TW201913111A - Testing device with temperature control testing area unit and test handler using the same capable of improving test quality - Google Patents

Abstract

The invention provides a testing device with a temperature control testing area unit. The temperature control testing area unit is provided with a carrier having at least one testing area serving as a containing space, and at least one air-blowing opening for blowing preset temperature gas is formed on at least one side surface of the testing area. The testing area of the carrier can be used for being provided with at least one test device for testing the electronic components. The temperature control testing area unit directly blows the preset temperature gas to the testing area through the air blowing opening located in the inner side surface of the testing area, so that the testing area in the carrier forms a preset temperature simulation test environment. When a pressing tool of the testing device presses the electronic component to be tested in the testing device, the temperature control testing area unit can enable the electronic component to be tested to be located in the testing area with the preset test temperature for performing testing operation, so that the practical benefit of improving the test quality is achieved.

Description

 Test device with temperature control zone unit and test classification device thereof  

The invention provides a measuring area on a vehicle for which a tester can be arranged, and directly blows a gas of a preset temperature to the measuring area by using a blowing port located on a side of the measuring area, so that the measuring area rapidly forms a preset temperature. The test environment is used to test the electronic components in the tester when the electronic components are pressed, so that the electronic components to be tested on the tester can accurately perform the test operation, thereby improving the test quality of the test device with the temperature control zone unit.

Nowadays, electronic components are used in different electronic devices. Since the environment in which electronic devices are located may be a high-temperature environment or a low-temperature environment, in order to ensure the quality of use of electronic components, after the electronic components are manufactured, the environment must be considered. Temperature, the electronic components are transferred to the test classification equipment, and the high temperature test operation or the low temperature test operation is performed in the preset temperature simulation test environment, thereby eliminating the defective products.

Please refer to Figures 1 and 2 for a schematic diagram of a test device for an electronic component test classification device. The test device is provided with a port 111 on the machine table 11, and a connection central control device is arranged below the machine table 11 (Fig. The testing machine 12 is not shown. The testing machine 12 is electrically connected to a circuit board 13 . The circuit board 13 is mounted with a substrate 14 having a plurality of test sockets 15 . The substrate 14 is locked to the machine table 11 . The test stand 15 has a plurality of probes 151. The first end of the probe 151 is electrically connected to the circuit board 13, and the second end is electrically connected to the electrical contact of the electronic component 16 to be tested. The port 111 of the 11 and the test stand 15 are covered with a cold measuring chamber 17 with a door panel 171. The cold measuring chamber 17 is connected to a conveying pipe 172 for conveying a nitrogen gas source, and is assembled on the top surface for displacement in the Z direction. The crimping device 18 is disposed at a position corresponding to each of the test sockets 15 to press down the pressing portion 181 of the electronic component 16 to be tested; in use, the testing device utilizes the conveying tube 172 The inside of the cold measuring chamber 17 transports a nitrogen cold source to form a low temperature simulation test environment inside the cold measuring chamber 17, The test piece 15 has been mounted on the electronic component 16 to be tested, and the crimping device 18 of the test device is placed in the Z direction downwardly and placed on the substrate 14 and covered above the test seat 15, and the lower pressing portion 181 The electronic component 16 to be tested is pressed down, so that the electrical contact of the electronic component 16 to be tested does contact the probe 151 of the test stand 15 to perform the test operation; however, the test device is placed over the test stand 15 for a cold test. The purpose of the chamber 17 is to perform the low temperature test operation by using the nitrogen cold source input in the cold chamber 17, so that the test socket 15 and the electronic component 16 to be tested can be in a low temperature simulation test environment, but the crimping device 18 is pressed down. When the electronic component 16 is to be tested, it will be placed on the top surface of the substrate 14 and covered above the test socket 15. Once the nitrogen source in the cold chamber 17 is blocked by the crimping device 18, the test cannot be smoothly flowed into the test. When the seat is at 15 o'clock, the temperature in the test stand 15 cannot be maintained at the preset low temperature test temperature, that is, the electronic component 16 to be tested cannot accurately perform the test operation in the preset low temperature test environment, thereby affecting the electronic component 16 to be tested. Test quality, especially when the electronics to be tested Member 16 will rise in the temperature of the test itself, and can not flow into the test element holder 15 smoothly under a nitrogen cold source, but will affect the quality of the test element 16 of the DUT, resulting in deletion can not effectively improve the quality of the test.

