KR20060044487A - 측정 방법, 모듈 및 시스템 - Google Patents

측정 방법, 모듈 및 시스템 Download PDF

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Publication number
KR20060044487A
KR20060044487A KR1020050023284A KR20050023284A KR20060044487A KR 20060044487 A KR20060044487 A KR 20060044487A KR 1020050023284 A KR1020050023284 A KR 1020050023284A KR 20050023284 A KR20050023284 A KR 20050023284A KR 20060044487 A KR20060044487 A KR 20060044487A
Authority
KR
South Korea
Prior art keywords
measurement
data
module
output
digital data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1020050023284A
Other languages
English (en)
Korean (ko)
Inventor
다쿠야 오타니
Original Assignee
애질런트 테크놀로지스, 인크.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 애질런트 테크놀로지스, 인크. filed Critical 애질런트 테크놀로지스, 인크.
Publication of KR20060044487A publication Critical patent/KR20060044487A/ko
Withdrawn legal-status Critical Current

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Classifications

    • E—FIXED CONSTRUCTIONS
    • E05—LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
    • E05D—HINGES OR SUSPENSION DEVICES FOR DOORS, WINDOWS OR WINGS
    • E05D7/00—Hinges or pivots of special construction
    • E05D7/04—Hinges adjustable relative to the wing or the frame
    • E05D7/0415—Hinges adjustable relative to the wing or the frame with adjusting drive means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • E—FIXED CONSTRUCTIONS
    • E05—LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
    • E05D—HINGES OR SUSPENSION DEVICES FOR DOORS, WINDOWS OR WINGS
    • E05D3/00—Hinges with pins
    • E05D3/02—Hinges with pins with one pin
    • E—FIXED CONSTRUCTIONS
    • E05—LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
    • E05D—HINGES OR SUSPENSION DEVICES FOR DOORS, WINDOWS OR WINGS
    • E05D7/00—Hinges or pivots of special construction
    • E05D7/08—Hinges or pivots of special construction for use in suspensions comprising two spigots placed at opposite edges of the wing, especially at the top and the bottom, e.g. trunnions
    • E05D7/081—Hinges or pivots of special construction for use in suspensions comprising two spigots placed at opposite edges of the wing, especially at the top and the bottom, e.g. trunnions the pivot axis of the wing being situated near one edge of the wing, especially at the top and bottom, e.g. trunnions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • E—FIXED CONSTRUCTIONS
    • E05—LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
    • E05Y—INDEXING SCHEME ASSOCIATED WITH SUBCLASSES E05D AND E05F, RELATING TO CONSTRUCTION ELEMENTS, ELECTRIC CONTROL, POWER SUPPLY, POWER SIGNAL OR TRANSMISSION, USER INTERFACES, MOUNTING OR COUPLING, DETAILS, ACCESSORIES, AUXILIARY OPERATIONS NOT OTHERWISE PROVIDED FOR, APPLICATION THEREOF
    • E05Y2600/00—Mounting or coupling arrangements for elements provided for in this subclass
    • E05Y2600/60—Mounting or coupling members; Accessories therefor
    • E05Y2600/626—Plates or brackets
    • E—FIXED CONSTRUCTIONS
    • E05—LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
    • E05Y—INDEXING SCHEME ASSOCIATED WITH SUBCLASSES E05D AND E05F, RELATING TO CONSTRUCTION ELEMENTS, ELECTRIC CONTROL, POWER SUPPLY, POWER SIGNAL OR TRANSMISSION, USER INTERFACES, MOUNTING OR COUPLING, DETAILS, ACCESSORIES, AUXILIARY OPERATIONS NOT OTHERWISE PROVIDED FOR, APPLICATION THEREOF
    • E05Y2900/00—Application of doors, windows, wings or fittings thereof
    • E05Y2900/10—Application of doors, windows, wings or fittings thereof for buildings or parts thereof
    • E05Y2900/13—Type of wing
    • E05Y2900/132—Doors
    • E05Y2900/134—Fire doors

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Mechanical Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Analogue/Digital Conversion (AREA)
  • Tests Of Electronic Circuits (AREA)
KR1020050023284A 2004-03-22 2005-03-21 측정 방법, 모듈 및 시스템 Withdrawn KR20060044487A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2004-00083340 2004-03-22
JP2004083340A JP2005274145A (ja) 2004-03-22 2004-03-22 測定方法、モジュールおよびシステム

Publications (1)

Publication Number Publication Date
KR20060044487A true KR20060044487A (ko) 2006-05-16

Family

ID=34987434

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020050023284A Withdrawn KR20060044487A (ko) 2004-03-22 2005-03-21 측정 방법, 모듈 및 시스템

Country Status (5)

Country Link
US (1) US7430488B2 (enExample)
JP (1) JP2005274145A (enExample)
KR (1) KR20060044487A (enExample)
CN (1) CN1674053A (enExample)
TW (1) TW200534189A (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7847715B2 (en) * 2008-08-04 2010-12-07 Honeywell International Inc. Segmented optics circuit drive for closed loop fiber optic sensors

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01196518A (ja) * 1988-01-30 1989-08-08 Dainippon Printing Co Ltd センサカード
JPH04105073A (ja) * 1990-08-24 1992-04-07 Yokogawa Electric Corp 実効値測定装置
JPH0572292A (ja) * 1991-09-12 1993-03-23 Toshiba Corp アナログ入力装置
JP2981127B2 (ja) * 1994-08-11 1999-11-22 本田技研工業株式会社 異種信号同時測定装置
JP3489488B2 (ja) * 1999-06-07 2004-01-19 ティアック株式会社 データレコード装置及びモジュール装置
DE10082824T1 (de) 1999-08-17 2002-02-28 Advantest Corp Adapter zum Steuern einer Meßvorrichtung, eine Meßvorrichtung, eine Steuervorrichtung für eine Meßvorrichtung, ein Verfahren zum Verarbeiten der Messung und ein Aufzeichnungsmedium
US6621763B2 (en) * 2001-07-23 2003-09-16 Siemens Milltronics Process Instruments Inc. Power saving technique for pulse-echo acoustic ranging systems

Also Published As

Publication number Publication date
US7430488B2 (en) 2008-09-30
TW200534189A (en) 2005-10-16
CN1674053A (zh) 2005-09-28
JP2005274145A (ja) 2005-10-06
US20050209809A1 (en) 2005-09-22

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Legal Events

Date Code Title Description
PA0109 Patent application

Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 20050321

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid