TW200643421A - Substrate inspection tool, substrate inspection device, and inspection contactor - Google Patents

Substrate inspection tool, substrate inspection device, and inspection contactor

Info

Publication number
TW200643421A
TW200643421A TW095104417A TW95104417A TW200643421A TW 200643421 A TW200643421 A TW 200643421A TW 095104417 A TW095104417 A TW 095104417A TW 95104417 A TW95104417 A TW 95104417A TW 200643421 A TW200643421 A TW 200643421A
Authority
TW
Taiwan
Prior art keywords
inspection
contactor
disposed
coil spring
substrate
Prior art date
Application number
TW095104417A
Other languages
English (en)
Inventor
Minoru Kato
Original Assignee
Nidec Read Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nidec Read Corp filed Critical Nidec Read Corp
Publication of TW200643421A publication Critical patent/TW200643421A/zh

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
TW095104417A 2005-02-15 2006-02-09 Substrate inspection tool, substrate inspection device, and inspection contactor TW200643421A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005037499A JP2006226702A (ja) 2005-02-15 2005-02-15 基板検査用治具、基板検査装置及び検査用接触子

Publications (1)

Publication Number Publication Date
TW200643421A true TW200643421A (en) 2006-12-16

Family

ID=36988221

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095104417A TW200643421A (en) 2005-02-15 2006-02-09 Substrate inspection tool, substrate inspection device, and inspection contactor

Country Status (2)

Country Link
JP (1) JP2006226702A (zh)
TW (1) TW200643421A (zh)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4955458B2 (ja) * 2007-05-25 2012-06-20 日置電機株式会社 プローブユニットおよび回路基板検査装置
JP2009047512A (ja) * 2007-08-17 2009-03-05 Koyo Technos:Kk 検査冶具および検査装置
JP5486745B2 (ja) 2008-09-29 2014-05-07 ウェントワース ラボラトリーズ、インク． ナノチューブプローブを含むプローブカードおよびその製造方法
JP5471144B2 (ja) * 2009-08-07 2014-04-16 大日本印刷株式会社 基板検査用治具および基板検査方法
JP2012088122A (ja) * 2010-10-18 2012-05-10 Mitsubishi Cable Ind Ltd 絶縁被覆プローブピン及びその製造方法
WO2012078944A1 (en) * 2010-12-09 2012-06-14 Wentworth Laboratories, Inc. Probe card assemblies and probe pins including carbon nanotubes
TWI542889B (zh) * 2011-06-03 2016-07-21 Hioki Electric Works A detection unit, a circuit board detection device, and a detection unit manufacturing method
JP2013003002A (ja) * 2011-06-17 2013-01-07 Hioki Ee Corp プローブユニットおよび回路基板検査装置
JP5868239B2 (ja) * 2012-03-27 2016-02-24 株式会社日本マイクロニクス プローブ及びプローブカード

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4027935A (en) * 1976-06-21 1977-06-07 International Business Machines Corporation Contact for an electrical contactor assembly
US4849898A (en) * 1988-05-18 1989-07-18 Management Information Technologies, Inc. Method and apparatus to identify the relation of meaning between words in text expressions
JPH05119098A (ja) * 1991-10-28 1993-05-14 Toppan Printing Co Ltd プリント配線板布線検査装置
JP2002055118A (ja) * 2000-08-11 2002-02-20 Citizen Watch Co Ltd プローバー
JP2002202337A (ja) * 2001-01-04 2002-07-19 Takashi Nansai ファインピッチ基板検査用治具
JP2004163228A (ja) * 2002-11-12 2004-06-10 Toyo Denshi Giken Kk プローブとそれを用いたコンタクト装置
JP2004257831A (ja) * 2003-02-25 2004-09-16 Micronics Japan Co Ltd 接触子及び電気的接続装置

Also Published As

Publication number Publication date
JP2006226702A (ja) 2006-08-31

Similar Documents

Publication Publication Date Title
TW200643421A (en) Substrate inspection tool, substrate inspection device, and inspection contactor
TW200633315A (en) Electrical connector
SG100762A1 (en) Contact structure and production method thereof and probe contact assembly using same
ATE459083T1 (de) Anordnung für die oberflächenmontage eines elektrischen bauteils durch löten und elektrisches bauteil für eine solche anordnung
EP1946696A4 (en) ELECTRONIC EQUIPMENT
TW200638617A (en) Electrical connector with provisions to reduce thermally-induced stresses
SG97194A1 (en) Contact structure and production method thereof and probe contact assembly using same
MY141171A (en) Electric connecting device and contactor
WO2006107788A3 (en) Multiple position swivel lamp with integral switch contacts
WO2006027355A3 (de) Halterungseinrichtung mit einem darauf befestigten schaltgerät
ATE368290T1 (de) Tastschalter
HK1101382A1 (en) Electrical connector device for use with elevator load bearing members
JP2007213964A5 (zh)
PL1724878T3 (pl) Beztulejkowy, tłoczony i formowany styk gniazdowy
EP1653488A3 (de) Subminiaturschalter
CN101292401A (zh) 电子器件的插座
TW200704320A (en) Electrical conncetor
WO2005104256A3 (de) Elektrische funktionseinheit und verfahren zu deren herstellung
TW200629297A (en) Channel fastener
US20120018291A1 (en) Switch assembly
TW200734661A (en) Electronic component device testing apparatus
TW200729517A (en) Passive electrically testable acceleration and voltage measurement devices
TW200512391A (en) Supporting unit for positioning stage and mounting structure therefor
TWI253661B (en) Point-push spring, sheet with point-push spring and switch device
CN206742120U (zh) 按键及电子装置