TW200503299A - Electric device comprising phase change material - Google Patents
Electric device comprising phase change materialInfo
- Publication number
- TW200503299A TW200503299A TW092135564A TW92135564A TW200503299A TW 200503299 A TW200503299 A TW 200503299A TW 092135564 A TW092135564 A TW 092135564A TW 92135564 A TW92135564 A TW 92135564A TW 200503299 A TW200503299 A TW 200503299A
- Authority
- TW
- Taiwan
- Prior art keywords
- phase
- change material
- phase change
- electric device
- resistor
- Prior art date
Links
- 239000012782 phase change material Substances 0.000 title abstract 4
- 229910052732 germanium Inorganic materials 0.000 abstract 2
- 229910052738 indium Inorganic materials 0.000 abstract 2
- 229910052725 zinc Inorganic materials 0.000 abstract 2
- 239000000463 material Substances 0.000 abstract 1
- 229910052714 tellurium Inorganic materials 0.000 abstract 1
- 229910052718 tin Inorganic materials 0.000 abstract 1
- 230000007704 transition Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B63/00—Resistance change memory devices, e.g. resistive RAM [ReRAM] devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B63/00—Resistance change memory devices, e.g. resistive RAM [ReRAM] devices
- H10B63/30—Resistance change memory devices, e.g. resistive RAM [ReRAM] devices comprising selection components having three or more electrodes, e.g. transistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/20—Multistable switching devices, e.g. memristors
- H10N70/231—Multistable switching devices, e.g. memristors based on solid-state phase change, e.g. between amorphous and crystalline phases, Ovshinsky effect
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/801—Constructional details of multistable switching devices
- H10N70/821—Device geometry
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/801—Constructional details of multistable switching devices
- H10N70/821—Device geometry
- H10N70/826—Device geometry adapted for essentially vertical current flow, e.g. sandwich or pillar type devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/801—Constructional details of multistable switching devices
- H10N70/841—Electrodes
- H10N70/8413—Electrodes adapted for resistive heating
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/801—Constructional details of multistable switching devices
- H10N70/881—Switching materials
- H10N70/884—Switching materials based on at least one element of group IIIA, IVA or VA, e.g. elemental or compound semiconductors
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Semiconductor Memories (AREA)
- Compositions Of Oxide Ceramics (AREA)
- Waveguide Switches, Polarizers, And Phase Shifters (AREA)
- Inorganic Insulating Materials (AREA)
- Organic Insulating Materials (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP02080430 | 2002-12-19 | ||
EP03100583 | 2003-03-07 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200503299A true TW200503299A (en) | 2005-01-16 |
Family
ID=32683811
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW092135564A TW200503299A (en) | 2002-12-19 | 2003-12-16 | Electric device comprising phase change material |
Country Status (9)
Country | Link |
---|---|
US (2) | USRE48202E1 (zh) |
EP (1) | EP1576676B1 (zh) |
JP (1) | JP2006511971A (zh) |
KR (1) | KR20050092017A (zh) |
AT (1) | ATE387726T1 (zh) |
AU (1) | AU2003282323A1 (zh) |
DE (1) | DE60319424T2 (zh) |
TW (1) | TW200503299A (zh) |
WO (1) | WO2004057684A1 (zh) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW200529414A (en) * | 2004-02-06 | 2005-09-01 | Renesas Tech Corp | Storage |
EP1766678A1 (en) | 2004-06-30 | 2007-03-28 | Koninklijke Philips Electronics N.V. | Method for manufacturing an electric device with a layer of conductive material contacted by nanowire |
