TW200415742A - Method and apparatus of utilizing a coating for enhanced holding of a semiconductor substrate during high pressure processing - Google Patents

Method and apparatus of utilizing a coating for enhanced holding of a semiconductor substrate during high pressure processing Download PDF

Info

Publication number
TW200415742A
TW200415742A TW093102820A TW93102820A TW200415742A TW 200415742 A TW200415742 A TW 200415742A TW 093102820 A TW093102820 A TW 093102820A TW 93102820 A TW93102820 A TW 93102820A TW 200415742 A TW200415742 A TW 200415742A
Authority
TW
Taiwan
Prior art keywords
wafer
vacuum
holding area
vacuum chuck
semiconductor
Prior art date
Application number
TW093102820A
Other languages
English (en)
Chinese (zh)
Inventor
Alexei Sheydayi
Joe Hillman
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Publication of TW200415742A publication Critical patent/TW200415742A/zh

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B11/00Cleaning flexible or delicate articles by methods or apparatus specially adapted thereto
    • B08B11/02Devices for holding articles during cleaning
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B25HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25BTOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FOR FASTENING, CONNECTING, DISENGAGING OR HOLDING
    • B25B11/00Work holders not covered by any preceding group in the subclass, e.g. magnetic work holders, vacuum work holders
    • B25B11/005Vacuum work holders
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/78Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using vacuum or suction, e.g. Bernoulli chucks

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
TW093102820A 2003-02-07 2004-02-06 Method and apparatus of utilizing a coating for enhanced holding of a semiconductor substrate during high pressure processing TW200415742A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/359,965 US20040154647A1 (en) 2003-02-07 2003-02-07 Method and apparatus of utilizing a coating for enhanced holding of a semiconductor substrate during high pressure processing

Publications (1)

Publication Number Publication Date
TW200415742A true TW200415742A (en) 2004-08-16

Family

ID=32823898

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093102820A TW200415742A (en) 2003-02-07 2004-02-06 Method and apparatus of utilizing a coating for enhanced holding of a semiconductor substrate during high pressure processing

Country Status (5)

Country Link
US (1) US20040154647A1 (https=)
EP (1) EP1590827A2 (https=)
JP (1) JP2006517351A (https=)
TW (1) TW200415742A (https=)
WO (1) WO2004073028A2 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102760666A (zh) * 2012-07-05 2012-10-31 西安永电电气有限责任公司 用于igbt的键合真空吸附工装

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060065288A1 (en) * 2004-09-30 2006-03-30 Darko Babic Supercritical fluid processing system having a coating on internal members and a method of using
US9673077B2 (en) * 2012-07-03 2017-06-06 Watlow Electric Manufacturing Company Pedestal construction with low coefficient of thermal expansion top
JP2015109360A (ja) * 2013-12-05 2015-06-11 東京エレクトロン株式会社 基板保持機構及び剥離システム
CN106625330B (zh) * 2016-12-02 2018-05-01 佛山市顺德区银美精工五金科技有限公司 一种双层结构真空吸台
US11199562B2 (en) 2019-08-08 2021-12-14 Western Digital Technologies, Inc. Wafer testing system including a wafer-flattening multi-zone vacuum chuck and method for operating the same

Family Cites Families (100)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2128426B1 (https=) * 1971-03-02 1980-03-07 Cnen
US3890176A (en) * 1972-08-18 1975-06-17 Gen Electric Method for removing photoresist from substrate
US4341592A (en) * 1975-08-04 1982-07-27 Texas Instruments Incorporated Method for removing photoresist layer from substrate by ozone treatment
US4029517A (en) * 1976-03-01 1977-06-14 Autosonics Inc. Vapor degreasing system having a divider wall between upper and lower vapor zone portions
US4091643A (en) * 1976-05-14 1978-05-30 Ama Universal S.P.A. Circuit for the recovery of solvent vapor evolved in the course of a cleaning cycle in dry-cleaning machines or plants, and for the de-pressurizing of such machines
US4346578A (en) * 1976-12-30 1982-08-31 Harrison Nelson K Extrusion press and method
US4219333A (en) * 1978-07-03 1980-08-26 Harris Robert D Carbonated cleaning solution
FR2536433A1 (fr) * 1982-11-19 1984-05-25 Privat Michel Procede et installation de nettoyage et decontamination particulaire de vetements, notamment de vetements contamines par des particules radioactives
GB8332394D0 (en) * 1983-12-05 1984-01-11 Pilkington Brothers Plc Coating apparatus
US4749440A (en) * 1985-08-28 1988-06-07 Fsi Corporation Gaseous process and apparatus for removing films from substrates
US4718049A (en) * 1986-01-23 1988-01-05 Western Atlas International, Inc. Pre-loaded vibrator assembly with mechanical lock
US4917556A (en) * 1986-04-28 1990-04-17 Varian Associates, Inc. Modular wafer transport and processing system
US4670126A (en) * 1986-04-28 1987-06-02 Varian Associates, Inc. Sputter module for modular wafer processing system
JPS63157870A (ja) * 1986-12-19 1988-06-30 Anelva Corp 基板処理装置
US4951601A (en) * 1986-12-19 1990-08-28 Applied Materials, Inc. Multi-chamber integrated process system
US5882165A (en) * 1986-12-19 1999-03-16 Applied Materials, Inc. Multiple chamber integrated process system
JPS63210148A (ja) * 1987-02-26 1988-08-31 Nikko Rika Kk 真空チヤツク用プラスチツクス焼結体
DE3725565A1 (de) * 1987-08-01 1989-02-16 Peter Weil Verfahren und anlage zum entlacken von gegenstaenden mit einem tauchbehaelter mit loesungsmittel
US5105556A (en) * 1987-08-12 1992-04-21 Hitachi, Ltd. Vapor washing process and apparatus
US4838476A (en) * 1987-11-12 1989-06-13 Fluocon Technologies Inc. Vapour phase treatment process and apparatus
US4933404A (en) * 1987-11-27 1990-06-12 Battelle Memorial Institute Processes for microemulsion polymerization employing novel microemulsion systems
JP2663483B2 (ja) * 1988-02-29 1997-10-15 勝 西川 レジストパターン形成方法
US5185296A (en) * 1988-07-26 1993-02-09 Matsushita Electric Industrial Co., Ltd. Method for forming a dielectric thin film or its pattern of high accuracy on a substrate
DE3837298C1 (https=) * 1988-11-03 1990-03-29 Fresenius Ag, 6380 Bad Homburg, De
US5013366A (en) * 1988-12-07 1991-05-07 Hughes Aircraft Company Cleaning process using phase shifting of dense phase gases
US5051135A (en) * 1989-01-30 1991-09-24 Kabushiki Kaisha Tiyoda Seisakusho Cleaning method using a solvent while preventing discharge of solvent vapors to the environment
US5068040A (en) * 1989-04-03 1991-11-26 Hughes Aircraft Company Dense phase gas photochemical process for substrate treatment
US5288333A (en) * 1989-05-06 1994-02-22 Dainippon Screen Mfg. Co., Ltd. Wafer cleaning method and apparatus therefore
US5186718A (en) * 1989-05-19 1993-02-16 Applied Materials, Inc. Staged-vacuum wafer processing system and method
US4923828A (en) * 1989-07-07 1990-05-08 Eastman Kodak Company Gaseous cleaning method for silicon devices
US4983223A (en) * 1989-10-24 1991-01-08 Chenpatents Apparatus and method for reducing solvent vapor losses
US5213619A (en) * 1989-11-30 1993-05-25 Jackson David P Processes for cleaning, sterilizing, and implanting materials using high energy dense fluids
DE69133413D1 (de) * 1990-05-07 2004-10-21 Canon Kk Substratträger des Vakuumtyps
US5370741A (en) * 1990-05-15 1994-12-06 Semitool, Inc. Dynamic semiconductor wafer processing using homogeneous chemical vapors
US5306350A (en) * 1990-12-21 1994-04-26 Union Carbide Chemicals & Plastics Technology Corporation Methods for cleaning apparatus using compressed fluids
EP0496605B1 (en) * 1991-01-24 2001-08-01 Wako Pure Chemical Industries Ltd Surface treating solutions for semiconductors
US5185058A (en) * 1991-01-29 1993-02-09 Micron Technology, Inc. Process for etching semiconductor devices
US5201960A (en) * 1991-02-04 1993-04-13 Applied Photonics Research, Inc. Method for removing photoresist and other adherent materials from substrates
US5730874A (en) * 1991-06-12 1998-03-24 Idaho Research Foundation, Inc. Extraction of metals using supercritical fluid and chelate forming legand
US5225173A (en) * 1991-06-12 1993-07-06 Idaho Research Foundation, Inc. Methods and devices for the separation of radioactive rare earth metal isotopes from their alkaline earth metal precursors
US5320742A (en) * 1991-08-15 1994-06-14 Mobil Oil Corporation Gasoline upgrading process
US5431843A (en) * 1991-09-04 1995-07-11 The Clorox Company Cleaning through perhydrolysis conducted in dense fluid medium
GB2259525B (en) * 1991-09-11 1995-06-28 Ciba Geigy Ag Process for dyeing cellulosic textile material with disperse dyes
KR930019861A (ko) * 1991-12-12 1993-10-19 완다 케이. 덴슨-로우 조밀상 기체를 이용한 코팅 방법
EP1172383B1 (en) * 1992-03-27 2008-04-16 University Of North Carolina At Chapel Hill Method of making fluoropolymers
JP2750554B2 (ja) * 1992-03-31 1998-05-13 日本電信電話株式会社 真空吸着装置
US5313965A (en) * 1992-06-01 1994-05-24 Hughes Aircraft Company Continuous operation supercritical fluid treatment process and system
JPH0613361A (ja) * 1992-06-26 1994-01-21 Tokyo Electron Ltd 処理装置
US5401322A (en) * 1992-06-30 1995-03-28 Southwest Research Institute Apparatus and method for cleaning articles utilizing supercritical and near supercritical fluids
US5267455A (en) * 1992-07-13 1993-12-07 The Clorox Company Liquid/supercritical carbon dioxide dry cleaning system
US5316591A (en) * 1992-08-10 1994-05-31 Hughes Aircraft Company Cleaning by cavitation in liquefied gas
US5355901A (en) * 1992-10-27 1994-10-18 Autoclave Engineers, Ltd. Apparatus for supercritical cleaning
US5294261A (en) * 1992-11-02 1994-03-15 Air Products And Chemicals, Inc. Surface cleaning using an argon or nitrogen aerosol
US5328722A (en) * 1992-11-06 1994-07-12 Applied Materials, Inc. Metal chemical vapor deposition process using a shadow ring
US5514220A (en) * 1992-12-09 1996-05-07 Wetmore; Paula M. Pressure pulse cleaning
US5403665A (en) * 1993-06-18 1995-04-04 Regents Of The University Of California Method of applying a monolayer lubricant to micromachines
US5312882A (en) * 1993-07-30 1994-05-17 The University Of North Carolina At Chapel Hill Heterogeneous polymerization in carbon dioxide
US5377705A (en) * 1993-09-16 1995-01-03 Autoclave Engineers, Inc. Precision cleaning system
US5417768A (en) * 1993-12-14 1995-05-23 Autoclave Engineers, Inc. Method of cleaning workpiece with solvent and then with liquid carbon dioxide
US5509431A (en) * 1993-12-14 1996-04-23 Snap-Tite, Inc. Precision cleaning vessel
US5641887A (en) * 1994-04-01 1997-06-24 University Of Pittsburgh Extraction of metals in carbon dioxide and chelating agents therefor
US5872257A (en) * 1994-04-01 1999-02-16 University Of Pittsburgh Further extractions of metals in carbon dioxide and chelating agents therefor
EP0681317B1 (en) * 1994-04-08 2001-10-17 Texas Instruments Incorporated Method for cleaning semiconductor wafers using liquefied gases
JP3320549B2 (ja) * 1994-04-26 2002-09-03 岩手東芝エレクトロニクス株式会社 被膜除去方法および被膜除去剤
KR0137841B1 (ko) * 1994-06-07 1998-04-27 문정환 식각잔류물 제거방법
US5482564A (en) * 1994-06-21 1996-01-09 Texas Instruments Incorporated Method of unsticking components of micro-mechanical devices
US5637151A (en) * 1994-06-27 1997-06-10 Siemens Components, Inc. Method for reducing metal contamination of silicon wafers during semiconductor manufacturing
US5522938A (en) * 1994-08-08 1996-06-04 Texas Instruments Incorporated Particle removal in supercritical liquids using single frequency acoustic waves
US5501761A (en) * 1994-10-18 1996-03-26 At&T Corp. Method for stripping conformal coatings from circuit boards
US5505219A (en) * 1994-11-23 1996-04-09 Litton Systems, Inc. Supercritical fluid recirculating system for a precision inertial instrument parts cleaner
US5629918A (en) * 1995-01-20 1997-05-13 The Regents Of The University Of California Electromagnetically actuated micromachined flap
US5681398A (en) * 1995-03-17 1997-10-28 Purex Co., Ltd. Silicone wafer cleaning method
JPH08330266A (ja) * 1995-05-31 1996-12-13 Texas Instr Inc <Ti> 半導体装置等の表面を浄化し、処理する方法
US5783082A (en) * 1995-11-03 1998-07-21 University Of North Carolina Cleaning process using carbon dioxide as a solvent and employing molecularly engineered surfactants
US5726211A (en) * 1996-03-21 1998-03-10 International Business Machines Corporation Process for making a foamed elastometric polymer
US6264752B1 (en) * 1998-03-13 2001-07-24 Gary L. Curtis Reactor for processing a microelectronic workpiece
US5868856A (en) * 1996-07-25 1999-02-09 Texas Instruments Incorporated Method for removing inorganic contamination by chemical derivitization and extraction
US5868862A (en) * 1996-08-01 1999-02-09 Texas Instruments Incorporated Method of removing inorganic contamination by chemical alteration and extraction in a supercritical fluid media
US5881577A (en) * 1996-09-09 1999-03-16 Air Liquide America Corporation Pressure-swing absorption based cleaning methods and systems
US5908510A (en) * 1996-10-16 1999-06-01 International Business Machines Corporation Residue removal by supercritical fluids
US5928389A (en) * 1996-10-21 1999-07-27 Applied Materials, Inc. Method and apparatus for priority based scheduling of wafer processing within a multiple chamber semiconductor wafer processing tool
US5888050A (en) * 1996-10-30 1999-03-30 Supercritical Fluid Technologies, Inc. Precision high pressure control assembly
JPH10144757A (ja) * 1996-11-08 1998-05-29 Dainippon Screen Mfg Co Ltd 基板処理システム
JP3437734B2 (ja) * 1997-02-26 2003-08-18 富士通株式会社 製造装置
US5900354A (en) * 1997-07-03 1999-05-04 Batchelder; John Samuel Method for optical inspection and lithography
US6284360B1 (en) * 1997-09-30 2001-09-04 3M Innovative Properties Company Sealant composition, article including same, and method of using same
US6235634B1 (en) * 1997-10-08 2001-05-22 Applied Komatsu Technology, Inc. Modular substrate processing system
US6067728A (en) * 1998-02-13 2000-05-30 G.T. Equipment Technologies, Inc. Supercritical phase wafer drying/cleaning system
JPH11243135A (ja) * 1998-02-26 1999-09-07 Kyocera Corp 真空吸着盤
US6244121B1 (en) * 1998-03-06 2001-06-12 Applied Materials, Inc. Sensor device for non-intrusive diagnosis of a semiconductor processing system
US6423642B1 (en) * 1998-03-13 2002-07-23 Semitool, Inc. Reactor for processing a semiconductor wafer
JPH11260896A (ja) * 1998-03-13 1999-09-24 Okamoto Machine Tool Works Ltd ウエハのチャック機構
US6017820A (en) * 1998-07-17 2000-01-25 Cutek Research, Inc. Integrated vacuum and plating cluster system
US6242165B1 (en) * 1998-08-28 2001-06-05 Micron Technology, Inc. Supercritical compositions for removal of organic material and methods of using same
US6548411B2 (en) * 1999-01-22 2003-04-15 Semitool, Inc. Apparatus and methods for processing a workpiece
US6250216B1 (en) * 1999-03-19 2001-06-26 The Minster Machine Company Press deflection controller and method of controlling press deflection
US7044143B2 (en) * 1999-05-14 2006-05-16 Micell Technologies, Inc. Detergent injection systems and methods for carbon dioxide microelectronic substrate processing systems
JP2000332087A (ja) * 1999-05-25 2000-11-30 Sony Corp 基板吸着装置
US6228563B1 (en) * 1999-09-17 2001-05-08 Gasonics International Corporation Method and apparatus for removing post-etch residues and other adherent matrices
US7250374B2 (en) * 2004-06-30 2007-07-31 Tokyo Electron Limited System and method for processing a substrate using supercritical carbon dioxide processing

