TW200913110A - Opener and buffer table for test handler - Google Patents

Opener and buffer table for test handler Download PDF

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Publication number
TW200913110A
TW200913110A TW097127015A TW97127015A TW200913110A TW 200913110 A TW200913110 A TW 200913110A TW 097127015 A TW097127015 A TW 097127015A TW 97127015 A TW97127015 A TW 97127015A TW 200913110 A TW200913110 A TW 200913110A
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Taiwan
Prior art keywords
opener
spacing
placement
pin
blocks
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TW097127015A
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Chinese (zh)
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TWI430381B (en
Inventor
Yun-Sung Na
In-Gu Jeon
Seung-Chul Ahn
Dong-Han Kim
Jae-Hyun Son
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Tech Wing Co Ltd
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Publication of TWI430381B publication Critical patent/TWI430381B/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2893Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

An opener and a buffer table for a test handler are disclosed. The opener includes an opening plate, a plurality of pin blocks forming pairs, and at least one or more interval retaining apparatus for retaining an interval between the pin blocks forming a pair. Each of the pin blocks is movably coupled to the opening plate, and includes opening pins for releasing a holding state of a holding apparatus that holds semiconductor devices in a carrier board. Although semiconductor devices to be tested are altered in size and a carrier board loading with the semiconductor devices is thus replaced, the opener does not need to be replaced, thereby reducing the replacement cost and the waste of resources.

Description

200913110 九、發明説明: 【發明所屬之技術領域】 本發明有關於-種測試處理機,且尤相關於一 釋放—經架置力m之夹持設備^持狀態 器。 【先前技術】 測試處理機是一種讓一測試機能夠對由某一製 造之半導體裝置進行測試、根據該測試結果以將該 體裝置加以分類,並且將該等半導趙裝置載置至客 上,的設備。該測試處理機既已在眾多公開文件中: 傳統的測試處理機係按一將經載置於一載板上 體裝置電子速接至一測試機的方式所組態設定。更 S ,當該測試處理機收到一載置有半導想裝置的客 時’該者將該等半導體裝置自該客戶托盤卻載至 上’然後將該等經載置於該載板上的半導體裝置電 至該測試機,因此該測試機可對該等裝置進行測試 之後’該測試處理機根據測試結果將受測半導艘裝 分類,然後再將該等自該載板卸載於一客戶托盤上 的類型係可歸類為測試托盤以及具有插座的測試板 試托盤係經組態設定以載置有半導體裝置,此者係 韓國專利註冊號第10-608094號案文中所揭示者。 插座之測試板係經組態設定以將經载置於其上的半 置電子連接至一測試機’此者可為由本案申請人向 種用以 之開啟200913110 IX. INSTRUCTIONS: [Technical Field] The present invention relates to a test processor, and more particularly to a release device that holds the tension m. [Prior Art] A test processor is a test machine capable of testing a semiconductor device manufactured by a certain type, classifying the body device based on the test result, and placing the semiconductor device on the guest. ,device of. The test processor is already in numerous publications: A conventional test handler is configured in such a manner that it is electronically coupled to a tester on a carrier. Further, when the test processor receives a passenger carrying a semiconductor device, the latter carries the semiconductor device from the customer tray to the upper portion and then places the load on the carrier. The semiconductor device is electrically connected to the testing machine, so that the testing machine can test the devices, the test processor classifies the tested semi-guided containers according to the test results, and then unloads the carrier from the carrier to a customer. The type on the tray can be classified as a test tray and the test tray with the socket is configured to be mounted with a semiconductor device, which is disclosed in the text of Korean Patent Registration No. 10-608094. The test board of the socket is configured to connect the half-mounted electronics placed thereon to a test machine. This can be used by the applicant of the present application.

