TW201625403A - 工件的貼合方法 - Google Patents
工件的貼合方法 Download PDFInfo
- Publication number
- TW201625403A TW201625403A TW104133516A TW104133516A TW201625403A TW 201625403 A TW201625403 A TW 201625403A TW 104133516 A TW104133516 A TW 104133516A TW 104133516 A TW104133516 A TW 104133516A TW 201625403 A TW201625403 A TW 201625403A
- Authority
- TW
- Taiwan
- Prior art keywords
- workpiece
- bonding
- workpieces
- surface activation
- gas
- Prior art date
Links
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Classifications
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- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
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- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
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- H01L21/187—Joining of semiconductor bodies for junction formation by direct bonding
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- H—ELECTRICITY
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- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
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Abstract
提供可達成高強度的接合狀態,而且,關於接合狀態可獲得良好的再現性之工件的貼合方法。
本發明之工件的貼合方法,係貼合分別由選自合成樹脂、玻璃、矽晶圓、水晶及藍寶石所成之群的材料所成之兩個工件彼此的方法,其特徵為具有使至少一方之工件的貼合面活性化的表面活性化工程,與將兩個工件在以個別的貼合面相互接觸之方式層積的層積工程;在進行前述表面活性化工程之前,進行從用於該表面活性化工程之工件的貼合面使水分脫離的前處理工程。
Description
本發明係關於貼合由合成樹脂、玻璃、矽晶圓、水晶或藍寶石所成之工件彼此的方法。
近年來,於生物化學領域中,注目使用微反應器,進行微量之試藥的分離、合成、抽出或分析等的手法。該微反應器係於例如由矽、矽氧烷樹脂或玻璃等所成的小基板上,藉由半導體微加工技術,形成微尺度的分析用通道等的微晶片所成者。
使用此種微反應器的反應分析系統,被稱為微整合分析系統(Micro Total Analysis System,以下稱為「μ TAS」)。依據該μ TAS,可根據相對於試藥體積的表面積之比例變大等來進行高速且高精度的分析反應,又,可實現簡潔且自動化的系統。
於微晶片中,藉由於亦稱為微型通道的流通路徑,設置配置有試藥之反應區域等之具有各種功能的區域,可構成適合各種用途的晶片。作為微晶片的用途,可舉出基因解析、臨床診斷、藥物篩選等之化學、生化學、
藥學、醫學、獸醫學的分野之分析,或化合物的合成、環境計測等。
