TW200406032A - Semiconductor integrated circuit device and method of manufacturing the same - Google Patents

Semiconductor integrated circuit device and method of manufacturing the same Download PDF

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Publication number
TW200406032A
TW200406032A TW092113859A TW92113859A TW200406032A TW 200406032 A TW200406032 A TW 200406032A TW 092113859 A TW092113859 A TW 092113859A TW 92113859 A TW92113859 A TW 92113859A TW 200406032 A TW200406032 A TW 200406032A
Authority
TW
Taiwan
Prior art keywords
type
aforementioned
region
film
well
Prior art date
Application number
TW092113859A
Other languages
English (en)
Chinese (zh)
Inventor
Aono Hideki
Hinoue Tatsuya
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Publication of TW200406032A publication Critical patent/TW200406032A/zh

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Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/0123Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
    • H10D84/0126Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/0123Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
    • H10D84/0126Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
    • H10D84/0144Manufacturing their gate insulating layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/0123Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
    • H10D84/0126Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
    • H10D84/0165Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs the components including complementary IGFETs, e.g. CMOS devices
    • H10D84/0181Manufacturing their gate insulating layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/02Manufacture or treatment characterised by using material-based technologies
    • H10D84/03Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
    • H10D84/038Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe

Landscapes

  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Formation Of Insulating Films (AREA)
  • Electrodes Of Semiconductors (AREA)
TW092113859A 2002-05-28 2003-05-22 Semiconductor integrated circuit device and method of manufacturing the same TW200406032A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002154589A JP2003347423A (ja) 2002-05-28 2002-05-28 半導体集積回路装置およびその製造方法

Publications (1)

Publication Number Publication Date
TW200406032A true TW200406032A (en) 2004-04-16

Family

ID=29561371

Family Applications (1)

Application Number Title Priority Date Filing Date
TW092113859A TW200406032A (en) 2002-05-28 2003-05-22 Semiconductor integrated circuit device and method of manufacturing the same

Country Status (4)

Country Link
US (1) US20030224575A1 (enExample)
JP (1) JP2003347423A (enExample)
KR (1) KR20030091814A (enExample)
TW (1) TW200406032A (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7138691B2 (en) 2004-01-22 2006-11-21 International Business Machines Corporation Selective nitridation of gate oxides
JP2006073796A (ja) 2004-09-02 2006-03-16 Matsushita Electric Ind Co Ltd 半導体装置及びその製造方法
JP4704101B2 (ja) * 2005-05-06 2011-06-15 ルネサスエレクトロニクス株式会社 半導体装置の製造方法
JP5266996B2 (ja) * 2008-09-12 2013-08-21 住友電気工業株式会社 半導体装置の製造方法および半導体装置
CN107564863B (zh) * 2016-06-30 2020-10-16 中芯国际集成电路制造(上海)有限公司 一种半导体器件及其制造方法
JP6640762B2 (ja) * 2017-01-26 2020-02-05 株式会社東芝 半導体装置
CN116364718A (zh) * 2021-12-28 2023-06-30 联华电子股份有限公司 半导体结构及其制造方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3686248B2 (ja) * 1998-01-26 2005-08-24 株式会社日立製作所 半導体集積回路装置およびその製造方法
TW580736B (en) * 2000-04-27 2004-03-21 Hitachi Ltd Fabrication method for semiconductor device
JP3746669B2 (ja) * 2000-10-17 2006-02-15 株式会社ルネサステクノロジ 半導体装置の製造方法
JP2002164442A (ja) * 2000-11-28 2002-06-07 Hitachi Ltd 半導体装置およびその製造方法
US6844227B2 (en) * 2000-12-26 2005-01-18 Matsushita Electric Industrial Co., Ltd. Semiconductor devices and method for manufacturing the same

Also Published As

Publication number Publication date
KR20030091814A (ko) 2003-12-03
US20030224575A1 (en) 2003-12-04
JP2003347423A (ja) 2003-12-05

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