程所製 等半導 戶托盤 渴示。 之半導 詳細而 戶托盤 一載板 子連接 。在此 置加以 。載板 。該測 例如於 該具有 導體裝 KIPO 200913110 申請之韓國專利申請案第10_2007_462654號案文 示者。 厅揭 該載板載置有半導體裝置並循繞某一循環路徑。該载 板含有一夾持設備,此者夾持經載置於其上之半導想x裝 置,並且在循環過程中防止該等逸離。此載板係如韓國 利註冊號第10-486412號案文所揭示。 然而,此夾持設備需要一開啟器’藉以在當將半導體 裝置載置於其上或是自該載板卸載時能夠釋放該失 的夾持狀態。 、认埔 該開啟器含有複數個開啟腳針,即例如在韓國專利註 冊號第1〇-687676號案文中所揭示者。這些開啟聊針係按 成對所構成,ϋ且按某-距離所間隔相分。該夾持設備在 當該開啟器上升(或是該載板下降)時釋放其夾持狀態。 當該等待測半導體裝置的實體標準(維度)改變\,即 必須更換該載板(在傳統測試托盤的情況下僅需更換插 器)。當更換該載板時,在一對夾持該等半導體裝置各者兩 侧之挾持設備間的距離也會改變。因此,此更換作業需改 變該等開啟腳針之間的間距。 因而’當半導體裝置在維度上有所變動時,該載板及 該開啟器亦必須隨之更換。在此情況下’傳統技術造成更 換成本增加以及資源浪費。 【發明内容】 本發明可解決上述問題,並且提供一關於一開啟器的 6 200913110 技術’該者之開啟腳針可調整於其間的間距,因而 適於各式载板。 Ο 根據本發明之一示範性具體實施例,本發明提 用於一測試處理機的開啟器,其中包含:一開啟平 數個腳針區塊’此等係按成對方式所構成,並且可 輕接於該開啟平板,同時含有開啟腳針,此等係用 夾持備之爽持狀態,該設備夾持一載板上的半 置,以及至少—或更多個間距保持設備,此等係用 一構成一成對之腳針區塊間的間距。 、 較佳地,該開啟器可另含有導引桿以供導 個腳針區塊的移動。 碩 — / ,八7丨勺此> 忖汉俾^ 一間距固定構你,· & μ 傅件,此者係用以固定一於構成—y 區塊間的間距.,、,Ώ 从及一間距保持構件,此者係月 該間距固定構株μ m 一 傅仔所固定的間距。The semi-conductor trays made by Cheng Cheng are thirsty. The semi-conductor is detailed and the tray is connected by a carrier. Put it here. Carrier board. The test is, for example, the Korean Patent Application No. 10_2007_462654 filed by the KIPO 200913110. The hall is unloaded with a semiconductor device mounted on a circular path. The carrier plate contains a holding device that holds the semiconductor device mounted thereon and prevents such escape during cycling. This carrier is disclosed in the text of Korean Patent Registration No. 10-486412. However, the holding device requires an opener' to release the lost grip state when the semiconductor device is placed thereon or unloaded from the carrier. The opener includes a plurality of opening pins, for example, as disclosed in Korean Patent Registration No. 1-687676. These open talks are made up of pairs and are separated by a distance. The gripping device releases its gripping state when the opener is raised (or the carrier is lowered). When the physical standard (dimension) of the semiconductor device is changed, the carrier must be replaced (in the case of a conventional test tray, only the interposer needs to be replaced). When the carrier is replaced, the distance between the holding devices on both sides of the pair of semiconductor devices is also changed. Therefore, this replacement operation needs to change the spacing between the opening pins. Thus, when the semiconductor device is changed in dimension, the carrier and the opener must also be replaced. In this case, 'traditional technology causes an increase in replacement costs and waste of resources. SUMMARY OF THE INVENTION The present invention solves the above problems and provides a technique for an opener that can be adjusted to a variety of carrier plates. Ο In accordance with an exemplary embodiment of the present invention, the present invention is directed to an opener for a test processor, comprising: an open square pin block 'these are constructed in pairs, and Lightly attached to the opening plate and containing the opening pin, the device is held in a holding state, the device holds a half of the carrier, and at least - or more than one spacing device, such A spacing between the blocks of the pair of pins is formed. Preferably, the opener may further comprise a guiding rod for guiding the movement of the foot block. Shuo - / , 8 7 丨 此 this > 忖 俾 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一 一And a spacing maintaining member, wherein the spacing is fixed by the spacing of the fixed structure μ m a Fu.

較佳地 件,以供將 少一者。 ^間距保持構件含有至少一或更多 彈性力度施加於構成一成對之腳針區 -間距保持構件係經整合地 定構件。 較佳地,pq 定;^ _ 11 保持構件為經整合地構成 疋構件的間距保持突 起。在此,該間距保持突 至構成該等構成一由粗 保符哭 ^ ^ ^ 成對之腳針區塊的突起接受 根據本發明之另—_ 另一不範性具體實施例,一 能夠調 供~兹 種 < ;複 移動地 以釋玫 導體裝 以保持 等複鼓 含有: 之腳針 保持由 彈性組 塊的至 間距固 間距固 經插入 ^ 〇 一測試 7 200913110 處理機的開啟器,其中包含:一開啟平板;多個腳針區瑰, 此等係可移動地耦接於該開啟平板,其中該等腳針區塊各 者含有開啟腳針,此等係用以釋放一夾持設備之夾持狀 態,該設備夾持一載板内的半導體裝置;以及一位置決定 設備,此者係用以決定該等腳針區塊的位置,其中該位置 係經任意地選定,並且該等腳針區塊係位於該所決定位置 處。 根據本發明之另一示範性具體實施例,一緩衝台含有 一放置台,其上構成有至少一或更多放置隔間以供接受半 導體裝置;以及一放置區域定義鉤架,此者可拆解地或可 移動地耦接於該放置台,以供藉由利用其至少一傾斜平面 來定義該放置台的一放置區域,其中該至少一傾斜平面係 定義該放置區域之傾斜平面的一部份。 【實施方式】 後文中將參照於隨附圖式以詳細說明本發明的示範性 具體實施例。在全篇各圖式中將利用相同的參考編號以指 稱相同或類似的部分。本揭中所併入之眾知功能及結構的 詳細說明或將省略,藉以避免模糊本發明主題項目。 <具體實施例1> 第1圖係一部份爆出外觀視圖,其中說明一根據本發 明之一第一具體實施例的開啟器1 0 0,而第2圖係一概念 平面視圖,其中說明第1圖的開啟器100。 200913110 即如第1及2圖所示’該開啟器ι 〇〇含 , 110、複數個腳針區塊120、導引桿13❶及汗啟平板 該開啟平板110構成接受多個隔間⑴B保持設備。 接受多個隔間⑴的區塊各者具有一巴域11的區塊。該等 動方式將-聊針區塊120放置於其内 2夠按可移 成多個用以固定該等導引桿130的孔祠==板110構 引桿⑽可讓該等腳針區塊120能夠在區:二中該等導 内沿此而移動。 °°接又隔間111 該等複數個腳針區塊120係按 腳針區塊12。係經插入於該等區塊接受二?:内該並等 且由位於其内的導引桿130可移動地導引。 内,並 該等腳針㈣U0各者含有収料。 由經納入在構成_ & y 腳針成對是 ⑵所構成ι 針區塊120内的開啟聊針 成對的失持狀態。 奴円之夹持設備 該等腳針區塊12G各者構成該等導引桿 通過的穿透孔洞I 22。 可紐此而 該等導引桿U0在該等通過該等聊 孔…狀態下會被插入該等孔洞112内二=穿透 腳針區塊120安裝於該開啟平板⑴中。因=該等 係用以導引該等腳針區塊12。的移動,並且將:13。 壤12。可移動地耗接於該開啟平板η。::針區 等腳針區塊及腳針接受隔間的形狀藉以無須該 130,因此能夠將經修“等導引桿 針區塊可移動地·轉接於該開啟 200913110 平板11 0的經修改腳針接受隔間 該間距保持設備係用以保才; 以保持在構成一成對之腳針區塊Preferably, there will be one less. The spacer holding member contains at least one or more elastic forces applied to form a pair of stitches - the spacer members are integrated members. Preferably, the holding member is held at a pitch that integrally constitutes the 疋 member. Here, the spacing is maintained to form a protrusion that constitutes a pair of foot blocks that are obscured by a thick guarantee. The other embodiment of the present invention is accepted. For the 移动 种 ; ; ; ; 释 释 释 释 释 释 玫 玫 玫 玫 玫 玫 玫 玫 玫 玫 玫 玫 玫 玫 玫 玫 玫 玫 玫 玫 玫 玫 玫 玫 玫 玫 玫 玫 2009 2009 2009 2009 2009 2009 2009 2009 2009 2009 2009 2009 2009 The method comprises: an opening plate; a plurality of foot pins, wherein the pins are movably coupled to the opening plate, wherein each of the pin blocks includes an opening pin, which is used for releasing a clamping a clamping state of the device, the device holding a semiconductor device in a carrier; and a position determining device for determining a position of the pin block, wherein the position is arbitrarily selected, and the position is The equal foot block is located at the determined position. In accordance with another exemplary embodiment of the present invention, a buffer station includes a placement station having at least one or more placement compartments thereon for receiving semiconductor devices; and a placement area defining a hook frame that is detachable Decoupled or movably coupled to the placement table for defining a placement area of the placement table by utilizing at least one inclined plane thereof, wherein the at least one oblique plane defines a portion of the inclined plane of the placement area Share. [Embodiment] Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings. The same reference numbers will be used throughout the drawings to refer to the same or the like. Detailed descriptions of well-known functions and structures incorporated in the present disclosure may be omitted to avoid obscuring the subject matter of the present invention. <Specific Embodiment 1> Fig. 1 is a partially exploded perspective view showing an opener 100 according to a first embodiment of the present invention, and Fig. 2 is a conceptual plan view, wherein The opener 100 of Fig. 1 will be described. 200913110 As shown in Figures 1 and 2, the opener ι 〇〇, 110, the plurality of pedestal blocks 120, the guide rod 13 ❶ and the sweat opening plate, the opening plate 110 constitutes a plurality of compartments (1) B holding device . Each of the blocks accepting the plurality of compartments (1) has a block of one bar field 11. The movement mode places the chatter block 120 therein. 2 is enough to be moved into a plurality of holes for fixing the guide rods 130==plate 110 struts (10) to allow the needles to be Block 120 can be moved along within the zone: two. °° and compartment 111 These plurality of foot blocks 120 are pressed by the foot block 12. Inserted into the blocks to receive the same and is movably guided by the guide rods 130 located therein. Inside, and the foot pins (4) U0 each contain a receipt. It is in a state of being held in pairs by the opening chat needles in the ι needle block 120 which is formed in the pair of (2) formed by the _ & y foot pins. The holding device of the slaves Each of the pin blocks 12G constitutes a through hole I 22 through which the guiding rod passes. Alternatively, the guide rods U0 are inserted into the holes 112 in the state of passing through the chat holes... The second pass-through pin block 120 is mounted in the opening plate (1). Because these are used to guide the pin blocks 12. Move and will: 13. Soil 12. It is movably consumed by the opening plate η. The needle region and the needle receiving the shape of the spacer do not need to be 130, so that the repaired "equal guide rod block can be movably transferred to the opening of the 200913110 flat panel 110. Modifying the foot pin to accept the compartment, the spacing device is used to protect the device; to maintain a pair of pin blocks

該間距固定鉤架14 1 疋釣架141係藉由利用螺栓ν而可拆解地耦The pitch fixing hook frame 14 1 is detachably coupled by using a bolt ν

之寬度而彼此相隔。從而,可將在兩個構成一成對之腳針 區塊1 2 0處所構成的一對開啟腳針1 2丨間之間距予以固 定。換言之,該間距固定鉤架141作為一間距固定構件。 因此:當待予測試之半導體裝置的大小改變並因而更換該 載板時’可僅更換該等間距固定鉤架ι41,該等各者具有 一寬度,而此寬度係對應於構成—經安裝在所更換之載板 上的夾持設備成對間之距離。所以,根據本發明之開啟器 ioo並不需要更換,原因在於該等構成成對之腳針區塊120 能夠依照其間的間距加以調整。The width is separated from each other. Therefore, the distance between the pair of opening pins 1 2 构成 formed by the two pairs of the needle blocks 1 2 0 can be fixed. In other words, the pitch fixing hook frame 141 serves as a spacing fixing member. Therefore, when the size of the semiconductor device to be tested is changed and thus the carrier is replaced, the equally spaced fixed hook frame ι 41 can be replaced, each of which has a width which corresponds to the configuration - is mounted The distance between the clamping devices on the replaced carrier board is in pairs. Therefore, the opener ioo according to the present invention does not need to be replaced because the pair of foot pins 120 can be adjusted in accordance with the spacing therebetween.

Cj 即如第2圖所示,該等由彈性材料所製成之四個彈簧 1 42係經安裝於兩個導引桿13 〇的個別末端。該等四個彈 簧1 42可將該等腳針區塊120彈性地推動至位在該等腳針 區塊120之間的間距固定鉤架141。該等彈簧142將其彈 性力度施加於構成一成對的腳針區塊120上,因此將該等 卿針區塊120定著於該等區塊接受隔間,並藉一對應於該 間距固定鉤架1 41之寬度W的間距所彼此相隔》 即如前述,待予測試之半導體裝置的大小雖為改變’ 10 200913110 並因而將目前載板更換為另一載,然就以於夾持設備之 間的距離而言,其構成-成對之夾持設備不同於該目前載 板者,該根據本發明之-具趙實施例的開啟器100可供以 將目前間距固定鉤帛141更換為其他的間距固定鉤架 ⑷’而其間距係對應於在所更換载板内之夹持設備的距 離。因此,無須更換根據本發明的開啟器而能施用於 更換載板。 ^ Γ <具體實施例1之應用範例1 > 具體實施例1係按一含有該等彈簧142以供—彈性组 件而用來作為一間距保持構件的方式所實作。在本廡用範 例1裡,即如第3圖所示,該開啟器1〇〇A含有複數個間 距保持鉤架M3而非彈簧。該等複數個間距保持鉤架143 係經利用而因此構成各個成對的腳針區塊12〇彼此相隔一 對應於該間距固定釣架141之寬度w的間距,並且固定於 該腳針區塊接受隔間。因此,該目前載板雖經更換為另一 載板,然該開啟器100A僅需更換該等間距固定鉤架】41 及間距保持鉤架143而無須更換其本身。亦即該開啟器 i 00A可施用於所更換的載板》可注意到該間距固定釣架及 該間距保持鉤架係按整合方式所構成。 <具體實施例1之應用範例2> 具體實施你"的應用範例1的實作方式係將一構成一 成對之腳針區塊120可移動地連接至該開啟平板ιι〇。而Cj As shown in Fig. 2, the four springs 1 42 made of elastic material are attached to the individual ends of the two guide bars 13 〇. The four springs 1 42 can resiliently urge the equally spaced block 120 into a spacer hook 141 positioned between the pin blocks 120. The springs 142 apply their elastic forces to form a pair of the needle blocks 120, so that the needle blocks 120 are positioned in the blocks to receive the compartments, and are fixed by the spacing The width W of the hook frame 1 41 is spaced apart from each other. As described above, the size of the semiconductor device to be tested is changed to '10 200913110 and thus the current carrier is replaced with another carrier, so that the clamping device is used. In terms of the distance between them, the constituent-paired holding device is different from the current carrier, and the opener 100 according to the present invention is adapted to replace the current spacing fixing hook 141 with The other spacing fixes the hook frame (4)' and the spacing corresponds to the distance of the clamping device within the replaced carrier. Therefore, it is possible to apply to the replacement carrier without replacing the opener according to the present invention. ^ Γ <Application Example 1 of Specific Embodiment 1> The specific embodiment 1 is implemented in such a manner as to contain the springs 142 for the elastic member to be used as a spacer member. In the first example, as shown in Fig. 3, the opener 1A contains a plurality of spacer holding hooks M3 instead of springs. The plurality of pitch-holding hook frames 143 are utilized so that the respective pairs of the needle-hand blocks 12 are spaced apart from each other by a pitch corresponding to the width w of the fixed-fishing frame 141, and are fixed to the foot block Accept the compartment. Therefore, although the current carrier is replaced with another carrier, the opener 100A only needs to replace the equally spaced hook frame 41 and the spacer retaining hook frame 143 without replacing itself. That is, the opener i 00A can be applied to the replaced carrier plate. It can be noted that the pitch fixed fishing frame and the pitch maintaining hook frame are constructed in an integrated manner. <Application Example 2 of Concrete Embodiment 1 The embodiment of the application example 1 of the present embodiment is a method of movably connecting a pair of pin blocks 120 to the opening tablet. and

200913110 在本應用範例2裡,即如第4圖所示, 實作方式則是將構成一成對之腳針區塊 一者,例如一腳針區塊12〇b,整合地構 啟平板110,而另一腳針區塊l2〇a為由 撐且可移動地連接至該開啟平板11〇。 即如在應用範例2中所述,該間距 為一位置決定設備,此者決定位於另 1 2 0 a的位置。 從艾衣 成對藉由一開啟腳針成對以同時地釋 顯知該具體實施例卩依該夾持設備成 聊針以㈣地釋放其夾持狀態的方 下’最好是設定一位置,藉以在當該 時能夠釋放經安裴於所更換載 夹持狀態。 該開啟器100B的 120a及120b之其 成於或固定於該開 彈簧1 4 2彈性地支 保持設備是用以作 -側處之腳針區塊 一载板的夾持設備 其失持狀態。將能 能夠藉由單一開啟 听修改。在此情況 腳針區塊移動至該 之夾持設備成對的200913110 In this application example 2, as shown in FIG. 4, the implementation method is to form a pair of pin segments, such as a pin block 12〇b, to integrally construct the plate 110. And the other foot block l2〇a is supported and movably connected to the opening plate 11〇. That is, as described in the application example 2, the pitch is a position determining device, and the one decides to be at another position of 120a. Paired from the Ai Yi pair by a pair of open foot pins to simultaneously explain that the specific embodiment converts the gripping device into a chatter to release the gripping state (4), preferably setting a position In order to be able to release the mounted clamped state during the replacement. The opening and closing of the 120a and 120b of the opener 100B is elastically supported by the opening spring 1 4 2 to hold the device in a state of being held by the holding device of the side pin block-carrier. Will be able to listen to the changes with a single turn-on. In this case, the foot block is moved to the holding device in pairs

