TW200617349A - Method, device for display panel inspection and its manufacturing method - Google Patents
Method, device for display panel inspection and its manufacturing methodInfo
- Publication number
- TW200617349A TW200617349A TW094126475A TW94126475A TW200617349A TW 200617349 A TW200617349 A TW 200617349A TW 094126475 A TW094126475 A TW 094126475A TW 94126475 A TW94126475 A TW 94126475A TW 200617349 A TW200617349 A TW 200617349A
- Authority
- TW
- Taiwan
- Prior art keywords
- height
- signals
- processes
- spraying
- inspection
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
- H01J9/20—Manufacture of screens on or from which an image or pattern is formed, picked up, converted or stored; Applying coatings to the vessel
- H01J9/22—Applying luminescent coatings
- H01J9/227—Applying luminescent coatings with luminescent material discontinuously arranged, e.g. in dots or lines
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/20—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J11/00—Gas-filled discharge tubes with alternating current induction of the discharge, e.g. alternating current plasma display panels [AC-PDP]; Gas-filled discharge tubes without any main electrode inside the vessel; Gas-filled discharge tubes with at least one main electrode outside the vessel
- H01J11/20—Constructional details
- H01J11/34—Vessels, containers or parts thereof, e.g. substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
- H01J9/42—Measurement or testing during manufacture
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004229676 | 2004-08-05 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200617349A true TW200617349A (en) | 2006-06-01 |
Family
ID=35787194
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094126475A TW200617349A (en) | 2004-08-05 | 2005-08-04 | Method, device for display panel inspection and its manufacturing method |
Country Status (5)
Country | Link |
---|---|
JP (1) | JPWO2006013915A1 (fr) |
KR (1) | KR20070057787A (fr) |
CN (1) | CN1993599A (fr) |
TW (1) | TW200617349A (fr) |
WO (1) | WO2006013915A1 (fr) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5050398B2 (ja) * | 2006-02-22 | 2012-10-17 | パナソニック株式会社 | ディスプレイパネルの検査方法および検査装置ならびに製造方法 |
CN104588270A (zh) * | 2014-12-30 | 2015-05-06 | 广东旭业光电科技股份有限公司 | 可实现快速检测镜头漏点胶的方法 |
KR101777290B1 (ko) * | 2016-01-12 | 2017-09-14 | 에스엔유 프리시젼 주식회사 | 광학측정장치의 데이터 평가장치 및 데이터 평가방법 |
JP6822864B2 (ja) * | 2017-01-31 | 2021-01-27 | アルファーデザイン株式会社 | 情報処理装置、情報処理方法、プログラム、 |
JP2019168315A (ja) * | 2018-03-23 | 2019-10-03 | 三菱電機株式会社 | 測定装置、回路基板、表示装置、および測定方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07311025A (ja) * | 1994-05-17 | 1995-11-28 | Komatsu Ltd | 3次元形状検査装置 |
JP3113212B2 (ja) * | 1996-05-09 | 2000-11-27 | 富士通株式会社 | プラズマディスプレイパネルの蛍光体層形成装置および蛍光体塗布方法 |
JP3725093B2 (ja) * | 2002-05-13 | 2005-12-07 | 株式会社日立国際電気 | リブ内蛍光体埋込量検査方法およびその検査装置 |
JP4010188B2 (ja) * | 2002-05-31 | 2007-11-21 | 東レ株式会社 | 塗膜の厚さ測定方法および測定装置と塗膜形成部材の製造方法 |
-
2005
- 2005-08-04 KR KR1020077002842A patent/KR20070057787A/ko not_active Application Discontinuation
- 2005-08-04 WO PCT/JP2005/014275 patent/WO2006013915A1/fr active Application Filing
- 2005-08-04 CN CNA2005800264780A patent/CN1993599A/zh active Pending
- 2005-08-04 JP JP2006531530A patent/JPWO2006013915A1/ja active Pending
- 2005-08-04 TW TW094126475A patent/TW200617349A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
CN1993599A (zh) | 2007-07-04 |
JPWO2006013915A1 (ja) | 2008-05-01 |
KR20070057787A (ko) | 2007-06-07 |
WO2006013915A1 (fr) | 2006-02-09 |
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