TW201303331A - 用於一測試裝置之轉接器及用於電路板測試之測試裝置 - Google Patents

用於一測試裝置之轉接器及用於電路板測試之測試裝置 Download PDF

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Publication number
TW201303331A
TW201303331A TW101122398A TW101122398A TW201303331A TW 201303331 A TW201303331 A TW 201303331A TW 101122398 A TW101122398 A TW 101122398A TW 101122398 A TW101122398 A TW 101122398A TW 201303331 A TW201303331 A TW 201303331A
Authority
TW
Taiwan
Prior art keywords
test
adapter
guide
holes
sample
Prior art date
Application number
TW101122398A
Other languages
English (en)
Chinese (zh)
Inventor
Victor Romanov
Andreas Gulzow
Bernd-Ulrich Ott
Original Assignee
Dtg Int Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dtg Int Gmbh filed Critical Dtg Int Gmbh
Publication of TW201303331A publication Critical patent/TW201303331A/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
TW101122398A 2011-07-06 2012-06-22 用於一測試裝置之轉接器及用於電路板測試之測試裝置 TW201303331A (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE201110051607 DE102011051607A1 (de) 2011-07-06 2011-07-06 Adapter für eine Prüfvorrichtung und Prüfvorrichtung zum Testen von Leiterplatten

Publications (1)

Publication Number Publication Date
TW201303331A true TW201303331A (zh) 2013-01-16

Family

ID=46458528

Family Applications (1)

Application Number Title Priority Date Filing Date
TW101122398A TW201303331A (zh) 2011-07-06 2012-06-22 用於一測試裝置之轉接器及用於電路板測試之測試裝置

Country Status (3)

Country Link
DE (1) DE102011051607A1 (fr)
TW (1) TW201303331A (fr)
WO (1) WO2013004775A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108008161A (zh) * 2017-10-26 2018-05-08 惠州市金百泽电路科技有限公司 金属化半孔光电产品电性能的快速检测方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0149776B2 (fr) * 1983-12-08 1993-04-14 Martin Maelzer Adaptateur pour un dispositif de test de circuits imprimés
DE3736689A1 (de) * 1986-11-18 1988-05-26 Luther Erich Adapter fuer ein leiterplattenpruefgeraet
DE4441347C2 (de) 1994-11-21 1998-10-29 Peter Fritzsche Verfahren zum Prüfen von elektronischen Schaltungen auf Leiterplatten und Vorrichtung zum Durchführen des Verfahrens
US5939892A (en) * 1996-04-12 1999-08-17 Methode Electronics, Inc. Circuit board testing fixture
DE19718637A1 (de) 1997-05-02 1998-11-05 Atg Test Systems Gmbh Vorrichtung und Verfahren zum Prüfen von Leiterplatten
DE19644725C1 (de) * 1996-10-28 1998-04-02 Atg Test Systems Gmbh Vorrichtung und Verfahren zum Prüfen von Leiterplatten
JP2000241485A (ja) * 1999-02-24 2000-09-08 Jsr Corp 回路基板の電気抵抗測定装置および方法
US6384614B1 (en) 2000-02-05 2002-05-07 Fluke Corporation Single tip Kelvin probe
DE10049301A1 (de) 2000-10-04 2002-05-02 Atg Test Systems Gmbh Modul für eine Prüfvorrichtung zum Testen von Leiterplatten
DE102006059429A1 (de) 2006-12-15 2008-06-26 Atg Luther & Maelzer Gmbh Modul für eine Prüfvorrichtung zum Testen von Leiterplatten
DE102007047269A1 (de) 2007-10-02 2009-04-09 Atg Luther & Maelzer Gmbh Vollrasterkassette für einen Paralleltester zum Testen einer unbestückten Leiterplatte, Federkontaktstift für eine solche Vollrasterkassette sowie Adapter für einen Paralleltester zum Testen einer unbestückten Leiterplatte

Also Published As

Publication number Publication date
WO2013004775A1 (fr) 2013-01-10
DE102011051607A1 (de) 2013-01-10

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