TW200700718A - X-ray inspection equipment - Google Patents

X-ray inspection equipment

Info

Publication number
TW200700718A
TW200700718A TW095111272A TW95111272A TW200700718A TW 200700718 A TW200700718 A TW 200700718A TW 095111272 A TW095111272 A TW 095111272A TW 95111272 A TW95111272 A TW 95111272A TW 200700718 A TW200700718 A TW 200700718A
Authority
TW
Taiwan
Prior art keywords
ray inspection
management area
inspected object
carrying
side shield
Prior art date
Application number
TW095111272A
Other languages
English (en)
Chinese (zh)
Other versions
TWI309298B (ko
Inventor
Masamitsu Nakatani
Original Assignee
Kobe Steel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kobe Steel Ltd filed Critical Kobe Steel Ltd
Publication of TW200700718A publication Critical patent/TW200700718A/zh
Application granted granted Critical
Publication of TWI309298B publication Critical patent/TWI309298B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G01V5/20—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/631—Specific applications or type of materials large structures, walls
TW095111272A 2005-06-17 2006-03-30 X-ray inspection equipment TW200700718A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005177363A JP2006349546A (ja) 2005-06-17 2005-06-17 Ｘ線検査設備

Publications (2)

Publication Number Publication Date
TW200700718A true TW200700718A (en) 2007-01-01
TWI309298B TWI309298B (ko) 2009-05-01

Family

ID=37519221

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095111272A TW200700718A (en) 2005-06-17 2006-03-30 X-ray inspection equipment

Country Status (4)

Country Link
JP (1) JP2006349546A (ko)
KR (1) KR100891765B1 (ko)
CN (1) CN1880948A (ko)
TW (1) TW200700718A (ko)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102226773B (zh) * 2011-03-30 2013-03-13 马军 X射线探伤机检测试验台
KR101374634B1 (ko) * 2012-08-10 2014-03-17 주식회사 쎄크 인라인 엑스-레이 차폐 도어유닛 및 이를 구비한 엑스-레이 검사시스템
CN102879408B (zh) * 2012-09-27 2014-11-12 南京奥特电气股份有限公司 管道焊缝探伤驱动装置
JP5975572B2 (ja) * 2013-01-28 2016-08-23 株式会社Ｉｈｉ検査計測 Ｘ線検査装置及び方法
JP5996451B2 (ja) * 2013-02-06 2016-09-21 株式会社Ｉｈｉ検査計測 Ｘ線検査用車両搬送装置
JP5996452B2 (ja) * 2013-02-12 2016-09-21 株式会社Ｉｈｉ検査計測 Ｘ線検査用車両搬送装置
JP6162496B2 (ja) * 2013-06-19 2017-07-12 株式会社Ｉｈｉ検査計測 Ｘ線検査用車両の搬送装置
JP2018159661A (ja) * 2017-03-23 2018-10-11 三菱電機プラントエンジニアリング株式会社 車両汚染検査装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL86229A (en) * 1987-05-26 1990-09-17 Science Applic Int Corp Explosive detection system
JPH02101254U (ko) * 1989-01-30 1990-08-13
JP3313755B2 (ja) * 1992-04-30 2002-08-12 東芝アイティー・コントロールシステム株式会社 断層撮影装置

Also Published As

Publication number Publication date
JP2006349546A (ja) 2006-12-28
KR20060132469A (ko) 2006-12-21
TWI309298B (ko) 2009-05-01
CN1880948A (zh) 2006-12-20
KR100891765B1 (ko) 2009-04-07

Similar Documents

Publication Publication Date Title
TW200700718A (en) X-ray inspection equipment
KR102055037B1 (ko) X-선 분석장치가 결합된 육류가공장치
HK1104181A1 (en) Eliminating cross-talk in a backscatter inspection portal comprising multiples sources by ensuring that only one source is emitting radiation at a time
WO2011115930A3 (en) Personnel screening system
US10571404B2 (en) Defect inspection apparatus, method, and program
US10168288B2 (en) System for radiography imaging and method of operating such system
ATE489619T1 (de) Verfahren zur abbildung der strahlung eines objekts auf einer detektorvorrichtung und inspektionsvorrichtung zur inspektion eines objekts
EP3115738A1 (de) Optoelektronisches messgerät und verfahren zur störungserkennung
EP2378058A3 (en) Monitoring sand screen
Schuetz et al. Reducing environmental scattering in industrial computed tomography by system redesign
WO2010112161A1 (de) Anlage zur prüfung von objekten mittels elektromagnetischer strahlen, insbesondere mittels röntgenstrahlen
CN103968785B (zh) 一种测厚仪及其使用、检修方法
CN103293174B (zh) 一种多探测器及多光管的x射线荧光光谱仪及针对大体积样品的x射线荧光光谱检测方法
DE102013020896B4 (de) Vorrichtung und Verfahren zur Überwachung eines Objektes in einem explosionsgeschützten Bereich mittels Ultraschall
JP2013213748A (ja) 内部構造検査装置および内部構造監視システム
CN202383090U (zh) 变剂量率辐照试验装置
JP6791479B2 (ja) 検査システム
GB2498308A (en) Automated personnel screening system and method
JP2009236542A (ja) Ｘ線検査装置
JP2010122103A (ja) Ｘ線検査方法およびｘ線検査装置
JP5255736B1 (ja) 放射能汚染の検査装置、その検査方法及びその検査プログラム
AU2012101931A4 (en) Antenna installations
EP4134664A3 (en) Airtight box for x-ray diffraction measurements
KR20150007515A (ko) 산업설비 현장 이동 감시장치
EP1983328B1 (de) Rückwärtsstreuung mit Hintergrundausblendung

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees