SG65062A1 - Test board mount/dismount apparatus - Google Patents

Test board mount/dismount apparatus

Info

Publication number
SG65062A1
SG65062A1 SG1998000744A SG1998000744A SG65062A1 SG 65062 A1 SG65062 A1 SG 65062A1 SG 1998000744 A SG1998000744 A SG 1998000744A SG 1998000744 A SG1998000744 A SG 1998000744A SG 65062 A1 SG65062 A1 SG 65062A1
Authority
SG
Singapore
Prior art keywords
test board
board mount
dismount apparatus
dismount
mount
Prior art date
Application number
SG1998000744A
Other languages
English (en)
Inventor
Yoshinao Kamo
Original Assignee
Ando Electric
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ando Electric filed Critical Ando Electric
Publication of SG65062A1 publication Critical patent/SG65062A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
SG1998000744A 1997-04-30 1998-04-15 Test board mount/dismount apparatus SG65062A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12789997A JP3324445B2 (ja) 1997-04-30 1997-04-30 テストボード着脱装置

Publications (1)

Publication Number Publication Date
SG65062A1 true SG65062A1 (en) 1999-05-25

Family

ID=14971425

Family Applications (1)

Application Number Title Priority Date Filing Date
SG1998000744A SG65062A1 (en) 1997-04-30 1998-04-15 Test board mount/dismount apparatus

Country Status (5)

Country Link
JP (1) JP3324445B2 (ko)
KR (1) KR100318955B1 (ko)
GB (1) GB2325357B (ko)
IE (1) IE980260A1 (ko)
SG (1) SG65062A1 (ko)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100632032B1 (ko) * 1999-07-14 2006-10-04 동부일렉트로닉스 주식회사 프로브 카드 분리 가이드를 구비한 ｄｃ 검사장비
JP4835939B2 (ja) * 2006-05-25 2011-12-14 横河電機株式会社 Ｉｃテスタ及びテストボードの着脱方法
KR100772152B1 (ko) * 2006-11-22 2007-11-02 프롬써어티 주식회사 웨이퍼 테스터용 테스트헤드와 퍼포먼스보드유닛의도킹장치
WO2011064847A1 (ja) * 2009-11-25 2011-06-03 株式会社アドバンテスト 基板装着装置、テストヘッド、及び電子部品試験装置
CN102451820B (zh) * 2010-10-15 2014-04-16 王立民 电子产品的挑检方法
KR101348423B1 (ko) * 2013-10-08 2014-01-10 주식회사 아이티엔티 자동 테스트 장비의 테스트 보드용 이젝터 장치
TWI593469B (zh) * 2014-05-22 2017-08-01 旺矽科技股份有限公司 晶粒標示方法及晶粒標示設備
KR101883749B1 (ko) 2017-08-16 2018-07-31 주식회사 포스코 소재 표면조도 측정지그 및 이를 이용한 측정방법
JP7109630B2 (ja) * 2019-11-07 2022-07-29 東京エレクトロン株式会社 ウエハ検査システム

Also Published As

Publication number Publication date
GB9807480D0 (en) 1998-06-10
JPH10300816A (ja) 1998-11-13
GB2325357B (en) 2001-07-18
KR19980081806A (ko) 1998-11-25
IE980260A1 (en) 1998-11-04
GB2325357A (en) 1998-11-18
JP3324445B2 (ja) 2002-09-17
KR100318955B1 (ko) 2002-03-20

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