TW200534189A - Method for controlling a measuring apparatus - Google Patents

Method for controlling a measuring apparatus Download PDF

Info

Publication number
TW200534189A
TW200534189A TW093137459A TW93137459A TW200534189A TW 200534189 A TW200534189 A TW 200534189A TW 093137459 A TW093137459 A TW 093137459A TW 93137459 A TW93137459 A TW 93137459A TW 200534189 A TW200534189 A TW 200534189A
Authority
TW
Taiwan
Prior art keywords
measurement
mentioned
data
output
module
Prior art date
Application number
TW093137459A
Other languages
English (en)
Chinese (zh)
Inventor
Takuya Otani
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of TW200534189A publication Critical patent/TW200534189A/zh

Links

Classifications

    • E—FIXED CONSTRUCTIONS
    • E05—LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
    • E05D—HINGES OR SUSPENSION DEVICES FOR DOORS, WINDOWS OR WINGS
    • E05D7/00—Hinges or pivots of special construction
    • E05D7/04—Hinges adjustable relative to the wing or the frame
    • E05D7/0415—Hinges adjustable relative to the wing or the frame with adjusting drive means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • E—FIXED CONSTRUCTIONS
    • E05—LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
    • E05D—HINGES OR SUSPENSION DEVICES FOR DOORS, WINDOWS OR WINGS
    • E05D3/00—Hinges with pins
    • E05D3/02—Hinges with pins with one pin
    • E—FIXED CONSTRUCTIONS
    • E05—LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
    • E05D—HINGES OR SUSPENSION DEVICES FOR DOORS, WINDOWS OR WINGS
    • E05D7/00—Hinges or pivots of special construction
    • E05D7/08—Hinges or pivots of special construction for use in suspensions comprising two spigots placed at opposite edges of the wing, especially at the top and the bottom, e.g. trunnions
    • E05D7/081—Hinges or pivots of special construction for use in suspensions comprising two spigots placed at opposite edges of the wing, especially at the top and the bottom, e.g. trunnions the pivot axis of the wing being situated near one edge of the wing, especially at the top and bottom, e.g. trunnions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • E—FIXED CONSTRUCTIONS
    • E05—LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
    • E05Y—INDEXING SCHEME ASSOCIATED WITH SUBCLASSES E05D AND E05F, RELATING TO CONSTRUCTION ELEMENTS, ELECTRIC CONTROL, POWER SUPPLY, POWER SIGNAL OR TRANSMISSION, USER INTERFACES, MOUNTING OR COUPLING, DETAILS, ACCESSORIES, AUXILIARY OPERATIONS NOT OTHERWISE PROVIDED FOR, APPLICATION THEREOF
    • E05Y2600/00—Mounting or coupling arrangements for elements provided for in this subclass
    • E05Y2600/60—Mounting or coupling members; Accessories therefor
    • E05Y2600/626—Plates or brackets
    • E—FIXED CONSTRUCTIONS
    • E05—LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
    • E05Y—INDEXING SCHEME ASSOCIATED WITH SUBCLASSES E05D AND E05F, RELATING TO CONSTRUCTION ELEMENTS, ELECTRIC CONTROL, POWER SUPPLY, POWER SIGNAL OR TRANSMISSION, USER INTERFACES, MOUNTING OR COUPLING, DETAILS, ACCESSORIES, AUXILIARY OPERATIONS NOT OTHERWISE PROVIDED FOR, APPLICATION THEREOF
    • E05Y2900/00—Application of doors, windows, wings or fittings thereof
    • E05Y2900/10—Application of doors, windows, wings or fittings thereof for buildings or parts thereof
    • E05Y2900/13—Type of wing
    • E05Y2900/132—Doors
    • E05Y2900/134—Fire doors

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Mechanical Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Analogue/Digital Conversion (AREA)
  • Tests Of Electronic Circuits (AREA)
TW093137459A 2004-03-22 2004-12-03 Method for controlling a measuring apparatus TW200534189A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004083340A JP2005274145A (ja) 2004-03-22 2004-03-22 測定方法、モジュールおよびシステム

Publications (1)

Publication Number Publication Date
TW200534189A true TW200534189A (en) 2005-10-16

Family

ID=34987434

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093137459A TW200534189A (en) 2004-03-22 2004-12-03 Method for controlling a measuring apparatus

Country Status (5)

Country Link
US (1) US7430488B2 (enExample)
JP (1) JP2005274145A (enExample)
KR (1) KR20060044487A (enExample)
CN (1) CN1674053A (enExample)
TW (1) TW200534189A (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7847715B2 (en) * 2008-08-04 2010-12-07 Honeywell International Inc. Segmented optics circuit drive for closed loop fiber optic sensors

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01196518A (ja) * 1988-01-30 1989-08-08 Dainippon Printing Co Ltd センサカード
JPH04105073A (ja) * 1990-08-24 1992-04-07 Yokogawa Electric Corp 実効値測定装置
JPH0572292A (ja) * 1991-09-12 1993-03-23 Toshiba Corp アナログ入力装置
JP2981127B2 (ja) * 1994-08-11 1999-11-22 本田技研工業株式会社 異種信号同時測定装置
JP3489488B2 (ja) * 1999-06-07 2004-01-19 ティアック株式会社 データレコード装置及びモジュール装置
DE10082824T1 (de) 1999-08-17 2002-02-28 Advantest Corp Adapter zum Steuern einer Meßvorrichtung, eine Meßvorrichtung, eine Steuervorrichtung für eine Meßvorrichtung, ein Verfahren zum Verarbeiten der Messung und ein Aufzeichnungsmedium
US6621763B2 (en) * 2001-07-23 2003-09-16 Siemens Milltronics Process Instruments Inc. Power saving technique for pulse-echo acoustic ranging systems

Also Published As

Publication number Publication date
US7430488B2 (en) 2008-09-30
CN1674053A (zh) 2005-09-28
JP2005274145A (ja) 2005-10-06
US20050209809A1 (en) 2005-09-22
KR20060044487A (ko) 2006-05-16

Similar Documents

Publication Publication Date Title
WO2014012343A1 (zh) 基于片上系统或系统级封装的内建自测试系统
JPS60124125A (ja) 多入力信号高速アナログ・デジタル変換回路
KR20140067437A (ko) Ｃｍｏｓ 이미지 센서를 테스트하는 테스트 시스템 및 이의 구동 방법
CN111819796A (zh) 模数转换方法、装置、芯片、电子设备及存储介质
JPWO2010061523A1 (ja) 試験方法及びそれに用いられるプログラム製品
CN114690025A (zh) 一种多工位并行测试方法
CN111856163A (zh) 一种非接触式单杆异步核相方法
CN106992782B (zh) 一种定时同步dac静态参数测试方法
CN101568845B (zh) 用于对待测设备进行测试的测试器、方法和计算机程序
WO2006022026A1 (ja) 半導体のテストシステム
CN102006496B (zh) 实现视频信号测量的数据处理设备及方法
JP2005274145A (ja) 測定方法、モジュールおよびシステム
CN115825843A (zh) 一种电能表现场检测系统、方法及装置
JP4040718B2 (ja) 測定装置
US20080082877A1 (en) Integrated testing system for wireless and high frequency products and a testing method thereof
JPH07243875A (ja) デバイスの測定装置及び測定方法
JP2002350510A (ja) 半導体試験装置
US6973395B2 (en) Observation and/or failure inspection apparatus, method and program therefor
JPH04240578A (ja) Ｉｃテスター
CN104849682B (zh) 集成电路标准样片特性参量测量装置及方法
JP3155969U (ja) 被測定デバイスの試験システム
JPS58145217A (ja) デジタル・フイルタ
JP3655769B2 (ja) 製品検査システム
JP3554959B2 (ja) Ｉｃテスタ
JP2004053513A (ja) 測定器における演算の分散処理方法