TW201831917A - 形成有非探針式連接器的探針檢測裝置 - Google Patents

形成有非探針式連接器的探針檢測裝置 Download PDF

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Publication number
TW201831917A
TW201831917A TW107105869A TW107105869A TW201831917A TW 201831917 A TW201831917 A TW 201831917A TW 107105869 A TW107105869 A TW 107105869A TW 107105869 A TW107105869 A TW 107105869A TW 201831917 A TW201831917 A TW 201831917A
Authority
TW
Taiwan
Prior art keywords
circuit board
printed circuit
guide block
block
flexible printed
Prior art date
Application number
TW107105869A
Other languages
English (en)
Chinese (zh)
Inventor
張棟俊
柳住衡
朱昊煐
Original Assignee
南韓商福熙瑞殷股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 南韓商福熙瑞殷股份有限公司 filed Critical 南韓商福熙瑞殷股份有限公司
Publication of TW201831917A publication Critical patent/TW201831917A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
TW107105869A 2017-02-21 2018-02-21 形成有非探針式連接器的探針檢測裝置 TW201831917A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020170023158A KR101895034B1 (ko) 2017-02-21 2017-02-21 논-포고 타입 커넥터를 포함하는 프로브 검사 장치
??10-2017-0023158 2017-02-21

Publications (1)

Publication Number Publication Date
TW201831917A true TW201831917A (zh) 2018-09-01

Family

ID=63434988

Family Applications (1)

Application Number Title Priority Date Filing Date
TW107105869A TW201831917A (zh) 2017-02-21 2018-02-21 形成有非探針式連接器的探針檢測裝置

Country Status (3)

Country Link
KR (1) KR101895034B1 (ko)
CN (1) CN108761152A (ko)
TW (1) TW201831917A (ko)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102216326B1 (ko) * 2020-04-17 2021-02-17 주식회사 케이에스디 Oled 원장 테스트용 프로브 유닛
KR102654553B1 (ko) * 2023-12-13 2024-04-04 주식회사 프로이천 네스트플레이트

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100608830B1 (ko) * 2004-11-09 2006-08-09 엘지전자 주식회사 접지스프링핑거를 구비한 이동통신 단말기
JP4262713B2 (ja) * 2005-11-10 2009-05-13 日本航空電子工業株式会社 検査装置
CN201156865Y (zh) * 2007-12-14 2008-11-26 天津太精电子有限公司 柔性印刷电路板fpc检测用夹具
CN102103152A (zh) * 2009-12-22 2011-06-22 沋博普利斯金股份有限公司 容易整列的lcd检测设备用一体型探针模块
US8841931B2 (en) * 2011-01-27 2014-09-23 Taiwan Semiconductor Manufacturing Company, Ltd. Probe card wiring structure
KR101406033B1 (ko) * 2014-04-15 2014-06-11 위드시스템 주식회사 핀 블록 교체가 가능한 검사용 소켓
KR101585182B1 (ko) * 2014-04-28 2016-01-14 황동원 반도체 소자 테스트용 소켓장치
KR20150142142A (ko) * 2014-06-10 2015-12-22 솔브레인이엔지 주식회사 Display 장비 검사 Noise 제거방안
CN104319505B (zh) * 2014-11-17 2018-01-19 合肥京东方光电科技有限公司 柔性印刷电路板插接治具

Also Published As

Publication number Publication date
CN108761152A (zh) 2018-11-06
KR101895034B1 (ko) 2018-10-04
KR20180096429A (ko) 2018-08-29

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