TW200617349A - Method, device for display panel inspection and its manufacturing method - Google Patents

Method, device for display panel inspection and its manufacturing method

Info

Publication number
TW200617349A
TW200617349A TW094126475A TW94126475A TW200617349A TW 200617349 A TW200617349 A TW 200617349A TW 094126475 A TW094126475 A TW 094126475A TW 94126475 A TW94126475 A TW 94126475A TW 200617349 A TW200617349 A TW 200617349A
Authority
TW
Taiwan
Prior art keywords
height
signals
processes
spraying
inspection
Prior art date
Application number
TW094126475A
Other languages
Chinese (zh)
Inventor
Osamu Kuramata
Hiromichi Sasamoto
Yasuki Shimizu
Original Assignee
Toray Industries
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toray Industries filed Critical Toray Industries
Publication of TW200617349A publication Critical patent/TW200617349A/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
    • H01J9/20—Manufacture of screens on or from which an image or pattern is formed, picked up, converted or stored; Applying coatings to the vessel
    • H01J9/22—Applying luminescent coatings
    • H01J9/227—Applying luminescent coatings with luminescent material discontinuously arranged, e.g. in dots or lines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/20—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J11/00—Gas-filled discharge tubes with alternating current induction of the discharge, e.g. alternating current plasma display panels [AC-PDP]; Gas-filled discharge tubes without any main electrode inside the vessel; Gas-filled discharge tubes with at least one main electrode outside the vessel
    • H01J11/20—Constructional details
    • H01J11/34—Vessels, containers or parts thereof, e.g. substrates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
    • H01J9/42—Measurement or testing during manufacture

Abstract

A method, device for display panel inspection and its manufacturing method, characterized in having height measurement means, wherein making substrate or height measurement means move toward the direction intersected with liquidized material which is sprayed by predetermined interval while measuring the height of the substrate of liquidized material separately. It extracts the height of each liquidized material and uses the connected height signals as inspection signals after obtaining approximate height shape signals from separated height shape signals and measures the spraying amount of each liquidized material from inspection signals. By inspecting the state of spraying processes after the processes of fluorescence paste spraying, it can discover the cause of defect occurred continuously in the spraying processes and suppresses the substrates of defection and loss to minimum and reconstruct the processes rapidly.
TW094126475A 2004-08-05 2005-08-04 Method, device for display panel inspection and its manufacturing method TW200617349A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004229676 2004-08-05

Publications (1)

Publication Number Publication Date
TW200617349A true TW200617349A (en) 2006-06-01

Family

ID=35787194

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094126475A TW200617349A (en) 2004-08-05 2005-08-04 Method, device for display panel inspection and its manufacturing method

Country Status (5)

Country Link
JP (1) JPWO2006013915A1 (en)
KR (1) KR20070057787A (en)
CN (1) CN1993599A (en)
TW (1) TW200617349A (en)
WO (1) WO2006013915A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5050398B2 (en) * 2006-02-22 2012-10-17 パナソニック株式会社 Display panel inspection method, inspection apparatus, and manufacturing method
CN104588270A (en) * 2014-12-30 2015-05-06 广东旭业光电科技股份有限公司 Method capable of quickly detecting lens missing glue
KR101777290B1 (en) * 2016-01-12 2017-09-14 에스엔유 프리시젼 주식회사 Data evaluating device of optical measuring device and data evaluating method of optical measuring device
JP6822864B2 (en) * 2017-01-31 2021-01-27 アルファーデザイン株式会社 Information processing equipment, information processing methods, programs,
JP2019168315A (en) * 2018-03-23 2019-10-03 三菱電機株式会社 Measurement device, circuit board, display device, and method for measurement

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07311025A (en) * 1994-05-17 1995-11-28 Komatsu Ltd Three-dimensional shape inspection device
JP3113212B2 (en) * 1996-05-09 2000-11-27 富士通株式会社 Plasma display panel phosphor layer forming apparatus and phosphor coating method
JP3725093B2 (en) * 2002-05-13 2005-12-07 株式会社日立国際電気 In-rib phosphor embedding amount inspection method and inspection apparatus therefor
JP4010188B2 (en) * 2002-05-31 2007-11-21 東レ株式会社 Method for measuring thickness of coating film and measuring apparatus and method for manufacturing coating film forming member

Also Published As

Publication number Publication date
JPWO2006013915A1 (en) 2008-05-01
CN1993599A (en) 2007-07-04
WO2006013915A1 (en) 2006-02-09
KR20070057787A (en) 2007-06-07

Similar Documents

Publication Publication Date Title
TW200617349A (en) Method, device for display panel inspection and its manufacturing method
EP1881374A3 (en) Inspection method and apparatus, lithographic apparatus, lithographic process line and device manufacturing method
WO2005098446A3 (en) Biomarkers for ovarian cancer
EP1874107A3 (en) Method, device and program for setting a reference value for substrate inspection
WO2011068768A3 (en) Apparatus and method for transferring particulate material
WO2007065012A3 (en) Apparatus and method for adjusting an orientation of probes
WO2007133581A3 (en) Apparatus and method for characterizing defects in a transparent substrate
WO2006109275A3 (en) Test strip coding and quality measurement
WO2007035664A3 (en) Apparatus and method of testing singulated dies
WO2009012343A3 (en) Arrays, substrates, devices, methods and systems for detecting target molecules
GB0513901D0 (en) Method and apparatus for measuring the structural integrity of a safe-life aircraft component
TW200643392A (en) Method of calibrating zero offset of a pressure sensor
TW200636409A (en) Substrate inspecting device
TW200801508A (en) Method and apparatus for detection of mechanical defects in an ingot piece composed of semiconductor material
DE102007023223A8 (en) Liquid crystal display, substrate for such and method for producing the substrate
SG130027A1 (en) Display panel inspection method and device, and display panel manufacturing method
WO2019053700A3 (en) Function-based probes for environmental microbiome analysis and methods of making and using the same
EP1927968A4 (en) Display, its inspecting method, its manufacturing method, display panel inspecting method, and display panel manufacturing method
WO2011006913A8 (en) Optimized lancet strip
WO2007143326A3 (en) Mini-prober for tft-lcd testing
CN207396279U (en) A kind of waterproof tester of fabric
WO2007130517A3 (en) Extended probe tips
CN205879757U (en) Rotation type salt atmosphere test machine
WO2011021183A8 (en) Aligned nanoarray and method for fabricating the same
EP2079857A4 (en) Method for measuring the active koh concentration in a koh etching process