TW200823452A - Inspection device and method for X-ray fluorescent analysis - Google Patents

Inspection device and method for X-ray fluorescent analysis Download PDF

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Publication number
TW200823452A
TW200823452A TW96146236A TW96146236A TW200823452A TW 200823452 A TW200823452 A TW 200823452A TW 96146236 A TW96146236 A TW 96146236A TW 96146236 A TW96146236 A TW 96146236A TW 200823452 A TW200823452 A TW 200823452A
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TW
Taiwan
Prior art keywords
sample
ray
chlorine
current
high voltage
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TW96146236A
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English (en)
Chinese (zh)
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TWI352808B (https=
Inventor
wei-xiang Lin
Ming-Shu Chen
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Techmax Technical Co Ltd
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Priority to TW96146236A priority Critical patent/TW200823452A/zh
Publication of TW200823452A publication Critical patent/TW200823452A/zh
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Publication of TWI352808B publication Critical patent/TWI352808B/zh

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  • Analysing Materials By The Use Of Radiation (AREA)
TW96146236A 2007-12-05 2007-12-05 Inspection device and method for X-ray fluorescent analysis TW200823452A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW96146236A TW200823452A (en) 2007-12-05 2007-12-05 Inspection device and method for X-ray fluorescent analysis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW96146236A TW200823452A (en) 2007-12-05 2007-12-05 Inspection device and method for X-ray fluorescent analysis

Publications (2)

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TW200823452A true TW200823452A (en) 2008-06-01
TWI352808B TWI352808B (https=) 2011-11-21

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TW96146236A TW200823452A (en) 2007-12-05 2007-12-05 Inspection device and method for X-ray fluorescent analysis

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI397679B (zh) * 2009-07-30 2013-06-01 Ind Tech Res Inst 螢光感測裝置及方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI397679B (zh) * 2009-07-30 2013-06-01 Ind Tech Res Inst 螢光感測裝置及方法

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Publication number Publication date
TWI352808B (https=) 2011-11-21

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