此能以更少之鉻與鋅之附著量良好地保持內層密接性,更有效地降低傳輸損失。As mentioned above, by setting the antirust layer 10 of the structure consisting of chromate layer 14/zinc hydroxide layer 13/zinc oxide layer 12/metal zinc layer 11 on the copper foil main body 1, instead of the inner layer Increasing the roughness of the non-roughened surface 1b of the copper foil main body 1 during the treatment can effectively improve the adhesion of the inner layer. It is especially important that the layers constituting the antirust layer 10 adopt a layer structure without mixing, and it is found that the adhesion of the inner layer can be kept well with less adhesion of chromium and zinc, and the transmission loss can be reduced more effectively. .

此種高水準地兼顧內層密接性與傳輸損失之降低之表面處理銅箔與先前相比,在使用不進行內層處理之製程時亦發揮其效果。最近,例如在批量積層製程、焊墊通孔製程之一部分中,以製程之簡化與成本降低為目的,以下情況增加,即,不進行抗蝕劑形成前之整面研磨、微蝕刻來製作電路板,進行內層處理、半蝕刻之省略,進行非電鍍之局部實施等。即便在該情況下,亦能解決由於無內層處理而內層密接性差之問題,因表面處理銅箔之非粗化面之鉻、鋅而增大傳輸損失之問題。This high-level surface-treated copper foil, which takes into account both the inner layer adhesion and the reduction of transmission loss, also exerts its effect when using a process that does not perform inner layer treatment. Recently, for example, in part of the mass build-up process and the pad via process, for the purpose of process simplification and cost reduction, there are increasing cases where circuits are produced without performing full-surface polishing and microetching before resist formation. Plate, inner layer treatment, omission of half-etching, partial implementation of electroless plating, etc. Even in this case, the problem of poor adhesion of the inner layer due to no inner layer treatment, and the problem of increased transmission loss due to surface treatment of chromium and zinc on the non-roughened surface of the copper foil can be solved.

除此之外,與在製作電路圖案之後實施內層處理之先前之方法相比,亦存在以下優點:藉由在製造表面處理銅箔時採用預先設置具有鋅氫氧化物層13、鋅氧化物層12、金屬鋅層11之防銹層10之方法,而以更少之製作印刷線路板時之製程便完成,在削減成本與提高生產率方面優異。In addition, compared with the previous method of performing inner layer treatment after making the circuit pattern, there are also the following advantages: by pre-setting the zinc hydroxide layer 13, zinc oxide The method of the antirust layer 10 of the layer 12 and the metal zinc layer 11 can be completed with fewer processes for making a printed circuit board, which is excellent in reducing costs and improving productivity.

本實施形態之表面處理銅箔以高水準兼顧非粗化面1b之密接性、可靠性以及傳輸損失之降低,因此,例如適宜作為在製作高頻傳輸用之覆銅積層板、印刷線路板(尤其是多層印刷線路板)時所使用之表面處理銅箔。即,本實施形態之覆銅積層板具備本實施形態之表面處理銅箔與積層於本實施形態之表面處理銅箔之粗化面1a側之樹脂制基材。此外,本實施形態之印刷線路板具備本實施形態之覆銅積層板。The surface-treated copper foil of this embodiment balances the adhesion, reliability, and transmission loss reduction of the non-roughened surface 1b at a high level, so it is suitable as, for example, copper-clad laminates and printed circuit boards for high-frequency transmission. Especially the surface-treated copper foil used in multilayer printed circuit boards). That is, the copper-clad laminated board of this embodiment is equipped with the surface-treated copper foil of this embodiment, and the resin base material laminated|stacked on the roughened surface 1a side of the surface-treated copper foil of this embodiment. Moreover, the printed wiring board of this embodiment is equipped with the copper clad laminated board of this embodiment.

在本實施形態之表面處理銅箔中,作為銅箔主體1可使用電解銅箔。此外,銅箔主體1之粗化面1a所具有之粗化粒子之平均高度可設於0.2 µm以上且0.8 µm以下之範圍內。而且,銅箔主體1之非粗化面1b之十點平均粗糙度Rzjis可設為1.5 µm以下。In the surface-treated copper foil of this embodiment, an electrolytic copper foil can be used as the copper foil main body 1 . In addition, the average height of the roughened particles on the roughened surface 1a of the copper foil main body 1 can be set within a range of not less than 0.2 µm and not more than 0.8 µm. Furthermore, the ten-point average roughness Rzjis of the non-roughened surface 1b of the copper foil main body 1 can be set to 1.5 µm or less.

用作銅箔主體1之銅箔在進行粗化處理前之時刻,較佳為JIS B0601(2001)所規定之利用觸針式粗糙度計測定出之十點平均粗糙度Rzjis在兩主面均為1.5 µm以下。若十點平均粗糙度Rzjis大,則擔憂傳輸損失增大。The copper foil used as the copper foil main body 1 is preferably the ten-point average roughness Rzjis measured by a stylus-type roughness meter as specified in JIS B0601 (2001) before roughening treatment. 1.5 µm or less. If the ten-point average roughness Rzjis is large, there is a concern that the transmission loss will increase.

在製造本實施形態之表面處理銅箔時,首先對銅箔之一者之主面實施粗化處理。作為粗化處理之代表例可列舉出銅粗化鍍敷。在銅粗化鍍敷中,使用硫酸銅鍍敷液。硫酸銅鍍敷液之硫酸濃度較佳為50 g/L 至250 g/L,更佳為70 g/L至200 g/L。若硫酸銅鍍敷液之硫酸濃度低於50 g/L,則擔憂導電率變低,粗化粒子之電沈積性變差。若硫酸銅鍍敷液之硫酸濃度高於250 g/L,則擔憂促進銅粗化鍍敷之設備之腐蝕。When manufacturing the surface-treated copper foil of this embodiment, the roughening process is given to the main surface of one of copper foils first. Copper roughening plating is mentioned as a representative example of roughening process. In copper roughening plating, a copper sulfate plating solution is used. The sulfuric acid concentration of the copper sulfate plating solution is preferably from 50 g/L to 250 g/L, more preferably from 70 g/L to 200 g/L. If the concentration of sulfuric acid in the copper sulfate plating solution is lower than 50 g/L, there is a concern that the electrical conductivity will decrease and the electrodepositability of the roughened particles will deteriorate. If the concentration of sulfuric acid in the copper sulfate plating solution is higher than 250 g/L, there is concern about the corrosion of equipment that promotes copper roughening plating.

硫酸銅鍍敷液之銅濃度較佳為6 g/L至100 g/L,更佳為10 g/L至50 g/L。若硫酸銅鍍敷液之銅濃度低於6 g/L,則擔憂粗化粒子之電沈積性變差。若硫酸銅鍍敷液之銅濃度高於100 g/L,則需要更大之電流以鍍敷成粒子狀,在設備方面亦為不現實。The copper concentration of the copper sulfate plating solution is preferably from 6 g/L to 100 g/L, more preferably from 10 g/L to 50 g/L. If the copper concentration of the copper sulfate plating solution is lower than 6 g/L, there is a concern that the electrodepositability of the roughened particles will deteriorate. If the copper concentration of the copper sulfate plating solution is higher than 100 g/L, a larger current is required to plate it into particles, which is also unrealistic in terms of equipment.

在硫酸銅鍍敷液中,亦可添加有機添加劑或無機添加劑。若作為有機添加劑添加高分子多糖類,則擴散極限電流密度變小,即便在更低電流密度條件下亦容易產生粗化粒子。此外,若添加較硫酸銅更難水溶性之鹽、貴金屬離子作為無機添加劑,則能增加銅之粗化粒子之產生個數。In the copper sulfate plating solution, organic additives or inorganic additives may also be added. When high-molecular polysaccharides are added as organic additives, the diffusion-limited current density becomes small, and roughened particles are likely to be generated even under lower current density conditions. In addition, adding salts that are less water-soluble than copper sulfate and noble metal ions as inorganic additives can increase the number of roughened copper particles.

銅粗化鍍敷中之電流密度較佳為5 A/dm2 至120 A/dm2 ,更佳為30 A/dm2 至100 A/dm2 。若電流密度低於5 A/dm2 ,則處理需要時間,因而擔憂生產率變低。若電流密度高於120 A/dm2 ,則擔憂粗化粒子之電沈積性變差。The current density in copper roughening plating is preferably 5 A/dm 2 to 120 A/dm 2 , more preferably 30 A/dm 2 to 100 A/dm 2 . If the current density is less than 5 A/dm 2 , the processing will take time, so there is a concern that the productivity will decrease. If the current density is higher than 120 A/dm 2 , there is a concern that the electrodepositability of the roughened particles will deteriorate.

亦可在實施粗化處理之後,進行覆蓋粗化粒子、提高粗化粒子與銅箔之密接性之被覆鍍敷處理。在該情況下,亦可使用上述硫酸銅鍍敷液。亦可藉由進一步多次重複進行該雙層處理,提高粗化粒子之均勻電沈積性。After the roughening treatment, a coating plating treatment for covering the roughened particles and improving the adhesion between the roughened particles and the copper foil may be performed. In this case, the above-mentioned copper sulfate plating solution can also be used. The uniform electrodeposition of the roughened particles can also be improved by further repeating the double-layer treatment several times.

此外,亦可藉由銅粗化鍍敷以外之方法進行粗化處理。作為示例,可列舉出:基於異種金屬鍍敷或合金鍍敷之粗化處理、基於蝕刻處理之粗化處理、藉由氧化劑或調整氣氛使銅箔之表面氧化而使表面粗化之粗化處理、藉由再還原氧化後表面而使表面粗化之粗化處理以及基於組合有該些之處理之粗化處理等。In addition, the roughening process can also be performed by methods other than copper roughening plating. Examples include: roughening treatment by dissimilar metal plating or alloy plating, roughening treatment by etching treatment, roughening treatment by oxidizing the surface of copper foil with an oxidizing agent or adjusting the atmosphere to roughen the surface , roughening treatment for roughening the surface by re-reducing the oxidized surface, roughening treatment based on treatment combining these, and the like.

然後,在上述銅箔之非粗化面1b上設置防銹層10。首先,在銅箔主體1之非粗化面1b上設置金屬鋅層11。金屬鋅層11之形成較佳為藉由電鍍鋅進行。對於鋅鍍敷液而言,例如使用鹼性鋅鍍敷液。鹼性鋅鍍敷液之鋅濃度較佳為2 g/L至10 g/L。若鹼性鋅鍍敷液之鋅濃度低於2 g/L,則擔憂鋅之電流效率降低,生產率降低。若鹼性鋅鍍敷液之鋅濃度高於10 g/L,則容易在鹼性鋅鍍敷液中生成沈澱,擔憂鹼性鋅鍍敷液之穩定性降低。Then, the antirust layer 10 is provided on the non-roughened surface 1b of the said copper foil. First, the metal zinc layer 11 is provided on the non-roughened surface 1b of the copper foil main body 1 . The formation of the metal zinc layer 11 is preferably performed by electro-galvanizing. As the zinc plating solution, for example, an alkaline zinc plating solution is used. The zinc concentration of the alkaline zinc plating solution is preferably 2 g/L to 10 g/L. If the zinc concentration of the alkaline zinc plating solution is lower than 2 g/L, there is a concern that the current efficiency of zinc will decrease and the productivity will decrease. If the zinc concentration of the alkaline zinc plating solution is higher than 10 g/L, precipitation is easily formed in the alkaline zinc plating solution, and there is concern that the stability of the alkaline zinc plating solution will decrease.

鹼性鋅鍍敷液之氫氧化鈉(NaOH)濃度較佳為25 g/L至45 g/L。若鹼性鋅鍍敷液之氫氧化鈉濃度低於25 g/L,則擔憂鹼性鋅鍍敷液之導電率降低,生產率降低。若鹼性鋅鍍敷液之氫氧化鈉濃度高於40 g/L,則容易再溶解已鍍敷之鋅,不易得到正常且均勻之鋅鍍敷被膜。電鍍鋅時之電流密度較佳為0.1 A/dm2 至1 A/dm2 ,處理時間較佳為2至5秒。The sodium hydroxide (NaOH) concentration of the alkaline zinc plating solution is preferably 25 g/L to 45 g/L. If the sodium hydroxide concentration of the alkaline zinc plating solution is lower than 25 g/L, there is a concern that the conductivity of the alkaline zinc plating solution will decrease and the productivity will decrease. If the concentration of sodium hydroxide in the alkaline zinc plating solution is higher than 40 g/L, it is easy to redissolve the zinc that has been plated, and it is difficult to obtain a normal and uniform zinc plating film. The current density during electrogalvanizing is preferably 0.1 A/dm 2 to 1 A/dm 2 , and the treatment time is preferably 2 to 5 seconds.

然後,在金屬鋅層11上設置鋅氧化物層12。作為形成鋅氧化物層12之方法之一例,可列舉出陽極氧化處理。藉由在適當之條件下實施陽極氧化處理,鋅金屬層之最表層之鋅被氧化,形成緻密之鋅氧化物層12。作為陽極氧化處理液,例如,可使用氫氧化鈉與碳酸鈉(Na2 CO3 )之混合溶液。該混合溶液之氫氧化鈉濃度較佳為2 g/L至10 g/L。若混合溶液之氫氧化鈉濃度低於2 g/L,則鋅氧化物容易成為粗糙雜亂之形狀。若混合溶液之氫氧化鈉濃度高於10 g/L,則擔憂鋅氧化物之產率降低。混合溶液之碳酸鈉濃度較佳在30 g/L至70 g/L之範圍。亦與氫氧化鈉濃度有關係,但若偏離該濃度範圍,則鋅氧化物容易成為粗糙雜亂之形狀。陽極氧化處理液亦有使用草酸、硼酸銨之情況。Then, the zinc oxide layer 12 is provided on the metal zinc layer 11 . Anodic oxidation treatment is mentioned as an example of the method of forming the zinc oxide layer 12 . By performing anodic oxidation treatment under appropriate conditions, the zinc on the outermost layer of the zinc metal layer is oxidized to form a dense zinc oxide layer 12 . As an anodizing solution, for example, a mixed solution of sodium hydroxide and sodium carbonate (Na 2 CO 3 ) can be used. The sodium hydroxide concentration of the mixed solution is preferably 2 g/L to 10 g/L. If the sodium hydroxide concentration of the mixed solution is lower than 2 g/L, the zinc oxide will easily become rough and messy. If the sodium hydroxide concentration of the mixed solution is higher than 10 g/L, it is worried that the yield of zinc oxide will decrease. The sodium carbonate concentration of the mixed solution is preferably in the range of 30 g/L to 70 g/L. It is also related to the concentration of sodium hydroxide, but if it deviates from this concentration range, the zinc oxide will easily become rough and messy. Oxalic acid and ammonium borate are also used in the anodizing treatment solution.

陽極氧化處理中之電流密度較佳為1 A/dm2 至10 A/dm2 ,處理時間較佳為2至20秒。若電流密度、處理時間過小,則擔憂不充分地形成鋅氧化物層12,但若陽極氧化處理之電流密度、時間過大,則擔憂金屬鋅層11幾乎全部被氧化。The current density in the anodizing treatment is preferably 1 A/dm 2 to 10 A/dm 2 , and the treatment time is preferably 2 to 20 seconds. If the current density and treatment time are too small, the zinc oxide layer 12 may not be formed sufficiently, but if the anodic oxidation treatment current density and time are too large, there may be a concern that almost all the metal zinc layer 11 may be oxidized.

作為形成鋅氧化物層12之其他方法之示例,可列舉出高溫氧化處理。具體而言為使金屬鋅層11在80℃至130℃左右之乾燥空氣中氧化2至5秒左右之方法。若高溫氧化處理之溫度、時間過小,則擔憂不充分地形成鋅氧化物層12,但若高溫氧化處理之溫度、時間過大,則擔憂金屬鋅層11幾乎全部被氧化。高溫氧化處理之條件需要根據金屬鋅之附著量進行適宜調整。As an example of another method of forming the zinc oxide layer 12, a high temperature oxidation treatment can be mentioned. Specifically, it is a method of oxidizing the metal zinc layer 11 in dry air at about 80° C. to 130° C. for about 2 to 5 seconds. If the temperature and time of the high-temperature oxidation treatment are too short, there may be concerns that the zinc oxide layer 12 may not be formed sufficiently, but if the temperature and time of the high-temperature oxidation treatment are too large, there may be a concern that almost all of the metallic zinc layer 11 may be oxidized. The conditions of high temperature oxidation treatment need to be properly adjusted according to the amount of metal zinc attached.