The first object of the present invention is to provide a test device with a temperature-controlled measuring area unit, wherein the temperature-controlled measuring area unit is provided with at least one measuring area for accommodating space and at least one side of the measuring area. Providing at least one air blowing port for blowing a preset temperature gas, wherein the measuring area of the carrier is suitable for assembling at least one test device for testing electronic components, and the temperature control measuring unit directly uses the air blowing port located on the side of the measuring area to directly measure the measuring area The gas of the preset temperature is blown, so that the measuring area in the vehicle forms a preset temperature simulation test environment, and when the crimping device of the testing device presses down the electronic component to be tested in the testing device, the temperature control measuring unit can The electronic component to be tested is accurately placed in the test area with the preset test temperature to achieve the practical benefit of improving the test quality.

The second object of the present invention is to provide a test device with a temperature-controlled measuring area unit, wherein the measuring area of the vehicle of the temperature-controlled measuring area unit is used for assembling a tester with a probe, and is located on the side of the measuring area. The blowing port blows the gas of the preset test temperature to the measuring area, and the probe of the testing device can be pre-cooled or preheated, so as to provide a preset temperature simulation test environment more quickly, and the utility model can effectively shorten the test pre-operation time. benefit.

A third object of the present invention is to provide a test classification device using a test device with a temperature control zone unit, comprising a machine table, a feeding device, a receiving device, a testing device of the invention, a conveying device and a central control device, The feeding device is disposed on the machine table and is provided with at least one feeding device for accommodating the electronic component to be tested, and the receiving device is disposed on the machine table and is provided with at least one receiving electronic component to be tested. The material bearing device is configured on the machine table, and is provided with a temperature control measuring unit, a tester and a crimping device, so that the electronic component performs the testing operation in the simulated test environment in the preset temperature. The device is disposed on the machine and is provided with at least one shifting device for transferring electronic components. The central control device is used for controlling and integrating the operations of the devices to perform an automated operation, thereby achieving practical benefits of improving work efficiency.

 [study]  

11‧‧‧ machine

111‧‧‧ mouth

12‧‧‧Testing machine

13‧‧‧Circuit board

14‧‧‧Substrate

15‧‧‧ test seat

151‧‧‧ probe

16‧‧‧Electronic components

17‧‧‧ Cold room

171‧‧‧ door panel

172‧‧‧ delivery tube

18‧‧‧Crimping tool

181‧‧‧Depression

 〔this invention〕  

20‧‧‧Testing device

21‧‧‧ Vehicles

211‧‧‧ first board

212‧‧‧Second plate

213‧‧‧ Third plate

2131‧‧‧second ventilation section

214‧‧‧4th plate

2141‧‧‧ Third ventilation section

215‧‧‧ fifth plate

2151‧‧‧Acceptance Department

2152‧‧‧ recess

2153‧‧‧First ventilation section

216‧‧‧ survey area

217‧‧‧ Block

2171‧‧‧Blowing port

2172‧‧‧Long slot

2181‧‧‧First air supply pipe

2182‧‧‧Second air supply pipe

22‧‧‧Test room

221‧‧‧ Door panel

222‧‧‧ delivery tube

231‧‧‧ test seat

2311‧‧‧Probe

2312‧‧‧Intersection

232‧‧‧PCB

233‧‧‧Tester

241‧‧‧Mobile parts

242‧‧‧Crimping tool

2421‧‧‧Depression

243‧‧‧Warm control

30‧‧‧ machine

31‧‧‧through hole

41‧‧‧Electronic components

50‧‧‧Feeding device

51‧‧‧Feeder

60‧‧‧ receiving device

61‧‧‧Receipt receiver

70‧‧‧Conveyor

71‧‧‧First mover

72‧‧‧First feeding platform

73‧‧‧Second feed stage

74‧‧‧Second shifter

75‧‧‧third shifter

76‧‧‧First discharge stage

77‧‧‧Second discharge platform

78‧‧‧fourth shifter

Figure 1: Schematic diagram of the use of a conventional electronic component test device (1).

Figure 2: Schematic diagram of the use of the conventional electronic component test device (2).

Figure 3: Top view of the temperature controlled cell unit of the test device of the present invention.

Figure 4 is a cross-sectional view of the temperature control cell unit of the present invention.

Figure 5: Configuration diagram of the temperature control unit and test room and tester of the test device.

Fig. 6 is a plan view showing the assembly of the temperature control measuring unit and the test seat of the present invention.

Figure 7: Schematic diagram of the use of the temperature-controlled measuring zone unit of the present invention (1).

Fig. 8 is a partially enlarged schematic view of Fig. 7.

Figure 9: Schematic diagram of the use of the temperature control zone unit of the present invention (2).

