TW201404901A - 有機層沉積設備、使用其製造有機發光顯示裝置之方法、以及以此方法製造之有機發光顯示裝置 - Google Patents
有機層沉積設備、使用其製造有機發光顯示裝置之方法、以及以此方法製造之有機發光顯示裝置 Download PDFInfo
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- TW201404901A TW201404901A TW102114045A TW102114045A TW201404901A TW 201404901 A TW201404901 A TW 201404901A TW 102114045 A TW102114045 A TW 102114045A TW 102114045 A TW102114045 A TW 102114045A TW 201404901 A TW201404901 A TW 201404901A
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- deposition
- organic layer
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Classifications
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- H10P72/0456—
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67173—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers in-line arrangement
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
- C23C14/243—Crucibles for source material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/50—Substrate holders
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/568—Transferring the substrates through a series of coating stations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67709—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations using magnetic elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/6776—Continuous loading and unloading into and out of a processing chamber, e.g. transporting belts within processing chambers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
-
- H10P72/3204—
-
- H10P72/3314—
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Metallurgy (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Organic Chemistry (AREA)
- Mechanical Engineering (AREA)
- Materials Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Optics & Photonics (AREA)
- Electroluminescent Light Sources (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020120077361A KR20140010303A (ko) | 2012-07-16 | 2012-07-16 | 유기층 증착 장치, 이를 이용한 유기 발광 디스플레이 장치의 제조 방법 및 이에 따라 제조된 유기 발광 디스플레이 장치 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW201404901A true TW201404901A (zh) | 2014-02-01 |
Family
ID=48613510
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW102114045A TW201404901A (zh) | 2012-07-16 | 2013-04-19 | 有機層沉積設備、使用其製造有機發光顯示裝置之方法、以及以此方法製造之有機發光顯示裝置 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20140014921A1 (enExample) |
| EP (1) | EP2688121A3 (enExample) |
| JP (1) | JP2014019954A (enExample) |
| KR (1) | KR20140010303A (enExample) |
| CN (1) | CN103540896A (enExample) |
| TW (1) | TW201404901A (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI586019B (zh) * | 2015-01-14 | 2017-06-01 | 史那精密股份有限公司 | 有機發光元件製造用群集型沉積裝置 |
| US11732345B2 (en) | 2020-06-04 | 2023-08-22 | Applied Materials, Inc. | Vapor deposition apparatus and method for coating a substrate in a vacuum chamber |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5328726B2 (ja) | 2009-08-25 | 2013-10-30 | 三星ディスプレイ株式會社 | 薄膜蒸着装置及びこれを利用した有機発光ディスプレイ装置の製造方法 |
| JP5677785B2 (ja) | 2009-08-27 | 2015-02-25 | 三星ディスプレイ株式會社Samsung Display Co.,Ltd. | 薄膜蒸着装置及びこれを利用した有機発光表示装置の製造方法 |
| US8876975B2 (en) * | 2009-10-19 | 2014-11-04 | Samsung Display Co., Ltd. | Thin film deposition apparatus |
