JPS5384482A - Test method for ic - Google Patents

Test method for ic

Info

Publication number
JPS5384482A
JPS5384482A JP16025076A JP16025076A JPS5384482A JP S5384482 A JPS5384482 A JP S5384482A JP 16025076 A JP16025076 A JP 16025076A JP 16025076 A JP16025076 A JP 16025076A JP S5384482 A JPS5384482 A JP S5384482A
Authority
JP
Japan
Prior art keywords
test method
blocks
test
dividing
situation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16025076A
Other languages
Japanese (ja)
Other versions
JPS6037904B2 (en
Inventor
Masato Watanabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP51160250A priority Critical patent/JPS6037904B2/en
Publication of JPS5384482A publication Critical patent/JPS5384482A/en
Publication of JPS6037904B2 publication Critical patent/JPS6037904B2/en
Expired legal-status Critical Current

Links

Abstract

PURPOSE: To carry out an IC test in a short time under the condition near to the mounting presenting a situation in which the noise source exists mutually, by dividing an IC into blocks in accordance with the function and the system and testing plural blocks at a time through input of the signal of the pattern according to each block.
COPYRIGHT: (C)1978,JPO&Japio
JP51160250A 1976-12-29 1976-12-29 IC test method Expired JPS6037904B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP51160250A JPS6037904B2 (en) 1976-12-29 1976-12-29 IC test method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP51160250A JPS6037904B2 (en) 1976-12-29 1976-12-29 IC test method

Publications (2)

Publication Number Publication Date
JPS5384482A true JPS5384482A (en) 1978-07-25
JPS6037904B2 JPS6037904B2 (en) 1985-08-29

Family

ID=15710934

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51160250A Expired JPS6037904B2 (en) 1976-12-29 1976-12-29 IC test method

Country Status (1)

Country Link
JP (1) JPS6037904B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5435865U (en) * 1977-08-17 1979-03-08

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5435865U (en) * 1977-08-17 1979-03-08
JPS5937736Y2 (en) * 1977-08-17 1984-10-19 日本電気株式会社 Device for determining quality of semiconductor integrated circuits

Also Published As

Publication number Publication date
JPS6037904B2 (en) 1985-08-29

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