SG99872A1 - Method and apparatus for laser analysis of dioxins - Google Patents

Method and apparatus for laser analysis of dioxins

Info

Publication number
SG99872A1
SG99872A1 SG200006031A SG200006031A SG99872A1 SG 99872 A1 SG99872 A1 SG 99872A1 SG 200006031 A SG200006031 A SG 200006031A SG 200006031 A SG200006031 A SG 200006031A SG 99872 A1 SG99872 A1 SG 99872A1
Authority
SG
Singapore
Prior art keywords
dioxins
laser analysis
laser
analysis
Prior art date
Application number
SG200006031A
Other languages
English (en)
Inventor
Futami Hiroshi
Takatsudo Yasuhiro
Original Assignee
Mitsubishi Heavy Ind Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP30343899A external-priority patent/JP3281876B2/ja
Priority claimed from JP32644499A external-priority patent/JP3342453B2/ja
Application filed by Mitsubishi Heavy Ind Ltd filed Critical Mitsubishi Heavy Ind Ltd
Publication of SG99872A1 publication Critical patent/SG99872A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/02—Analysing fluids
    • G01N29/036—Analysing fluids by measuring frequency or resonance of acoustic waves
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/162—Direct photo-ionisation, e.g. single photon or multi-photon ionisation

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Acoustics & Sound (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
SG200006031A 1999-10-26 2000-10-20 Method and apparatus for laser analysis of dioxins SG99872A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP30343899A JP3281876B2 (ja) 1999-10-26 1999-10-26 ダイオキシン類分析装置及び燃焼制御システム
JP32644499A JP3342453B2 (ja) 1999-11-17 1999-11-17 ダイオキシン類分析方法及び装置

Publications (1)

Publication Number Publication Date
SG99872A1 true SG99872A1 (en) 2003-11-27

Family

ID=26563514

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200006031A SG99872A1 (en) 1999-10-26 2000-10-20 Method and apparatus for laser analysis of dioxins

Country Status (9)

Country Link
US (1) US6573493B1 (ru)
EP (1) EP1096546A2 (ru)
KR (1) KR20010060199A (ru)
CN (1) CN1294300A (ru)
AU (1) AU757797B2 (ru)
CA (1) CA2324552A1 (ru)
RU (1) RU2205384C2 (ru)
SG (1) SG99872A1 (ru)
TW (1) TW488118B (ru)

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US7583710B2 (en) 2001-01-30 2009-09-01 Board Of Trustees Operating Michigan State University Laser and environmental monitoring system
US7450618B2 (en) * 2001-01-30 2008-11-11 Board Of Trustees Operating Michigan State University Laser system using ultrashort laser pulses
AU2002245345A1 (en) * 2001-01-30 2002-08-12 Board Of Trustees Operating Michigan State University Control system and apparatus for use with laser excitation or ionization
US7567596B2 (en) * 2001-01-30 2009-07-28 Board Of Trustees Of Michigan State University Control system and apparatus for use with ultra-fast laser
US7609731B2 (en) * 2001-01-30 2009-10-27 Board Of Trustees Operating Michigan State University Laser system using ultra-short laser pulses
US7973936B2 (en) * 2001-01-30 2011-07-05 Board Of Trustees Of Michigan State University Control system and apparatus for use with ultra-fast laser
JP3706910B2 (ja) * 2002-05-07 2005-10-19 国立大学法人神戸大学 ダイオキシン類の同族体・異性体のレーザー分光法による定量方法及び装置
WO2005088294A1 (ja) * 2004-03-16 2005-09-22 Kabushiki Kaisha Idx Technologies レーザーイオン化質量分析装置
DE102004025841B4 (de) * 2004-05-24 2015-07-09 Bruker Daltonik Gmbh Verfahren und Vorrichtung zur massenspektroskopischen Untersuchung von Analyten
KR100667039B1 (ko) * 2004-10-22 2007-01-12 한국생명공학연구원 다이옥신 노출 여부 진단용 마커 및 이를 이용하여 다이옥신 노출을 확인하는 방법
US8633437B2 (en) * 2005-02-14 2014-01-21 Board Of Trustees Of Michigan State University Ultra-fast laser system
DE102005035932A1 (de) * 2005-07-28 2007-02-08 Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. KG Optischer Sensor für in-situ Messungen
WO2008054429A2 (en) * 2005-11-15 2008-05-08 Zolo Technologies, Inc. All-fiber architecture for an embedded flight sensor for aeropropulsion applications
US8618470B2 (en) 2005-11-30 2013-12-31 Board Of Trustees Of Michigan State University Laser based identification of molecular characteristics
US9018562B2 (en) * 2006-04-10 2015-04-28 Board Of Trustees Of Michigan State University Laser material processing system
KR100778383B1 (ko) * 2006-06-16 2007-11-22 한국표준과학연구원 크라이오 펌프 흡착재의 가스 흡착 특성 측정 장치 및 방법
US20080083874A1 (en) * 2006-10-10 2008-04-10 Prest Harry F Vacuum interface for mass spectrometer
GB0712363D0 (en) * 2007-06-26 2007-08-01 Smiths Group Plc Detectors
CN101144795B (zh) * 2007-10-29 2010-06-02 钢铁研究总院 脉冲熔融-飞行时间质谱元素分析仪
JP4392850B1 (ja) * 2008-07-22 2010-01-06 三井造船株式会社 赤外線吸収検査装置および赤外線吸収検査方法
CN101408510B (zh) * 2008-10-15 2012-01-04 深圳市龙澄高科技环保有限公司 利用紫外分光光度计测定飞灰中二噁英的方法
WO2010141128A2 (en) 2009-03-05 2010-12-09 Board Of Trustees Of Michigan State University Laser amplification system
US8630322B2 (en) 2010-03-01 2014-01-14 Board Of Trustees Of Michigan State University Laser system for output manipulation
JP5894078B2 (ja) * 2010-10-29 2016-03-23 アトナープ株式会社 サンプリング装置
KR101041531B1 (ko) * 2011-01-13 2011-06-17 주식회사 동일그린시스 이동식 대기오염 측정 장치 및 이를 이용한 대기오염 측정 시스템
CN103547910A (zh) * 2011-05-20 2014-01-29 株式会社堀场制作所 测量单元及气体分析装置
CN102323040B (zh) * 2011-05-30 2014-02-19 中国科学院上海微系统与信息技术研究所 脉冲激射型太赫兹量子级联激光器的功率测量装置及方法
CN103930770B (zh) * 2011-10-21 2017-02-22 Abb技术有限公司 用于在线监视电力变压器中呋喃类物质的传感器结构
GB2502307A (en) * 2012-05-22 2013-11-27 Kromek Ltd Radiation Detection
EP3298379A1 (en) * 2015-05-20 2018-03-28 Saudi Arabian Oil Company Sampling techniques to detect hydrocarbon seepage
KR101735300B1 (ko) * 2015-11-05 2017-05-16 한국표준과학연구원 공정가스 분석장치
WO2017090792A1 (ko) * 2015-11-26 2017-06-01 한국기초과학지원연구원 유해 물질의 이온 이동도 측정 장치 및 그의 레퍼런스 데이터 획득방법
DE102016113771B4 (de) * 2016-07-26 2019-11-07 Bundesrepublik Deutschland, Vertreten Durch Den Bundesminister Für Wirtschaft Und Energie, Dieser Vertreten Durch Den Präsidenten Der Bundesanstalt Für Materialforschung Und -Prüfung (Bam) Analysevorrichtung für gasförmige Proben und Verfahren zum Nachweis von Analyten in einem Gas
CN107037171A (zh) * 2016-12-29 2017-08-11 浙江富春江环保科技研究有限公司 一种用于二恶英在线检测的气相色谱‑质谱间传输线系统
CN107677720B (zh) * 2017-10-10 2023-10-24 浙江富春江环保科技研究有限公司 一种二恶英在线检测系统机柜
CN107998847A (zh) * 2017-11-07 2018-05-08 无锡艾科瑞思产品设计与研究有限公司 一种自带废气处理装置的废气检测系统
CN112198096A (zh) * 2020-09-30 2021-01-08 中国工程物理研究院激光聚变研究中心 一种铍粉尘浓度在线监测设备及其监测方法
CN113514462B (zh) * 2021-04-26 2023-05-23 浙江师范大学 一种用于捕捉产物微分散射截面的精细结构的装置及方法