然後,在鋅氧化物層12上設置鋅氫氧化物層13。作為形成鋅氫氧化物層13之方法之一例,可列舉出高溫水蒸氣處理。藉由將鋅氧化物層12暴露在高溫水蒸氣中,在鋅氧化物層12之最表層形成鋅氫氧化物層13。高溫水蒸氣處理之溫度較佳為70℃至100℃,濕度較佳為80%RH以上。高溫水蒸氣處理之處理時間較佳為1至4秒。Then, a zinc hydroxide layer 13 is provided on the zinc oxide layer 12 . As an example of the method of forming the zinc hydroxide layer 13, a high temperature steam process is mentioned. By exposing the zinc oxide layer 12 to high temperature water vapor, the zinc hydroxide layer 13 is formed on the outermost layer of the zinc oxide layer 12 . The temperature of high-temperature steam treatment is preferably 70°C to 100°C, and the humidity is preferably above 80%RH. The treatment time of the high temperature steam treatment is preferably 1 to 4 seconds.

作為形成鋅氫氧化物層13之其他方法之示例,可列舉出將形成有鋅氧化物層12之銅箔作為電極,在中性水溶液中進行陰極極化之氫生成處理。例如,在硫酸鉀(K2 SO4 )、硫酸鈉(Na2 SO4 )之中性鹽水溶液中,在電流密度為0.1 A/dm2 至1 A/dm2 之範圍內進行陰極極化。藉由在形成有鋅氧化物層12之銅箔(電極)之表面生成氫,而在最表層形成鋅氫氧化物層13。中性鹽水溶液中之中性鹽之濃度較佳為0.5 mol/L至2 mol/L左右之範圍。氫生成處理之處理時間較佳為1至5秒左右之範圍。As an example of another method of forming the zinc hydroxide layer 13 , a hydrogen generation process in which the copper foil on which the zinc oxide layer 12 is formed is used as an electrode and subjected to cathodic polarization in a neutral aqueous solution is mentioned. For example, cathodic polarization is performed in potassium sulfate (K 2 SO 4 ), sodium sulfate (Na 2 SO 4 ) neutral brine solution at a current density in the range of 0.1 A/dm 2 to 1 A/dm 2 . By generating hydrogen on the surface of the copper foil (electrode) on which the zinc oxide layer 12 is formed, the zinc hydroxide layer 13 is formed on the outermost layer. The concentration of the neutral salt in the neutral saline solution is preferably in the range of about 0.5 mol/L to 2 mol/L. The processing time of the hydrogen generation processing is preferably in the range of about 1 to 5 seconds.

然後,在鋅氫氧化物層13上設置鉻酸鹽層14。形成鉻酸鹽層14之鉻酸鹽處理大致分為酸性鉻酸鹽處理與鹼性鉻酸鹽處理兩種。藉由進行該些兩種中之任一者或兩者之處理,在鋅氫氧化物層13上形成由鉻化合物構成之鉻酸鹽層14。Then, a chromate layer 14 is provided on the zinc hydroxide layer 13 . The chromate treatment for forming the chromate layer 14 is roughly divided into two types: acid chromate treatment and alkaline chromate treatment. By performing either or both of these two treatments, a chromate layer 14 composed of a chromium compound is formed on the zinc hydroxide layer 13 .

所謂酸性鉻酸鹽處理係在酸性之鉻酸酐(VI)水溶液中浸漬銅箔之處理,或者為在酸性之鉻酸酐(VI)水溶液中將銅箔作為電極進行陰極極化之處理。酸性之鉻酸酐(VI)水溶液之鉻(VI)濃度較佳為1 g/L至8 g/L。若鉻(VI)濃度低於1 g/L,則不易得到足夠之鉻之附著量,若高於8 g/L,則作業上之危險性、廢液處理之成本增大,因此不佳。The so-called acid chromate treatment refers to the treatment of immersing copper foil in acidic chromic anhydride (VI) aqueous solution, or the treatment of cathodic polarization using copper foil as an electrode in acidic chromic anhydride (VI) aqueous solution. The chromium (VI) concentration of the acidic chromic anhydride (VI) aqueous solution is preferably 1 g/L to 8 g/L. If the concentration of chromium (VI) is lower than 1 g/L, it will be difficult to obtain a sufficient amount of chromium adhesion, and if it is higher than 8 g/L, it will increase the risk of operation and the cost of waste liquid treatment, so it is not preferable.

酸性之鉻酸酐(VI)水溶液之pH值較佳為2至5之範圍。若酸性之鉻酸酐(VI)水溶液之pH值低於2,則有下層之材料過剩地溶出之情況,因此不佳。若酸性之鉻酸酐(VI)水溶液之pH值高於5,則不易得到足夠之鉻之附著量。對於pH值之調整可使用硫酸。The pH value of the acidic aqueous solution of chromic anhydride (VI) is preferably in the range of 2-5. If the pH of the acidic chromic anhydride (VI) aqueous solution is lower than 2, the material of the lower layer may be excessively eluted, which is not preferable. If the pH value of the acidic chromic anhydride (VI) aqueous solution is higher than 5, it is difficult to obtain sufficient chromium adhesion. Sulfuric acid can be used for pH adjustment.

在進行陰極極化時之電流密度較佳為2 A/dm2 至10 A/dm2 。浸漬時間或陰極極化之處理時間亦取決於電流密度,但較佳為2至8秒。在陰極極化之處理時間或電流密度過大時,有下層之材料過剩地溶出之情況,因此不佳。在陰極極化之處理時間或電流密度過小時,不易得到足夠之鉻之附著量。酸性之鉻酸酐(VI)水溶液之液體溫度較佳為25℃至40℃。The current density at the time of cathodic polarization is preferably 2 A/dm 2 to 10 A/dm 2 . The immersion time or the treatment time of cathodic polarization also depends on the current density, but is preferably 2 to 8 seconds. When the treatment time of cathodic polarization or the current density is too large, the material of the lower layer may be excessively eluted, so it is not preferable. When the treatment time of cathodic polarization or the current density is too small, it is difficult to obtain sufficient chromium adhesion. The liquid temperature of the acidic aqueous solution of chromic anhydride (VI) is preferably 25°C to 40°C.

所謂鹼性鉻酸鹽處理係在鹼性之鉻酸酐(VI)水溶液中將銅箔作為電極進行陰極極化之處理。鹼性之鉻酸酐(VI)水溶液之鉻(VI)濃度較佳為1 g/L至8 g/L。若鉻(VI)濃度低於1 g/L,則不易得到足夠之鉻之附著量,若高於8 g/L,則作業上之危險性、廢液處理之成本增大,因此不佳。The so-called alkaline chromate treatment refers to the treatment of cathodic polarization using copper foil as an electrode in an alkaline chromic anhydride (VI) aqueous solution. The concentration of chromium (VI) in the basic aqueous solution of chromic anhydride (VI) is preferably 1 g/L to 8 g/L. If the concentration of chromium (VI) is lower than 1 g/L, it will be difficult to obtain a sufficient amount of chromium adhesion, and if it is higher than 8 g/L, it will increase the risk of operation and the cost of waste liquid treatment, so it is not preferable.

鹼性之鉻酸酐(VI)水溶液之pH值較佳為9至14之範圍。若鹼性之鉻酸酐(VI)水溶液之pH值低於9,則不易得到足夠之鉻之附著量。若鹼性之鉻酸酐(VI)水溶液之pH值高於14,則鹼性鉻酸鹽處理之設備之腐蝕性變高,因此不現實。對於pH值之調整,可使用氫氧化鈉、氫氧化鉀等單純鹼性鹽。The pH value of the basic aqueous solution of chromic anhydride (VI) is preferably in the range of 9-14. If the pH value of the alkaline aqueous solution of chromic anhydride (VI) is lower than 9, it is difficult to obtain sufficient chromium adhesion. If the pH value of the alkaline chromic anhydride (VI) aqueous solution is higher than 14, the corrosion of the equipment for alkaline chromate treatment will become high, so it is not practical. For pH adjustment, simple alkaline salts such as sodium hydroxide and potassium hydroxide can be used.

另外,亦可在鹼性之鉻酸酐(VI)水溶液中添加鋅。若添加鋅,則亦可有效地抑制下層之鋅之過剩溶出。該鋅亦能以氧化鋅之形式添加。鹼性之鉻酸酐(VI)水溶液之鋅濃度較佳為2 g/L至10 g/L之範圍。In addition, zinc can also be added to the alkaline chromic anhydride (VI) aqueous solution. If zinc is added, it can also effectively suppress the excessive dissolution of zinc in the lower layer. The zinc can also be added in the form of zinc oxide. The zinc concentration of the basic aqueous solution of chromic anhydride (VI) is preferably in the range of 2 g/L to 10 g/L.

亦可對藉由上述一連串之防銹層形成處理而形成有防銹層10之銅箔之非粗化面1b進一步進行矽烷偶合劑等有機處理。此外,亦可在對非粗化面1b實施防銹層形成處理前、後或同時在粗化面1a形成防銹層。在粗化面1a形成之防銹層可由鎳、鋅、鉻等構成,亦可為與非粗化面1b之防銹層10相同之構成。此外,亦可在粗化面1a形成有防銹層之後,進一步進行矽烷偶合劑等有機處理。Organic treatment such as a silane coupling agent may be further performed on the non-roughened surface 1b of the copper foil on which the antirust layer 10 was formed by the above-mentioned series of antirust layer forming treatments. In addition, the antirust layer may be formed on the roughened surface 1a before, after, or simultaneously with the antirust layer forming treatment on the non-roughened surface 1b. The antirust layer formed on the roughened surface 1a may be made of nickel, zinc, chromium, etc., or may have the same composition as that of the antirust layer 10 on the non-roughened surface 1b. In addition, after the antirust layer is formed on the roughened surface 1a, an organic treatment such as a silane coupling agent may be further performed.

本實施形態之覆銅積層板係使用上述本實施形態之表面處理銅箔而形成。此種本實施形態之覆銅積層板可藉由公知之方法形成。例如,覆銅積層板可藉由在本實施形態之表面處理銅箔之粗化面1a(黏貼面)積層並黏貼樹脂制基材而製造。The copper-clad laminate of this embodiment is formed using the surface-treated copper foil of this embodiment mentioned above. Such a copper-clad laminate according to this embodiment can be formed by a known method. For example, a copper-clad laminate can be manufactured by laminating on the roughened surface 1a (adhesion surface) of the surface-treated copper foil of this embodiment and adhering it to a resin base material.

此處,作為樹脂制基材所使用之樹脂,可使用各種成分之高分子樹脂。對於剛性線路板或半導體封裝體(PKG)用之印刷線路板,可主要使用酚樹脂、環氧樹脂。對於柔性基板,可主要使用聚醯亞胺、聚醯胺醯亞胺。在精密圖案(高密度)線路板或高頻基板中,作為尺寸穩定性良好之材料、翹曲扭曲少之材料、熱收縮少之材料等,可使用玻璃轉移點(Tg)高之耐熱樹脂。Here, as the resin used for the resin base material, polymer resins having various components can be used. For rigid circuit boards or printed circuit boards for semiconductor packages (PKG), phenolic resins and epoxy resins are mainly used. For the flexible substrate, polyimide, polyamideimide can be mainly used. In precision pattern (high density) circuit boards or high-frequency substrates, heat-resistant resins with high glass transition points (Tg) can be used as materials with good dimensional stability, materials with less warpage and distortion, and materials with less thermal shrinkage.

作為耐熱樹脂,可列舉出:液晶聚合物、聚醚醚酮、聚苯硫醚、聚苯醚、聚伸苯醚(Polyphenylene oxide)、聚醚醯亞胺、聚醚碸、聚萘二甲酸乙二酯、聚對苯二甲酸乙二酯、熱塑性聚醯亞胺等熱塑性樹脂或由該些構成之聚合物合金,進一步可列舉出:聚醯亞胺、耐熱性環氧樹脂、雙馬來醯亞胺三嗪等氰酸酯系樹脂、熱固化改性聚苯醚等熱固性樹脂等。尤其是本實施形態之覆銅積層板之樹脂制基材所使用之樹脂較佳為聚苯醚系樹脂。聚苯醚系樹脂之介電損耗正切與相對介電常數小,熱穩定性與化學穩定性優異,與異種材料之密接性優異。因此,聚苯醚系樹脂作為樹脂制基材適宜用於印刷線路板之用途。Examples of heat-resistant resins include liquid crystal polymers, polyether ether ketone, polyphenylene sulfide, polyphenylene oxide, polyphenylene oxide, polyether imide, polyether ketone, polyethylene naphthalate Thermoplastic resins such as diester, polyethylene terephthalate, and thermoplastic polyimide, or polymer alloys composed of these, further examples include: polyimide, heat-resistant epoxy resin, bismaleimide Cyanate ester resins such as iminotriazine, thermosetting resins such as thermosetting modified polyphenylene ether, etc. In particular, the resin used for the resin base material of the copper-clad laminate of this embodiment is preferably a polyphenylene ether-based resin. The dielectric loss tangent and relative permittivity of polyphenylene ether resin are small, the thermal stability and chemical stability are excellent, and the adhesion to dissimilar materials is excellent. Therefore, polyphenylene ether-based resins are suitable for use in printed wiring boards as resin base materials.

本實施形態之印刷線路板較佳為使用上述覆銅積層板而形成。此種本實施形態之印刷線路板可利用公知之方法形成。It is preferable that the printed wiring board of this embodiment is formed using the said copper clad laminated board. Such a printed wiring board of this embodiment can be formed by a known method.

此外,可藉由利用通常方法化學蝕刻上述覆銅積層板之表面處理銅箔之一部分而形成所期望之電路圖案,製作印刷線路板。此外,在電路圖案上當然可安裝電子電路零件。作為電子電路零件,可使用通常在電子印刷線路板安裝者,除半導體元件單獨體以外,例如亦可列舉出:晶片電阻、晶片電容器、半導體封裝體(PKG)等。 [實施例]In addition, a printed wiring board can be produced by chemically etching a part of the surface-treated copper foil of the above-mentioned copper-clad laminate board by a usual method to form a desired circuit pattern. In addition, it is of course possible to mount electronic circuit components on the circuit pattern. As electronic circuit components, those usually mounted on electronic printed circuit boards can be used. In addition to individual semiconductor elements, for example, chip resistors, chip capacitors, semiconductor packages (PKG) and the like can be used. [Example]

以下示出實施例與比較例,進一步對本發明進行具體說明。對於作為銅箔主體之銅箔,使用有M面之Rzjis為1.0 µm、S面之Rzjis為0.8 µm之兩面光澤電解銅箔。對該銅箔之M面實施銅粗化鍍敷而進行粗化處理,並且進一步進行被覆鍍敷處理,而製造出以粗化粒子之平均高度在0.2 µm以上且0.8 µm以下之範圍內之粗化處理銅箔。粗化粒子之平均高度按照專利文獻6所記載之方法,根據粗化處理銅箔之截面之掃描電子顯微鏡圖像(SEM圖像)計算出。Examples and comparative examples are shown below, and the present invention will be further described in detail. As the copper foil main body, a double-sided glossy electrolytic copper foil with an Rzjis of 1.0 µm on the M side and an Rzjis of 0.8 µm on the S side was used. Copper roughening plating is performed on the M surface of the copper foil to perform roughening treatment, and further coating plating treatment is performed to produce a rough surface with an average height of roughening particles in the range of 0.2 µm to 0.8 µm. chemically treated copper foil. The average height of the roughened particles was calculated from the scanning electron microscope image (SEM image) of the cross-section of the roughened copper foil according to the method described in Patent Document 6.

