JPS5384482A - Test method for ic - Google Patents
Test method for icInfo
- Publication number
- JPS5384482A JPS5384482A JP16025076A JP16025076A JPS5384482A JP S5384482 A JPS5384482 A JP S5384482A JP 16025076 A JP16025076 A JP 16025076A JP 16025076 A JP16025076 A JP 16025076A JP S5384482 A JPS5384482 A JP S5384482A
- Authority
- JP
- Japan
- Prior art keywords
- test method
- blocks
- test
- dividing
- situation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Abstract
PURPOSE: To carry out an IC test in a short time under the condition near to the mounting presenting a situation in which the noise source exists mutually, by dividing an IC into blocks in accordance with the function and the system and testing plural blocks at a time through input of the signal of the pattern according to each block.
COPYRIGHT: (C)1978,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP51160250A JPS6037904B2 (en) | 1976-12-29 | 1976-12-29 | IC test method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP51160250A JPS6037904B2 (en) | 1976-12-29 | 1976-12-29 | IC test method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5384482A true JPS5384482A (en) | 1978-07-25 |
JPS6037904B2 JPS6037904B2 (en) | 1985-08-29 |
Family
ID=15710934
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP51160250A Expired JPS6037904B2 (en) | 1976-12-29 | 1976-12-29 | IC test method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6037904B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5435865U (en) * | 1977-08-17 | 1979-03-08 |
-
1976
- 1976-12-29 JP JP51160250A patent/JPS6037904B2/en not_active Expired
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5435865U (en) * | 1977-08-17 | 1979-03-08 | ||
JPS5937736Y2 (en) * | 1977-08-17 | 1984-10-19 | 日本電気株式会社 | Device for determining quality of semiconductor integrated circuits |
Also Published As
Publication number | Publication date |
---|---|
JPS6037904B2 (en) | 1985-08-29 |
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