JPS6479671A - Net analysis - Google Patents

Net analysis

Info

Publication number
JPS6479671A
JPS6479671A JP62236140A JP23614087A JPS6479671A JP S6479671 A JPS6479671 A JP S6479671A JP 62236140 A JP62236140 A JP 62236140A JP 23614087 A JP23614087 A JP 23614087A JP S6479671 A JPS6479671 A JP S6479671A
Authority
JP
Japan
Prior art keywords
passes
input
net
individual
searching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62236140A
Other languages
Japanese (ja)
Inventor
Tsutomu Takei
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP62236140A priority Critical patent/JPS6479671A/en
Publication of JPS6479671A publication Critical patent/JPS6479671A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE:To enable determination of preference in pass to be subjected to a due test, by providing a means for weighting, a level setting means, a means for generating a table and the like. CONSTITUTION:It is possible to generate a test pattern for a type of circuit that registers are linked at stages by a means adapted to set a level at input or output terminals of respective components during the searching of a net. Weighing means and means for weighting passes analyzed are arranged for the respective components and it is possible to determine preference of passes depending on the weight for the individual passes when the passes of signals transmitted through the components exist in plurality within the net. Moreover, a means is provided to permit the generation of a table that enables the searching of a sequence between the individual passes and of conditions for establishing the individual passes with respect to the passes analyzed. Thus, necessary conditions are traced back for passes or the like from the input to output terminals thereby enabling the determination of an input signal to be set for the input terminal.
JP62236140A 1987-09-22 1987-09-22 Net analysis Pending JPS6479671A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62236140A JPS6479671A (en) 1987-09-22 1987-09-22 Net analysis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62236140A JPS6479671A (en) 1987-09-22 1987-09-22 Net analysis

Publications (1)

Publication Number Publication Date
JPS6479671A true JPS6479671A (en) 1989-03-24

Family

ID=16996351

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62236140A Pending JPS6479671A (en) 1987-09-22 1987-09-22 Net analysis

Country Status (1)

Country Link
JP (1) JPS6479671A (en)

Similar Documents

Publication Publication Date Title
NL192801B (en) A method for testing a carrier with a plurality of digitally operating integrated circuits, an integrated circuit suitable for mounting on a carrier thus to be tested, and a carrier provided with several such integrated circuits.
JPS6483169A (en) Integrated circuit device
JPS6479671A (en) Net analysis
JPS5727041A (en) Large-scale integrated circuit having testing function
JPS5444480A (en) Package for integrated circuit
JPS6443773A (en) Propagation delay testing method for logic circuit
JPS56155452A (en) Testing method for large scale integrated circuit device
SU1182407A1 (en) Method of testing null-point instruments for resistance to combined actions
JPS5293361A (en) Automatic tester
JPS57111714A (en) Integrated circuit
JPS6488266A (en) Testing system of semiconductor logic circuit
JPS53118327A (en) Automatic test data generator
JPS56119863A (en) Testing method for printed board unit
JPS6479676A (en) Ic tester
JPS5328497A (en) Tester for coin selector
JPS5739365A (en) Large scale integration testing device
JPS5440056A (en) Diagnosis device for computer board
JPS6479670A (en) Test circuit generation system
JPS5595114A (en) Sequence controller
JPS53110443A (en) Operation unit
JPS5689064A (en) Testing apparatus
JPS6413480A (en) Ic testing device
JPS56135126A (en) Amplitude frequency counting device for oscillation body
JPS5384482A (en) Test method for ic
JPS55121158A (en) Noise test unit