JPH1068614A - Image pickup system - Google Patents

Image pickup system

Info

Publication number
JPH1068614A
JPH1068614A JP8225391A JP22539196A JPH1068614A JP H1068614 A JPH1068614 A JP H1068614A JP 8225391 A JP8225391 A JP 8225391A JP 22539196 A JP22539196 A JP 22539196A JP H1068614 A JPH1068614 A JP H1068614A
Authority
JP
Japan
Prior art keywords
imaging
read
image pickup
image
electronic component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8225391A
Other languages
Japanese (ja)
Inventor
Hidekuni Niiyama
秀邦 新山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidec Precision Corp
Original Assignee
Nidec Copal Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nidec Copal Corp filed Critical Nidec Copal Corp
Priority to JP8225391A priority Critical patent/JPH1068614A/en
Publication of JPH1068614A publication Critical patent/JPH1068614A/en
Pending legal-status Critical Current

Links

Landscapes

  • Supply And Installment Of Electrical Components (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide an image pickup system in which the size is reduced, the inspection time is shortened and the cost is reduced. SOLUTION: The image pickup system 1 comprises an illumination system 3 having an LED 9 for illuminating an object 6 arranged in a region S to be read out, a system 4 for picking up the image of the object 6 by receiving the light from the illumination system 3 reflected on the object 6, and a lens system 5 interposed between the image pickup system 4 and the illumination system 3 in order to focus the reflected light on the image pickup system 4. The lens system 5 comprises a single focus lens system 12 while the image pickup system 4 comprises a single image pickup means 13. A side face observation mirror 8 is arranged oppositely to at least one side face 6a of the object 6 arranged in the region S to be read out. Reflected light from the side face observation mirror 8 is directed directly to a focus lens means 12 the image of at least one side face 6a of the object 6 is picked up by the image pickup means 13.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、撮像装置に係り、
特に、電子部品を回路基板に実装する過程において、リ
ードの側方観察に利用する撮像装置に関するものであ
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an imaging device,
In particular, the present invention relates to an imaging device used for side observation of a lead in a process of mounting an electronic component on a circuit board.

【0002】[0002]

【従来の技術】従来から存在する撮像装置の一例とし
て、特開平6−216580号公報がある。この公報に
開示された装置は、QFP,SOP等からなる電子部品
を回路基板上に実装する際に、ノズルで真空吸引された
電子部品のリード(アウタ・リード)を、一台のカメラ
で直接観察する構成になっている。従って、パッケージ
の側面から延びたリードの曲がり状態を、側方に配置し
たカメラで光学的に且つ非接触状態で観察し得るので、
リードの浮き沈み(コプラナリティ)等を検査でき、回
路基板に部品を実装するための事前の測定が可能とな
り、リード浮きした不良部品を事前に選別することがで
きる。
2. Description of the Related Art Japanese Patent Application Laid-Open No. 6-216580 discloses an example of a conventional imaging apparatus. In the device disclosed in this publication, when an electronic component such as a QFP or an SOP is mounted on a circuit board, a lead (outer lead) of the electronic component sucked by a nozzle is directly taken by one camera. It is configured to be observed. Therefore, the bent state of the lead extending from the side surface of the package can be observed optically and in a non-contact state with a camera arranged on the side,
It is possible to inspect the ups and downs (coplanarity) of the leads and the like, and to perform a preliminary measurement for mounting the components on the circuit board, and it is possible to preliminarily select the defective components with the raised leads.

【0003】[0003]

【発明が解決しようとする課題】しかしながら、従来の
撮像装置は、上述したように構成されているため、次の
ような課題が存在していた。すなわち、側方に配置した
一台のカメラで電子部品のリードを側方から検査してい
るので、ノズルを90度ずつ回転させながら、電子部品
の各側面を順次撮像する流れ工程が必要になり、電子部
品のリードの検査に時間がかかる。また、電子部品の四
側面を同時に検査する場合には、電子部品の周囲に四個
のカメラを配置しなければならないので、撮像装置が大
型化するといった問題点があった。
However, since the conventional imaging apparatus is configured as described above, there are the following problems. That is, since the lead of the electronic component is inspected from the side by one camera arranged on the side, a flow step of sequentially imaging each side surface of the electronic component while rotating the nozzle by 90 degrees is required. In addition, it takes time to inspect leads of electronic components. Further, when inspecting the four side surfaces of the electronic component at the same time, four cameras must be arranged around the electronic component, so that there is a problem that the image pickup apparatus becomes large.

【0004】本発明は、上述の課題を解決するためにな
されたもので、特に、小型化、検査時間の短縮化及び低
コスト化を可能にした撮像装置を提供することを目的と
する。
[0004] The present invention has been made to solve the above-mentioned problems, and it is an object of the present invention to provide an image pickup apparatus capable of reducing the size, the inspection time, and the cost.

【0005】[0005]

【課題を解決するための手段】請求項1に係る本発明の
撮像装置は、読取り領域に配置される読取り対象物を照
明光により照らすための光源をもった照明系と、照明系
により照らされた際に生じる読取り対象物からの反射光
を受光して読取り対象物を撮像する撮像系と、撮像系と
照明系との間に配置されて反射光を撮像系上に結像させ
るレンズ系とを有する撮像装置において、レンズ系を一
つの結像レンズ手段で構成し、撮像系を一つの撮像手段
で構成し、読取り領域に配置させる読取り対象物の少な
くとも一側面に対峙する位置に側面観察ミラーを配置
し、側面観察ミラーからの反射光を結像レンズ手段に直
接入射させ、撮像手段で読取り対象物の少なくとも一側
面の像を撮像することを特徴とする。
According to a first aspect of the present invention, there is provided an image pickup apparatus comprising: an illumination system having a light source for illuminating an object to be read disposed in a reading area with illumination light; and an illumination system. An imaging system that receives reflected light from the object to be read and captures an image of the object to be read, and a lens system that is arranged between the imaging system and the illumination system and forms an image of the reflected light on the imaging system. In the imaging apparatus having the above, the lens system is constituted by one imaging lens unit, the imaging system is constituted by one imaging unit, and a side surface observation mirror is provided at a position facing at least one side surface of a reading object arranged in a reading area. Is disposed, the reflected light from the side-viewing mirror is directly incident on the imaging lens means, and the image pickup means captures an image of at least one side of the object to be read.

【0006】この撮像装置においては、読取り領域に配
置された読取り対象物は、照明系から出射される照明光
により照らされる。このとき、読取り対象物の側面から
の反射光は、読取り対象物の側面に対峙する位置に設け
られた側面観察ミラーで反射した後、結像レンズ手段に
直接達する。そして、結像レンズ手段を通過した光は、
撮像手段で読取り対象物の側面の像として撮像される。
従って、結像レンズ手段の固定倍率に応じて、側面観察
ミラーと結像レンズ手段との間の光路長さを、側面観察
ミラーの反射角を変えるだけで簡単に変更することがで
きる。特に、本発明の撮像装置は小型化が図られている
ので、電子部品実装装置内での設置スペースが他の機構
との兼ね合いで制限される場合に有効である。
[0006] In this imaging apparatus, a reading object arranged in a reading area is illuminated by illumination light emitted from an illumination system. At this time, the reflected light from the side surface of the object to be read is reflected by a side surface observation mirror provided at a position facing the side surface of the object to be read, and then directly reaches the imaging lens unit. The light that has passed through the imaging lens means
The image is taken as an image of the side surface of the object to be read by the imaging means.
Therefore, according to the fixed magnification of the imaging lens means, the optical path length between the side-viewing mirror and the imaging lens means can be easily changed only by changing the reflection angle of the side-viewing mirror. In particular, since the imaging device of the present invention is reduced in size, it is effective when the installation space in the electronic component mounting device is limited in consideration of other mechanisms.

【0007】この場合、側面観察ミラーは、読取り領域
に配置させる読取り対象物の二側面に対峙させ、撮像手
段で読取り対象物の二側面の像を同時に撮像すると好ま
しい。このような構成を採用した場合、一つの結像レン
ズ手段を通過した読取り対象物の二側面の像を、一つ撮
像手段で同時に撮像することができるので、読取り対象
物の二側面の同時観察が可能になり、読取り対象物の二
側面から延びるリードの浮き沈み量を一度に検査するこ
とができる。また、読取り対象物の四側面にリードが配
列されたタイプの電子部品であっても、90度回転させ
るだけで全てのリードの浮き沈み量を検査することがで
きる。従って、リードの検査スピードの効率化が図れ
る。
In this case, it is preferable that the side-viewing mirror face two sides of the object to be read disposed in the reading area, and that the imaging means simultaneously capture images of the two sides of the object to be read. When such a configuration is adopted, images of two sides of the object to be read that have passed through one imaging lens unit can be simultaneously imaged by one imaging unit, so that simultaneous observation of the two sides of the object to be read is possible. And the amount of ups and downs of the leads extending from the two sides of the object to be read can be inspected at one time. Further, even for an electronic component of a type in which leads are arranged on four sides of an object to be read, the ups and downs of all the leads can be inspected only by rotating by 90 degrees. Accordingly, the efficiency of lead inspection can be increased.

【0008】また、側面観察ミラーは、読取り領域に配
置させる読取り対象物の四側面に対峙させ、撮像手段で
読取り対象物の四側面の像を同時に撮像すると好まし
い。このような構成を採用した場合、一つの結像レンズ
手段を通過した読取り対象物の四側面の像を、一つ撮像
手段で同時に撮像することができるので、読取り対象物
の四側面の同時観察が可能になる。従って、読取り対象
物の四側面に配列されたリードの浮き沈み量を一度に検
査することができ、リードの検査スピードが飛躍的に向
上する。
It is preferable that the side-viewing mirrors face the four sides of the object to be read arranged in the reading area, and that the imaging means simultaneously captures images of the four sides of the object to be read. When such a configuration is adopted, images of four sides of the object to be read that have passed through one imaging lens unit can be simultaneously imaged by one imaging unit, so that simultaneous observation of the four sides of the object to be read is possible. Becomes possible. Therefore, the amount of ups and downs of the leads arranged on the four sides of the object to be read can be inspected at a time, and the inspection speed of the leads is dramatically improved.

【0009】更に、側面観察ミラーからの反射光及び読
取り対象物の底面からの反射光を結像レンズ手段に直接
入射させ、撮像手段で読取り対象物の側面及び底面の像
を同時に撮像すると好ましい。このような構成を採用し
た場合、撮像手段で読取り対象物の底面の像も同時に撮
像することができ、吸着ノズルに対する読取り対象物の
位置ズレや姿勢をも撮像できるので、読取り対象物の検
査が一層確実なものになる。
Further, it is preferable that the reflected light from the side observation mirror and the reflected light from the bottom surface of the object to be read are directly incident on the imaging lens means, and the images of the side surface and the bottom surface of the object to be read are simultaneously taken by the imaging means. When such a configuration is adopted, the image of the bottom surface of the object to be read can be simultaneously imaged by the imaging means, and the displacement and posture of the object to be read with respect to the suction nozzle can also be imaged. It will be more certain.

【0010】[0010]

【発明の実施の形態】以下、図面と共に本発明による撮
像装置の好適な実施形態について詳細に説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Preferred embodiments of an imaging apparatus according to the present invention will be described below in detail with reference to the drawings.

【0011】図1は、本実施形態に係る撮像装置を示す
斜視図である。同図に示す撮像装置1は、暗箱を構成す
るケーシング2を備え、このケーシング2内において、
上部には照明系3が配置され、下部には撮像系4が配置
され、照明系3と撮像系4との間にはレンズ系5が配置
されている。この撮像装置1は、電子部品の小型化,薄
型化,多機能化の要求から開発されたパッケージをもつ
電子部品(表面実装デバイス)の撮像を行い、図示しな
い電子部品実装装置の一部として組み込まれている。パ
ッケージとしては、QFP,SOP,SOJ,QFJ等
がある。
FIG. 1 is a perspective view showing an image pickup apparatus according to this embodiment. The imaging apparatus 1 shown in FIG. 1 includes a casing 2 forming a dark box.
An illumination system 3 is arranged at an upper part, an imaging system 4 is arranged at a lower part, and a lens system 5 is arranged between the illumination system 3 and the imaging system 4. The image pickup apparatus 1 picks up an image of an electronic component (surface mount device) having a package developed in response to demands for downsizing, thinning, and multifunctional electronic components, and is incorporated as a part of an electronic component mounting device (not shown). Have been. Packages include QFP, SOP, SOJ, QFJ, and the like.

【0012】図1及び図2に示すように、撮像装置1の
最上部には、パッケージ化された読取り対象物としての
電子部品6を配置させる読取り領域Sが設けられ、この
読取り領域Sは、吸着ノズル7を利用して部品ストック
場所から回路基板(図示せず)上に搬送させる途中の電
子部品6を、部品検査のために一時的に取込む領域であ
る。この読取り領域Sの四方には全反射型のミラーから
なる四枚の側面観察ミラー8が配置されている。各側面
観察ミラー8は、読取り領域Sを中心として、水平方向
に90度の位相角をもって配設されると共に、所定の反
射角αをもってケーシング2の内壁面に固定されてい
る。さらに、各側面観察ミラー8は、読取り領域S内の
電子部品6の各側面6aと水平方向において一対一で対
峙すると共に、各側面6aからの反射光をレンズ系5に
集光させるように斜め下方に向けられている。
As shown in FIGS. 1 and 2, at the top of the image pickup apparatus 1, there is provided a reading area S for disposing a packaged electronic component 6 as an object to be read. This is an area where the electronic component 6 being transported from the component stocking location to a circuit board (not shown) using the suction nozzle 7 is temporarily taken in for component inspection. Four side-viewing mirrors 8 composed of total reflection type mirrors are arranged on four sides of the reading area S. Each side-viewing mirror 8 is disposed with a phase angle of 90 degrees in the horizontal direction around the reading area S, and is fixed to the inner wall surface of the casing 2 with a predetermined reflection angle α. Further, each side surface observation mirror 8 faces each side surface 6a of the electronic component 6 in the reading area S in a one-to-one manner in the horizontal direction, and obliquely collects the reflected light from each side surface 6a to the lens system 5. Pointed downward.

【0013】この読取り領域Sの下方には照明系3が配
置され、照明系3は、電子部品6の各側面6a及び底面
6bを斜め下方から照らすための光源9を有している。
光源9はLEDの列として環状の取付け台10上に配列
され、この取付け台10はケーシング2に固定され、取
付け台10の中央には、電子部品6の底面6bとレンズ
系5とを結ぶ底面像用光路を確保するために、電子部品
6の底面6bからの反射光をレンズ系5に向けて通過さ
せる開口部11が形成されている。また、取付け台10
は、側面観察ミラー8の下方において、側面観察ミラー
8とレンズ系5とを結ぶ側面像用光路を避けるようにし
て配置されることが必要である。なぜなら、側面観察ミ
ラー8での反射光をレンズ系5に直接入射させるためで
ある。
An illumination system 3 is arranged below the reading area S. The illumination system 3 has a light source 9 for illuminating each side surface 6a and bottom surface 6b of the electronic component 6 from obliquely below.
The light source 9 is arranged as a row of LEDs on an annular mounting base 10, which is fixed to the casing 2, and in the center of the mounting base 10 is a bottom surface connecting the bottom surface 6 b of the electronic component 6 and the lens system 5. In order to secure an optical path for the image, an opening 11 is formed to allow the reflected light from the bottom surface 6b of the electronic component 6 to pass toward the lens system 5. Also, the mounting table 10
Needs to be arranged below the side-viewing mirror 8 so as to avoid the side-view image optical path connecting the side-viewing mirror 8 and the lens system 5. This is because the light reflected by the side surface observation mirror 8 is directly incident on the lens system 5.

【0014】このレンズ系5は、一つの結像レンズ手段
12からなると共に、固定焦点型であり所望の焦点距離
を有し、読取り領域Sの真下において、この結像レンズ
手段12は中心軸線に対して同心状に配設されている。
そして、結像レンズ手段12は、各側面観察ミラー8で
の反射光を四方から取り入れることができる程度の広角
性を有し、電子部品6の底面像及び側面像を同時に取り
入れることのできる被写界深度を有している。
The lens system 5 comprises a single imaging lens means 12 and is of a fixed focus type and has a desired focal length. Immediately below the reading area S, the imaging lens means 12 is located at the center axis. It is arranged concentrically with respect to it.
The imaging lens means 12 has such a wide angle that the reflected light from each side-viewing mirror 8 can be taken in from all directions, and can capture the bottom and side images of the electronic component 6 at the same time. It has a depth of field.

【0015】撮像系4は一つのCCD(撮像手段)13
からなり、このCCD13は、結像レンズ手段12の焦
点位置に配設され、結像レンズ手段12の真下におい
て、中心軸線に対して同心状に配設されている。従っ
て、結像レンズ手段12を通過した電子部品6の側面像
及び底面像を、CCD13で同時に撮像させることがで
きる。
The imaging system 4 includes one CCD (imaging means) 13
The CCD 13 is disposed at the focal position of the imaging lens means 12 and is disposed directly below the imaging lens means 12 and concentrically with respect to the central axis. Therefore, a side image and a bottom image of the electronic component 6 having passed through the imaging lens means 12 can be simultaneously captured by the CCD 13.

【0016】次に、四つの側面6aに複数のリードLが
配列されたQFPタイプの電子部品6を、撮像装置1で
撮像する際の動作説明をする。
Next, a description will be given of the operation when the image pickup apparatus 1 picks up an image of the QFP type electronic component 6 in which a plurality of leads L are arranged on the four side surfaces 6a.

【0017】先ず、電子部品実装装置(図示せず)の吸
着ノズル7により真空吸引されて所定場所から搬送され
た電子部品6を撮像装置1の読取り領域S内に配置させ
る。そして、LEDからなる光源9を点灯させることに
より、電子部品6の各側面6a及び底面6bが照明され
る。このとき、各側面6aに配列させた各リードLが照
らされると同時に、各リードLでの反射光は、四方の各
側面観察ミラー8に入射し、各側面観察ミラー8で反射
した光は結像レンズ手段12に集光する。また、電子部
品6の底面6bは、水平なフラットな面からなるので、
底面6bでの反射光は、真下に反射すると同時に、取付
け台10の開口部11を通過した後、結像レンズ手段1
2に入射する。
First, the electronic component 6 sucked in vacuum by the suction nozzle 7 of the electronic component mounting apparatus (not shown) and transported from a predetermined place is arranged in the reading area S of the image pickup apparatus 1. Then, the side surface 6a and the bottom surface 6b of the electronic component 6 are illuminated by turning on the light source 9 made of an LED. At this time, each of the leads L arranged on each side surface 6a is illuminated, and at the same time, the light reflected by each lead L enters each of the four side surface observation mirrors 8 and the light reflected by each side surface mirror 8 is combined. The light is focused on the image lens means 12. Also, since the bottom surface 6b of the electronic component 6 is a horizontal flat surface,
The light reflected by the bottom surface 6b is reflected immediately below and, at the same time, passes through the opening 11 of the mounting table 10, and then forms the imaging lens means 1.
2 is incident.

【0018】そして、結像レンズ手段12を透過した光
はCCD13に入射し、図3に示すように、CCD13
では、電子部品6の四つの側面像14と一つの底面像1
5が同時に撮像される。この場合、底面像15がCCD
13の中央で撮像され、その四方で各側面像14が鏡面
対称状態で撮像される。そして、CCD13で撮像され
た側面像14は、図示しない画像処理装置にデータとし
て送り込まれることにより、各リードLにおける浮き沈
み量の検査や吸着ノズル7による吸着姿勢の良否チャッ
クに利用される。また、CCD13で撮像された底面像
15も、画像処理装置にデータとして送り込まれること
により、吸着ノズル7に対する電子部品6の位置ズレや
吸着姿勢の検査として利用される。この段階で、リード
配列の悪い不良品や吸着姿勢の悪い電子部品6を事前に
選別する。このように、電子部品6の四つの側面像14
と一つの底面像15を同時に撮像することで、電子部品
6の検査スピードや検査精度が飛躍的に向上する。
The light transmitted through the imaging lens means 12 is incident on the CCD 13, and as shown in FIG.
Now, four side images 14 and one bottom image 1 of the electronic component 6
5 are imaged simultaneously. In this case, the bottom image 15 is a CCD
An image is picked up at the center of 13, and each side image 14 is imaged in a mirror-symmetrical state on four sides. The side image 14 picked up by the CCD 13 is sent to an image processing device (not shown) as data, and is used for inspection of the amount of ups and downs in each lead L and chucking of the suction posture by the suction nozzle 7. Further, the bottom image 15 picked up by the CCD 13 is also sent as data to the image processing device, and is used as an inspection for a positional shift and a suction posture of the electronic component 6 with respect to the suction nozzle 7. At this stage, a defective product having a poor lead arrangement and an electronic component 6 having a poor suction attitude are selected in advance. Thus, the four side images 14 of the electronic component 6
By simultaneously capturing one bottom image 15 and the other, the inspection speed and inspection accuracy of the electronic component 6 are dramatically improved.