銅粗化鍍敷之條件如下所述。 硫酸銅鍍敷液之銅濃度:35 g/L 硫酸銅鍍敷液之硫酸濃度:140 g/L 硫酸銅鍍敷液之溫度:27℃ 電流密度:55 A/dm2 處理時間:4秒The conditions of copper roughening plating are as follows. Copper concentration of copper sulfate plating solution: 35 g/L Sulfuric acid concentration of copper sulfate plating solution: 140 g/L Temperature of copper sulfate plating solution: 27°C Current density: 55 A/dm 2 Processing time: 4 seconds

被覆鍍敷處理之條件如下所述。 硫酸銅鍍敷液之銅濃度:120 g/L 硫酸銅鍍敷液之硫酸濃度:90 g/L 電流密度:10 A/dm2 處理時間:6秒The conditions of the coating plating treatment are as follows. Copper concentration of copper sulfate plating solution: 120 g/L Sulfuric acid concentration of copper sulfate plating solution: 90 g/L Current density: 10 A/dm 2 Processing time: 6 seconds

使用如此製造出之粗化處理銅箔,製造出實施例1至實施例5與比較例1至比較例4之表面處理銅箔。以下記錄各表面處理銅箔之製造方法。 (實施例1)Surface-treated copper foils of Examples 1 to 5 and Comparative Examples 1 to 4 were produced using the roughened copper foil produced in this way. The manufacturing method of each surface-treated copper foil is described below. (Example 1)

對粗化處理銅箔之S面(非粗化面)按照下列順序實施以下之(1)、(2)、(3)以及(4)所示之處理,形成防銹層,得到表面處理銅箔。The S surface (non-roughened surface) of the roughened copper foil is subjected to the treatments shown in (1), (2), (3) and (4) in the following order to form an antirust layer and obtain surface treated copper. foil.

(1)在以下所示之條件下對粗化處理銅箔之S面實施電鍍鋅。 鹼性鋅鍍敷液之鋅濃度:3 g/L 鹼性鋅鍍敷液之氫氧化鈉濃度:30 g/L 鹼性鋅鍍敷液之溫度:25℃ 電流密度:0.6 A/dm2 處理時間:5秒(1) Electrogalvanizing was performed on the S surface of the roughened copper foil under the conditions shown below. Zinc concentration of alkaline zinc plating solution: 3 g/L Sodium hydroxide concentration of alkaline zinc plating solution: 30 g/L Temperature of alkaline zinc plating solution: 25°C Current density: 0.6 A/dm 2 treatment Time: 5 seconds

(2)在以下所示之條件下對粗化處理銅箔之S面實施陽極氧化處理。 陽極氧化處理液之氫氧化鈉濃度:8 g/L 陽極氧化處理液之碳酸鈉濃度:42 g/L 陽極氧化處理液之溫度:34℃ 電流密度:5 A/dm2 處理時間:3秒(2) Anodizing treatment was performed on the S surface of the roughened copper foil under the conditions shown below. Concentration of sodium hydroxide in the anodizing treatment solution: 8 g/L Sodium carbonate concentration in the anodizing treatment solution: 42 g/L Temperature of the anodizing treatment solution: 34°C Current density: 5 A/dm 2 Treatment time: 3 seconds

(3)在以下所示之條件下對粗化處理銅箔之S面實施高溫水蒸氣處理。 溫度:85℃ 濕度:90%RH 處理時間:3秒(3) Under the conditions shown below, the S surface of the roughened copper foil was treated with high-temperature steam. Temperature: 85°C Humidity: 90%RH Processing time: 3 seconds

(4)在以下所示之條件下對粗化處理銅箔之S面實施酸性鉻酸鹽處理。 酸性之鉻酸酐(VI)水溶液之鉻(VI)濃度:5 g/L 酸性之鉻酸酐(VI)水溶液之pH值:3.2 酸性之鉻酸酐(VI)水溶液之溫度:40℃ 電流密度:5 A/dm2 處理時間:4秒 (實施例2)(4) Under the conditions shown below, acid chromate treatment was given to the S surface of the roughening process copper foil. Chromium (VI) concentration in acidic chromic anhydride (VI) aqueous solution: 5 g/L pH value of acidic chromic anhydride (VI) aqueous solution: 3.2 Temperature of acidic chromic anhydride (VI) aqueous solution: 40°C Current density: 5 A /dm 2 processing time: 4 seconds (Example 2)

除代替上述(4)所示之處理進行以下之(4a)所示之處理之方面以外,與實施例1同樣地在粗化處理銅箔之S面形成防銹層,得到表面處理銅箔。A rustproof layer was formed on the S surface of the roughened copper foil in the same manner as in Example 1, except that the treatment shown in (4a) below was performed instead of the treatment shown in (4) above, and a surface-treated copper foil was obtained.

(4a)在以下所示之條件下對粗化處理銅箔之S面實施鹼性鉻酸鹽處理。 鹼性之鉻酸酐(VI)水溶液之鉻(VI)濃度:5 g/L 鹼性之鉻酸酐(VI)水溶液之pH值:13.5 鹼性之鉻酸酐(VI)水溶液之鋅濃度:3 g/L 鹼性之鉻酸酐(VI)水溶液之溫度:30℃ 電流密度:4 A/dm2 處理時間:5秒 (實施例3)(4a) Alkaline chromate treatment was given to the S surface of the roughening process copper foil under the conditions shown below. Chromium (VI) concentration of alkaline chromic anhydride (VI) aqueous solution: 5 g/L pH value of alkaline chromic anhydride (VI) aqueous solution: 13.5 Zinc concentration of alkaline chromic anhydride (VI) aqueous solution: 3 g/L L Alkaline chromic anhydride (VI) aqueous solution temperature: 30°C Current density: 4 A/dm 2 Treatment time: 5 seconds (Example 3)

除在上述(4)所示之處理後進一步進行上述(4a)所示之處理之方面以外,與實施例1同樣地在粗化處理銅箔之S面形成防銹層,得到表面處理銅箔。 (實施例4)Except that the treatment shown in (4a) above was further performed after the treatment shown in (4) above, an antirust layer was formed on the S surface of the roughened copper foil in the same manner as in Example 1 to obtain a surface-treated copper foil. . (Example 4)

除代替上述(2)所示之處理進行以下之(2a)所示之處理之方面以外,與實施例3同樣地在粗化處理銅箔之S面形成防銹層,得到表面處理銅箔。A rustproof layer was formed on the S surface of the roughened copper foil in the same manner as in Example 3, except that the treatment shown in (2a) below was performed instead of the treatment shown in (2) above, and a surface-treated copper foil was obtained.

(2a)在以下所示之條件下對粗化處理銅箔之S面實施高溫氧化處理。 溫度:110℃ 處理時間:5秒 (實施例5)(2a) High-temperature oxidation treatment was performed on the S surface of the roughened copper foil under the conditions shown below. Temperature: 110°C Processing time: 5 seconds (Example 5)

除代替上述(3)所示之處理進行以下之(3a)所示之處理之方面以外,與實施例4同樣地在粗化處理銅箔之S面形成防銹層,得到表面處理銅箔。Except having performed the process shown in the following (3a) instead of the process shown in said (3), it carried out similarly to Example 4, and formed the antirust layer on the S surface of the roughening process copper foil, and obtained the surface-treated copper foil.

(3a)在以下所示之條件下對粗化處理銅箔之S面實施氫生成處理。 中性鹽水溶液之硫酸鈉濃度:1 mol/L 電流密度:0.4 A/dm2 處理時間:5秒(3a) Hydrogen generation process was given to the S surface of the roughening process copper foil under the conditions shown below. Sodium sulfate concentration in neutral saline solution: 1 mol/L Current density: 0.4 A/dm 2 Processing time: 5 seconds

作為在銅箔之非粗化面形成之通常之防銹層之代表例,示出比較例1至比較例3。 (比較例1)Comparative examples 1 to 3 are shown as typical examples of the usual antirust layer formed on the non-roughened surface of copper foil. (comparative example 1)

除不進行上述(2)與(3)所示之處理,僅進行上述(1)與(4)所示之處理之方面以外,與實施例1同樣地在粗化處理銅箔之S面形成防銹層,得到表面處理銅箔。 (比較例2)Except that the treatments shown in (2) and (3) above are not carried out, and only the treatments shown in (1) and (4) above are carried out, the S surface of the roughened copper foil is formed in the same way as in Example 1. Antirust layer, get surface treated copper foil. (comparative example 2)

除不進行上述(2)與(3)所示之處理,僅進行上述(1)與(4a)所示之處理之方面以外,與實施例2同樣地在粗化處理銅箔之S面形成防銹層,得到表面處理銅箔。 (比較例3)Except that the treatments shown in (2) and (3) above are not carried out, and only the treatments shown in (1) and (4a) above are carried out, the S surface of the roughened copper foil is formed in the same way as in Example 2. Antirust layer, get surface treated copper foil. (comparative example 3)

除不進行上述(2)與(3)所示之處理,僅進行上述(1)、(4)、以及(4a)所示之處理之方面以外,與實施例3同樣地在粗化處理銅箔之S面形成防銹層,得到表面處理銅箔。 (比較例4)Except that the treatment shown in the above (2) and (3) is not carried out, only the aspects of the treatment shown in the above (1), (4) and (4a) are carried out, in the same manner as in Example 3, the roughening treatment of copper The anti-rust layer is formed on the S surface of the foil, and the surface-treated copper foil is obtained. (comparative example 4)

對比較例3之表面處理銅箔之S面實施微蝕刻處理作為內層處理。作為微蝕刻液,使用有MEC股份有限公司製造之Etch Bond CZ-8000。Microetching treatment was performed on the S surface of the surface-treated copper foil of Comparative Example 3 as inner layer treatment. As the microetching solution, Etch Bond CZ-8000 manufactured by MEC Co., Ltd. was used.

進行以上述方式製造出之實施例1至實施例5與比較例1至比較例4之表面處理銅箔之評價。評價之項目為防銹層之結構、內層密接性以及傳輸特性。關於內層密接性,對常態密接性、耐熱密接性以及耐鹽酸密接性之三種內層密接性進行評價。以下說明評價方法。 (防銹層之結構之評價方法)The evaluation of the surface-treated copper foils of Examples 1 to 5 and Comparative Examples 1 to 4 produced in the above manner was performed. The evaluation items are the structure of the anti-rust layer, the adhesion of the inner layer and the transmission characteristics. Regarding the inner layer adhesiveness, three kinds of inner layer adhesiveness of normal state adhesiveness, heat-resistant adhesiveness and hydrochloric acid-resistant adhesiveness were evaluated. The evaluation method will be described below. (Evaluation method for the structure of the antirust layer)

對於表面處理銅箔之S面,利用X射線光電子能譜法(XPS)與硬X射線光電子能譜法(HAXPES)進行分析。XPS測定與HAXPES測定使用ULVAC PHI公司製造之X射線光電子能譜分析裝置PHI Quants進行。關於入射X射線,在XPS測定中使用單色化Al-Kα線(hν=1486.6 eV),在HAXPES測定中使用單色化Cr-Kα線(hν=5414.9 eV)。XPS測定與HAXPES測定均以45°掠出角進行。The S surface of the surface-treated copper foil was analyzed by X-ray photoelectron spectroscopy (XPS) and hard X-ray photoelectron spectroscopy (HAXPES). The XPS measurement and HAXPES measurement were performed using PHI Quants, an X-ray photoelectron spectroscopy analyzer manufactured by ULVAC PHI. For incident X-rays, monochromatic Al-Kα rays (hν=1486.6 eV) were used in XPS measurement, and monochromatic Cr-Kα rays (hν=5414.9 eV) were used in HAXPES measurement. Both XPS and HAXPES measurements were carried out at a grazing angle of 45°.

使用分析軟體Multipak對在XPS測定與HAXPES測定中得到之Zn2p3/2 譜以及O1s譜進行背景扣除與峰分離。背景扣除使用Shirley法,峰分離使用擬Voigt (pseudo-Voigt)函數。峰頂之結合能相對於本說明書所記載之數值允許±0.2 eV作為誤差範圍。例如Zn(0)之峰為1021.8 eV,因此實際上在進行峰分離時使用1021.6 eV至1022.0 eV之範圍之值。The analysis software Multipak was used to perform background subtraction and peak separation on the Zn2p 3/2 spectrum and O1s spectrum obtained in XPS and HAXPES measurements. The Shirley method was used for background subtraction, and the pseudo-Voigt (pseudo-Voigt) function was used for peak separation. The binding energy of the peak top allows ±0.2 eV as an error range relative to the value recorded in this specification. For example, the peak of Zn(0) is 1021.8 eV, so the value in the range of 1021.6 eV to 1022.0 eV is actually used for peak separation.

按照以下所示之順序(A)至(C),對金屬鋅層、鋅氧化物層以及鋅氫氧化物層之三層之有無與順序進行評價。The presence or absence and order of the three layers of the metal zinc layer, the zinc oxide layer and the zinc hydroxide layer were evaluated in accordance with the procedures (A) to (C) shown below.

(A)對分別在XPS測定與HAXPES測定中得到之Zn2p3/2 譜僅以Zn(0)之峰(1021.8 eV)與Zn(II)之峰(1022.5 eV)進行峰分離,計算出各個峰面積率。面積率之單位為%,僅以兩個峰進行峰分離表示兩個峰之面積率相加為100%。將實施例1之銅箔之測定結果作為示例示於圖2之(a)與圖2之(b)。(A) For the Zn2p 3/2 spectrum obtained by XPS measurement and HAXPES measurement, only the peak of Zn(0) (1021.8 eV) and the peak of Zn(II) (1022.5 eV) were separated, and the peaks were calculated Area rate. The unit of the area ratio is %, and only two peaks are separated to indicate that the area ratios of the two peaks add up to 100%. The measurement results of the copper foil of Example 1 are shown in (a) of FIG. 2 and (b) of FIG. 2 as an example.

此時,在滿足成為「與XPS測定相比,在HAXPES測定中Zn(0)之峰之面積率增加5個百分點以上」之條件(以下,記為條件A)時,可評價為自表層側起存在Zn(II)/金屬Zn之層結構。In this case, when the condition (hereinafter, referred to as condition A) of "the area ratio of the Zn(0) peak in the HAXPES measurement is increased by 5% or more compared with the XPS measurement" can be evaluated from the surface layer side There is a layer structure of Zn(II)/metal Zn.

(B)對分別在XPS測定與HAXPES測定中得到之O1s譜僅以氧化物之峰(530.9 eV)與氫氧化物之峰(532.4 eV)進行峰分離,計算出各個峰面積率。將實施例1之測定結果作為示例示於圖2之(c)與圖2之(d)。(B) For the O1s spectrum obtained by XPS measurement and HAXPES measurement, only the oxide peak (530.9 eV) and the hydroxide peak (532.4 eV) were separated, and the area ratio of each peak was calculated. The measurement results of Example 1 are shown in (c) and (d) of FIG. 2 as examples.

此時,在滿足成為「與XPS測定相比,在HAXPES測定中氧化物之峰之面積率增加5個百分點以上」之條件(以下,記為條件B)時,可評價為自表層側起存在氫氧化物/氧化物之層結構。At this time, when the condition (hereinafter, referred to as condition B) is satisfied that the area ratio of the oxide peak in the HAXPES measurement is increased by 5% or more compared with the XPS measurement, it can be evaluated that hydrogen exists from the surface layer side. Oxide/oxide layer structure.

(C)藉由滿足上述條件A與B之兩方,可評價為自銅箔側起按順序存在金屬鋅層、鋅氧化物層以及鋅氫氧化物層之三層結構。(C) By satisfying both of the above conditions A and B, it can be evaluated as a three-layer structure in which a metal zinc layer, a zinc oxide layer, and a zinc hydroxide layer exist in order from the copper foil side.

將結果示於表1。在表1中,關於條件A與條件B之項目,在滿足其條件時表示為○標記,在不滿足其條件時表示為×標記。此外,關於比較例4,對S面進行微蝕刻,因此不利用XPS測定來檢測鋅等。因此,在表1中以無資料之含義表示為-標記。The results are shown in Table 1. In Table 1, the items about condition A and condition B are marked with ○ marks when the conditions are satisfied, and marked with X marks when the conditions are not satisfied. In addition, in Comparative Example 4, since the microetching was performed on the S surface, zinc and the like were not detected by XPS measurement. Therefore, in Table 1, it is represented as - mark with the meaning of no data.

另外,在本實施例與比較例中,在銅箔之非粗化面之最表層存在鉻酸鹽層。眾所周知,在鉻酸鹽層中,鉻氧化物與鉻氫氧化物混合存在。由此證實,與XPS測定相比,在HAXPES測定中鉻氧化物之峰之面積率之增加小於5個百分點,確認到鉻不具有層結構與在最表層存在鉻酸鹽層。因此,可知:鉻酸鹽層之存在對使用有本方法之鋅氫氧化物層、鋅氧化物層以及金屬鋅層之評價無影響。

Figure 02_image001
(內層密接性之評價方法:常態密接性)Moreover, in this Example and a comparative example, the chromate layer existed in the outermost layer of the non-roughened surface of copper foil. It is well known that in the chromate layer, chromium oxides and chromium hydroxides are mixed. From this, it was confirmed that the increase in the area ratio of the chromium oxide peak in the HAXPES measurement was less than 5 percentage points compared with the XPS measurement, and it was confirmed that chromium does not have a layer structure and that a chromate layer exists on the outermost layer. Therefore, it can be seen that the presence of the chromate layer has no influence on the evaluation of the zinc hydroxide layer, zinc oxide layer and metal zinc layer using the method.
Figure 02_image001
(Evaluation method of inner layer tightness: normal tightness)

作為內層密接性之評價之一,基於JIS C6481:1996,進行常態剝離試驗。在實施例與比較例之銅箔之非粗化面即S面,重疊兩片作為樹脂制基材之低介電聚苯醚系樹脂膜(Panasonic股份有限公司製造之多層基板材料MEGTRON7,厚度60 µm)進行貼合,製作出覆銅積層板。另外,對於實施例1至實施例5與比較例1至比較例3,在樹脂膜之貼附前不進行整面研磨、微蝕刻處理而製作出覆銅積層板。對於比較例4,在進行微蝕刻處理後製作出覆銅積層板。As one of the evaluations of inner layer adhesion, a normal peeling test was performed based on JIS C6481:1996. On the non-roughened surface of the copper foil of the examples and comparative examples, that is, the S surface, two low-dielectric polyphenylene ether resin films (multilayer substrate material MEGTRON7 manufactured by Panasonic Co., Ltd., thickness 60 µm) to make a copper clad laminate. In addition, in Examples 1 to 5 and Comparative Examples 1 to 3, copper-clad laminates were produced without performing full-surface grinding and microetching treatment before attaching the resin film. In Comparative Example 4, a copper-clad laminate was produced after microetching.

在對該覆銅積層板進行氯化銅蝕刻後去除遮蔽膠帶,製作出具有寬度10 mm之電路配線之電路線路板。在室溫環境中,使用東洋精機制作所股份有限公司製造之Tensilon試驗機,自樹脂制基材向90度方向以50 mm/分鐘之速度剝離該電路線路板之電路配線部分(銅箔部分),測定出剝離強度作為常態剝離強度。將結果示於表1。The masking tape was removed after performing copper chloride etching on this copper-clad laminated board, and the circuit wiring board which has the circuit wiring of width 10 mm was produced. In a room temperature environment, use a Tensilon testing machine manufactured by Toyo Seiki Seisakusho Co., Ltd. to peel off the circuit wiring part (copper foil part) of the circuit board from the resin base material in a 90-degree direction at a speed of 50 mm/min. , The peel strength was measured as the normal peel strength. The results are shown in Table 1.

在表1中,在常態剝離強度為0.62 N/mm以上時,判定為常態密接性優異,以○標記表示,在常態剝離強度小於0.62 N/mm時,判定為常態密接性不充分,以×標記表示。 (內層密接性之評價方法:耐熱密接性)In Table 1, when the normal-state peel strength is 0.62 N/mm or more, it is judged that the normal-state adhesiveness is excellent, and it is indicated by a circle. mark indicates. (Evaluation method of inner layer adhesion: heat-resistant adhesion)

作為內層密接性之評價之一,基於JIS C6481:1996,進行耐熱剝離試驗。與常態剝離試驗之情況同樣地製作電路線路板,在300℃之加熱大氣烘箱加熱1小時後,自然空冷至常溫。之後,與常態剝離試驗之情況同樣地進行剝離試驗,測定出剝離強度作為耐熱剝離強度。將結果示於表1。As one of the evaluations of inner layer adhesion, a heat-resistant peeling test was performed based on JIS C6481:1996. In the same way as in the normal peeling test, a circuit board was made, heated in a heated atmosphere oven at 300°C for 1 hour, and then naturally air-cooled to room temperature. Thereafter, a peeling test was performed in the same manner as in the case of the normal peeling test, and the peeling strength was measured as the heat-resistant peeling strength. The results are shown in Table 1.

在表1中,在耐熱剝離強度為0.55 N/mm以上時,判定為耐熱密接性優異,以○標記表示,在耐熱剝離強度小於0.55 N/mm時,判定為耐熱密接性不充分,以×標記表示。 (內層密接性之評價方法:耐鹽酸密接性)In Table 1, when the heat-resistant peel strength is 0.55 N/mm or more, it is judged that the heat-resistant adhesiveness is excellent, and it is indicated by a circle. mark indicates. (Evaluation method of inner layer adhesion: hydrochloric acid resistance adhesion)

作為內層密接性之評價之一,基於JIS C6481:1996,進行耐鹽酸剝離試驗。與常態剝離試驗之情況同樣地製作電路線路板,在液體溫度25℃、濃度12質量%之鹽酸中浸漬30分鐘。之後,在仔細水洗後,與常態剝離試驗之情況同樣地進行剝離試驗,測定出剝離強度作為耐鹽酸剝離強度。將結果示於表1。As one of the evaluations of inner layer adhesion, a hydrochloric acid peeling test was performed based on JIS C6481:1996. A circuit board was prepared in the same manner as in the normal peeling test, and immersed in hydrochloric acid with a liquid temperature of 25° C. and a concentration of 12% by mass for 30 minutes. After that, after careful water washing, a peeling test was performed in the same manner as in the normal state peeling test, and the peeling strength was measured as the hydrochloric acid-resistant peeling strength. The results are shown in Table 1.

在表1中,在耐鹽酸剝離強度為0.55 N/mm以上時,判定為耐鹽酸密接性優異,以○標記表示,在耐鹽酸剝離強度小於0.55 N/mm小於時,判定為耐鹽酸密接性不充分,以×標記表示。 (傳輸特性之評價方法)In Table 1, when the hydrochloric acid peel strength is 0.55 N/mm or more, it is judged that the hydrochloric acid resistance is excellent, and it is indicated by a circle, and when the hydrochloric acid peel strength is less than 0.55 N/mm, it is judged as the hydrochloric acid resistance. Insufficient, indicated by × mark. (Evaluation method of transmission characteristics)

使用實施例以及比較例之銅箔與作為樹脂制基材之低介電聚苯醚系樹脂膜(Panasonic股份有限公司製造之多層基板材料MEGTRON7,厚度60 µm),製作出圖3所示之截面結構之形成有帶線路之線路板,評價傳輸特性。形成於線路板之帶線路之電路寬度設為140 µm,電路長度設為310 mm。Using the copper foils of Examples and Comparative Examples and a low-dielectric polyphenylene ether-based resin film (Multilayer substrate material MEGTRON7 manufactured by Panasonic Co., Ltd., thickness 60 µm) as a resin base material, the cross-section shown in Fig. 3 was produced The structure is formed with a circuit board with a circuit, and the transmission characteristics are evaluated. The circuit width of the strip line formed on the circuit board was set to 140 µm, and the circuit length was set to 310 mm.

詳細而言,在銅箔22之兩面上配置樹脂層30、30,並且在樹脂層30、30上分別積層銅箔21、23,製作出線路板。樹脂層30、30均由重疊之兩片低介電聚苯醚系樹脂膜構成。此外,銅箔21、23均將粗化面朝向樹脂層30側配置。Specifically, the resin layers 30, 30 are arranged on both surfaces of the copper foil 22, and the copper foils 21, 23 are respectively laminated on the resin layers 30, 30 to produce a wiring board. Both the resin layers 30 and 30 are composed of two overlapping low-dielectric polyphenylene ether resin films. Moreover, both copper foils 21 and 23 are arrange|positioned so that the rough surface may face the resin layer 30 side.

對於比較例4,首先在使用比較例3之銅箔利用氯化銅蝕刻形成電路後進行微蝕刻處理,之後貼合外層覆銅積層板。For Comparative Example 4, first, the copper foil of Comparative Example 3 was used to form a circuit by copper chloride etching, followed by microetching treatment, and then the outer layer copper-clad laminate was bonded.

另外,非粗化面側所露出之微帶線路亦有用於傳輸特性之評價之情況,但無法正確地測定非粗化面側對傳輸特性造成之影響,因此,作為如本發明之多層印刷線路板用之銅箔之評價並不合適,以如本例之帶線路之評價為合適。In addition, the microstrip line exposed on the side of the non-roughened surface may also be used for the evaluation of transmission characteristics, but the influence of the non-roughened surface side on the transmission characteristics cannot be accurately measured. Therefore, as the multilayer printed circuit of the present invention The evaluation of copper foil for boards is not suitable, and the evaluation of strip lines such as this example is suitable.

向形成於該線路板之銅箔22之電路使用Keysight Technologies公司製造之網路分析器(network analyzer) N5291A傳輸高頻信號,測定出傳輸損失。銅箔21、23接地。特性阻抗設為50 Ω。傳輸損失之測定值之絕對值越小,傳輸損失越少,即表示高頻信號能良好地傳輸。將結果示於表1。A high-frequency signal was transmitted to the circuit formed on the copper foil 22 of the wiring board using a network analyzer (network analyzer) N5291A manufactured by Keysight Technologies, and the transmission loss was measured. The copper foils 21 and 23 are grounded. The characteristic impedance is set to 50 Ω. The smaller the absolute value of the measured value of the transmission loss is, the less the transmission loss is, which means that the high-frequency signal can be transmitted well. The results are shown in Table 1.

在表1中,在測定出之於28 GHz之傳輸損失之絕對值小於11 dB/310 mm時,判定為傳輸損失小,以○標記表示,在為11 dB/310 mm以上且小於15 dB/310 mm時,判定為傳輸損失稍大,以×標記表示,在為15 dB/310 mm以上時,判定為傳輸損失大,以××標記表示。In Table 1, when the absolute value of the measured transmission loss at 28 GHz is less than 11 dB/310 mm, it is judged that the transmission loss is small, indicated by a ○ mark, and it is more than 11 dB/310 mm and less than 15 dB/ When it is 310 mm, it is judged that the transmission loss is slightly large, and it is indicated by an × mark, and when it is 15 dB/310 mm or more, it is judged that the transmission loss is large, and it is indicated by a ×× mark.

根據表1可知,實施例1至實施例5之銅箔為滿足條件A、B之銅箔,常態密接性、耐熱密接性、耐鹽酸密接性以及傳輸特性全部優異。It can be seen from Table 1 that the copper foils of Examples 1 to 5 satisfy conditions A and B, and are excellent in normal state adhesion, heat resistance adhesion, hydrochloric acid resistance adhesion, and transmission characteristics.

與此相對,比較例1至比較例3之銅箔為在非粗化面具備先前之防銹層之銅箔,確認到不滿足條件A、B與常態密接性優異,但耐熱密接性、耐鹽酸密接性以及傳輸特性差。比較例4之銅箔進行有微蝕刻處理,因此確認到常態密接性、耐熱密接性以及耐鹽酸密接性優異,但傳輸特性明顯差。On the other hand, the copper foils of Comparative Examples 1 to 3 are copper foils having a previous anti-rust layer on the non-roughened surface, and it was confirmed that they did not satisfy the conditions A and B and were excellent in normal state adhesion, but heat-resistant adhesion, resistance Hydrochloric acid adhesion and transmission characteristics are poor. Since the copper foil of Comparative Example 4 was subjected to microetching treatment, it was confirmed that the normal-state adhesiveness, heat-resistant adhesiveness, and hydrochloric acid-resistant adhesiveness were excellent, but the transmission characteristics were significantly inferior.

1:銅箔主體 1a:粗化面 1b:非粗化面 10:防銹層 11:金屬鋅層 12:鋅氧化物層 13:鋅氫氧化物層 14:鉻酸鹽層 21:銅箔 22:銅箔 23:銅箔 30:樹脂層1: copper foil body 1a: Rough surface 1b: Non-roughened surface 10: Anti-rust layer 11: metal zinc layer 12: Zinc oxide layer 13: Zinc hydroxide layer 14: Chromate layer 21: copper foil 22: copper foil 23: copper foil 30: resin layer

圖1係表示本發明之一實施形態之表面處理銅箔之結構之剖視圖。 圖2係表示實施例1之銅箔之防銹層之XPS分析與HAXPES分析之結果之圖表。 圖3係表示評價傳輸特性之線路板之結構之剖視圖。Fig. 1 is a cross-sectional view showing the structure of a surface-treated copper foil according to an embodiment of the present invention. Fig. 2 is a graph showing the results of XPS analysis and HAXPES analysis of the antirust layer of the copper foil of Example 1. Fig. 3 is a cross-sectional view showing the structure of a circuit board for evaluation of transmission characteristics.

國內寄存資訊(請依寄存機構、日期、號碼順序註記) 無 國外寄存資訊(請依寄存國家、機構、日期、號碼順序註記) 無Domestic deposit information (please note in order of depositor, date, and number) none Overseas storage information (please note in order of storage country, institution, date, and number) none

1:銅箔主體 1: copper foil body

1a:粗化面 1a: Rough surface

1b:非粗化面 1b: Non-roughened surface

10:防銹層 10: Anti-rust layer

11:金屬鋅層 11: metal zinc layer

12:鋅氧化物層 12: Zinc oxide layer

13:鋅氫氧化物層 13: Zinc hydroxide layer

14:鉻酸鹽層 14: Chromate layer

Claims (6)

一種表面處理銅箔,其具備:銅箔主體,其兩個主面中之一者為由粗化處理形成之粗化面,另一者為非粗化面;以及防銹層,其形成於前述銅箔主體之前述非粗化面上;且前述防銹層具有由金屬鋅構成之金屬鋅層、由鋅氧化物構成之鋅氧化物層、由鋅氫氧化物構成之鋅氫氧化物層以及由鉻化合物構成之鉻酸鹽層,前述防銹層所具有之該些各層自前述銅箔主體側起按照前述金屬鋅層、前述鋅氧化物層、前述鋅氫氧化物層、前述鉻酸鹽層之順序積層。 A surface-treated copper foil comprising: a copper foil main body, one of two main surfaces of which is a roughened surface formed by roughening treatment, and the other is a non-roughened surface; and an antirust layer formed on The aforementioned non-roughened surface of the aforementioned copper foil main body; and the aforementioned antirust layer has a metallic zinc layer consisting of metallic zinc, a zinc oxide layer consisting of zinc oxide, and a zinc hydroxide layer consisting of zinc hydroxide And a chromate layer composed of a chromium compound, the layers of the aforementioned antirust layer are arranged according to the aforementioned metal zinc layer, the aforementioned zinc oxide layer, the aforementioned zinc hydroxide layer, and the aforementioned chromic acid layer from the side of the aforementioned copper foil main body. Sequential layering of salt layers. 如請求項1所述之表面處理銅箔,其中,前述銅箔主體為電解銅箔。 The surface-treated copper foil according to claim 1, wherein the main body of the copper foil is electrolytic copper foil. 如請求項1或2所述之表面處理銅箔,其中,前述非粗化面之十點平均粗糙度Rzjis為1.5μm以下。 The surface-treated copper foil according to claim 1 or 2, wherein the ten-point average roughness Rzjis of the non-roughened surface is 1.5 μm or less. 如請求項1或2所述之表面處理銅箔,其中,前述粗化面所具有之粗化粒子之平均高度在0.2μm以上且0.8μm以下之範圍內。 The surface-treated copper foil according to claim 1 or 2, wherein the average height of the roughened particles on the roughened surface is in the range of 0.2 μm to 0.8 μm. 一種覆銅積層板,其具備:如請求項1至4中任一項所述之表面處理銅箔與積層於該表面處理銅箔之前述粗化面側之樹脂制基材。 A copper-clad laminate comprising: the surface-treated copper foil according to any one of claims 1 to 4, and a resin base material laminated on the roughened surface side of the surface-treated copper foil. 一種印刷線路板,其具備如請求項5所述之覆銅積層板。 A printed circuit board comprising the copper-clad laminate as described in Claim 5.
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