TW200949256A - Probe card for testing image sensing chips - Google Patents

Probe card for testing image sensing chips Download PDF

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Publication number
TW200949256A
TW200949256A TW97118427A TW97118427A TW200949256A TW 200949256 A TW200949256 A TW 200949256A TW 97118427 A TW97118427 A TW 97118427A TW 97118427 A TW97118427 A TW 97118427A TW 200949256 A TW200949256 A TW 200949256A
Authority
TW
Taiwan
Prior art keywords
circuit board
unit
probe
light
window
Prior art date
Application number
TW97118427A
Other languages
English (en)
Chinese (zh)
Other versions
TWI375038B (enrdf_load_stackoverflow
Inventor
Evan Huang
Darren Cheng
Spin Hua
Randy Ye
Original Assignee
Probeleader Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Probeleader Co Ltd filed Critical Probeleader Co Ltd
Priority to TW97118427A priority Critical patent/TW200949256A/zh
Publication of TW200949256A publication Critical patent/TW200949256A/zh
Application granted granted Critical
Publication of TWI375038B publication Critical patent/TWI375038B/zh

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  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
TW97118427A 2008-05-19 2008-05-19 Probe card for testing image sensing chips TW200949256A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW97118427A TW200949256A (en) 2008-05-19 2008-05-19 Probe card for testing image sensing chips

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW97118427A TW200949256A (en) 2008-05-19 2008-05-19 Probe card for testing image sensing chips

Publications (2)

Publication Number Publication Date
TW200949256A true TW200949256A (en) 2009-12-01
TWI375038B TWI375038B (enrdf_load_stackoverflow) 2012-10-21

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ID=44870875

Family Applications (1)

Application Number Title Priority Date Filing Date
TW97118427A TW200949256A (en) 2008-05-19 2008-05-19 Probe card for testing image sensing chips

Country Status (1)

Country Link
TW (1) TW200949256A (enrdf_load_stackoverflow)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103543372A (zh) * 2012-07-13 2014-01-29 旺矽科技股份有限公司 光学检测装置
TWI481874B (zh) * 2012-07-13 2015-04-21 Mjc Probe Inc 光學檢測裝置
TWI702404B (zh) * 2019-03-18 2020-08-21 中華精測科技股份有限公司 探針卡測試裝置
CN111722093A (zh) * 2019-03-18 2020-09-29 中华精测科技股份有限公司 探针卡测试装置
CN112858870A (zh) * 2019-11-26 2021-05-28 松翰股份有限公司 全区域影像测试方法与架构

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103543304B (zh) 2012-07-13 2016-05-18 旺矽科技股份有限公司 高频探针卡
CN103543298B (zh) 2012-07-13 2016-03-23 旺矽科技股份有限公司 探针固持结构及其光学检测装置
TWI506279B (zh) * 2013-01-15 2015-11-01 Mjc Probe Inc 高頻探針卡

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103543372A (zh) * 2012-07-13 2014-01-29 旺矽科技股份有限公司 光学检测装置
TWI481874B (zh) * 2012-07-13 2015-04-21 Mjc Probe Inc 光學檢測裝置
CN103543372B (zh) * 2012-07-13 2016-08-24 旺矽科技股份有限公司 光学检测装置
TWI702404B (zh) * 2019-03-18 2020-08-21 中華精測科技股份有限公司 探針卡測試裝置
CN111722093A (zh) * 2019-03-18 2020-09-29 中华精测科技股份有限公司 探针卡测试装置
CN112858870A (zh) * 2019-11-26 2021-05-28 松翰股份有限公司 全区域影像测试方法与架构

Also Published As

Publication number Publication date
TWI375038B (enrdf_load_stackoverflow) 2012-10-21

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