CN1674053A - 测定方法、模块及系统 - Google Patents

测定方法、模块及系统 Download PDF

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Publication number
CN1674053A
CN1674053A CNA2004101025248A CN200410102524A CN1674053A CN 1674053 A CN1674053 A CN 1674053A CN A2004101025248 A CNA2004101025248 A CN A2004101025248A CN 200410102524 A CN200410102524 A CN 200410102524A CN 1674053 A CN1674053 A CN 1674053A
Authority
CN
China
Prior art keywords
mentioned
data
module
mensuration
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CNA2004101025248A
Other languages
English (en)
Chinese (zh)
Inventor
大谷卓也
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of CN1674053A publication Critical patent/CN1674053A/zh
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • E—FIXED CONSTRUCTIONS
    • E05—LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
    • E05D—HINGES OR SUSPENSION DEVICES FOR DOORS, WINDOWS OR WINGS
    • E05D7/00—Hinges or pivots of special construction
    • E05D7/04—Hinges adjustable relative to the wing or the frame
    • E05D7/0415—Hinges adjustable relative to the wing or the frame with adjusting drive means
    • E—FIXED CONSTRUCTIONS
    • E05—LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
    • E05D—HINGES OR SUSPENSION DEVICES FOR DOORS, WINDOWS OR WINGS
    • E05D3/00—Hinges with pins
    • E05D3/02—Hinges with pins with one pin
    • E—FIXED CONSTRUCTIONS
    • E05—LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
    • E05D—HINGES OR SUSPENSION DEVICES FOR DOORS, WINDOWS OR WINGS
    • E05D7/00—Hinges or pivots of special construction
    • E05D7/08—Hinges or pivots of special construction for use in suspensions comprising two spigots placed at opposite edges of the wing, especially at the top and the bottom, e.g. trunnions
    • E05D7/081—Hinges or pivots of special construction for use in suspensions comprising two spigots placed at opposite edges of the wing, especially at the top and the bottom, e.g. trunnions the pivot axis of the wing being situated near one edge of the wing, especially at the top and bottom, e.g. trunnions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • E—FIXED CONSTRUCTIONS
    • E05—LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
    • E05Y—INDEXING SCHEME ASSOCIATED WITH SUBCLASSES E05D AND E05F, RELATING TO CONSTRUCTION ELEMENTS, ELECTRIC CONTROL, POWER SUPPLY, POWER SIGNAL OR TRANSMISSION, USER INTERFACES, MOUNTING OR COUPLING, DETAILS, ACCESSORIES, AUXILIARY OPERATIONS NOT OTHERWISE PROVIDED FOR, APPLICATION THEREOF
    • E05Y2600/00—Mounting or coupling arrangements for elements provided for in this subclass
    • E05Y2600/60—Mounting or coupling members; Accessories therefor
    • E05Y2600/626—Plates or brackets
    • E—FIXED CONSTRUCTIONS
    • E05—LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
    • E05Y—INDEXING SCHEME ASSOCIATED WITH SUBCLASSES E05D AND E05F, RELATING TO CONSTRUCTION ELEMENTS, ELECTRIC CONTROL, POWER SUPPLY, POWER SIGNAL OR TRANSMISSION, USER INTERFACES, MOUNTING OR COUPLING, DETAILS, ACCESSORIES, AUXILIARY OPERATIONS NOT OTHERWISE PROVIDED FOR, APPLICATION THEREOF
    • E05Y2900/00—Application of doors, windows, wings or fittings thereof
    • E05Y2900/10—Application of doors, windows, wings or fittings thereof for buildings or parts thereof
    • E05Y2900/13—Type of wing
    • E05Y2900/132—Doors
    • E05Y2900/134—Fire doors

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Mechanical Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Analogue/Digital Conversion (AREA)
  • Tests Of Electronic Circuits (AREA)
CNA2004101025248A 2004-03-22 2004-12-24 测定方法、模块及系统 Pending CN1674053A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004083340A JP2005274145A (ja) 2004-03-22 2004-03-22 測定方法、モジュールおよびシステム
JP2004083340 2004-03-22

Publications (1)

Publication Number Publication Date
CN1674053A true CN1674053A (zh) 2005-09-28

Family

ID=34987434

Family Applications (1)

Application Number Title Priority Date Filing Date
CNA2004101025248A Pending CN1674053A (zh) 2004-03-22 2004-12-24 测定方法、模块及系统

Country Status (5)

Country Link
US (1) US7430488B2 (enExample)
JP (1) JP2005274145A (enExample)
KR (1) KR20060044487A (enExample)
CN (1) CN1674053A (enExample)
TW (1) TW200534189A (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7847715B2 (en) * 2008-08-04 2010-12-07 Honeywell International Inc. Segmented optics circuit drive for closed loop fiber optic sensors

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01196518A (ja) * 1988-01-30 1989-08-08 Dainippon Printing Co Ltd センサカード
JPH04105073A (ja) * 1990-08-24 1992-04-07 Yokogawa Electric Corp 実効値測定装置
JPH0572292A (ja) * 1991-09-12 1993-03-23 Toshiba Corp アナログ入力装置
JP2981127B2 (ja) * 1994-08-11 1999-11-22 本田技研工業株式会社 異種信号同時測定装置
JP3489488B2 (ja) * 1999-06-07 2004-01-19 ティアック株式会社 データレコード装置及びモジュール装置
DE10082824T1 (de) 1999-08-17 2002-02-28 Advantest Corp Adapter zum Steuern einer Meßvorrichtung, eine Meßvorrichtung, eine Steuervorrichtung für eine Meßvorrichtung, ein Verfahren zum Verarbeiten der Messung und ein Aufzeichnungsmedium
US6621763B2 (en) * 2001-07-23 2003-09-16 Siemens Milltronics Process Instruments Inc. Power saving technique for pulse-echo acoustic ranging systems

Also Published As

Publication number Publication date
US7430488B2 (en) 2008-09-30
TW200534189A (en) 2005-10-16
JP2005274145A (ja) 2005-10-06
US20050209809A1 (en) 2005-09-22
KR20060044487A (ko) 2006-05-16

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C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C02 Deemed withdrawal of patent application after publication (patent law 2001)
WD01 Invention patent application deemed withdrawn after publication