SU1182407A1 - Method of testing null-point instruments for resistance to combined actions - Google Patents
Method of testing null-point instruments for resistance to combined actions Download PDFInfo
- Publication number
- SU1182407A1 SU1182407A1 SU833677005A SU3677005A SU1182407A1 SU 1182407 A1 SU1182407 A1 SU 1182407A1 SU 833677005 A SU833677005 A SU 833677005A SU 3677005 A SU3677005 A SU 3677005A SU 1182407 A1 SU1182407 A1 SU 1182407A1
- Authority
- SU
- USSR - Soviet Union
- Prior art keywords
- testing
- aim
- simulated
- compensation circuit
- test
- Prior art date
Links
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
Abstract
СПОСОБ ИСПЫТАНИЙ КОМПЕНСАЦИОННЫХ ПРИБОРОВ НА УСТОЙЧИВОСТЬ К КОМБИНИРОВАННЬМ ВОЗДЕЙСТВИЯМ, заключающийс в том, что исследуемый прибор испытывают на нескольких различных испытательных стендах, а часть возмущающих факторов при испытании имитируют электрическими-сигналами, подаваемыми в контур компенсации, отличающийс тем, что, с целью повышени эффективности испытаний , имитируемые электрические сигналы устанавливают пропорциональными входным параметрам прибора.A TEST METHOD FOR COMPENSATION INSTRUMENTS FOR RESISTANCE TO COMBINED IMPACTS, which means that the device under test is tested on several different test benches, and when testing, some of the disturbing factors are imitated by electrical signals fed to the compensation circuit, with the aim of aiming for the purpose of testing with the purpose of testing with the purpose of testing, with the purpose of testing, with the aim of testing, the device is simulated with electric-signals fed to the compensation circuit, with the aim of which, with the aim of aiming, with the aim of testing, with the aim of testing, with the purpose of testing, they are simulated by electric-signals supplied to the compensation circuit, with the aim of which, with the aim of aiming, with the purpose of testing, with the aim of testing, with the purpose of testing, they are imitated by electric-signals supplied to the compensation circuit, with the aim of aiming for the purpose of testing for the purpose of testing with the purpose of testing with the aim of testing, with the aim of testing, with the aim of testing, they are simulated with the purpose of testing with the purpose of testing with the purpose of testing to compensate The simulated electrical signals are set proportional to the input parameters of the device.
Description
ii
(О(ABOUT
0000
дd
4:four:
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU833677005A SU1182407A1 (en) | 1983-12-19 | 1983-12-19 | Method of testing null-point instruments for resistance to combined actions |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU833677005A SU1182407A1 (en) | 1983-12-19 | 1983-12-19 | Method of testing null-point instruments for resistance to combined actions |
Publications (1)
Publication Number | Publication Date |
---|---|
SU1182407A1 true SU1182407A1 (en) | 1985-09-30 |
Family
ID=21094512
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SU833677005A SU1182407A1 (en) | 1983-12-19 | 1983-12-19 | Method of testing null-point instruments for resistance to combined actions |
Country Status (1)
Country | Link |
---|---|
SU (1) | SU1182407A1 (en) |
-
1983
- 1983-12-19 SU SU833677005A patent/SU1182407A1/en active
Non-Patent Citations (1)
Title |
---|
Авторское свидетельство СССР № 938051, кл. G Ul М 7/00, 1980. * |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP0285799A3 (en) | Device for the functional electric testing of wiring arrays, in particular of circuit boards | |
ATE14939T1 (en) | APPARATUS FOR DYNAMIC IN-CIRCUIT KEYING OF ELECTRONIC DIGITAL CIRCUIT ELEMENTS. | |
JPS5516294A (en) | Degital type diagnosising device | |
DE3684139D1 (en) | SIX-GATE REFLECTOR TEST ARRANGEMENT. | |
SU1182407A1 (en) | Method of testing null-point instruments for resistance to combined actions | |
CA2324135A1 (en) | Apparatus for testing bare-chip lsi mounting board | |
JPS52122446A (en) | Circuit tester | |
JPS5797466A (en) | Testing method for analogically printed board | |
EP0215641A3 (en) | Vibration testing apparatus | |
JPS5727041A (en) | Large-scale integrated circuit having testing function | |
JPS5750666A (en) | Testing device for function of circuit | |
JPS5788759A (en) | Wiring method for active matrix substrate | |
SU849529A1 (en) | Telephone channel simulating device | |
ATE1117T1 (en) | CIRCUIT ARRANGEMENT FOR GENERATION OF A TEST VOLTAGE. | |
ATE597T1 (en) | METHOD OF CORRECTING THE SENSITIVITY OF THE WEIGHING DEVICE OF ELECTRICAL WEIGHING EQUIPMENT AND CIRCUIT ARRANGEMENT FOR PERFORMING THE METHOD. | |
DE69119140D1 (en) | Integrated circuit test device for a printed circuit and application of this device for testing such a printed circuit | |
JPS5797467A (en) | In-circuit testing method | |
JPS5340901A (en) | Chassis dynamometer | |
JPS56119863A (en) | Testing method for printed board unit | |
JPS574559A (en) | Testing method of integrated circuit | |
JPS6479671A (en) | Net analysis | |
JPS5676064A (en) | Adjustment test method of compound substrate | |
JPS52116895A (en) | Wiring order tester | |
JPS5729961A (en) | Testing system | |
JPS6473267A (en) | Test data generation system for lsi |