TW200811805A - TFT array board its inspection method and display device - Google Patents

TFT array board its inspection method and display device Download PDF

Info

Publication number
TW200811805A
TW200811805A TW096122996A TW96122996A TW200811805A TW 200811805 A TW200811805 A TW 200811805A TW 096122996 A TW096122996 A TW 096122996A TW 96122996 A TW96122996 A TW 96122996A TW 200811805 A TW200811805 A TW 200811805A
Authority
TW
Taiwan
Prior art keywords
signal
line
lines
pixel
circuit
Prior art date
Application number
TW096122996A
Other languages
English (en)
Chinese (zh)
Inventor
Masafumi Agari
Hidetada Tokioka
Suehiro Goto
Ryuichi Hashido
Naoki Nakagawa
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of TW200811805A publication Critical patent/TW200811805A/zh

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10—OLED displays
    • H10K59/12—Active-matrix OLED [AMOLED] displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10—OLED displays
    • H10K59/12—Active-matrix OLED [AMOLED] displays
    • H10K59/121—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
    • H10K59/1213—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements the pixel elements being TFTs
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/12—Passive devices, e.g. 2 terminal devices
    • H01L2924/1204—Optical Diode
    • H01L2924/12044—OLED

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Geometry (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Electroluminescent Light Sources (AREA)
  • Control Of El Displays (AREA)
TW096122996A 2006-08-25 2007-06-26 TFT array board its inspection method and display device TW200811805A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006229247A JP2008052111A (ja) 2006-08-25 2006-08-25 Ｔｆｔアレイ基板、その検査方法および表示装置

Publications (1)

Publication Number Publication Date
TW200811805A true TW200811805A (en) 2008-03-01

Family

ID=39236208

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096122996A TW200811805A (en) 2006-08-25 2007-06-26 TFT array board its inspection method and display device

Country Status (3)

Country Link
JP (1) JP2008052111A (ko)
KR (1) KR100873534B1 (ko)
TW (1) TW200811805A (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI412766B (zh) * 2009-09-04 2013-10-21 Wintek Corp 主動元件陣列以及檢測方法

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5225782B2 (ja) * 2008-08-08 2013-07-03 株式会社ジャパンディスプレイイースト 表示装置
JP5503255B2 (ja) * 2009-11-10 2014-05-28 グローバル・オーエルイーディー・テクノロジー・リミテッド・ライアビリティ・カンパニー 画素回路、表示装置および検査方法
KR101528148B1 (ko) * 2012-07-19 2015-06-12 엘지디스플레이 주식회사 화소 전류 측정을 위한 유기 발광 다이오드 표시 장치 및 그의 화소 전류 측정 방법
US9495910B2 (en) 2013-11-22 2016-11-15 Global Oled Technology Llc Pixel circuit, driving method, display device, and inspection method
JP6277380B2 (ja) * 2014-02-25 2018-02-14 株式会社Ｊｏｌｅｄ Ｅｌ表示装置の製造方法
JP6468686B2 (ja) * 2014-04-25 2019-02-13 株式会社半導体エネルギー研究所 入出力装置
WO2015190043A1 (ja) 2014-06-13 2015-12-17 株式会社Ｊｏｌｅｄ 表示パネルの検査方法及び表示パネルの製造方法
JP6927805B2 (ja) * 2017-08-31 2021-09-01 京セラ株式会社 発光素子基板の検査方法および発光素子基板
CN108182895B (zh) * 2017-12-12 2020-06-30 武汉华星光电技术有限公司 一种用于检测显示面板中像素电位的电路及方法、显示面板
JP7012548B2 (ja) * 2018-02-07 2022-01-28 シャープ株式会社 表示装置及び表示システム
CN109166527B (zh) 2018-10-24 2020-07-24 合肥京东方卓印科技有限公司 显示面板、显示装置及驱动方法
KR102612739B1 (ko) * 2018-12-19 2023-12-12 엘지디스플레이 주식회사 표시장치 및 이의 구동방법
CN114967954A (zh) * 2021-02-19 2022-08-30 群创光电股份有限公司 电子装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5799688A (en) * 1980-12-11 1982-06-21 Sharp Kk Display driving circuit
JP2516197B2 (ja) * 1985-08-23 1996-07-10 株式会社日立製作所 半導体素子の検査方法
JPH0711639B2 (ja) * 1986-04-01 1995-02-08 松下電器産業株式会社 薄膜トランジスタアレイの欠陥検査方法
JPH0194391A (ja) * 1987-10-07 1989-04-13 Tel Kyushu Kk 検査方法
JPH079521B2 (ja) * 1988-12-29 1995-02-01 松下電器産業株式会社 点欠陥の検出及び補修の可能なアクティブマトリクス基板の製造方法
JP4138102B2 (ja) * 1998-10-13 2008-08-20 セイコーエプソン株式会社 表示装置及び電子機器
JP2000276108A (ja) * 1999-03-24 2000-10-06 Sanyo Electric Co Ltd アクティブ型ｅｌ表示装置
JP2001265248A (ja) * 2000-03-14 2001-09-28 Internatl Business Mach Corp <Ibm> アクティブ・マトリックス表示装置、及び、その検査方法
JP5041627B2 (ja) * 2000-05-12 2012-10-03 株式会社半導体エネルギー研究所 Ｅｌ表示装置、電子機器
JP2004191603A (ja) * 2002-12-10 2004-07-08 Semiconductor Energy Lab Co Ltd 表示装置およびその検査方法
JP2004294457A (ja) * 2002-12-16 2004-10-21 Agilent Technologies Japan Ltd アクティブマトリクス型の表示装置およびその検査方法
KR100491560B1 (ko) * 2003-05-06 2005-05-27 엘지.필립스 엘시디 주식회사 액정표시소자의 검사방법 및 장치
JP4338131B2 (ja) * 2003-09-30 2009-10-07 インターナショナル・ビジネス・マシーンズ・コーポレーション Ｔｆｔアレイ、表示パネル、およびｔｆｔアレイの検査方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI412766B (zh) * 2009-09-04 2013-10-21 Wintek Corp 主動元件陣列以及檢測方法

Also Published As

Publication number Publication date
KR100873534B1 (ko) 2008-12-11
JP2008052111A (ja) 2008-03-06
KR20080018815A (ko) 2008-02-28

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