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09243601A (ja) * 1996-03-07 1997-09-19 Nkk Corp 排ガス中の微量有機化合物の測定装置
JPH11218522A (ja) * 1998-02-02 1999-08-10 Mitsubishi Heavy Ind Ltd ダイオキシン分析装置及び分析方法
JPH11218520A (ja) * 1998-02-02 1999-08-10 Mitsubishi Heavy Ind Ltd ダイオキシン分析装置
JPH11218521A (ja) * 1998-02-02 1999-08-10 Mitsubishi Heavy Ind Ltd ダイオキシン分析装置及びダイオキシン計測システム

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US5252060A (en) 1992-03-27 1993-10-12 Mckinnon J Thomas Infrared laser fault detection method for hazardous waste incineration
RU94026309A (ru) 1994-07-14 1996-06-27 Р.М. Лазаренко-Маневич Способ спектроэлектрохимического анализа диоксинов и диоксиноподобных соединений
DE4441972C2 (de) 1994-11-25 1996-12-05 Deutsche Forsch Luft Raumfahrt Verfahren und Vorrichtung zum Nachweis von Probenmolekülen in einem Trägergas
WO1998009316A1 (fr) 1996-08-29 1998-03-05 Nkk Corporation Spectroscope de masse a ionisation par laser et procede d'analyse par spectroscopie de masse
US5843205A (en) 1996-12-06 1998-12-01 Kabushiki Kaisha Kawasaki Giken Method of removing dioxins in a waste incineration plant
WO1998025078A1 (fr) 1996-12-06 1998-06-11 Nkk Corporation Dispositif de combustion et procede pour limiter la production de dioxines
JPH1114596A (ja) 1997-06-26 1999-01-22 Nkk Corp ダイオキシン類の迅速分析方法
US6291737B1 (en) * 1997-11-21 2001-09-18 Kurita Water Industries Ltd. Method of decomposing dioxins
DE19754161C2 (de) 1997-12-06 1999-11-25 Gsf Forschungszentrum Umwelt Verfahren zum Nachweis von Substanzen und Substanzklassen
JP2001062251A (ja) * 1999-08-31 2001-03-13 Seon:Kk ごみ焼却炉におけるダイオキシン類の処理方法
JP3342453B2 (ja) * 1999-11-17 2002-11-11 三菱重工業株式会社 ダイオキシン類分析方法及び装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09243601A (ja) * 1996-03-07 1997-09-19 Nkk Corp 排ガス中の微量有機化合物の測定装置
JPH11218522A (ja) * 1998-02-02 1999-08-10 Mitsubishi Heavy Ind Ltd ダイオキシン分析装置及び分析方法
JPH11218520A (ja) * 1998-02-02 1999-08-10 Mitsubishi Heavy Ind Ltd ダイオキシン分析装置
JPH11218521A (ja) * 1998-02-02 1999-08-10 Mitsubishi Heavy Ind Ltd ダイオキシン分析装置及びダイオキシン計測システム

Also Published As

Publication number Publication date
CN1294300A (zh) 2001-05-09
AU757797B2 (en) 2003-03-06
US6573493B1 (en) 2003-06-03
EP1096546A2 (en) 2001-05-02
AU6669600A (en) 2001-05-03
KR20010060199A (ko) 2001-07-06
CA2324552A1 (en) 2001-04-26
RU2205384C2 (ru) 2003-05-27
TW488118B (en) 2002-05-21

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