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102760666A (zh) * 2012-07-05 2012-10-31 西安永电电气有限责任公司 用于igbt的键合真空吸附工装

Also Published As

Publication number Publication date
US20040154647A1 (en) 2004-08-12
WO2004073028A2 (en) 2004-08-26
EP1590827A2 (en) 2005-11-02
WO2004073028A3 (en) 2005-01-20
JP2006517351A (ja) 2006-07-20

Similar Documents

Publication Publication Date Title
KR101896491B1 (ko) 플라즈마 에칭 장치 및 플라즈마 에칭 방법
KR100400037B1 (ko) 콘택 플러그를 구비하는 반도체 소자 및 그의 제조 방법
CN101577247B (zh) 把金属和超低k值电介质集成
CN100524668C (zh) 防止在抗蚀剂剥离过程中对多孔低k材料的损伤的方法
US8529783B2 (en) Method for backside polymer reduction in dry-etch process
US11721627B2 (en) Graphene layer for reduced contact resistance
CN101031181A (zh) 现场基板处理的方法和装置
KR20040096365A (ko) 반도체소자의 제조방법
CN104201135A (zh) 一种湿法腐蚀装置及其使用方法
CN109962039A (zh) 一种半导体器件及电子装置
JP2008198659A (ja) プラズマエッチング方法
TWI283889B (en) Vacuum chuck utilizing sintered material and method of providing thereof
JP2007194284A (ja) プラズマ処理方法、プラズマ処理装置、及び記憶媒体
TW200415742A (en) Method and apparatus of utilizing a coating for enhanced holding of a semiconductor substrate during high pressure processing
CN101179048A (zh) 半导体装置的制造方法
US20080020585A1 (en) Semiconductor device fabricating method, plasma processing system and storage medium
KR101322360B1 (ko) 반도체 장치의 제조 방법 및 반도체 장치
JP2004260001A (ja) 半導体装置の製造方法
US20040152397A1 (en) Method of planarizing a semiconductor die
TW200525692A (en) Method of fabricating a semiconductor device with metal wiring
US20070163995A1 (en) Plasma processing method, apparatus and storage medium
JP2002134494A (ja) 半導体装置およびその製造方法
CN100501938C (zh) 深沟槽工艺中保护沟槽底部的方法
CN111435650B (zh) 半导体结构及其形成方法
CN101627460A (zh) 被破坏低k介电膜层去除的方法