| KR101084184B1 (ko) | 2010-01-11 | 2011-11-17 | 삼성모바일디스플레이주식회사 | 박막 증착 장치 |
| KR101193186B1 (ko) | 2010-02-01 | 2012-10-19 | 삼성디스플레이 주식회사 | 박막 증착 장치, 이를 이용한 유기 발광 디스플레이 장치의 제조방법 및 이에 따라 제조된 유기 발광 디스플레이 장치 |
| KR101156441B1 (ko) | 2010-03-11 | 2012-06-18 | 삼성모바일디스플레이주식회사 | 박막 증착 장치 |
| US8894458B2 (en) | 2010-04-28 | 2014-11-25 | Samsung Display Co., Ltd. | Thin film deposition apparatus, method of manufacturing organic light-emitting display device by using the apparatus, and organic light-emitting display device manufactured by using the method |
| KR101223723B1 (ko) | 2010-07-07 | 2013-01-18 | 삼성디스플레이 주식회사 | 박막 증착 장치, 이를 이용한 유기 발광 디스플레이 장치의 제조방법 및 이에 따라 제조된 유기 발광 디스플레이 장치 |
| KR101723506B1 (ko) | 2010-10-22 | 2017-04-19 | 삼성디스플레이 주식회사 | 유기층 증착 장치 및 이를 이용한 유기 발광 디스플레이 장치의 제조 방법 |
| KR101738531B1 (ko) | 2010-10-22 | 2017-05-23 | 삼성디스플레이 주식회사 | 유기 발광 디스플레이 장치의 제조 방법 및 이에 따라 제조된 유기 발광 디스플레이 장치 |
| KR20120045865A (ko) | 2010-11-01 | 2012-05-09 | 삼성모바일디스플레이주식회사 | 유기층 증착 장치 |
| KR20120065789A (ko) | 2010-12-13 | 2012-06-21 | 삼성모바일디스플레이주식회사 | 유기층 증착 장치 |
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| KR101840654B1 (ko) | 2011-05-25 | 2018-03-22 | 삼성디스플레이 주식회사 | 유기층 증착 장치 및 이를 이용한 유기 발광 디스플레이 장치의 제조 방법 |
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| CN103545460B (zh) * | 2012-07-10 | 2017-04-12 | 三星显示有限公司 | 有机发光显示装置、有机发光显示设备及其制造方法 |
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| KR102369314B1 (ko) * | 2015-06-16 | 2022-03-04 | 삼성디스플레이 주식회사 | 증착 장치 |
| KR102376728B1 (ko) * | 2015-07-07 | 2022-03-21 | 삼성디스플레이 주식회사 | 증착원, 이를 포함하는 증착 장치 및 증착 장치를 이용한 표시 장치의 제조 방법 |
| KR102391346B1 (ko) | 2015-08-04 | 2022-04-28 | 삼성디스플레이 주식회사 | 유기 발광 표시 장치, 유기층 증착 장치 및 이를 이용한 유기 발광 표시 장치의 제조방법 |
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| CN105483633B (zh) * | 2016-02-01 | 2017-12-08 | 京东方科技集团股份有限公司 | 一种磁控溅射装置 |
| KR102152890B1 (ko) * | 2016-05-18 | 2020-10-26 | 어플라이드 머티어리얼스, 인코포레이티드 | 증착 소스의 운송을 위한 장치 및 방법 |
| EP3366804B1 (en) * | 2017-02-22 | 2022-05-11 | Satisloh AG | Box coating apparatus for vacuum coating of substrates, in particular spectacle lenses |
| JP6620228B2 (ja) * | 2017-03-17 | 2019-12-11 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 真空処理システムを動作させる方法 |
| US10540339B2 (en) * | 2017-05-19 | 2020-01-21 | Microsoft Technology Licensing, Llc | Matching a resource with a user for a predicted user need |
| JP2019534938A (ja) * | 2017-09-26 | 2019-12-05 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 材料堆積装置、真空堆積システム、及び真空堆積を行う方法 |
| WO2019064426A1 (ja) * | 2017-09-28 | 2019-04-04 | シャープ株式会社 | 蒸着源および蒸着装置並びに蒸着膜製造方法 |
| KR102020768B1 (ko) * | 2017-12-29 | 2019-09-11 | 주식회사 에스에프에이 | 기판 증착장치 |
| KR102020767B1 (ko) * | 2017-12-29 | 2019-09-11 | 주식회사 에스에프에이 | 기판 증착장치 |
| WO2019187162A1 (ja) * | 2018-03-30 | 2019-10-03 | シャープ株式会社 | 表示デバイスの製造方法および蒸着装置 |
| KR20200002242A (ko) * | 2018-06-29 | 2020-01-08 | 캐논 톡키 가부시키가이샤 | 성막 장치, 유기 디바이스의 제조 장치, 및 유기 디바이스의 제조 방법 |
| KR102641512B1 (ko) | 2018-07-20 | 2024-02-28 | 삼성디스플레이 주식회사 | 표시 장치의 제조장치 및 표시 장치의 제조방법 |
| JP6586216B1 (ja) * | 2018-11-22 | 2019-10-02 | 長州産業株式会社 | 蒸着装置及び蒸着方法 |
| KR102179271B1 (ko) * | 2019-01-11 | 2020-11-16 | 캐논 톡키 가부시키가이샤 | 성막장치, 전자 디바이스 제조장치, 성막방법, 및 전자 디바이스 제조방법 |
| KR102257008B1 (ko) * | 2019-01-11 | 2021-05-26 | 캐논 톡키 가부시키가이샤 | 성막 장치, 성막 방법 및 전자 디바이스 제조방법 |
| KR102700940B1 (ko) * | 2019-02-19 | 2024-09-02 | 삼성디스플레이 주식회사 | 표시 장치의 제조장치 및 표시 장치의 제조방법 |
| KR102282068B1 (ko) * | 2019-12-26 | 2021-07-27 | 주식회사 에스에프에이 | 기판 증착장치 |
| EP4094306A4 (en) | 2020-01-22 | 2024-02-28 | Applied Materials, Inc. | INLINE MONITORING OF OLED LAYER THICKNESS AND DOPANT CONCENTRATION |
| US11889740B2 (en) * | 2020-01-22 | 2024-01-30 | Applied Materials, Inc. | In-line monitoring of OLED layer thickness and dopant concentration |
| JP7509810B2 (ja) | 2022-02-24 | 2024-07-02 | キヤノントッキ株式会社 | 成膜装置 |
| KR102765571B1 (ko) * | 2024-06-14 | 2025-02-11 | (주)펀솔루션테크놀러지 | 오픈 에어리어를 조절하는 기판 증착장치 |
| KR102765576B1 (ko) * | 2024-06-14 | 2025-02-11 | (주)펀솔루션테크놀러지 | 듀얼 리니어 소스를 구비한 증착장치 및 이를 이용한 기판 증착방법 |
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| JP2002146516A (ja) * | 2000-11-07 | 2002-05-22 | Sony Corp | 有機薄膜の蒸着方法 |
| US20030010288A1 (en) * | 2001-02-08 | 2003-01-16 | Shunpei Yamazaki | Film formation apparatus and film formation method |
| JP4315420B2 (ja) * | 2003-04-18 | 2009-08-19 | キヤノン株式会社 | 露光装置及び露光方法 |
| JP2005126821A (ja) * | 2003-09-30 | 2005-05-19 | Fuji Photo Film Co Ltd | 真空蒸着装置および真空蒸着の前処理方法 |
| JP2006016660A (ja) * | 2004-07-01 | 2006-01-19 | Showa Shinku:Kk | 有機薄膜形成装置および方法 |
| EP1717339A2 (de) * | 2005-04-20 | 2006-11-02 | Applied Films GmbH & Co. KG | Kontinuierliche Beschichtungsanlage |
| WO2007099929A1 (ja) * | 2006-02-28 | 2007-09-07 | Ulvac, Inc. | 有機薄膜蒸着方法及び有機薄膜蒸着装置 |
| KR101097311B1 (ko) * | 2009-06-24 | 2011-12-21 | 삼성모바일디스플레이주식회사 | 유기 발광 디스플레이 장치 및 이를 제조하기 위한 유기막 증착 장치 |
| JP5677785B2 (ja) * | 2009-08-27 | 2015-02-25 | 三星ディスプレイ株式會社Samsung Display Co.,Ltd. | 薄膜蒸着装置及びこれを利用した有機発光表示装置の製造方法 |
| CN102482760B (zh) * | 2009-09-15 | 2014-07-02 | 夏普株式会社 | 蒸镀方法和蒸镀装置 |
| US8609442B2 (en) * | 2010-10-29 | 2013-12-17 | Sharp Kabushiki Kaisha | Vapor deposition method, vapor deposition device and organic EL display device |
-
2012
- 2012-07-16 KR KR1020120077361A patent/KR20140010303A/ko not_active Withdrawn
-
2013
- 2013-03-11 US US13/794,743 patent/US20140014921A1/en not_active Abandoned
- 2013-04-19 TW TW102114045A patent/TW201404901A/zh unknown
- 2013-06-14 EP EP13172155.7A patent/EP2688121A3/en not_active Withdrawn
- 2013-07-12 JP JP2013146915A patent/JP2014019954A/ja active Pending
- 2013-07-15 CN CN201310301733.4A patent/CN103540896A/zh active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI586019B (zh) * | 2015-01-14 | 2017-06-01 | 史那精密股份有限公司 | 有機發光元件製造用群集型沉積裝置 |
| US11732345B2 (en) | 2020-06-04 | 2023-08-22 | Applied Materials, Inc. | Vapor deposition apparatus and method for coating a substrate in a vacuum chamber |
| TWI821677B (zh) * | 2020-06-04 | 2023-11-11 | 美商應用材料股份有限公司 | 氣相沉積設備及在真空腔室中塗覆基板的方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP2688121A3 (en) | 2016-02-17 |
| US20140014921A1 (en) | 2014-01-16 |
| EP2688121A2 (en) | 2014-01-22 |
| KR20140010303A (ko) | 2014-01-24 |
| JP2014019954A (ja) | 2014-02-03 |
| CN103540896A (zh) | 2014-01-29 |
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