TW200719421A - Bonding surfaces together via plasma treatment on both surfaces with wet treatment on only one surface - Google Patents
Bonding surfaces together via plasma treatment on both surfaces with wet treatment on only one surfaceInfo
- Publication number
- TW200719421A TW200719421A TW095123901A TW95123901A TW200719421A TW 200719421 A TW200719421 A TW 200719421A TW 095123901 A TW095123901 A TW 095123901A TW 95123901 A TW95123901 A TW 95123901A TW 200719421 A TW200719421 A TW 200719421A
- Authority
- TW
- Taiwan
- Prior art keywords
- treatment
- together via
- via plasma
- plasma treatment
- wet
- Prior art date
Links
- 238000009832 plasma treatment Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/185—Joining of semiconductor bodies for junction formation
- H01L21/187—Joining of semiconductor bodies for junction formation by direct bonding
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Micromachines (AREA)
- Mechanical Light Control Or Optical Switches (AREA)
- Lining Or Joining Of Plastics Or The Like (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/194,036 US20070023850A1 (en) | 2005-07-30 | 2005-07-30 | Bonding surfaces together via plasma treatment on both surfaces with wet treatment on only one surface |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200719421A true TW200719421A (en) | 2007-05-16 |
Family
ID=37405110
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095123901A TW200719421A (en) | 2005-07-30 | 2006-06-30 | Bonding surfaces together via plasma treatment on both surfaces with wet treatment on only one surface |
Country Status (5)
Country | Link |
---|---|
US (1) | US20070023850A1 (zh) |
EP (1) | EP1911071A1 (zh) |
JP (1) | JP2009502534A (zh) |
TW (1) | TW200719421A (zh) |
WO (1) | WO2007016003A1 (zh) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2217043B1 (en) * | 2007-11-06 | 2019-01-30 | Mitsubishi Materials Corporation | Method for producing a substrate for power module |
JP5391599B2 (ja) * | 2008-07-14 | 2014-01-15 | オムロン株式会社 | 基板接合方法及び電子部品 |
US9329336B2 (en) * | 2012-07-06 | 2016-05-03 | Micron Technology, Inc. | Method of forming a hermetically sealed fiber to chip connection |
JP6334125B2 (ja) * | 2013-10-11 | 2018-05-30 | 任天堂株式会社 | 表示制御プログラム、表示制御装置、表示制御システム、および表示制御方法 |
KR101759093B1 (ko) * | 2015-07-01 | 2017-07-18 | 서울대학교산학협력단 | 나노포어 구조체, 나노포어 구조를 이용한 이온소자 및 나노멤브레인 구조체 제조방법 |
Family Cites Families (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06244389A (ja) * | 1992-12-25 | 1994-09-02 | Canon Inc | 半導体基板の作製方法及び該方法により作製された半導体基板 |
JP2701709B2 (ja) * | 1993-02-16 | 1998-01-21 | 株式会社デンソー | 2つの材料の直接接合方法及び材料直接接合装置 |
JPH08181296A (ja) * | 1994-12-26 | 1996-07-12 | Nippondenso Co Ltd | 半導体基板の製造方法 |
JPH08316441A (ja) * | 1995-05-15 | 1996-11-29 | Hitachi Ltd | 半導体基板の製造方法 |
US5603779A (en) * | 1995-05-17 | 1997-02-18 | Harris Corporation | Bonded wafer and method of fabrication thereof |
JPH0982588A (ja) * | 1995-09-12 | 1997-03-28 | Denso Corp | 窒化物の直接接合方法及びその直接接合物 |
US5866469A (en) * | 1996-06-13 | 1999-02-02 | Boeing North American, Inc. | Method of anodic wafer bonding |
JPH10308354A (ja) * | 1997-05-08 | 1998-11-17 | Denso Corp | 半導体基板の製造方法 |
US5882987A (en) * | 1997-08-26 | 1999-03-16 | International Business Machines Corporation | Smart-cut process for the production of thin semiconductor material films |
WO1999010927A1 (en) * | 1997-08-29 | 1999-03-04 | Farrens Sharon N | In situ plasma wafer bonding method |
SG71182A1 (en) * | 1997-12-26 | 2000-03-21 | Canon Kk | Substrate processing apparatus substrate support apparatus substrate processing method and substrate manufacturing method |
US6316332B1 (en) * | 1998-11-30 | 2001-11-13 | Lo Yu-Hwa | Method for joining wafers at a low temperature and low stress |
JP2000306993A (ja) * | 1999-04-22 | 2000-11-02 | Sony Corp | 多層基板の製造方法 |
US6902987B1 (en) * | 2000-02-16 | 2005-06-07 | Ziptronix, Inc. | Method for low temperature bonding and bonded structure |
KR100741541B1 (ko) * | 2000-05-30 | 2007-07-20 | 신에쯔 한도타이 가부시키가이샤 | 접합웨이퍼의 제조방법 및 접합웨이퍼 |
JP4628580B2 (ja) * | 2001-04-18 | 2011-02-09 | 信越半導体株式会社 | 貼り合せ基板の製造方法 |
WO2003010806A2 (en) * | 2001-07-26 | 2003-02-06 | Massachusetts Institute Of Technology | Semiconductor substrate bonding by mass transport growth fusion |
AU2002339592A1 (en) * | 2001-10-29 | 2003-05-12 | Analog Devices Inc. | A method for bonding a pair of silicon wafers together and a semiconductor wafer |
US6822326B2 (en) * | 2002-09-25 | 2004-11-23 | Ziptronix | Wafer bonding hermetic encapsulation |
FR2846788B1 (fr) * | 2002-10-30 | 2005-06-17 | Procede de fabrication de substrats demontables | |
US20040126993A1 (en) * | 2002-12-30 | 2004-07-01 | Chan Kevin K. | Low temperature fusion bonding with high surface energy using a wet chemical treatment |
US7071077B2 (en) * | 2003-03-26 | 2006-07-04 | S.O.I.Tec Silicon On Insulator Technologies S.A. | Method for preparing a bonding surface of a semiconductor layer of a wafer |
JP3970814B2 (ja) * | 2003-08-05 | 2007-09-05 | シャープ株式会社 | 半導体装置の製造方法 |
US7563691B2 (en) * | 2004-10-29 | 2009-07-21 | Hewlett-Packard Development Company, L.P. | Method for plasma enhanced bonding and bonded structures formed by plasma enhanced bonding |
-
2005
- 2005-07-30 US US11/194,036 patent/US20070023850A1/en not_active Abandoned
-
2006
- 2006-06-30 TW TW095123901A patent/TW200719421A/zh unknown
- 2006-07-21 JP JP2008524009A patent/JP2009502534A/ja active Pending
- 2006-07-21 EP EP06788237A patent/EP1911071A1/en not_active Withdrawn
- 2006-07-21 WO PCT/US2006/028561 patent/WO2007016003A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
EP1911071A1 (en) | 2008-04-16 |
US20070023850A1 (en) | 2007-02-01 |
WO2007016003A1 (en) | 2007-02-08 |
JP2009502534A (ja) | 2009-01-29 |
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