第5圖係—部份爆出外觀視 -第二具體實施例的開啟器 圏’其中說明一坌 鉤年楚⑼圖開啟器5( J东。第6B圖係 ., 固係一側視圖,其, Μ圖間距固定釣架54卜 具體實施 該等彈簧142 例1係經實作 而用以作為— 以納入該間 間距保持設 中說明一根據本發 i 6A圖係一平面視 所含有的間距固定 自方向A所觀看的 距固定鉤架1 4 1及 備。即如第5圖以 12 200913110Figure 5 is a partial exploded view - the second embodiment of the opener 圏 ' which illustrates a 坌 hook year Chu (9) figure opener 5 (J East. Figure 6B system., a solid side view, The slanting distance of the fishing frame 54 is specifically implemented. The 142 example 1 is implemented as a method for accommodating the spacing between the first and second embodiments according to the present invention. The spacing is fixed from the fixed hook frame 1 4 1 and the device viewed from the direction A. That is, as shown in Fig. 5 to 12 200913110

及第6A和6B圖所示’具趙實施例2的實作 固定釣架541在其兩者末端處分別地構成多個間距二 起542’並且構成-成對的卿針區塊52〇構成多個突起 受凹槽521,藉以接受該等間距保持突起542。 在具體實施例2裡,用 保持突起5 4 2係經整合地構 的間距固定鉤架5 4 1處。 以作為一間距保持構件的間 成在用以作為一間距固定構 類似於具體實施例1 及2。 具體實施例2具有應用範 將能顯知在具體實施例 530。 2中可無須使用該等導引 在前述具體實施例裡,該開啟器是位於該載板的下 處。應瞭解該等具體實施例可依該開啟器是位於該載板 方處的方式加以修改,而其中該開啟器在其下方側構成 等開啟腳針》 距 突 接 距 件 1 桿 方 上 該 <缓衝台應用> 當半導艘裝置在大小上有所更動時,此大小更動要 一經安裝於一載置部份之緩衝台的放置隔間亦必須在大 上有所改變。 一緩衝台係用以讓一撿拾及放置設備能夠在該撿拾 放置設備將所撿拾的半導體裝置放置於該載板上之前, 將自一客戶托盤所撿拾的半導體裝置予以對齊。該缓衝 可具備多個放置隔間,而其數量大於由該撿拾及放置設 求 小 及 先 台 備 13 200913110 所檢拾的半導體裝置。這是因為由該撿拾及放置設備所撿 拾的半導體裝置係為以暫時地載置於該等放置隔間上(或 是第一放置隔間),而此等隔間係經構成於該等放置隔間 (或是第二放置隔間)的一側處。一般說來,當在一測試機 的某一接觸插座處出現一問題(故障)時,該撿拾及放置設 備並不會將半導體裝置載置在對應於該故障(問題)接觸插 座的位置上。相反地’該檢拾及放置設備會將為以載置於 該故障接觸插座上之半導體裝置暫時地栽置在該第二放置 隔間上。 類似於該載板,當半導體裝置在大小上改變時,即必 須將該S前緩衝台更換為另一者。然而,這會造成更換成 本增加以及資源浪費。 因此,當該缓衝台運用根據本發明而經調適於該開啟 器的技術時,即可減少更換成本及資源浪費。第7圖係一 平面視圖’其中說明對其施用根據本發明之技術的緩衝台 700 ’而其一部份係自該緩衝台700所拆解。 即如第7圖所示’該緩衝台700含有一放置台710以 及一放置區域定義鉤架720。 該放置台710構成有複數個放置隔間711以供接受半 導體裝置。該等放置隔間711各者具有一放置區域,此者 是由所四個傾斜平面711a、711b、712a及712b所定義。 兩個鄰近傾斜平面711a及711b係經整合地構成於該放置 台710。而另外兩個鄰近傾斜平面712a及712b以及底部 平面722則是構成於該放置區域定義鉤架72〇。將能瞭解 14And the solid fixed fishing frame 541 of the embodiment 2 of the present invention has a plurality of spacings 542' at the ends of the two ends, and constitutes a pair of pairs of needle blocks 52〇. The plurality of protrusions are received by the recess 521 to receive the equally spaced retaining projections 542. In the second embodiment, the hook frame 542 is fixed by the spacing of the retaining projections 542. The arrangement as a spacer member is used to be fixed as a pitch similar to the specific embodiments 1 and 2. The specific embodiment 2 has an application that will be apparent in the specific embodiment 530. It is not necessary to use such guidance in 2. In the foregoing embodiment, the opener is located below the carrier. It should be understood that the specific embodiments may be modified in such a manner that the opener is located at the side of the carrier, wherein the opener constitutes an opening foot on the lower side thereof. Buffer Station Application> When the semi-guided vessel is changed in size, the size of the semi-guided vessel must be changed in size when it is installed in the buffering station of a loading section. A buffer station is provided for a pick and place device to align the semiconductor devices picked up from a customer tray before the pick and place device places the picked semiconductor device on the carrier. The buffer can be provided with a plurality of placement compartments, and the number of the buffers is larger than that of the semiconductor device picked up by the pick-and-place arrangement and the pre-installation device 13 200913110. This is because the semiconductor devices picked up by the pick-and-place device are temporarily placed on the placement compartments (or the first placement compartment), and the compartments are constructed in the placement At the side of the compartment (or the second compartment). In general, when a problem (fault) occurs at a contact socket of a test machine, the pick-and-place device does not place the semiconductor device in a position corresponding to the fault (problem) contact socket. Conversely, the pick and place device will temporarily implant the semiconductor device placed on the fault contact socket on the second placement compartment. Similar to the carrier, when the semiconductor device is changed in size, the S front buffer table must be replaced with the other. However, this can result in increased replacement costs and wasted resources. Therefore, when the buffer station employs the technique adapted to the opener according to the present invention, replacement cost and waste of resources can be reduced. Fig. 7 is a plan view showing a buffer table 700' to which the technique according to the present invention is applied, and a part thereof is disassembled from the buffer table 700. That is, as shown in Fig. 7, the buffer table 700 includes a placement table 710 and a placement area defining a hook frame 720. The placement table 710 is constructed with a plurality of placement compartments 711 for receiving semiconductor devices. Each of the placement compartments 711 has a placement area defined by the four inclined planes 711a, 711b, 712a, and 712b. Two adjacent inclined planes 711a and 711b are integrally formed on the placement table 710. The other two adjacent inclined planes 712a and 712b and the bottom plane 722 are formed in the placement area defining the hook frame 72A. Will be able to understand 14

200913110 可按照將該底部平面構成於該放置台710之内的方式 改該具體實施例。當該放置區域定義鉤架7 2 0被替換 一鉤架時,從而亦即更改該放置區域。更詳細地說, 導體裝置在大小上有所更動時,必須將目前的放置區 義鉤架720更換為其他的放置區域定義鉤架,藉以將 半導體裝置的大小改變成經更改的半導體裝置大小 即,由於可調整該放置區域而無須更換該目前緩 700,因此不需要更換該緩衝台700。 第8A至8C圖為平面視圖,該等說明數項示範 例,其中既經標準化的放置區域定義鉤架720、720a及 係經個別地放置在放置台之内。 在本具體實施例裡,在該放置區域定義鉤架720 成兩個傾斜平面721a及721b。然將能顯知可按在該 區域定義鉤架720之内構成僅單一傾斜平面的方式來 本具體實施例。 此外,實作本具體實施例的方式為更換該放置區 義鉤架720。然將能瞭解,即如第9圖所示,本具體 例可為實作因而該放置區域定義鉤架 920按對角線 (亦即箭頭a的方向)而移動,並且含有一用以將該放 域定義鉤架920固定於該移動位置處的固定設備。經 於第9圖緩衝台之内的固定設備含有一推動組件94 1 簧942及一間距固定鉤架943。 該推動組件 94 1彈性地支撐該放置區域定義 92 0。該等彈簧942在該放置區域定義鉤架920之方向 來修 為另 當半 域定 該等 。亦 衝台 性範 720b 内構 放置 修改 域定 實施 方向 置區 安裝 、彈 鉤架 上將 15 200913110 -彈性力度施加於該推動㈣941。可運作該間距固定鉤 架943 ®此該放置區域^義鉤架92G在某一距離上無法 由該推動組件941所衝推,並從而固定-放置區域。 一第μ圖為一概念平面視圖1中說明一根據本發明之 另-應用範例的缓衝台1 000,以及自該緩衝台1〇〇 解的一部份。 即如第10圖所示,兩個傾斜平面1〇11&及l〇ub係位 於該放置自1010上的前側及後側局部處並且面向彼此。這 兩個傾斜平面i i i a及1 〇 i i b係由該等彈簧i⑷所彈性支 樓,因此該等傾斜平面可按前側及後側方向移動。該放置 區域定義夠架刪構成在右側及左側方向上彼此面向的 傾斜平面1〇213及102lb。因此,當將該放置區域定義鉤 架1020替換成另_者時,可調整該放置區域。在此,就以 方向而言’前側及後側方式是指與右側及左側方向相垂直 的方向。 即如前述,根據本發明之開啟器可在當該等半導體裝 置各者的大小改變時調整其開啟腳針之間的間距。因此, 無論半導體裝置的大小是否改變皆無須更換該開啟器從 而能夠減少資源浪費及更換成本。當將本發明之概念施用 於一緩衝台時,該緩衝台可根據所更換的半導體裝置維度 來調整該放置區域,如此能夠減少資源浪費及更換成本。 前文中雖既已詳細說明多項本發明示範性具體實施 例,然應瞭解對於本揭所述基本發明性概念而為熟諳本項 技藝之人士所顯知的眾多變化及修改將仍歸屬按後載申請 16 200913110 專利範圍中所定義的本發明示範性具體實施例精神及範圍 之内。 【圖式簡單說明】 自後載詳細說明,且併同於隨附圖式,將更能顯知本 發明的特性與優點,其中: 第1圖係一部份爆出外觀視圖,其中說明一根據本發 明之一第一具體實施例的開啟器;200913110 This embodiment can be modified in such a manner that the bottom plane is formed within the placement table 710. When the placement area defines that the hook frame 702 is replaced with a hook frame, the placement area is thus changed. In more detail, when the conductor device is changed in size, the current placement area hook frame 720 must be replaced with another placement area definition hook frame, thereby changing the size of the semiconductor device to the modified semiconductor device size. Since the placement area can be adjusted without replacing the current buffer 700, the buffer stage 700 does not need to be replaced. Figures 8A through 8C are plan views illustrating a number of exemplary embodiments in which the hook frames 720, 720a and the system are individually placed within the placement table by standardized placement areas. In the present embodiment, the hook frame 720 is defined in the placement area as two inclined planes 721a and 721b. It will be apparent that this embodiment can be constructed in such a manner that only a single inclined plane is formed within the hook frame 720 defined in the region. Moreover, the manner in which the present embodiment is implemented is to replace the placement hook frame 720. It will be understood that, as shown in FIG. 9, this specific example can be implemented such that the placement area defines the hook frame 920 to move in a diagonal direction (ie, the direction of the arrow a), and contains one for The play field definition hook frame 920 is fixed to the stationary device at the moving position. The fixture in the buffer table of Fig. 9 includes a pusher assembly 94 1 spring 942 and a spacer fixed hook frame 943. The pusher assembly 94 1 elastically supports the placement area definition 92 0 . The springs 942 define the direction of the hook frame 920 in the placement area to modify the other half fields. Also rushing Taiwan Scope 720b internal structure placement modification domain implementation direction installation area installation, bomb hook frame upper 15 200913110 - elastic force applied to the push (four) 941. The spacer fixing hook 943 can be operated. The placement area hook 92G cannot be pushed by the pushing unit 941 at a certain distance, and thus the fixing-placement area. A μ-figure is a conceptual plan view 1 illustrating a buffer station 1 000 according to another application example of the present invention, and a portion of the buffer station 1 being decomposed. That is, as shown in Fig. 10, the two inclined planes 1〇11& and l〇ub are located at the front side and the rear side portion which are placed from 1010 and face each other. The two inclined planes i i i a and 1 〇 i i b are elastically supported by the springs i (4) so that the inclined planes are movable in the front and rear directions. The placement area defines the inclined planes 1 〇 213 and 102 lb which face each other in the right and left directions. Therefore, when the placement area defining hook 1020 is replaced with another one, the placement area can be adjusted. Here, the front side and the rear side means the direction perpendicular to the right side and the left side direction. That is, as described above, the opener according to the present invention can adjust the spacing between the opening pins when the size of each of the semiconductor devices is changed. Therefore, it is not necessary to replace the opener regardless of whether the size of the semiconductor device is changed, thereby reducing resource waste and replacement cost. When the concept of the present invention is applied to a buffer station, the buffer station can adjust the placement area according to the dimensions of the replaced semiconductor device, thus reducing resource waste and replacement cost. While the invention has been described in detail with reference to the exemplary embodiments of the embodiments of the invention It is within the spirit and scope of the exemplary embodiments of the invention as defined in the scope of the invention. BRIEF DESCRIPTION OF THE DRAWINGS The features and advantages of the present invention will become more apparent from the following detailed description of the appended claims. An opener according to a first embodiment of the present invention;