US7700934B2 (en) | 2004-09-27 | 2010-04-20 | Koninklijke Philips Electronics N.V. | Electric device with nanowires comprising a phase change material |
JP2006245251A (ja) * | 2005-03-03 | 2006-09-14 | Mitsubishi Materials Corp | 非晶質状態が安定な相変化記録膜およびこの相変化記録膜を形成するためのスパッタリングターゲット |
US20070052009A1 (en) * | 2005-09-07 | 2007-03-08 | The Regents Of The University Of California | Phase change memory device and method of making same |
WO2007057972A1 (ja) * | 2005-11-21 | 2007-05-24 | Renesas Technology Corp. | 半導体装置 |
KR20090007363A (ko) | 2006-03-24 | 2009-01-16 | 엔엑스피 비 브이 | 상변화 저항기를 갖는 전기 디바이스 및 전기 장치 |
KR101177284B1 (ko) * | 2007-01-18 | 2012-08-24 | 삼성전자주식회사 | 상변화 물질층과 그 제조방법과 이 방법으로 형성된 상변화물질층을 포함하는 상변화 메모리 소자와 그 제조 및 동작방법 |
CN101663771A (zh) | 2007-04-20 | 2010-03-03 | Nxp股份有限公司 | 电子器件和制造电子器件的方法 |
KR100857466B1 (ko) * | 2007-05-16 | 2008-09-08 | 한국전자통신연구원 | 안티몬-아연 합금을 이용한 상변화형 비휘발성 메모리 소자및 이의 제조방법 |
CN100530739C (zh) * | 2007-07-17 | 2009-08-19 | 中国科学院上海微系统与信息技术研究所 | 相变材料呈环形的相变存储器器件单元及制备方法 |
ATE527702T1 (de) | 2008-01-16 | 2011-10-15 | Nxp Bv | Mehrschichtige struktur mit einer phasenwechselmaterialschicht und verfahren zu ihrer herstellung |
US7906774B2 (en) | 2008-02-01 | 2011-03-15 | Industrial Technology Research Institute | Phase change memory device |
US20110012082A1 (en) * | 2008-03-21 | 2011-01-20 | Nxp B.V. | Electronic component comprising a convertible structure |
US20110108792A1 (en) * | 2009-11-11 | 2011-05-12 | International Business Machines Corporation | Single Crystal Phase Change Material |
US8129268B2 (en) | 2009-11-16 | 2012-03-06 | International Business Machines Corporation | Self-aligned lower bottom electrode |
US8233317B2 (en) * | 2009-11-16 | 2012-07-31 | International Business Machines Corporation | Phase change memory device suitable for high temperature operation |
US8470635B2 (en) | 2009-11-30 | 2013-06-25 | Micron Technology, Inc. | Keyhole-free sloped heater for phase change memory |
US8017432B2 (en) * | 2010-01-08 | 2011-09-13 | International Business Machines Corporation | Deposition of amorphous phase change material |
CN103247757B (zh) * | 2013-04-18 | 2015-11-18 | 宁波大学 | 一种用于相变存储器的Zn-Sb-Te相变存储薄膜材料及其制备方法 |
US9257643B2 (en) * | 2013-08-16 | 2016-02-09 | International Business Machines Corporation | Phase change memory cell with improved phase change material |
WO2015161257A1 (en) * | 2014-04-18 | 2015-10-22 | Northeastern Univeristy | Piezoelectric mems resonator with integrated phase change material switches |
WO2017066195A1 (en) | 2015-10-13 | 2017-04-20 | Northeastern University | Piezoelectric cross-sectional lame mode transformer |
DE102017210369A1 (de) | 2017-06-21 | 2018-12-27 | Lithium Energy and Power GmbH & Co. KG | Batteriezelle |
CN112331767B (zh) * | 2020-10-27 | 2023-12-22 | 华中科技大学 | 一种Ge-Sb基相变材料及多级相变存储器 |
Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE69023786T2 (de) | 1989-03-17 | 1996-06-13 | Fuji Xerox Co Ltd | Optischer Aufzeichnungsträger. |
US5534712A (en) | 1991-01-18 | 1996-07-09 | Energy Conversion Devices, Inc. | Electrically erasable memory elements characterized by reduced current and improved thermal stability |
US5166758A (en) | 1991-01-18 | 1992-11-24 | Energy Conversion Devices, Inc. | Electrically erasable phase change memory |
US5128099A (en) * | 1991-02-15 | 1992-07-07 | Energy Conversion Devices, Inc. | Congruent state changeable optical memory material and device |
US5714768A (en) | 1995-10-24 | 1998-02-03 | Energy Conversion Devices, Inc. | Second-layer phase change memory array on top of a logic device |
US5825046A (en) * | 1996-10-28 | 1998-10-20 | Energy Conversion Devices, Inc. | Composite memory material comprising a mixture of phase-change memory material and dielectric material |
US5912839A (en) * | 1998-06-23 | 1999-06-15 | Energy Conversion Devices, Inc. | Universal memory element and method of programming same |
DE69936228T2 (de) | 1998-12-23 | 2008-02-07 | Battelle Memorial Institute, Richland | Mesoporöser siliciumdioxidfilm ausgehend von tensid enthaltender lösung und verfahren zu dessen herstellung |
DE60030703T2 (de) | 1999-03-15 | 2007-09-13 | Matsushita Electric Industrial Co., Ltd., Kadoma | Informationsaufzeichnungselement und herstellungsverfahren |
EP1760797A1 (en) * | 1999-03-25 | 2007-03-07 | OVONYX Inc. | Electrically programmable memory element with improved contacts |
US6314014B1 (en) * | 1999-12-16 | 2001-11-06 | Ovonyx, Inc. | Programmable resistance memory arrays with reference cells |
WO2002009206A1 (en) | 2000-07-22 | 2002-01-31 | Ovonyx, Inc. | Electrically programmable memory element |
US6809401B2 (en) * | 2000-10-27 | 2004-10-26 | Matsushita Electric Industrial Co., Ltd. | Memory, writing apparatus, reading apparatus, writing method, and reading method |
AU2002354082A1 (en) | 2001-12-12 | 2003-06-23 | Matsushita Electric Industrial Co., Ltd. | Nonvolatile memory |
US6899938B2 (en) * | 2002-02-22 | 2005-05-31 | Energy Conversion Devices, Inc. | Phase change data storage device for multi-level recording |
EP1343154B1 (en) * | 2002-03-05 | 2006-10-25 | Mitsubishi Kagaku Media Co., Ltd. | Phase-change recording material used for an information recording medium and an information recording medium employing it |
US6917532B2 (en) | 2002-06-21 | 2005-07-12 | Hewlett-Packard Development Company, L.P. | Memory storage device with segmented column line array |
US6850432B2 (en) * | 2002-08-20 | 2005-02-01 | Macronix International Co., Ltd. | Laser programmable electrically readable phase-change memory method and device |
EP1559146A1 (en) | 2002-08-21 | 2005-08-03 | Ovonyx Inc. | Utilizing atomic layer deposition for programmable device |
US6778420B2 (en) * | 2002-09-25 | 2004-08-17 | Ovonyx, Inc. | Method of operating programmable resistant element |
AU2003303171A1 (en) | 2002-12-19 | 2004-07-14 | Koninklijke Philips Electronics N.V. | Electric device with phase change material and parallel heater |
WO2004057618A2 (en) | 2002-12-19 | 2004-07-08 | Koninklijke Philips Electronics N.V. | Electric device comprising a layer of phase change material and method of manufacturing the same |
-
2003
- 2003-12-03 KR KR1020057011349A patent/KR20050092017A/ko not_active Application Discontinuation
- 2003-12-03 EP EP03773940A patent/EP1576676B1/en not_active Expired - Lifetime
- 2003-12-03 AU AU2003282323A patent/AU2003282323A1/en not_active Abandoned
- 2003-12-03 DE DE60319424T patent/DE60319424T2/de not_active Expired - Lifetime
- 2003-12-03 JP JP2005502598A patent/JP2006511971A/ja not_active Withdrawn
- 2003-12-03 US US15/210,771 patent/USRE48202E1/en active Active
- 2003-12-03 WO PCT/IB2003/005648 patent/WO2004057684A1/en active IP Right Grant
- 2003-12-03 US US10/539,251 patent/US8779474B2/en not_active Ceased
- 2003-12-03 AT AT03773940T patent/ATE387726T1/de not_active IP Right Cessation
- 2003-12-16 TW TW092135564A patent/TW200503299A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
DE60319424D1 (de) | 2008-04-10 |
ATE387726T1 (de) | 2008-03-15 |
KR20050092017A (ko) | 2005-09-16 |
USRE48202E1 (en) | 2020-09-08 |
JP2006511971A (ja) | 2006-04-06 |
AU2003282323A1 (en) | 2004-07-14 |
US20060049389A1 (en) | 2006-03-09 |
WO2004057684A1 (en) | 2004-07-08 |
EP1576676B1 (en) | 2008-02-27 |
EP1576676A1 (en) | 2005-09-21 |
DE60319424T2 (de) | 2009-02-19 |
US8779474B2 (en) | 2014-07-15 |
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