TW200531195A - Bump bonding apparatus and method for inspecting bump non-adhesion - Google Patents
Bump bonding apparatus and method for inspecting bump non-adhesion Download PDFInfo
- Publication number
- TW200531195A TW200531195A TW094101995A TW94101995A TW200531195A TW 200531195 A TW200531195 A TW 200531195A TW 094101995 A TW094101995 A TW 094101995A TW 94101995 A TW94101995 A TW 94101995A TW 200531195 A TW200531195 A TW 200531195A
- Authority
- TW
- Taiwan
- Prior art keywords
- bump
- capillary
- sphere
- conductor
- lead
- Prior art date
Links
Classifications
-
- H10W72/075—
-
- H10W72/012—
-
- H10W72/0711—
-
- H10W72/01225—
-
- H10W72/07141—
-
- H10W72/07521—
-
- H10W72/07533—
-
- H10W72/20—
-
- H10W72/50—
-
- H10W72/536—
-
- H10W72/90—
-
- H10W72/9415—
Landscapes
- Wire Bonding (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004059118A JP2005251919A (ja) | 2004-03-03 | 2004-03-03 | バンプボンディング装置及びバンプ不着検出方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW200531195A true TW200531195A (en) | 2005-09-16 |
Family
ID=34909148
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW094101995A TW200531195A (en) | 2004-03-03 | 2005-01-24 | Bump bonding apparatus and method for inspecting bump non-adhesion |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20050194422A1 (OSRAM) |
| JP (1) | JP2005251919A (OSRAM) |
| KR (1) | KR100628706B1 (OSRAM) |
| TW (1) | TW200531195A (OSRAM) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100720269B1 (ko) * | 2006-05-10 | 2007-05-23 | 삼성에스디에스 주식회사 | Rfid 태그 라벨 자동 부착시스템 및 그 방법 |
| KR101231192B1 (ko) * | 2008-03-19 | 2013-02-07 | 삼성테크윈 주식회사 | 와이어 본딩 모니터링 장치, 와이어 본딩 장비 및 와이어볼의 본딩 높이 값 모니터링 방법 |
| JP2010123817A (ja) * | 2008-11-21 | 2010-06-03 | Fujitsu Ltd | ワイヤボンディング方法および電子装置とその製造方法 |
| JP2011066191A (ja) * | 2009-09-17 | 2011-03-31 | Renesas Electronics Corp | 半導体装置の製造方法およびボンディング装置 |
| US9455544B2 (en) * | 2010-08-10 | 2016-09-27 | Kulicke And Soffa Industries, Inc. | Wire loops, methods of forming wire loops, and related processes |
| US9604305B2 (en) * | 2011-10-26 | 2017-03-28 | GM Global Technology Operations LLC | Quality status display for a vibration welding process |
| KR101620351B1 (ko) * | 2012-01-30 | 2016-05-12 | 삼성전자주식회사 | 회로소자의 와이어 본딩 방법 |
| TWI649816B (zh) * | 2016-08-23 | 2019-02-01 | 日商新川股份有限公司 | 打線方法與打線裝置 |
| CN112400226B (zh) * | 2018-06-29 | 2024-07-30 | 库利克和索夫工业公司 | 焊接线材与焊线机上的焊接位置之间的焊接的检测方法 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3370556B2 (ja) * | 1997-05-14 | 2003-01-27 | 株式会社新川 | ワイヤボンディング装置及びその制御方法 |
| US6098868A (en) * | 1997-05-23 | 2000-08-08 | Masushita Electric Industrial Co., Ltd. | Bump forming method and bump bonder |
| US6237833B1 (en) * | 1998-06-15 | 2001-05-29 | Rohm Co., Ltd. | Method of checking wirebond condition |
-
2004
- 2004-03-03 JP JP2004059118A patent/JP2005251919A/ja active Pending
-
2005
- 2005-01-24 TW TW094101995A patent/TW200531195A/zh unknown
- 2005-02-28 KR KR1020050016556A patent/KR100628706B1/ko not_active Expired - Fee Related
- 2005-03-03 US US11/071,842 patent/US20050194422A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| KR100628706B1 (ko) | 2006-09-29 |
| JP2005251919A (ja) | 2005-09-15 |
| US20050194422A1 (en) | 2005-09-08 |
| KR20060043245A (ko) | 2006-05-15 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TW200531195A (en) | Bump bonding apparatus and method for inspecting bump non-adhesion | |
| JP3504448B2 (ja) | 半導体装置 | |
| US20150008251A1 (en) | Method and apparatus for measuring a free air ball size during wire bonding | |
| US11121049B2 (en) | Semiconductor package with a wire bond mesh | |
| US20050090091A1 (en) | Method of forming multi-piled bump | |
| CN100381803C (zh) | 用于接触器阵列的接触结构以及具有此结构的电子装置 | |
| CN112345150A (zh) | 压力传感器及其制作方法 | |
| CN1134671C (zh) | 在集成电路检测中识别接触错误的装置 | |
| CN2718545Y (zh) | 整体装配的压力传感器装置 | |
| JP2007208210A (ja) | 半導体装置及びその製造方法 | |
| CN101405860B (zh) | 用于细铝线的铝凸块接合 | |
| CN117433690A (zh) | 一种低倾角误差的微差压传感器 | |
| CN105115659B (zh) | 一种多冗余度压力敏感芯体 | |
| JP2005277168A (ja) | 半導体装置、その組立方法及び半導体装置用導電性接着剤 | |
| CN204301913U (zh) | 一种改进型细长杆结构的压阻式传感器 | |
| TW200849424A (en) | Semiconductor package and method for discharging electronic devices on a substrate | |
| JP6769359B2 (ja) | 圧力センサおよびその製造方法 | |
| CN101488482B (zh) | 半导体封装结构及其制造方法 | |
| CN116888715A (zh) | 打线接合系统、检查装置、打线接合方法以及程序 | |
| CN206490788U (zh) | 一种mems麦克风壳体结构 | |
| CN116337293B (zh) | 一种扩散硅压阻式压力传感器模块 | |
| JP7723511B2 (ja) | 力学量測定装置 | |
| CN202352654U (zh) | 电子元件 | |
| JP2014178212A (ja) | 半導体試験装置および半導体の試験方法 | |
| JPS59208763A (ja) | 樹脂封止型電子装置 |