【0019】本発明は、前述した実施形態に限定される
ものではなく、例えば、図4に示すように、撮像装置1
Aでは、読取り領域Sの真下、すなわち、読取り領域S
と結像レンズ手段12との間を光源9の取付け台20で
完全に塞ぐことにより、図5に示すように、CCD13
には、四つの側面像14のみが撮像され、電子部品6の
底面6bの部分は取付け台20の陰になり現れない。な
お、図4に示した撮像装置1Aにおいて、図1に示した
撮像装置1の構成と同一又は同等な部分には、同一の符
号を付し、その説明は省略する。
The present invention is not limited to the above-described embodiment. For example, as shown in FIG.
In A, the reading area S is located immediately below the reading area S, that is, the reading area S
By completely closing the space between the light source 9 and the imaging lens means 12 with the mount 20 for the light source 9, as shown in FIG.
, Only the four side images 14 are imaged, and the portion of the bottom surface 6b of the electronic component 6 is hidden behind the mounting table 20 and does not appear. In the image pickup apparatus 1A shown in FIG. 4, the same or equivalent components as those of the image pickup apparatus 1 shown in FIG. 1 are denoted by the same reference numerals, and description thereof will be omitted.

【0020】また、側面観察ミラー8を二枚にし、電子
部品6の二側面6aに各側面観察ミラー8を対峙させる
ことにより、電子部品6の二側面6aのみにリードLが
配列されているSOPパッケージのようなタイプに極め
て有効であり、しかも、四枚の側面観察ミラー8をもつ
撮像装置に比べ更なる小型化や低コスト化が図れる。
The SOP in which the leads L are arranged only on the two side surfaces 6a of the electronic component 6 is formed by making the two side observation mirrors 8 and making each side observation mirror 8 face the two side surfaces 6a of the electronic component 6. This is extremely effective for a type such as a package, and can further reduce the size and cost as compared with an imaging device having four side-viewing mirrors 8.

【0021】また、本発明の撮像装置は、電子部品6の
撮像に限らず、吸着ノズル7の先端に設けられた吸着面
を読取り対象物として、その水平度や高さレベルをチェ
ックする場合にも利用される。
Further, the image pickup apparatus of the present invention is not limited to the image pickup of the electronic component 6, but may be used for checking the horizontality and the height level of the suction surface provided at the tip of the suction nozzle 7 as an object to be read. Is also used.

【0022】[0022]

【発明の効果】本発明による撮像装置は、以上のように
構成されているため、次のような効果を得る。すなわ
ち、レンズ系を一つの結像レンズ手段で構成し、撮像系
を一つの撮像手段で構成し、読取り領域に配置させる読
取り対象物の少なくとも一側面に対峙する位置に側面観
察ミラーを配置し、側面観察ミラーからの反射光を結像
レンズ手段に直接入射させ、撮像手段で読取り対象物の
少なくとも一側面の像を撮像することにより、撮像装置
を小型化することができ、部品点数を減らすことでコス
トの低減を図り、しかも読取り対象物の検査時間の短縮
化を可能にしている。
Since the imaging apparatus according to the present invention is configured as described above, the following effects can be obtained. That is, the lens system is constituted by one imaging lens unit, the imaging system is constituted by one imaging unit, and a side surface observation mirror is arranged at a position facing at least one side surface of a reading object to be arranged in a reading area, The reflected light from the side-viewing mirror is directly incident on the imaging lens means, and the image pickup means picks up an image of at least one side of the object to be read, so that the image pickup apparatus can be downsized and the number of parts can be reduced. Thus, the cost can be reduced, and the inspection time of the object to be read can be reduced.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明に係る撮像装置の一実施形態を示す斜視
図である。
FIG. 1 is a perspective view showing an embodiment of an imaging device according to the present invention.

【図2】図1に示した撮像装置の構成を示す概略図であ
る。
FIG. 2 is a schematic diagram illustrating a configuration of the imaging device illustrated in FIG. 1;

【図3】図1の撮像装置により得られた電子部品の画像
を示す図である。
FIG. 3 is a diagram showing an image of an electronic component obtained by the imaging device of FIG. 1;

【図4】本発明に係る撮像装置の他の実施形態を示す概
略図である。
FIG. 4 is a schematic diagram showing another embodiment of the imaging device according to the present invention.

【図5】図4の撮像装置により得られた電子部品の画像
を示す図である。
FIG. 5 is a diagram illustrating an image of an electronic component obtained by the imaging device of FIG. 4;

【符号の説明】[Explanation of symbols]

S…読取り領域、1,1A…撮像装置、3…照明系、4
…撮像系、5…レンズ系、6…電子部品(読取り対象
物)、6a…側面、6b…底面、7…吸着ノズル(読取
り対象物)、8…側面観察ミラー、9…LED(光
源)、12…結像レンズ手段、13…CCD(撮像手
段)。
S: reading area, 1, 1A: imaging device, 3: illumination system, 4
... Imaging system, 5 ... Lens system, 6 ... Electronic components (read object), 6a ... Side, 6b ... Bottom surface, 7 ... Suction nozzle (Read object), 8 ... Side observation mirror, 9 ... LED (light source), 12: imaging lens means, 13: CCD (imaging means).

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 読取り領域に配置される読取り対象物を
照明光により照らすための光源をもった照明系と、前記
照明系により照らされた際に生じる前記読取り対象物か
らの反射光を受光して前記読取り対象物を撮像する撮像
系と、前記撮像系と前記照明系との間に配置されて前記
反射光を前記撮像系上に結像させるレンズ系とを有する
撮像装置において、 前記レンズ系を一つの結像レンズ手段で構成し、前記撮
像系を一つの撮像手段で構成し、前記読取り領域に配置
させる前記読取り対象物の少なくとも一側面に対峙する
位置に側面観察ミラーを配置し、前記側面観察ミラーか
らの反射光を前記結像レンズ手段に直接入射させ、前記
撮像手段で前記読取り対象物の少なくとも一側面の像を
撮像することを特徴とする撮像装置。
1. An illumination system having a light source for illuminating an object to be read arranged in a reading area with illumination light, and receiving reflected light from the object to be read generated when the object is illuminated by the illumination system. An imaging system having an imaging system for imaging the object to be read, and a lens system arranged between the imaging system and the illumination system to form the reflected light on the imaging system. Is constituted by one imaging lens means, the imaging system is constituted by one imaging means, and a side observation mirror is arranged at a position facing at least one side of the object to be read arranged in the reading area, An imaging apparatus, wherein reflected light from a side-viewing mirror is directly incident on the imaging lens unit, and the imaging unit captures an image of at least one side surface of the object to be read.
【請求項2】 前記側面観察ミラーは、前記読取り領域
に配置させる前記読取り対象物の二側面に対峙させ、前
記撮像手段で前記読取り対象物の二側面の像を同時に撮
像することを特徴とする請求項1記載の撮像装置。
2. The apparatus according to claim 1, wherein the side-viewing mirror faces two sides of the object to be read arranged in the reading area, and the imaging means simultaneously captures images of the two sides of the object to be read. The imaging device according to claim 1.
【請求項3】 前記側面観察ミラーは、前記読取り領域
に配置させる前記読取り対象物の四側面に対峙させ、前
記撮像手段で前記読取り対象物の四側面の像を同時に撮
像することを特徴とする請求項1記載の撮像装置。
3. The apparatus according to claim 2, wherein the side-viewing mirror faces four sides of the object to be read arranged in the reading area, and the imaging means simultaneously captures images of the four sides of the object to be read. The imaging device according to claim 1.
【請求項4】 前記側面観察ミラーからの反射光及び前
記読取り対象物の底面からの反射光を前記結像レンズ手
段に直接入射させ、前記撮像手段で前記読取り対象物の
側面及び底面の像を同時に撮像することを特徴とする請
求項2又は3記載の撮像装置。
4. The reflected light from the side-viewing mirror and the reflected light from the bottom surface of the object to be read are directly incident on the imaging lens means, and the image pickup means forms images of the side surface and the bottom surface of the object to be read. The imaging device according to claim 2, wherein imaging is performed simultaneously.
JP8225391A 1996-08-27 1996-08-27 Image pickup system Pending JPH1068614A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8225391A JPH1068614A (en) 1996-08-27 1996-08-27 Image pickup system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8225391A JPH1068614A (en) 1996-08-27 1996-08-27 Image pickup system

Publications (1)

Publication Number Publication Date
JPH1068614A true JPH1068614A (en) 1998-03-10

Family

ID=16828632

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8225391A Pending JPH1068614A (en) 1996-08-27 1996-08-27 Image pickup system

Country Status (1)

Country Link
JP (1) JPH1068614A (en)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003065754A (en) * 2001-08-24 2003-03-05 Ricoh Co Ltd Method and device for measuring flatness of semiconductor device package
WO2004046643A1 (en) * 2002-11-21 2004-06-03 Fuji Machine Mfg. Co., Ltd. Device and method for acquiring image of electronic circuit part
JP2007071775A (en) * 2005-09-08 2007-03-22 Tokyo Weld Co Ltd Visual examination device
JP2009276338A (en) * 2008-04-14 2009-11-26 Ueno Seiki Kk Visual inspecting apparatus
JP2010122027A (en) * 2008-11-19 2010-06-03 Nagoya Institute Of Technology Three-dimensional ct measurement system
US8359735B2 (en) 2009-04-17 2013-01-29 Samsung Techwin Co., Ltd. Head assembly for chip mounter
JP2013130535A (en) * 2011-12-22 2013-07-04 Nippon Telegr & Teleph Corp <Ntt> Three-dimensional shape measurement system
JP2016004087A (en) * 2014-06-13 2016-01-12 日本電産コパル株式会社 Image-capturing device, and mounted component image-capturing device
WO2016092673A1 (en) * 2014-12-11 2016-06-16 富士機械製造株式会社 Component-mounting machine
JP2016173288A (en) * 2015-03-17 2016-09-29 株式会社オオシマ設備 Screw inspection device
CN108918528A (en) * 2018-06-01 2018-11-30 深圳回收宝科技有限公司 A kind of endpoint detection methods, device and storage medium
JP2020091300A (en) * 2015-06-05 2020-06-11 ケーエルエー コーポレイション Apparatus for inspecting side faces of semiconductor devices

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003065754A (en) * 2001-08-24 2003-03-05 Ricoh Co Ltd Method and device for measuring flatness of semiconductor device package
JP4557471B2 (en) * 2001-08-24 2010-10-06 株式会社リコー Method and apparatus for testing flatness of semiconductor device package
WO2004046643A1 (en) * 2002-11-21 2004-06-03 Fuji Machine Mfg. Co., Ltd. Device and method for acquiring image of electronic circuit part
JP2007071775A (en) * 2005-09-08 2007-03-22 Tokyo Weld Co Ltd Visual examination device
JP2009276338A (en) * 2008-04-14 2009-11-26 Ueno Seiki Kk Visual inspecting apparatus
JP2010122027A (en) * 2008-11-19 2010-06-03 Nagoya Institute Of Technology Three-dimensional ct measurement system
US8359735B2 (en) 2009-04-17 2013-01-29 Samsung Techwin Co., Ltd. Head assembly for chip mounter
JP2013130535A (en) * 2011-12-22 2013-07-04 Nippon Telegr & Teleph Corp <Ntt> Three-dimensional shape measurement system
JP2016004087A (en) * 2014-06-13 2016-01-12 日本電産コパル株式会社 Image-capturing device, and mounted component image-capturing device
WO2016092673A1 (en) * 2014-12-11 2016-06-16 富士機械製造株式会社 Component-mounting machine
JPWO2016092673A1 (en) * 2014-12-11 2017-09-21 富士機械製造株式会社 Component mounter
JP2016173288A (en) * 2015-03-17 2016-09-29 株式会社オオシマ設備 Screw inspection device
JP2020091300A (en) * 2015-06-05 2020-06-11 ケーエルエー コーポレイション Apparatus for inspecting side faces of semiconductor devices
CN108918528A (en) * 2018-06-01 2018-11-30 深圳回收宝科技有限公司 A kind of endpoint detection methods, device and storage medium

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