Figure 10: Schematic diagram of the use of the temperature-controlled measuring zone unit of the present invention (3).

Figure 11 is a partial enlarged view of Fig. 10.

Figure 12: Schematic diagram of the test device of the present invention applied to a test classification device.

In order to make the present invention more fully understood by the reviewing committee, a preferred embodiment and a drawing will be described in detail as follows: Please refer to Figures 3 and 4, the testing device 20 of the present invention has a temperature-controlled measuring zone unit. The temperature control unit is provided with a carrier 21 having at least one measurement area, and the carrier 21 can be integrally formed or composed of a plurality of boards. In this embodiment, the carrier 21 is provided with two The first and second plates 211 and 212 are assembled to each other, and the first and second plates 211 and 212 are assembled with third and fourth plates 213 and 214 on both sides to make the first and second plates 211 and 212 and The third and fourth plates 213 and 214 are assembled into a hollow frame, and a fifth plate body 215 having at least one measuring area is assembled in the hollow portion. The measuring area can be a recessed or hollowed-out accommodating space, in this embodiment. In the fifth board body 215, a plurality of hollowed-out measuring areas 216 are opened for assembling testers (not shown) for testing electronic components, and at least one side of the measuring area 216 is recessed with a receiving portion for assembly. In the present embodiment, the fifth plate body 215 is attached to the first and second faces of the measuring area 216, and is provided with a receiving portion 2151 for assembly testing. And the carrier 21 is provided with at least one air blowing port for blowing a preset temperature gas to the measuring area 216. Further, the air blowing port can be directly opened to the fifth board body 215 or another independent component, in this embodiment. The fifth plate body 215 is provided with at least one recessed portion 2152 corresponding to the measuring area 216 for assembling a body 217. The block body 217 is provided with a plurality of air blowing ports 2171, and the first end of the air blowing port 2171 is connected. In the measuring area 216, the second end is connected to a large-sized long slot 2172, which is connected to at least one air passage, which is connected to a gas supply device (not shown), such as a nitrogen gas supply device or In the present embodiment, the air passage is provided in the fifth plate body 215 with at least one first ventilation section 2153 that communicates with the long groove 2172 of the block body 217, and the plurality of first ventilation sections 2153 respectively The second ventilation section 2131 or the third ventilation section 2141 is connected to the third plate body 213 and the fourth plate body 214, and the second ventilation section 2131 and the third ventilation section 2141 are respectively connected to the first air supply pipe 2181 and the second. The air supply pipe 2182, the first air supply pipe 2181 and the second air supply pipe 2182 are connected to the nitrogen gas. A gas supply device (not shown) delivers nitrogen gas.

Referring to FIGS. 5 and 6, the test device 20 is provided with a through hole 31 in the machine base 30, and a test chamber 22 covering a door panel 221 is disposed above the through hole 31, and the test chamber 22 is connected to at least one The conveying pipe 222 for conveying the preheating gas, the conveying pipe 222 inputs the high temperature or low temperature preheating gas to the test chamber 22 according to the test operation, and the gas may be nitrogen or low temperature dry air or high temperature air, etc., in this embodiment. The conveying pipe 222 is connected to a nitrogen gas supply device (not shown) to input low-temperature nitrogen gas to the test chamber 22, and the temperature control measuring unit is locked by the first plate body 211 and the second plate body 212 of the carrier 21. The test area 20 is located below the port 31 of the machine 30, and the test device 20 is disposed at the test area 216 of the carrier 21 of the temperature control unit to set at least one test electron. In the present embodiment, the tester is provided with a test stand 231 having a probe 2311, and a joint portion 2312 is protruded from the first and second faces of the test seat 231 to be assembled across the carrier. The receiving portion 2151 of the fifth plate body 215 of 21 causes the test seat 231 to be located in the measuring area 216, and the test seat 231 is The pin 2311 is located at the side of the air outlet 2171 of the block 217. The first end of the probe 2311 of the test stand 231 is electrically connected to a circuit board 232. The circuit board 232 is electrically connected to a test machine 233. 20, in the interior of the test chamber 22, a crimping device 242 driven by the moving member 241 for Z-direction displacement is mounted to press the electronic component on the test socket 231 to perform a test operation, and the crimping tool 242 is corresponding to the test seat. A pressing portion 2421 is disposed at a position of 231, and the electronic component to be tested is pressed below, and the crimping device 242 can be a pressing member under the simple pressing electronic component, or a pressing member capable of pressing and transferring the electronic component. In this embodiment, the crimping device 242 simply presses down the electronic component, and the crimping device 242 is provided with at least one temperature control 243 to assist the electronic component to be tested to maintain a preset test temperature. The control 243 can be a refrigerated wafer or a heating element or a body with a pre-warmed fluid. In the present embodiment, the temperature control 243 is a refrigerated wafer.

Referring to Figures 7 and 8, in order to perform the low temperature test operation of the electronic component, the test device 20 inputs the low temperature nitrogen into the inside of the test chamber 22 by the transfer tube 222, so that the inside of the test chamber 22 forms a low temperature simulation test environment due to The crimping tool 242 has not been displaced downward in the Z direction, and the low temperature nitrogen gas in the test chamber 22 can flow into the measuring area 216 of the carrier 21 of the temperature control measuring unit through the through hole 31 of the machine 30, and The first air supply pipe 2181 and the second air supply pipe 2182 of the temperature control zone unit are connected to a nitrogen gas supply device (not shown), and may be respectively connected to the second ventilation section of the third plate body 213 and the fourth plate body 214. 2131 and the third venting section 2141 deliver the low temperature nitrogen gas to the first venting section 2153 of the fifth plate body 215, and the first venting section 2153 further transports the low temperature nitrogen gas to the long groove 2172 of the block body 217, so that the low temperature nitrogen gas is long groove 2172 Dividing to a plurality of air blowing ports 2171, a plurality of low-temperature nitrogen gases are directly blown to the measuring area 216 by a plurality of air blowing ports 2171 located on the inner side of the measuring area 216, and not only the plurality of probes 2311 of the test socket 231 can be pre-cooled, but also The temperature measurement zone unit 216 forms a low temperature simulation Test environment.

Referring to Figures 9, 10 and 11, since the interior of the test chamber 22 has a low temperature nitrogen gas to form a low temperature simulation test environment, a feeder of a transport device (not shown) moves the electronic component 41 to be tested. The test chamber 22 is transferred to the test area 216 of the temperature control test area unit, and placed on the test stand 231, so that the electrical contact of the electronic component 41 to be tested contacts the plurality of probes 2311 of the test stand 231; Then, the crimping device 242 is driven by the moving member 241 to be displaced downward in the Z direction, and the pressing portion 2421 presses down the electronic component 41 to be tested, so that the electrical contact of the electronic component 41 to be tested does contact the test socket 231. The plurality of probes 2311 are connected to the inside of the measuring area 216 of the carrier 21 by the air blowing port 2171 of the block 217 of the temperature control measuring unit, and can be directly measured by the side by using a plurality of blowing ports 2171 of the block 217. The zone 216 uniformly blows the low temperature nitrogen gas, so that the measurement zone 216 of the carrier 21 also forms a preset low temperature simulation test environment; therefore, the test device 20 can utilize the temperature control even in the low temperature simulation test environment formed by the test chamber 22. The measuring area 216 of the measuring unit is directly formed around the test seat 231 A low temperature simulation test environment to ensure that the electronic component 41 to be tested is in a low temperature analog test environment. Since the test socket 231 is electrically connected to the circuit board 232, the circuit board 232 is electrically connected to a test machine 233, so that the test socket 231 can be The low-temperature test operation is accurately performed on the electronic component 41 to be tested located in the low-temperature simulation test environment to ensure that the electronic component 41 is accurately tested at a low temperature in a simulated low-temperature simulation environment, thereby achieving the practical benefit of improving the test quality.

Please refer to the figures 3, 4, 5 and 12, which are schematic diagrams of the testing device 20 with the temperature-controlled measuring area unit applied to the electronic component testing and sorting device, which is equipped with the feeding device on the machine table 30. 50, receiving device 60, testing device 20 of the present invention, conveying device 70 and central control device (not shown); the feeding device 50 is mounted on the machine table 30, and at least one is provided for the feeding tray a material receiver 51 for accommodating at least one electronic component to be tested; the receiving device 60 is mounted on the machine table 30, and is provided with at least one receiving receptacle 61 for receiving trays for accommodating at least A tested electronic component; the testing device 20 of the present invention is mounted on the machine 30, and is provided with a temperature control measuring unit, a testing room, a tester and a crimping device, so that the electronic component is indeed tested at a preset temperature. The environment performs a test operation. In this embodiment, the test chamber 22 is mounted above the machine 30 and is placed above the temperature control unit, and the temperature control unit is mounted on the machine 30, and A carrier 21 having a measuring area 216 is provided, and at least one side of the measuring area 216 is provided with at least one side a blowing port 2171 is blown to the preset temperature gas, and the measuring area 216 of the carrier 21 is for assembling a tester of at least one test electronic component, the tester is provided with an electrically connected test socket 231 and a circuit board 232, Performing a test operation on the electronic component, the crimping tool 242 can be used to press down the electronic component to be tested in the Z direction, and the air blowing port 2171 of the temperature control measuring unit blows a gas of a preset temperature to the measuring area 216, so that the measuring area 216 is formed. a preset temperature simulation test environment for the electronic component to accurately perform the test operation in the test area 216; the transport device 70 is mounted on the machine table 30, and is provided with at least one shifter for transferring electronic components, In the embodiment, a first feeder 71 is provided to take out the electronic component to be tested at the feeding device 51 of the feeding device 50, and transfer it to the first loading stage 72 and the second input. The material loading station 73, the first loading stage 72 and the second loading stage 73 carry the electronic component to be tested to the side of the testing device 20, and the conveying device 70 uses the second shifter 74 and the third shifting The hopper 75 takes out the electronic component to be tested on the first loading stage 72 and the second loading stage 73, and moves it into the measurement. The test operation is performed by the seat 231, and the tested electronic components of the test socket 231 are transferred to the first discharge stage 76 and the second discharge stage 77, the first discharge stage 76 and the second discharge stage. 77 carries out the measured electronic components for the fourth feeder 78 to take out the tested electronic components, and according to the test results, transfer to the receiving device 61 of the receiving device 60 for sorting and collecting, the central control The device is used to control and integrate the operation of each device to perform automated operations to achieve practical benefits of improving operational efficiency.

Claims (10)

 A testing device with a temperature-controlled measuring zone unit, comprising: a temperature-controlled measuring zone unit: a carrier having at least one measuring zone, wherein the carrier is provided with a blowing preset temperature gas on at least one side of the measuring zone The air blowing port is such that the measuring area forms a pre-temperature simulation test environment; the tester is assembled in the measuring area of the temperature control measuring unit to test the electronic components.    According to the test device of the temperature control measuring unit according to the first aspect of the patent application, the carrier of the temperature control measuring unit is integrally formed or composed of a plurality of plates.    The testing device with the temperature-controlled measuring area unit according to the first aspect of the patent application, wherein the measuring area of the temperature-controlled measuring area unit can be a recessed or hollowed-out accommodating space.    The test device with a temperature-controlled measuring area unit according to the first aspect of the patent application, wherein the measuring area of the temperature-controlled measuring area unit is provided with a receiving portion on at least one side, and the tester is provided with at least one test electronic The test seat of the component is provided with at least one joint portion to be assembled to the receiving portion of the temperature control test zone unit.    The test device with the temperature-controlled measuring zone unit according to the first aspect of the patent application, wherein the air-blowing port of the temperature-controlled measuring zone unit is integrally formed on the carrier or disposed on the independent block.    The test device with a temperature-controlled measuring zone unit according to claim 5, wherein the temperature-controlled measuring zone unit is provided with a recess on at least one side of the measuring zone of the carrier for assembling the at least one blowing The block of the mouth.    According to the testing device of the temperature control measuring unit according to Item 6 of the patent application scope, the first end of the air blowing port of the block is connected to the measuring area, and the second end is connected to a large size. a trough connecting the at least one air passage, the air passage being connected to an air supply duct.    The testing device with the temperature-controlled measuring unit according to the first aspect of the patent application, further comprising the testing device is provided with at least one crimping device for crimping electronic components, the crimping device being provided with at least one temperature control.    According to the testing device of the temperature control measuring unit according to the first aspect of the patent application, wherein the carrier of the temperature control measuring unit of the testing device is mounted on the machine, the testing device is attached to the machine and A test chamber is disposed above the measuring area of the vehicle, and the test chamber is connected to at least one conveying pipe for conveying the preheating gas.    A test classification device using a test device with a temperature-controlled measurement zone unit, comprising: a machine table; a feeding device: disposed on the machine platform, and provided with at least one feeding device for accommodating at least one waiting Measuring electronic component; receiving device: disposed on the machine, and provided with at least one receiving device for accommodating at least one tested electronic component; at least one according to claim 1 The test device with the temperature control measuring unit is disposed on the machine, and is provided with the temperature control measuring unit and the test device, so that the electronic component performs the testing operation in the preset temperature simulation test environment; the conveying device: It is disposed on the machine and is provided with at least one shifter for transferring electronic components. The central control device is used for controlling and integrating the operations of the devices to perform automated operations.