GB2325357B - Test board mount/dismount apparatus - Google Patents
Test board mount/dismount apparatusInfo
- Publication number
- GB2325357B GB2325357B GB9807480A GB9807480A GB2325357B GB 2325357 B GB2325357 B GB 2325357B GB 9807480 A GB9807480 A GB 9807480A GB 9807480 A GB9807480 A GB 9807480A GB 2325357 B GB2325357 B GB 2325357B
- Authority
- GB
- United Kingdom
- Prior art keywords
- test board
- board mount
- dismount apparatus
- dismount
- mount
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12789997A JP3324445B2 (en) | 1997-04-30 | 1997-04-30 | Test board attaching / detaching device |
Publications (3)
Publication Number | Publication Date |
---|---|
GB9807480D0 GB9807480D0 (en) | 1998-06-10 |
GB2325357A GB2325357A (en) | 1998-11-18 |
GB2325357B true GB2325357B (en) | 2001-07-18 |
Family
ID=14971425
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB9807480A Expired - Fee Related GB2325357B (en) | 1997-04-30 | 1998-04-07 | Test board mount/dismount apparatus |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP3324445B2 (en) |
KR (1) | KR100318955B1 (en) |
GB (1) | GB2325357B (en) |
IE (1) | IE980260A1 (en) |
SG (1) | SG65062A1 (en) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100632032B1 (en) * | 1999-07-14 | 2006-10-04 | 동부일렉트로닉스 주식회사 | Dc test equipment with guide for separating probe card |
JP4835939B2 (en) * | 2006-05-25 | 2011-12-14 | 横河電機株式会社 | IC tester and test board attaching / detaching method |
KR100772152B1 (en) * | 2006-11-22 | 2007-11-02 | 프롬써어티 주식회사 | Device for docking test head and performance board unit of wafer tester |
US20120280707A1 (en) * | 2009-11-25 | 2012-11-08 | Advantest Corporation | Board mounting apparatus, test head, and electronic device test apparatus |
CN102451820B (en) * | 2010-10-15 | 2014-04-16 | 王立民 | Selecting method of electronic product |
KR101348423B1 (en) * | 2013-10-08 | 2014-01-10 | 주식회사 아이티엔티 | Ejector device for test board of automatic test equipment |
TWI593469B (en) * | 2014-05-22 | 2017-08-01 | 旺矽科技股份有限公司 | Die marking method and die marking equipment |
KR101883749B1 (en) | 2017-08-16 | 2018-07-31 | 주식회사 포스코 | Zig for measuring surface roughness of steel and measuring method using the same |
JP7109630B2 (en) * | 2019-11-07 | 2022-07-29 | 東京エレクトロン株式会社 | Wafer inspection system |
-
1997
- 1997-04-30 JP JP12789997A patent/JP3324445B2/en not_active Expired - Fee Related
-
1998
- 1998-04-07 IE IE980260A patent/IE980260A1/en not_active IP Right Cessation
- 1998-04-07 GB GB9807480A patent/GB2325357B/en not_active Expired - Fee Related
- 1998-04-15 SG SG1998000744A patent/SG65062A1/en unknown
- 1998-04-28 KR KR1019980015169A patent/KR100318955B1/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR100318955B1 (en) | 2002-03-20 |
GB9807480D0 (en) | 1998-06-10 |
SG65062A1 (en) | 1999-05-25 |
GB2325357A (en) | 1998-11-18 |
JPH10300816A (en) | 1998-11-13 |
IE980260A1 (en) | 1998-11-04 |
JP3324445B2 (en) | 2002-09-17 |
KR19980081806A (en) | 1998-11-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20030407 |