此種微晶片係典型上具有一對基板對向而被接著的構造。然後,於至少一方的基板的表面上形成有細微的流通路徑(例如,寬度10~數100μm,深度10~數100μm程度)。作為構成微晶片的基板,根據易於製造,也可進行光學檢測,主要使用玻璃基板。又,在最近,致力於雖然輕量但相較於玻璃基板較不易破損,且廉價之使用樹脂基板之微晶片的開發。
於微晶片的製造中,作為基板的貼合方法,有使用接著劑的方法、熱融接所致之方法。然而,該等方法有以下問題。
於藉由接著劑來貼合的方法中,會產生接著劑侵入微小流通路徑而使流通路徑閉塞,微小流通路徑的一部份變狹窄而流通路徑成為不均勻,或流通路徑壁面的均質特性混亂的產生之問題。
又,於藉由熱熔接來貼合的方法中,以加熱熔融溫度以上來熔接的話,在加熱階段,流通路徑被破壞,或流通路徑未保持為所定剖面形狀,故有難以進行微晶片的高功能化的問題。
因此,近年來,提案有例如藉由將真空紫外線照射至基板表面,使該基板的表面活性化,之後,貼合基板的方法(參照專利文獻1至5)。又,作為使基板的表面活性化的方法,也可利用於大氣壓或其附近下,使加工氣體電
漿化,並使該電漿化的加工氣體接觸基板的表面的方法。
〔專利文獻1〕日本專利第3714338號
〔專利文獻2〕日本特開2006-187730號公報
〔專利文獻3〕日本特開2008-19348號公報
〔專利文獻4〕WO2008/087800A1公報
〔專利文獻5〕日本專利第5152361號
然而,於先前的貼合方法中,發現有以下的問題。亦即,即使高精度地管理照射至基板表面之紫外線的照度,或用以使加工氣體電漿化的電力及加工氣體的流量等之基板的表面活性化處理條件,以及接合基板彼此時之加壓壓力、加壓溫度及加熱時間等的接合處理條件,所得之接合體的接合狀態也會發生不均,難以確實達成高強度的接合狀態。
因此,本發明的目的係提供可達成高強度的接合狀態,而且,關於接合狀態可獲得良好的再現性之工件的貼合方法。
本案發明者們係針對前述課題而重複銳意檢討的結果,發現根據工件的貼合面的水分量,所得之接合體的接合狀態會產生變化,並依據此見識而完成本發明。
亦即,本發明的工件的貼合方法,係貼合分別由選自合成樹脂、玻璃、矽晶圓、水晶及藍寶石所成之群的材料所成之兩個工件彼此的方法,其特徵為:具有:表面活性化工程,係使至少一方之工件的貼合面活性化;及接合工程,係將兩個工件在以個別的貼合面相互接觸之方式層積之狀態下接合;在進行前述表面活性化工程之前,進行從用於該表面活性化工程之工件的貼合面使水分脫離的前處理工程。
於本發明的工件的貼合方法中,前述前處理工程,係藉由對用於前述表面活性化工程的工件加熱來進行為佳。
又,前述前處理工程,係藉由將用於前述表面活性化工程的工件配置於減壓空間來進行為佳。
又,前述前處理工程,係藉由對於用於前述表面活性化工程之工件的貼合面,吹附乾燥空氣或惰性氣體來進行為佳。
又,前述表面活性化工程,係對前述工件的貼合面照射真空紫外線的紫外線照射處理工程為佳。
又,前述表面活性化工程,係使藉由大氣壓電漿而電
漿化的加工氣體,與前述工件的貼合面接觸的電漿氣體處理工程為佳。
依據本發明的工件的貼合方法,於表面活性化工程的前處理工程中,使水分從工件的貼合面脫離,故可達成高強度的接合狀態,而且關於接合狀態,可獲得良好的再現性。
1‧‧‧加熱板
20‧‧‧處理室
20a‧‧‧一側壁
20b‧‧‧另一側壁
21‧‧‧平台
22‧‧‧真空閥
23‧‧‧洩壓口
24‧‧‧配管
25‧‧‧真空泵
30‧‧‧平台
35‧‧‧噴射噴嘴
40‧‧‧容器
40a‧‧‧一側壁
40b‧‧‧另一側壁
41‧‧‧托盤
43‧‧‧氣體導入口
44‧‧‧氣體排出口
50‧‧‧殼體
51‧‧‧電極
52‧‧‧介電體層
53‧‧‧氣體供給口
54‧‧‧噴嘴
55‧‧‧高頻電源
G‧‧‧前處理用氣體
G1‧‧‧加工氣體
G2‧‧‧電漿化的加工氣體
W1,W2‧‧‧工件
〔圖1〕揭示用以藉由對工件加熱,執行前處理工程的裝置的說明圖。
〔圖2〕揭示用以藉由將工件配置於減壓空間,執行前處理工程的裝置的說明圖。
〔圖3〕揭示用以藉由對於工件的貼合面,吹附由乾燥空氣或惰性氣體所成的前處理用氣體,來執行前處理工程的裝置的說明圖。
〔圖4〕揭示用以藉由將工件配置於乾燥氣氛下,執行前處理工程的裝置的說明圖。
〔圖5〕揭示本發明所用之大氣壓電漿裝置的一例之構造的說明用剖面圖。
以下,針對本發明之工件的貼合方法的實施形態進行說明。
本發明之工件的貼合方法,係例如貼合板狀之兩個工件彼此的方法。適用於本發明的貼合方法的工件,係由選自合成樹脂、玻璃、矽晶圓、水晶及藍寶石所成之群的材料所成者。
作為構成工件的合成樹脂,可使用聚二甲基矽氧烷等的矽氧烷樹脂、環烯烴樹脂、丙烯酸樹脂等。
作為構成工件的玻璃,可使用石英玻璃、藍寶石玻璃、鹼玻璃、硼矽酸玻璃等。
兩個工件個別作為由相互同種的材料所成者亦可,作為由不同材料所成者亦可。作為兩個工件的材質的組合,樹脂-樹脂、樹脂-玻璃、玻璃-玻璃、樹脂-矽晶圓、玻璃-矽晶圓、矽晶圓-矽晶圓為佳。再者,於矽晶圓的表面,形成有氧化矽膜亦可。
本發明的工件的貼合方法,係具有使至少一方之工件的貼合面活性化的表面活性化工程,與將兩個工件在以個別的貼合面相互接觸之方式層積之狀態下接合的接合工程。表面活性化工程僅對於一方的工件進行即可,但是,對於兩個工件雙方進行為佳。
然後,於本發明之工件的貼合方法中,在進行表面活性化工程之前,進行從用於該表面活性化工程之工件的貼合面,使水分脫離的前處理工程。
前處理工程係對於用於表面活性化工程的工件進行即可,但是,於表面活性化工程僅對於一方的工件進行之狀況中,對於兩個工件雙方進行亦可。
作為用以執行前處理工程的處理方法,只要是使水分從工件的貼合面脫離者即可,並未特別限定。作為該處理方法的具體例,可舉出(1)對工件加熱的方法,(2)將工件配置於減壓空間的方法,(3)對於工件的貼合面,吹附由乾燥空氣或惰性氣體所成之前處理用氣體的方法,(4)將工件配置於乾燥氣氛下的方法等。在該等中,(1)、(2)及(3)的方法為佳。
圖1係揭示用以藉由對工件加熱,執行前處理工程的裝置的說明圖。該裝置係具有對工件W1、W2加熱的加熱板10。於該裝置中,板狀的工件W1、W2係被載置於加熱板10上,藉由該加熱板10直接加熱。
工件W的加熱條件係根據構成工件W1、W2的材料而適當設定,加熱溫度為75℃以上為佳,為水的沸點即100℃以上更佳。
舉出具體的加熱條件的話,例如在工件W1或工件W2是由合成樹脂所成者時,加熱溫度為100~110℃,加
熱時間為30~300秒鐘。
又,在工件W1及工件W2是由玻璃、矽晶圓、水晶或藍寶石所成者時,加熱溫度為120~140℃,加熱時間為30~300秒鐘。
圖2係揭示用以藉由將工件配置於減壓空間,執行前處理工程的裝置的說明圖。於該裝置中,於矩形的箱型之處理室20內,設置有載置工件W1、W2的平台21。於處理室20的一側壁20a,設置有真空閥22。又,於處理室20的另一側壁20b,設置有洩壓口23。於真空閥22,透過配管24連接有真空泵25。
於圖2所示之裝置中,板狀的工件W1、W2,以其貼合面朝向上方之方式載置於平台21上。之後,藉由驅動真空泵25,處理室20內成為減壓空間。
處理室20內之減壓空間的氣壓,係例如1000Pa以下。
又,工件W1、W2配置於減壓空間的處理時間,係例如1~5分鐘。
圖3係揭示用以藉由對於工件的貼合面,吹附由乾燥空氣或惰性氣體所成的前處理用氣體,來執行前處理工程的裝置的說明圖。於該裝置中,於載置工件W1、W2之平台30的上方,配置有噴射前處理用氣體G的噴射噴嘴35。
作為構成前處理用氣體G的乾燥空氣,使用露點為-40℃以下者為佳。
又,作為構成前處理用氣體G的惰性氣體,可使用氮氣、氬氣等。
於圖3所示之裝置中,板狀的工件W1、W2,以其貼合面朝向上方之方式載置於平台30上。之後,前處理用氣體G從噴射噴嘴35噴射,被吹附至工件W1、W2的貼合面。
被吹附至工件W1、W2的前處理用氣體G的流量,為0.03~0.12m3/min為佳。
又,工件W1、W2被前處理用氣體G吹附的處理時間,係例如5~300秒鐘。
圖4係揭示用以藉由將工件配置於乾燥氣氛下,執行前處理工程的裝置的說明圖。於該裝置中,於矩形的箱型之容器40內,設置有載置工件W1、W2的托盤41。又,鄰接於容器40的一側壁40a,設置有導入乾燥空氣的氣體導入口43。又,於容器40的另一側壁40b,設置有排出容器40內之氣體的氣體排出口44。
於圖4所示之裝置中,板狀的工件W1、W2,以其貼合面朝向上方之方式載置於托盤41上。然後,載置工件W1、W2的托盤41,被配置於容器40內。之後,藉由乾燥空氣從氣體導入口43導入至容器40內,讓容器40內成為乾燥氣氛。
容器40內的乾燥氣氛,係相對濕度5%以下,例如處理溫度為常溫(20℃)的話,露點為-20℃以下為佳。容器40內的乾燥氣氛的程度,係可藉由例用露點計(省略
圖示)測定從氣體排出口44排出之氣體的露點來推定。
又,工件W1、W2配置於乾燥氣氛下的處理時間,係例如1~5分鐘。
於本發明的工件的貼合方法中,前處理工程的完成後之工件的質量基準水分含量為0.12%以下為佳。在該質量基準水分含量超過0.12%之狀況中,在貼合工件彼此時,有難以確實達成高強度的接合狀態之情況。
在此,質量基準水分含量可藉由加熱乾燥式水分計來測定。
又,從前處理工程完成到開始表面活性化工程為止的時間,係10分鐘以下為佳。該時間超過10分鐘時,於被前處理過之工件的表面,有水分會再次附著之虞。因此,有關於所得之接合體,難以確實達成高強度的接合狀態之情況。
表面活性化工程係對工件的貼合面,照射真空紫外線的紫外線照射處理工程,或使藉由大氣壓電漿而電漿化的加工氣體,與工件的貼合面接觸的電漿氣體處理工程為佳。
(1)紫外線照射處理工程
作為表面活性化工程,於選擇紫外線處理工程之狀況中,對被前處理過之工件的貼合面,照射波長200nm以
下的真空紫外線。
作為放射真空紫外線的光源,可合適地使用於波長172nm具有輝線之氙準分子燈等的準分子燈、於波長185nm具有輝線的低壓水銀燈、於波長120~200nm的範圍具有輝線的氘燈。
被照射至工件的貼合面之真空紫外線的照度係例如10~100mW/cm2。
又,對於工件的貼合面之紫外線的照射時間,係因應構成工件的材料而適當設定,例如5~120秒鐘。
(2)電漿氣體處理工程
作為表面活性化工程,選擇電漿氣體處理工程之狀況中,使藉由大氣壓電漿而電漿化的加工氣體,與工件的貼合面接觸。
圖5係揭示本發明所用之大氣壓電漿裝置的一例之構造的說明用剖面圖。該大氣壓電漿裝置,係具有例如由鋁所成之長方體狀的殼體50。於該殼體50內,水平配置電性連接於高頻電源55的板狀之電極51。於該電極51的下面,形成有介電體層52。於此例的大氣壓電漿裝置中,電極51設為高壓側電極,殼體50設為接地側電極。
於殼體50的上面,設置有對殼體50內供給加工氣體的氣體供給口53。又,於殼體50的下面,形成有將於殼體50內藉由大氣壓電漿而電漿化的加工氣體,放出至外部的複數噴嘴54。
於此種大氣壓電漿裝置中,在大氣壓或其附近的壓力下,加工氣體G1從氣體供給口53被供給至殼體50內。在此狀態下,藉由高頻電源55透過介電體層52對電極51與殼體50之間施加高頻電場的話,在電極51與殼體50之間會產生介電體屏障放電。結果,存在於殼體50與介電體層52之間的加工氣體G1被游離或激發而電漿化。然後,電漿化的加工氣體G2係從殼體50的噴嘴54放出至外部,接觸配置於殼體50的下方之工件(省略圖示)的貼合面。
於以上內容中,作為加工氣體G1,使用以氮氣、氬氣等作為主成分,含有氧氣0.01~5體積%所成者為佳。又,也可使用氮氣與潔淨乾燥空氣(CDA)的混合氣體。
又,從高頻電源55供給的電力,係頻率為20~70kHz,電壓為5~15kVp-p。
又,電漿氣體處理所致之處理時間係例如5~100秒鐘。
於接合工程中,將兩個工件在以個別的貼合面相互接觸之方式層積之狀態下接合。
作為用以接合工件彼此的具體的方法,可舉出(1)在層積兩個工件之狀態下加熱的方法,(2)在層積兩個工件之狀態下對厚度方向加壓的方法,(3)在層積兩個工件之狀態下對厚度方向一邊加壓一邊加熱的方法,
(4)在層積兩個工件之狀態下對厚度方向加壓,在解除加壓後加熱的方法等。
接合工程之具體條件,係因應構成工件的材料,於該工件不會發生變形的範圍內適當設定。
舉出具體的加熱條件的話,於對兩個工件加熱之狀況中,一方的工件是由合成樹脂所成者時,加熱溫度為100~110℃。又,兩個工件雙方是由玻璃、矽晶圓、水晶或藍寶石所成者時,加熱溫度是120~140℃。
又,於對兩個工件加壓之狀況中,一方的工件是由合成樹脂所成者時,加壓力是0.2~10MPa。又,兩個工件雙方是由玻璃、矽晶圓、水晶或藍寶石所成者時,加壓力是1~10MPa。
依據前述之工件的貼合方法,於表面活性化工程的前處理工程中,使水分從工件的貼合面脫離,故可達成高強度的接合狀態,而且關於接合狀態,可獲得良好的再現性。
以下,針對本發明之工件的貼合方法的具體實施例進行說明,但是,本發明並不限定於後述實施例。
製作後述之工件A及工件B。
工件A係由環烯烴樹脂(日本Zeon股份有限公司製
「ZEONEX480R」)所成,尺寸為30mm×30mm×3mm的矩形之板狀者。
工件B係由合成石英玻璃所成,尺寸為25mm×45mm×2mm的矩形之板狀者。
並藉由加熱乾燥式水分計(A&D公司製)來測定工件A及工件B的個別之質量基準水分含量。該加熱乾燥式水分計係對載置於水分計內之電子天秤的試料進行加熱,以天秤測定試料的質量變化,作為水分,求出加熱乾燥前後之試料質量的減少量。結果,工件A的質量基準水分含量為0.13%,工件B的質量基準水分含量為0.07%。
作為一方的工件,使用工件A,作為另一方的工件,使用工件B,藉由針對兩個工件,進行後述之前處理工程、紫外線照射工程及接合工程來進行貼合。
使用圖1所示之裝置,藉由針對兩個工件,個別以加熱溫度為75℃,加熱時間為5分鐘的條件進行加熱,進行前處理工程。並藉由加熱乾燥式水分計(A&D公司製)來測定前處理工程後之工件A及工件B的個別之質量基準水分含量。於表1揭示結果。
使用氙準分子燈,對兩個工件個別之一面(貼合面),以照度為40mW/cm2,照射時間為30秒鐘的條件,照射真空紫外線。
將兩個工件以個別的一面相互接觸之方式層積。在此,兩個工件的個別一面之相互接觸的接觸面積為625mm2。接下來,以加壓力為2MPa,加壓時間為300秒鐘的條件,藉由加壓,接合兩個工件。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度(tensile shear strength)。於表1揭示結果。
於前處理工程中,將加熱溫度變更成100℃以外,與實施例1相同,進行兩個工件的貼合。於表1揭示前處理工程後之兩個工件的個別質量基準水分含量。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
於前處理工程中,將加熱溫度變更成120℃以外,與實施例1相同,進行兩個工件的貼合。於表1揭示前處理工程後之兩個工件的個別質量基準水分含量。
針對所得之接合體,以JIS K 6850為基準,測定抗拉
伸剪切強度。於表1揭示結果。
除了將前處理工程如以下進行以外,與實施例1相同,進行兩個工件的貼合。於表1揭示前處理工程後之兩個工件的個別質量基準水分含量。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
使用圖2所示之裝置,藉由將兩個工件,個別配置5分鐘於氣壓為133Pa的減壓空間內,進行前處理工程。
除了將前處理工程如以下進行以外,與實施例1相同,進行兩個工件的貼合。於表1揭示前處理工程後之兩個工件的個別質量基準水分含量。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
使用圖3所示之裝置,藉由對於兩個工件個別之一面(貼合面),以流量為0.03m3/min的條件,吹附5分鐘的氮氣,進行前處理工程。
除了將前處理工程如以下進行以外,與實施例1相同,進行兩個工件的貼合。於表1揭示前處理工程後之兩個工件的個別質量基準水分含量。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
使用圖4所示之裝置,藉由將工件A及工件B,個別配置5分鐘於溫度20℃且相對濕度為5%(露點為-20℃)的乾燥氣氛下,進行前處理工程。
除了不進行前處理工程以外,與實施例1相同,進行兩個工件的貼合。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
除了作為另一方的工件,使用工件A來代替工件B以外,與實施例1相同,進行兩個工件的貼合。
針對所得之接合體,以IIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
除了作為另一方的工件,使用工件A來代替工件B以外,與實施例2相同,進行兩個工件的貼合。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
除了作為另一方的工件,使用工件A來代替工件B以外,與實施例3相同,進行兩個工件的貼合。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
除了作為另一方的工件,使用工件A來代替工件B以外,與實施例4相同,進行兩個工件的貼合。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
除了作為另一方的工件,使用工件A來代替工件B以外,與實施例5相同,進行兩個工件的貼合。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
除了作為另一方的工件,使用工件A來代替工件B以外,與實施例6相同,進行兩個工件的貼合。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
除了作為另一方的工件,使用工件A來代替工件B以外,與比較例1相同,進行兩個工件的貼合。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
除了作為一方的工件,使用工件B來代替工件A以外,與實施例1相同,進行兩個工件的貼合。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
除了作為一方的工件,使用工件B來代替工件A以外,與實施例2相同,進行兩個工件的貼合。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
除了作為一方的工件,使用工件B來代替工件A以外,與實施例3相同,進行兩個工件的貼合。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
除了作為一方的工件,使用工件B來代替工件A以外,與實施例4相同,進行兩個工件的貼合。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
除了作為一方的工件,使用工件B來代替工件A以外,與實施例5相同,進行兩個工件的貼合。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
除了作為一方的工件,使用工件B來代替工件A以外,與實施例6相同,進行兩個工件的貼合。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
除了作為一方的工件,使用工件B來代替工件A以外,與比較例1相同,進行兩個工件的貼合。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
除了進行以下所示之電漿氣體處理工程,來代替紫外線照射工程以外,與實施例8相同,進行兩個工件的貼合。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
準備圖5所示,後述之規格的大氣壓電漿裝置。
殼體的材質:鋁
電極的材質:於表面藉由熱熔射,形成厚度為500μm的由氧化鋁所成之皮膜的因瓦合金(Super Invar)。
電極的尺寸:50mm×300mm
殼體與介電體層的間隔距離:0.5mm
電壓:7.0kVp-p
頻率:60kHz
額定電力:1100VA
於前述之大氣壓電漿裝置的下方,從噴嘴離開2mm的位置,將工件以其一面(貼合面)與噴嘴對向之方式配置。然後,作為加工氣體,藉由一邊將流量為150L/min的氮氣及流量為1L/min的潔淨乾燥空氣(加工氣體中的氧濃度為約0.14體積%)供給至殼體內,一邊使大氣壓電漿裝置動作,對於工件的一面,進行15秒鐘的電漿氣體處理。
除了進行與實施例19相同之條件的電漿氣體處理工程,來代替紫外線照射工程以外,與實施例9相同,進行兩個工件的貼合。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
除了進行與實施例19相同之條件的電漿氣體處理工程,來代替紫外線照射工程以外,與比較例2相同,進行兩個工件的貼合。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
由表1的結果可知,依據實施例1~20的貼合方法,於所得之接合體中,可達成高強度的接合狀態。
10‧‧‧加熱板
W1,W2‧‧‧工件
Claims (6)
- 一種工件的貼合方法,係分別由選自合成樹脂、玻璃、矽晶圓、水晶及藍寶石所成之群的材料所成之兩個工件彼此貼合的方法,其特徵為:具有:表面活性化工程,係使至少一方之工件的貼合面活性化;及接合工程,係將兩個工件在以個別的貼合面相互接觸之方式層積之狀態下接合;在進行前述表面活性化工程之前,進行從用於該表面活性化工程之工件的貼合面使水分脫離的前處理工程。
- 如申請專利範圍第1項所記載之工件的貼合方法,其中,前述前處理工程,係藉由對用於前述表面活性化工程的工件加熱來進行。
- 如申請專利範圍第1項所記載之工件的貼合方法,其中,前述前處理工程,係藉由將用於前述表面活性化工程的工件配置於減壓空間來進行。
- 如申請專利範圍第1項所記載之工件的貼合方法,其中,前述前處理工程,係藉由對於用於前述表面活性化工程之工件的貼合面,吹附乾燥空氣或惰性氣體來進行。
- 如申請專利範圍第1項至第4項中任一項所記載 之工件的貼合方法,其中,前述表面活性化工程,係對前述工件的貼合面照射真空紫外線的紫外線照射處理工程。
- 如申請專利範圍第1項至第4項中任一項所記載之工件的貼合方法,其中,前述表面活性化工程,係使藉由大氣壓電漿而電漿化的加工氣體,與前述工件的貼合面接觸的電漿氣體處理工程。
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2015
- 2015-10-09 WO PCT/JP2015/078767 patent/WO2016060080A1/ja active Application Filing
- 2015-10-09 KR KR1020177012951A patent/KR20170071539A/ko active Search and Examination
- 2015-10-09 EP EP15850483.7A patent/EP3208070A4/en not_active Withdrawn
- 2015-10-09 US US15/518,364 patent/US20170305069A1/en not_active Abandoned
- 2015-10-09 JP JP2016554067A patent/JPWO2016060080A1/ja active Pending
- 2015-10-13 TW TW104133516A patent/TW201625403A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
WO2016060080A1 (ja) | 2016-04-21 |
US20170305069A1 (en) | 2017-10-26 |
EP3208070A1 (en) | 2017-08-23 |
EP3208070A4 (en) | 2018-06-06 |
JPWO2016060080A1 (ja) | 2017-07-06 |
KR20170071539A (ko) | 2017-06-23 |
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