TW200710383A - Apparatus for inspecting outside appearances - Google Patents

Apparatus for inspecting outside appearances

Info

Publication number
TW200710383A
TW200710383A TW095129455A TW95129455A TW200710383A TW 200710383 A TW200710383 A TW 200710383A TW 095129455 A TW095129455 A TW 095129455A TW 95129455 A TW95129455 A TW 95129455A TW 200710383 A TW200710383 A TW 200710383A
Authority
TW
Taiwan
Prior art keywords
workpiece
rotation stage
receiving part
checking
feeding
Prior art date
Application number
TW095129455A
Other languages
Chinese (zh)
Other versions
TWI414781B (en
Inventor
Hirofumi Mizukami
Original Assignee
Tokyo Weld Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Weld Co Ltd filed Critical Tokyo Weld Co Ltd
Publication of TW200710383A publication Critical patent/TW200710383A/en
Application granted granted Critical
Publication of TWI414781B publication Critical patent/TWI414781B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2441—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using interferometry
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G47/00—Article or material-handling devices associated with conveyors; Methods employing such devices
    • B65G47/02—Devices for feeding articles or materials to conveyors
    • B65G47/04—Devices for feeding articles or materials to conveyors for feeding articles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G01N2021/8893—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a video image and a processed signal for helping visual decision

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Biochemistry (AREA)
  • Signal Processing (AREA)
  • Mechanical Engineering (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Specific Conveyance Elements (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
  • Adornments (AREA)

Abstract

A device for checking an appearance, characterized in that the device comprises a rotation stage 31 having a plurality of workpiece receiving part 31a on the periphery thereof for receiving and transferring workpieces; a feeding means for keeping the workpieces w, which is received by the workpiece receiving part 31a, attracted and feeding thereto an outside space of the rotation stage 31; and a checking means for checking an appearance of the workpiece w fed from the rotation stage 31. After the workpiece receiving part 31 a of the rotation stage 31 is positioned on a predetermined position, the workpiece w at the workpiece receiving part 31a is fed out by an attraction spray head 28 as the feeding means. The workpiece w at the outside space of the rotation stage 31 is checked by a photographing means 37 as the checking means.
TW095129455A 2005-09-08 2006-08-10 Apparatus for inspecting outside appearances TWI414781B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005260928A JP4848160B2 (en) 2005-09-08 2005-09-08 Appearance inspection device

Publications (2)

Publication Number Publication Date
TW200710383A true TW200710383A (en) 2007-03-16
TWI414781B TWI414781B (en) 2013-11-11

Family

ID=37858985

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095129455A TWI414781B (en) 2005-09-08 2006-08-10 Apparatus for inspecting outside appearances

Country Status (4)

Country Link
JP (1) JP4848160B2 (en)
KR (1) KR101114076B1 (en)
CN (1) CN1929087B (en)
TW (1) TWI414781B (en)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4810455B2 (en) * 2007-02-14 2011-11-09 ホリストン ポリテック株式会社 Capacitor appearance inspection method
CN102062584A (en) * 2010-12-18 2011-05-18 深圳市瑞摩特科技发展有限公司 Remote controller automatic detection production line
JP5083701B2 (en) * 2011-01-31 2012-11-28 アキム株式会社 Parts conveyor
JP5674060B2 (en) * 2011-02-09 2015-02-25 上野精機株式会社 Electronic component transfer device and taping unit
CN102122144B (en) * 2011-03-04 2012-07-25 常州工学院 Numerical control system for detecting cam contours
CN102175181B (en) * 2011-03-04 2012-05-23 常州工学院 Detection method of cam contour detection device
CN103029963B (en) * 2011-10-10 2015-07-15 东京威尔斯股份有限公司 Workpiece conveying device
CN103728302A (en) * 2013-11-22 2014-04-16 香港斯托克股份有限公司 Automatic detection equipment for object appearance
CN103995001B (en) * 2014-06-04 2017-01-11 昆山宝锦激光拼焊有限公司 Weld inspection device convenient for transferring plates
KR101693684B1 (en) 2015-04-06 2017-01-06 나승옥 Work appearance inspection apparatus and method by the same
CN109238141B (en) * 2018-09-21 2020-10-09 绵阳鼎飞益电子科技有限公司 Chip pin optical detection system
CN109932488B (en) * 2019-03-18 2021-11-05 广东荣旭智能技术有限公司 Capacitor appearance detection method
TWI823679B (en) * 2021-11-19 2023-11-21 日商芝浦機械電子裝置股份有限公司 Supply device and film forming device

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61279145A (en) * 1985-06-05 1986-12-09 Nhk Spring Co Ltd Defect detecting apparatus for pin piece of electronic part
JP2587998B2 (en) * 1988-06-08 1997-03-05 株式会社日立製作所 Appearance inspection device
JPH0711494B2 (en) * 1988-06-16 1995-02-08 松下電工株式会社 Inspection method for translucent containers
JPH0682732B2 (en) * 1989-10-20 1994-10-19 東京航空計器株式会社 IC package lead terminal floating amount inspection device
JP2932870B2 (en) * 1992-11-27 1999-08-09 松下電器産業株式会社 Observation device for electronic components
JPH0821380A (en) * 1994-07-01 1996-01-23 Mitsubishi Electric Corp Scroll fluid machinery
JPH08136463A (en) * 1994-11-10 1996-05-31 Taiyo Yuden Co Ltd Appearance inspection device
JP3755181B2 (en) * 1996-04-05 2006-03-15 松下電器産業株式会社 Electronic component mounting device
JPH1065392A (en) * 1996-08-19 1998-03-06 Matsushita Electric Ind Co Ltd Electronic component supply equipment and electronic component mount method
JPH1068614A (en) * 1996-08-27 1998-03-10 Copal Co Ltd Image pickup system
JP3694800B2 (en) * 1997-05-30 2005-09-14 株式会社安川電機 Optical encoder
JP4007526B2 (en) * 1998-04-06 2007-11-14 日東工業株式会社 6-side inspection system for chips
JP2000074639A (en) * 1998-09-03 2000-03-14 Mitsubishi Materials Corp Automatic visual inspection machine
JP2001041902A (en) * 1999-08-02 2001-02-16 Yasunaga Corp Foreign matter inspecting apparatus
JP2001304831A (en) * 2000-04-21 2001-10-31 Keyence Corp Optical angle measuring apparatus
JP2002057500A (en) * 2000-08-15 2002-02-22 Nidec Copal Corp Method for recognizing electronic component
JP3723070B2 (en) * 2000-11-10 2005-12-07 株式会社 東京ウエルズ Work transfer device
JP2004010301A (en) * 2002-06-10 2004-01-15 Tokyo Weld Co Ltd Work carrier device and work carrying method
JP2004018054A (en) * 2002-06-18 2004-01-22 Tokyo Weld Co Ltd Work transfer device
CN2603401Y (en) * 2003-01-29 2004-02-11 纬典股份有限公司 Automatic electronic component detection equipment

Also Published As

Publication number Publication date
JP2007071775A (en) 2007-03-22
JP4848160B2 (en) 2011-12-28
TWI414781B (en) 2013-11-11
KR101114076B1 (en) 2012-03-05
CN1929087A (en) 2007-03-14
KR20070029053A (en) 2007-03-13
CN1929087B (en) 2010-05-19

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