TWI352808B - - Google Patents
Download PDFInfo
- Publication number
- TWI352808B TWI352808B TW96146236A TW96146236A TWI352808B TW I352808 B TWI352808 B TW I352808B TW 96146236 A TW96146236 A TW 96146236A TW 96146236 A TW96146236 A TW 96146236A TW I352808 B TWI352808 B TW I352808B
- Authority
- TW
- Taiwan
- Prior art keywords
- sample
- ray
- current
- intensity
- unit
- Prior art date
Links
- 238000001514 detection method Methods 0.000 claims description 19
- 238000001228 spectrum Methods 0.000 claims description 19
- 229910052801 chlorine Inorganic materials 0.000 claims description 17
- 239000000460 chlorine Substances 0.000 claims description 17
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 claims description 16
- 238000004458 analytical method Methods 0.000 claims description 9
- 238000000034 method Methods 0.000 claims description 8
- 238000004876 x-ray fluorescence Methods 0.000 claims description 7
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 5
- 229910052782 aluminium Inorganic materials 0.000 claims description 5
- 238000007689 inspection Methods 0.000 claims description 5
- 238000012545 processing Methods 0.000 claims description 5
- 230000003595 spectral effect Effects 0.000 claims description 5
- 238000012360 testing method Methods 0.000 claims description 3
- 238000005070 sampling Methods 0.000 claims description 2
- 238000005259 measurement Methods 0.000 claims 1
- 238000010998 test method Methods 0.000 claims 1
- 229910052724 xenon Inorganic materials 0.000 claims 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 claims 1
- 239000000523 sample Substances 0.000 description 35
- 238000010586 diagram Methods 0.000 description 8
- 230000007613 environmental effect Effects 0.000 description 7
- 239000000463 material Substances 0.000 description 6
- 238000011088 calibration curve Methods 0.000 description 4
- WKBOTKDWSSQWDR-UHFFFAOYSA-N Bromine atom Chemical compound [Br] WKBOTKDWSSQWDR-UHFFFAOYSA-N 0.000 description 2
- GDTBXPJZTBHREO-UHFFFAOYSA-N bromine Substances BrBr GDTBXPJZTBHREO-UHFFFAOYSA-N 0.000 description 2
- 229910052794 bromium Inorganic materials 0.000 description 2
- 238000001914 filtration Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 241000254158 Lampyridae Species 0.000 description 1
- 230000000747 cardiac effect Effects 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 235000013399 edible fruits Nutrition 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000012921 fluorescence analysis Methods 0.000 description 1
- 125000005843 halogen group Chemical group 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000008267 milk Substances 0.000 description 1
- 210000004080 milk Anatomy 0.000 description 1
- 235000013336 milk Nutrition 0.000 description 1
- 231100000614 poison Toxicity 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000003440 toxic substance Substances 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW96146236A TW200823452A (en) | 2007-12-05 | 2007-12-05 | Inspection device and method for X-ray fluorescent analysis |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW96146236A TW200823452A (en) | 2007-12-05 | 2007-12-05 | Inspection device and method for X-ray fluorescent analysis |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200823452A TW200823452A (en) | 2008-06-01 |
| TWI352808B true TWI352808B (https=) | 2011-11-21 |
Family
ID=44771149
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW96146236A TW200823452A (en) | 2007-12-05 | 2007-12-05 | Inspection device and method for X-ray fluorescent analysis |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW200823452A (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI397679B (zh) * | 2009-07-30 | 2013-06-01 | Ind Tech Res Inst | 螢光感測裝置及方法 |
-
2007
- 2007-12-05 TW TW96146236A patent/TW200823452A/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| TW200823452A (en) | 2008-06-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP5297142B2 (ja) | 異物検出方法および装置 | |
| JP5340524B2 (ja) | 放射線検出器及び放射線検出方法 | |
| US20100193700A1 (en) | Spectral photon counting detector | |
| US9465135B2 (en) | High energy X-ray inspection system using a fan-shaped beam and collimated backscatter detectors | |
| US8155268B2 (en) | Rapid screening for lead concentration compliance by X-ray fluorescence (XRF) analysis | |
| JP2008506124A (ja) | 物質の平均原子番号及び質量を求めるための方法及びシステム | |
| JP2004536284A (ja) | Ｘ線蛍光分析器 | |
| CN109154578B (zh) | 用于表面缺陷检测和分析的产生脉冲中子的瞬时伽马发射测量系统 | |
| JP2010133934A5 (https=) | ||
| US7696480B2 (en) | Method and apparatus for determining an object material | |
| JP7309385B2 (ja) | 光子計数型検出器の較正方法 | |
| US7656996B2 (en) | Device and method for mapping the distribution of an X-ray fluorescence marker | |
| US9036778B2 (en) | System and method for measuring the thickness of a zinc layer on steel and for measuring the iron concentration in a zinc layer | |
| TWI352808B (https=) | ||
| AU2011203239A1 (en) | Mineral particle material resolving X-ray imaging | |
| KR102001217B1 (ko) | 엑스선 검출기를 교정하는 방법 | |
| JP4005547B2 (ja) | プラスティックを分析するｘ線分析装置 | |
| JP6357479B2 (ja) | 材料の識別方法 | |
| JP3265361B2 (ja) | 液中粒子計測装置およびその方法 | |
| JP6255414B2 (ja) | 材料の識別方法 | |
| US20090074132A1 (en) | Computer tomography apparatus and method of examining an object of interest with a computer tomography apparatus | |
| JP6193854B2 (ja) | 光子束の分光測定用の処理装置及び方法 | |
| JP3399861B2 (ja) | Ｘ線分析装置 | |
| RU2659763C1 (ru) | Многофазный рентгеновский расходомер | |
| TW548096B (en) | Method and device for measuring bone density by digital quantum X-ray |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |