JPS5676064A - Adjustment test method of compound substrate - Google Patents
Adjustment test method of compound substrateInfo
- Publication number
- JPS5676064A JPS5676064A JP15301479A JP15301479A JPS5676064A JP S5676064 A JPS5676064 A JP S5676064A JP 15301479 A JP15301479 A JP 15301479A JP 15301479 A JP15301479 A JP 15301479A JP S5676064 A JPS5676064 A JP S5676064A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- probe
- adjustment
- awk
- adjustment test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Supply And Installment Of Electrical Components (AREA)
Abstract
PURPOSE: To enable a continuous adjustment test of each unit single body and the entire compound substrate by a method wherein a probe stand having probes at positions corresponding to adjustment inspection points on a compound substrate assembled with multi-circuit units in a freely divided manner is installed.
CONSTITUTION: A compound substrate 1 is constituted with freely divided circuit units A, B... which are split by splitting part 1a.... Further, a probe stand 2 which is provided with probes 3... at positions corresponding to adjustment test points on the substrate 1 is installed. Each probe 3 is connected through lead wires 4 to a controller 5 which is connected to external apparatuses 61, 62... such as a power source, a frequency oscillator, a distortion factor meter and a level meter, etc. In the above-mentioned constitution, the stand 2 is positioned on the substrate 1 and the probe 3 is made to contact with the adjustment test point on the substrate 1. Next thereto, apparatuses 61W6n are connected to the probe 3 of each unit of AWK by controlling the controller 5 and an electronic input is given and an electronic output is taken out to check and adjust the characteristics of each of AWK units. Next thereto, a probe selected by the controller 5 is connected to each unit of AWK units and an inputting and an outputting are performed in the same manner as in the above-mentioned way, thus, the entire adjustment of the substrate 1 is performed.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15301479A JPS5676064A (en) | 1979-11-28 | 1979-11-28 | Adjustment test method of compound substrate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15301479A JPS5676064A (en) | 1979-11-28 | 1979-11-28 | Adjustment test method of compound substrate |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5676064A true JPS5676064A (en) | 1981-06-23 |
JPS6230385B2 JPS6230385B2 (en) | 1987-07-02 |
Family
ID=15553064
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15301479A Granted JPS5676064A (en) | 1979-11-28 | 1979-11-28 | Adjustment test method of compound substrate |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5676064A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4780670A (en) * | 1985-03-04 | 1988-10-25 | Xerox Corporation | Active probe card for high resolution/low noise wafer level testing |
-
1979
- 1979-11-28 JP JP15301479A patent/JPS5676064A/en active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4780670A (en) * | 1985-03-04 | 1988-10-25 | Xerox Corporation | Active probe card for high resolution/low noise wafer level testing |
Also Published As
Publication number | Publication date |
---|---|
JPS6230385B2 (en) | 1987-07-02 |
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