JPS5676064A - Adjustment test method of compound substrate - Google Patents

Adjustment test method of compound substrate

Info

Publication number
JPS5676064A
JPS5676064A JP15301479A JP15301479A JPS5676064A JP S5676064 A JPS5676064 A JP S5676064A JP 15301479 A JP15301479 A JP 15301479A JP 15301479 A JP15301479 A JP 15301479A JP S5676064 A JPS5676064 A JP S5676064A
Authority
JP
Japan
Prior art keywords
substrate
probe
adjustment
awk
adjustment test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15301479A
Other languages
Japanese (ja)
Other versions
JPS6230385B2 (en
Inventor
Takatsugu Saito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pioneer Corp
Original Assignee
Pioneer Electronic Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pioneer Electronic Corp filed Critical Pioneer Electronic Corp
Priority to JP15301479A priority Critical patent/JPS5676064A/en
Publication of JPS5676064A publication Critical patent/JPS5676064A/en
Publication of JPS6230385B2 publication Critical patent/JPS6230385B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Supply And Installment Of Electrical Components (AREA)

Abstract

PURPOSE: To enable a continuous adjustment test of each unit single body and the entire compound substrate by a method wherein a probe stand having probes at positions corresponding to adjustment inspection points on a compound substrate assembled with multi-circuit units in a freely divided manner is installed.
CONSTITUTION: A compound substrate 1 is constituted with freely divided circuit units A, B... which are split by splitting part 1a.... Further, a probe stand 2 which is provided with probes 3... at positions corresponding to adjustment test points on the substrate 1 is installed. Each probe 3 is connected through lead wires 4 to a controller 5 which is connected to external apparatuses 61, 62... such as a power source, a frequency oscillator, a distortion factor meter and a level meter, etc. In the above-mentioned constitution, the stand 2 is positioned on the substrate 1 and the probe 3 is made to contact with the adjustment test point on the substrate 1. Next thereto, apparatuses 61W6n are connected to the probe 3 of each unit of AWK by controlling the controller 5 and an electronic input is given and an electronic output is taken out to check and adjust the characteristics of each of AWK units. Next thereto, a probe selected by the controller 5 is connected to each unit of AWK units and an inputting and an outputting are performed in the same manner as in the above-mentioned way, thus, the entire adjustment of the substrate 1 is performed.
COPYRIGHT: (C)1981,JPO&Japio
JP15301479A 1979-11-28 1979-11-28 Adjustment test method of compound substrate Granted JPS5676064A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15301479A JPS5676064A (en) 1979-11-28 1979-11-28 Adjustment test method of compound substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15301479A JPS5676064A (en) 1979-11-28 1979-11-28 Adjustment test method of compound substrate

Publications (2)

Publication Number Publication Date
JPS5676064A true JPS5676064A (en) 1981-06-23
JPS6230385B2 JPS6230385B2 (en) 1987-07-02

Family

ID=15553064

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15301479A Granted JPS5676064A (en) 1979-11-28 1979-11-28 Adjustment test method of compound substrate

Country Status (1)

Country Link
JP (1) JPS5676064A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4780670A (en) * 1985-03-04 1988-10-25 Xerox Corporation Active probe card for high resolution/low noise wafer level testing

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4780670A (en) * 1985-03-04 1988-10-25 Xerox Corporation Active probe card for high resolution/low noise wafer level testing

Also Published As

Publication number Publication date
JPS6230385B2 (en) 1987-07-02

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