第2圖係一概念平面視圖,其中說明第1圖的開啟器; 第3圖係一概念平面視圖,其中說明一根據本發明第 一具體實施例之一第一應用範例的開啟器; 第4圖係一概念平面視圖,其中說明一根據本發明第 一具體實施例之一第二應用範例的開啟器; 第5圖係一部份爆出外觀視圖,其中說明一根據本發 明之一第二具體實施例的開啟器; 第6A圖係一平面視圖,其中說明一第5圖開啟器之 中所含有的間距固定鉤架; 第6B圖係一侧視圖,其中說明自方向A所觀看的第 6A圖間距固定鉤架; 第7圖顯示一根據本發明之緩衝台的平面視圖; 第8A至8C圖為平面視圖,其t說明第7圖緩衝台的 使用狀態;以及 第9圖及第10圖為概念平面視圖,其中說明一根據本 發明之另一應用範例的緩衝台。 【主要元件符號說明】 17 200913110Figure 2 is a conceptual plan view showing the opener of Figure 1; Figure 3 is a conceptual plan view showing an opener according to a first application example of the first embodiment of the present invention; Figure 1 is a conceptual plan view showing an opener according to a second application example of the first embodiment of the present invention; Figure 5 is a partial exploded view showing a second according to the present invention The opener of the embodiment; FIG. 6A is a plan view showing a fixed hook frame included in the opener of FIG. 5; FIG. 6B is a side view showing the first view from the direction A 6A is a fixed hook frame; FIG. 7 is a plan view showing a buffer table according to the present invention; FIGS. 8A to 8C are plan views, t is a view showing the use state of the buffer table of FIG. 7; and FIG. 9 and FIG. The figure is a conceptual plan view illustrating a buffer station in accordance with another application example of the present invention. [Main component symbol description] 17 200913110

100 開 啟 器 711a 傾 斜 平 面 100A 開 啟 器 711b 傾 斜 平 面 100B 開 啟 器 712a 傾 斜 平 面 110 開 啟 平 板 712b 傾 斜 平 面 111 隔 間 720 放 置 區 域 定 義 鉤 架 112 孔 洞 720a 放 置 區 域 定 義 鉤 架 120 腳 針 區 塊 720b 放 置 區 域 定 義 鉤 架 120a 腳 針 區 塊 721a 傾 斜 平 面 120b 腳 針 區 塊 721b 傾 斜 平 面 121 開 啟 腳 針 722 底 部 平 面 122 穿 透 孔 洞 900 緩 衝 台 130 導 引 桿 920 放 置 區 域 定 義 鉤 架 141 間 距 固 定 鉤 架 941 推 動 組 件 142 彈 簧 942 彈 簧 143 間 距 保 持 鉤 架 943 間 距 固 定 鉤 架 500 開 啟 器 1000 緩 衝 台 520 腳 針 塊 1010 放 置 台 521 突 起 接 受 凹 槽 1011a 傾 斜 平 面 530 導 引 桿 1011b 傾 斜 平 面 541 間 距 固 定 鉤 架 1020 放 置 區 域 定 義 鉤 架 542 間 距 保 持 突 起 1021a 傾 斜 平 面 700 缓 衝 台 1021b 傾 斜 平 面 710 放 置 台 1042 彈 簧 711 放 置 隔 間 18100 opener 711a inclined plane 100A opener 711b inclined plane 100B opener 712a inclined plane 110 open flat panel 712b inclined plane 111 compartment 720 placement area definition hook frame 112 hole 720a placement area definition hook frame 120 foot pin block 720b placement area definition Hook frame 120a Needle block 721a Inclined plane 120b Foot block 721b Inclined plane 121 Open foot pin 722 Bottom plane 122 Through hole 900 Buffer table 130 Guide rod 920 Placement area definition Hook frame 141 Pitch fixed hook frame 941 Pushing assembly 142 Spring 942 Spring 143 Pitch Hold Hook 943 Pitch Fixed Hook 500 Opener 1000 Cushion Table 520 Needle Block 1010 Placement Table 521 Projection Acceptance Groove 1011a Inclined Plane 530 Guide Rod 1011b Inclined Plane 541 Spacer Fixed Hook Frame 1020 Placement Area Defining hook frame 542 1021a from the retaining protrusion 700 inclined plane buffer 1021b inclined plane 710 placed station table 711 of the spring 1042 placed between the spacer 18

Claims (1)

200913110 十、申請專利範圚: 1 ·—種用於一測試處理機 一開啟平板; 之開啟器 包含: 複數個腳針區塊 地耦接該開啟平板, 持設備之夾持狀態, 置;以及 v巧耩成,並_a 匕含開啟聊# ㈣針,其係用以釋~夹持設備夹持八符一載板上的半 至少一 &amp;更多㈣距保持設備 —成對之腳針區塊間的間距。 其係用以保持&quot;一 移動 一夾 體裝 構成 .如f請專利範圍第1項所述之開啟器,另包含 導引器’其係』以導弓丨該等複數個腳針區塊的 .如申請專利範圍第1項所述之開啟器,其中該等 —或更多間距保持設備各者包含: 一間距固定構件,其係用以固定—構成一成對之 區塊間的間距;以及 一間距保持構件’其係用以保持由該間距因定構 固定的間距。 ’如申請專利範圍第3項所述之開啟器,其中該間 持構件包含至少一或更多彈性組件’藉以將一彈性力 加於構成一成對之腳針區塊的至少一者。 至少 腳針 件所 距保 度施 19 200913110 5.如申請專利範圍第3項所述之開啟器其中該 夺構件係經整合地構成於該間距固定構件。 6·如申請專利範圍第5項所述之開啟器’其中該 持構件為間距保持突起,其係與該間距固定構件整 成’其中該等間距保持突起係經插入至經構成於構 對之該腳針區塊的突起接受凹槽内。 .一種用於一測試處理機之開啟器,包含: 一開啟平板; :多個腳針區塊,其係可移動地耦接於該開啟平 s等腳針區塊各者含有開啟腳針’其係用以釋放 設備之夾持狀態,該夾持設備夾持一載板内的半 置;β及 位置決定設備’其係用以決定該等腳針區 置其中該位置係經任意地選定,並且該等腳針區 於該所決定位置處。 8 .—種用於一測試處理機之緩衝台,包含: 一放置台,其上構成有至少一或更多放置隔間 接受半導體裝置;以及 放置區域定義鉤架,其可拆解地或可移動地 間距保 間距保 合地構 成一成 板,其 一爽持 導體裝 塊的位 塊係位 ,以供 耦接該 20 200913110 放置台,以供藉由利用其至少一傾斜平面來定義該放置台 的一放置區域,其中該至少一傾斜平面係定義該放置區域 之傾斜平面的一部份。200913110 X. Patent application: 1 - The type is used for a test processor to open the tablet; the opener comprises: a plurality of pin blocks coupled to the opening plate, holding the clamping state of the device; v巧耩成, and _a 匕 开启 Open Chat # (four) needle, which is used to release the holding device to hold the octave on the carrier board at least one &amp; more (four) distance holding device - paired feet The spacing between the needle blocks. It is used to maintain a &quot;moving one clip body assembly. For example, please refer to the opener described in item 1 of the patent scope, and further include an introducer 'the system' to guide the plurality of the needle blocks. The opener of claim 1, wherein the one or more spacing maintaining devices each comprise: a spacing fixing member for fixing - forming a spacing between a pair of blocks And a spacing holding member 'which is used to maintain a spacing fixed by the spacing due to the configuration. The opener of claim 3, wherein the interposing member comprises at least one or more elastic members </ RTI> to apply an elastic force to at least one of the pair of pin segments. The at least one of the members of the invention is the same as that of the opening member of the third aspect of the invention, wherein the member is integrally formed in the spacer fixing member. 6. The opener of claim 5, wherein the holding member is a pitch maintaining protrusion that is integral with the spacing fixing member, wherein the equally spaced retaining protrusions are inserted into the structured pair The protrusion of the foot block receives the groove. An opener for a test processor, comprising: an open flat plate; a plurality of foot pin blocks movably coupled to the open flat s and the like, each of which includes an open foot pin It is used to release the clamping state of the device, the clamping device holds a half in a carrier; the β and position determining device is used to determine the position of the pin, wherein the position is arbitrarily selected And the pin areas are at the determined position. 8. A buffer station for a test processor, comprising: a placement station having at least one or more placement compartments for receiving semiconductor devices; and a placement area defining a hook frame detachable or configurable The movable ground spacing is configured to maintain a pitch of the conductor block, and a bit block of the conductor block is coupled to the 20 200913110 placing table for defining the placement by using at least one inclined plane thereof. a placement area of the table, wherein the at least one oblique plane defines a portion of the inclined plane of the placement area.
TW097127015A 2007-07-16 2008-07-16 Opener and buffer table for test handler TWI430381B (en)

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